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H. Lochner

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2017
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Alexander Hirler, Josef Biba, Adnan Alsioufy, T. Lehndorff, Torsten Sulima, H. Lochner, U. Abelein, Walter Hansch:
Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability. Microelectron. Reliab. 76-77: 38-41 (2017)

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