default search action

combined dblp search
author search
venue search
publication search

ask others

Thorsten Oeder

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2018
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/irps/CastellazziFZOP18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/CastellazziFZOP18
Alberto Castellazzi, Asad Fayyaz, Siwei Zhu, Thorsten Oeder, Martin Pfost:
Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. IRPS 2018: 4
2017
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/OederCP17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/OederCP17
Thorsten Oeder, Alberto Castellazzi, Martin Pfost:
Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. Microelectron. Reliab. 76-77: 321-326 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.