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"Negative bias temperature instability on three oxide thicknesses ..."
Terence B. Hook et al. (2005)
- Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz:
Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectron. Reliab. 45(1): 47-56 (2005)
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