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"The application of control chart for defects and defect clustering in IC ..."
Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang (2007)
- Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang:
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory. Expert Syst. Appl. 32(3): 765-776 (2007)
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