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ORCIDBenoît Charlot
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2010 – 2019
- 2019
[i2]Abhishek Singh Dahiya, Jerome Thireau, Jamila Boudaden, Swatchith Lal, Umair Gulzar, Yan Zhang, Thierry Gil, Nadine Azémard, Peter Ramm, Tim Kiessling, Cian O'Murchu, Fredrik Sebelius, Jonas Tilly, Colm Glynn, Shane Geary, Colm O'Dwyer, Kafil Razeeb, Alain Lacampagne
, Benoît Charlot, Aida Todri-Sanial:
Energy Autonomous Wearable Sensors for Smart Healthcare: A Review. CoRR abs/1912.02596 (2019)
2000 – 2009
- 2008
- [j5]Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire:
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectron. Reliab. 48(2): 204-211 (2008) - [i1]Benoît Charlot, Winston Sun, Kiyotaka Yamashita, Hiroyuki Fujita, Hiroshi Toshiyoshi:
In-Plane Bistable Nanowire For Memory Devices. CoRR abs/0805.0889 (2008) - 2005
- [c9]Ghislain Despesse, Jean-Jacques Chaillout, Thomas Jager, Jean-Michel Léger, Andrea Vassilev, Skandar Basrour, Benoît Charlot:
High damping electrostatic system for vibration energy scavenging. sOc-EUSAI 2005: 283-286 - [c8]Yasser Ammar, Aurélien Buhrig, Marcin Marzencki, Benoît Charlot, Skandar Basrour, Karine Matou, Marc Renaudin:
Wireless sensor network node with asynchronous architecture and vibration harvesting micro power generator. sOc-EUSAI 2005: 287-292 - 2004
- [c7]Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois:
On-chip testing of embedded silicon transducers. SoCC 2004: 13-18 - 2003
- [j4]Cosmin Roman, Salvador Mir, Benoît Charlot:
Building an analogue fault simulation tool and its application to MEMS. Microelectron. J. 34(10): 897-906 (2003) - 2002
- [c6]Gabriela Nicolescu, S. Martinez, Lobna Kriaa, Wassim Youssef, Sungjoo Yoo, Benoît Charlot, Ahmed Amine Jerraya:
Application of Multi-Domain and Multi-Language Cosimulation to an Optical MEM Switch Design. ASP-DAC/VLSI Design 2002: 426- - 2001
- [b1]Benoît Charlot:
Modélisation de fautes et conception en vue du test structurel des microsystèmes. (Fault modeling and design-for-test of MEMS). Grenoble Institute of Technology, France, 2001 - [j3]Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois:
Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electron. Test. 17(6): 459-470 (2001) - [c5]Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski:
An Analog-based Approach for MEMS Testing. LATW 2001: 200-203 - [c4]Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois:
Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217 - 2000
- [j2]Salvador Mir, Benoît Charlot, Bernard Courtois:
Extending Fault-Based Testing to Microelectromechanical Systems. J. Electron. Test. 16(3): 279-288 (2000) - [c3]Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz:
Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
1990 – 1999
- 1999
- [j1]Salvador Mir, Benoît Charlot:
On the Integration of Design and Test for Chips Embedding MEMS. IEEE Des. Test Comput. 16(4): 28-38 (1999) - [c2]Salvador Mir, Benoît Charlot, Bernard Courtois:
Extending fault-based testing to microelectromechanical systems. ETW 1999: 64-68 - [c1]Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois:
Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
Coauthor Index
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