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"Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology."

Zhan Gao et al. (2024)

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DOI: 10.1109/MDAT.2023.3294872

access: closed

type: Journal Article

metadata version: 2024-03-16

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  - journals/dt/Gao0BCSMHGM24
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  - https://dblp.org/rec/journals/dt/Gao0BCSMHGM24
Zhan Gao, Min-Chun Hu, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. IEEE Des. Test 41(2): 56-64 (2024)

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