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2020 – today
- 2022
[c8]Yannick Raffel, Sunanda Thunder, Maximilian Lederer
, Ricardo Olivo, Raik Hoffmann, Luca Pirro, Sven Beyer, Talha Chohan, Po-Tsang Huang, Sourav De, Thomas Kämpfe, Konrad Seidel, Johannes Heitmann:
Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications. ICICDT 2022: 8-11- [c7]Yannick Raffel, Ricardo Olivo, Maximilian Lederer, Franz Müller, Raik Hoffmann, Tarek Ali, Konstantin Mertens, Luca Pirro, Maximilian Drescher, Sven Beyer, Thomas Kämpfe, Konrad Seidel, Lukas M. Eng, Johannes Heitmann:
Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination. IMW 2022: 1-4 - [c6]Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, Michael Otto, Alban Zaka, Jan Hoentschel:
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. IRPS 2022: 59-1 - 2021
- [c5]Luca Pirro, Aarthi Jayakumar, Olaf Zimmerhackl, Dieter Lipp, Ralf Illgen, Armin Muehlhoff, Ronny Pfuetzner, Alban Zaka, Michael Otto, Jan Hoentschel, Yannick Raffel, Konrad Seidel, Ricardo Olivo:
Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices. IRPS 2021: 1-4
2010 – 2019
- 2019
- [c4]Zhixing Zhao, Patrick James Artz, Klaus Hempel, Juergen Faul, Tianbing Chen, Richard Taylor, Jerome Mazurier, Carsten Grass, Jan Hoentschel, David Harame, Steffen Lehmann, Luca Lucci, Yogadissen Andee, Alexis Divay, Luca Pirro, Tom Herrmann, Alban Zaka, Ricardo Sousa:
22FDX® fMAX Optimization through Parasitics Reduction and GM Boost. ESSDERC 2019: 166-169 - [c3]Luca Pirro, Alban Zaka, Olaf Zimmerhackl, T. Hermann, Michael Otto, E. M. Bazizi, Jan Hoentschel, X. Li, R. Taylor:
Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias. IRPS 2019: 1-5 - 2018
- [c2]Luca Pirro, Olaf Zimmerhackl, Alban Zaka, Lars Müller-Meskamp, Ranjith Nelluri, Tom Hermann, Ignasi Cortes-Mayol, Andreas Huschka, Michael Otto, E. Nowak, Anurag Mittal, Jan Hoentschel:
RTN and LFN Noise Performance in Advanced FDSOI Technology. ESSDERC 2018: 254-257 - 2015
- [c1]Luca Pirro, Irina Ionica, Sorin Cristoloveanu, Gérard Ghibaudo:
Low-frequency noise in bare SOI wafers: Experiments and model. ESSDERC 2015: 286-289
Coauthor Index
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