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"Novel yield model for integrated circuits with clustered defects."

Lee-Ing Tong, Li-Chang Chao (2008)

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DOI: 10.1016/J.ESWA.2007.03.013

access: closed

type: Journal Article

metadata version: 2017-05-26

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  - https://dblp.org/rec/journals/eswa/TongC08
Lee-Ing Tong, Li-Chang Chao:
Novel yield model for integrated circuits with clustered defects. Expert Syst. Appl. 34(4): 2334-2341 (2008)

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