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T. Lehndorff

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2010 – 2019

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2019
[c1]
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  - conf/irps/HirlerABLLLSSSW19
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Alexander Hirler, Adnan Alsioufy, Josef Biba, T. Lehndorff, D. Lipp, Helmut Lochner, Mahesh Siddabathula, S. Simon, Torsten Sulima, Maciej Wiatr, Walter Hansch:
Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. IRPS 2019: 1-4
2017
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Alexander Hirler, Josef Biba, Adnan Alsioufy, T. Lehndorff, Torsten Sulima, H. Lochner, U. Abelein, Walter Hansch:
Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability. Microelectron. Reliab. 76-77: 38-41 (2017)

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