"Low-frequency noise in bare SOI wafers: Experiments and model."

Luca Pirro et al. (2015)

Details and statistics

DOI: 10.1109/ESSDERC.2015.7324770

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

a service of  Schloss Dagstuhl - Leibniz Center for Informatics