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Ningdong Li
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2020 – today
- 2023
- [c1]Lina Xie, Ningdong Li, Yuping Xing, Liang Guo:
Development trends and countermeasures of China's cloud artificial intelligence chip industry. PAAP 2023: 1-6 - 2021
- [j9]Fayu Wan
, Ningdong Li
, Blaise Ravelo
, Wenceslas Rahajandraibe
, Sébastien Lalléchère:
Design of ₌׀₌ Shape Stub-Based Negative Group Delay Circuit. IEEE Des. Test 38(2): 78-88 (2021) - [j8]Blaise Ravelo
, Fayu Wan
, Ningdong Li
, Zhifei Xu
, Preeti Thakur
, Atul Thakur
:
Diakoptics Modelling Applied to Flying Bird-Shape NGD Microstrip Circuit. IEEE Trans. Circuits Syst. II Express Briefs 68(2): 637-641 (2021) - 2020
- [j7]Xiang Zhou, Binhong Li, Ningdong Li
, Blaise Ravelo
, Xiaofeng Hu, Qizheng Ji, Fayu Wan
, Glauco Fontgalland:
Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines. IEEE Access 8: 72749-72756 (2020) - [j6]Fayu Wan
, Ningdong Li
, Blaise Ravelo, Junxiang Ge
:
O=O Shape Low-Loss Negative Group Delay Microstrip Circuit. IEEE Trans. Circuits Syst. II Express Briefs 67-II(10): 1795-1799 (2020) - [j5]Fayu Wan
, Ningdong Li
, Blaise Ravelo
, Nour Mohammad Murad
, Wenceslas Rahajandraibe
:
NGD Analysis of Turtle-Shape Microstrip Circuit. IEEE Trans. Circuits Syst. 67-II(11): 2477-2481 (2020)
2010 – 2019
- 2019
- [j4]Blaise Ravelo
, Ningdong Li, Fayu Wan
, Jiao Feng:
Design, Modeling and Synthesis of Negative Group Delay IL-Shape Topology. IEEE Access 7: 153900-153909 (2019) - [j3]Fayu Wan
, Ningdong Li
, Blaise Ravelo
, Junxiang Ge, Binhong Li:
Time-Domain Experimentation of NGD ActiveRC-Network Cell. IEEE Trans. Circuits Syst. II Express Briefs 66-II(4): 562-566 (2019) - 2018
- [j2]Fayu Wan
, Ningdong Li, Blaise Ravelo
, Qizheng Ji, Binhong Li, Junxiang Ge:
The Design Method of the Active Negative Group Delay Circuits Based on a Microwave Amplifier and an RL-Series Network. IEEE Access 6: 33849-33858 (2018) - [j1]Fayu Wan
, Ningdong Li, Blaise Ravelo
, Qizheng Ji, Junxiang Ge:
S-Parameter Model of Three Parallel Interconnect Lines Generating Negative Group-Delay Effect. IEEE Access 6: 57152-57159 (2018)
Coauthor Index
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