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ORCIDTerence B. Hook
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Journal Articles
- 2005
[j5]Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz:
Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectron. Reliab. 45(1): 47-56 (2005)- 2003
- [j4]Randy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus:
Ultralow-power SRAM technology. IBM J. Res. Dev. 47(5-6): 553-566 (2003) - 2001
- [j3]Terence B. Hook, David Harmon, Chuan Lin:
Plasma process-induced damage on thick (6.8 nm) and thin (3.5 nm) gate oxide: parametric shifts, hot-carrier response, and dielectric integrity degradation. Microelectron. Reliab. 41(5): 751-765 (2001) - 1999
- [j2]Terence B. Hook, Jay S. Burnham, Ronald J. Bolam:
Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations. IBM J. Res. Dev. 43(3): 393-406 (1999) - 1992
- [j1]Terence B. Hook:
Automatic extraction of circuit models from layout artwork for a BiCMOS technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(6): 732-738 (1992)
Conference and Workshop Papers
- 2012
- [c2]Terence B. Hook:
Fully depleted devices for designers: FDSOI and FinFETs. CICC 2012: 1-7 - 2001
- [c1]Stephen V. Kosonocky, Michael Immediato, Peter E. Cottrell, Terence B. Hook, Randy W. Mann, Jeff Brown:
Enchanced multi-threshold (MTCMOS) circuits using variable well bias. ISLPED 2001: 165-169
Coauthor Index
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