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Min-Chun Hu 0002

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affiliation: National Tsing-Hua University, Department of Electrical Engineering, Hsinchu, Taiwan
affiliation: Cadence Design Systems, Endicott, NY, USA
not to be confused with: Min-Chun Hu 0001

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2020 – today

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2024
[j2]
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Zhan Gao, Min-Chun Hu, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. IEEE Des. Test 41(2): 56-64 (2024)
2021
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Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. J. Electron. Test. 37(2): 161-189 (2021)
2020
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Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen:
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. ETS 2020: 1-6

2010 – 2019

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2019
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Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen:
Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. ITC 2019: 1-6
[c1]
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Zhan Gao, Min-Chun Hu, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. ITC-Asia 2019: 91-96

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