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F. Cantin

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2008
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M. Verchiani, Emilien Bouyssou, Guillaume Fiannaca, F. Cantin, Christine Anceau, Pierre Ranson:
Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction. Microelectron. Reliab. 48(8-9): 1412-1416 (2008)

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