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2010 – 2019
- 2016
[c10]Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger:
Improving SRAM test quality by leveraging self-timed circuits. DATE 2016: 984-989- [c9]Juergen Alt, Paolo Bernardi
, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser:
Thermal issues in test: An overview of the significant aspects and industrial practice. VTS 2016: 1-4 - 2011
- [j3]Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Masking of X-Values by Use of a Hierarchically Configurable Register. J. Electron. Test. 27(1): 31-41 (2011)
2000 – 2009
- 2009
- [j2]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electron. Test. 25(4-5): 247-258 (2009) - [c8]Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. ETS 2009: 39-44 - [c7]Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Masking of X-values by Use of a Hierarchically Configurable Register. ETS 2009: 149-154 - 2008
- [c6]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
Accelerated Shift Registers for X-tolerant Test Data Compaction. ETS 2008: 133-139 - 2007
- [c5]Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel:
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. ITC 2007: 1-9 - 2006
- [b1]Andreas Leininger:
New diagnosis and test methods with high compaction rates. University of Potsdam, 2006, ISBN 978-3-86664-066-5, pp. 1-98 - [c4]Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang:
The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. ATS 2006: 360-368 - 2005
- [c3]Ralf Arnold, Andreas Leininger:
Evaluating ATE-equipment for volume diagnosis. ITC 2005: 9 - [c2]Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai:
Compression mode diagnosis enables high volume monitoring diagnosis flow. ITC 2005: 10 - 2004
- [j1]Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger:
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electron. Test. 20(6): 611-622 (2004) - [c1]Andreas Leininger, Michael Gössel, Peter Muhmenthaler:
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE 2004: 1302-1309
Coauthor Index
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