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"Extending Fault-Based Testing to Microelectromechanical Systems."

Salvador Mir, Benoît Charlot, Bernard Courtois (2000)

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DOI: 10.1023/A:1008303717862

access: closed

type: Journal Article

metadata version: 2020-09-11

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Salvador Mir, Benoît Charlot, Bernard Courtois:
Extending Fault-Based Testing to Microelectromechanical Systems. J. Electron. Test. 16(3): 279-288 (2000)

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