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Lee-Ing Tong
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2010 – 2019
- 2013
- [j12]Chih-Wei Chang, Lee-Ing Tong:
Monitoring the software development process using a short-run control chart. Softw. Qual. J. 21(3): 479-499 (2013) - 2012
- [j11]Yu-Hsiang Chung, Lee-Ing Tong:
Bi-criteria minimization for the permutation flowshop scheduling problem with machine-based learning effects. Comput. Ind. Eng. 63(1): 302-312 (2012) - 2011
- [j10]Lee-Ing Tong, Yung-Chia Chang
, Shan-Hui Lin:
Determining the optimal re-sampling strategy for a classification model with imbalanced data using design of experiments and response surface methodologies. Expert Syst. Appl. 38(4): 4222-4227 (2011) - [j9]Yi-Shian Lee, Lee-Ing Tong:
Forecasting time series using a methodology based on autoregressive integrated moving average and genetic programming. Knowl. Based Syst. 24(1): 66-72 (2011)
2000 – 2009
- 2009
- [j8]Li-Chang Chao, Lee-Ing Tong:
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index. Expert Syst. Appl. 36(6): 10158-10167 (2009) - 2008
- [j7]Lee-Ing Tong, Li-Chang Chao:
Novel yield model for integrated circuits with clustered defects. Expert Syst. Appl. 34(4): 2334-2341 (2008) - [j6]Lee-Ing Tong, Chung-Ho Wang
, Chih-Wei Tsai:
Robust design for multiple dynamic quality characteristics using data envelopment analysis. Qual. Reliab. Eng. Int. 24(5): 557-571 (2008) - 2007
- [j5]Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang:
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory. Expert Syst. Appl. 32(3): 765-776 (2007) - 2005
- [j4]Kun-Lin Hsieh, Lee-Ing Tong, Hung-Pin Chiu, Hsin-Ya Yeh:
Optimization of a multi-response problem in Taguchi's dynamic system. Comput. Ind. Eng. 49(4): 556-571 (2005) - [j3]Tai-Yih Yang, Lee-Ing Tong, Benjamin J. C. Yuan:
An innovative model of multi-project wafer service in the foundry industry. Int. J. Technol. Manag. 30(1/2): 172-187 (2005) - 2004
- [j2]Lee-Ing Tong, Chung-Ho Wang
, Chih-Chien Chen, Chun-Tzu Chen:
Dynamic multiple responses by ideal solution analysis. Eur. J. Oper. Res. 156(2): 433-444 (2004) - 2001
- [j1]Kun-Lin Hsieh, Lee-Ing Tong:
Optimization of multiple quality responses involving qualitative and quantitative characteristics in IC manufacturing using neural networks. Comput. Ind. 46(1): 1-12 (2001)
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