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Justin Shi
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2010 – 2019
- 2019
- [c3]Deepak Aggarwal, Fei Cao, Harish Charan, Debzani Deb, Dabin Ding, Toby Dragon, Muztaba Fuad
, Prashant Kumar, Hemant Joshi, Anthony Moore, Justin Shi, Michelle M. Zhu, Martina Barnas, Noemi de La Rocque Rodriguez:
EduPar Posters. IPDPS Workshops 2019: 347-349 - 2014
- [i2]Justin Shi:
On The Reproducibility and Scalability of Extreme Scale Applications. CoRR abs/1405.4464 (2014) - [i1]Doug James, Nancy Wilkins-Diehr, Victoria Stodden, Dirk Colbry, Carlos Rosales, Mark R. Fahey, Justin Shi, Rafael Ferreira da Silva, Kyo Lee, Ralph Roskies, Laurence Loewe, Susan Lindsey, Rob Kooper, Lorena A. Barba, David H. Bailey, Jonathan M. Borwein, Óscar Corcho, Ewa Deelman, Michael C. Dietze, Benjamin Gilbert, Jan Harkes, Seth Keele, Praveen Kumar, Jong Lee, Erika Linke, Richard Marciano, Luigi Marini, Chris Mattmann, Dave Mattson, Kenton McHenry, Robert T. McLay, Sheila Miguez, Barbara S. Minsker, María S. Pérez-Hernández, Dan Ryan, Mats Rynge, Idafen Santana-Pérez, Mahadev Satyanarayanan, Gloriana St. Clair, Keith Webster, Eivind Hovig, Daniel S. Katz, Sophie Kay, Geir Kjetil Sandve, David Skinner, Gabrielle Allen, John Cazes, Kym Won Cho, Jim Fonseca, Lorraine J. Hwang, Lars Koesterke, Pragnesh Patel, Line Pouchard, Edward Seidel, Isuru Suriarachchi:
Standing Together for Reproducibility in Large-Scale Computing: Report on reproducibility@XSEDE. CoRR abs/1412.5557 (2014) - 2012
- [j1]Justin Shi, Eric G. Soenen, Alan Roth, Ying-Chih Hsu, Martin Kinyua:
Practical Considerations for a Digital Inductive-Switching DC/DC Converter With Direct Battery Connect in Deep Sub-Micron CMOS. IEEE J. Solid State Circuits 47(8): 1946-1959 (2012) - 2011
- [c2]Justin Shi, Ying-Chih Hsu, Eric G. Soenen, Alan Roth, Justin Gaither:
A wide-range DC/DC converter with 2nd order digital compensation and direct battery connection in 40nm CMOS. CICC 2011: 1-4 - 2010
- [c1]Eric G. Soenen, Alan Roth, Justin Shi, Martin Kinyua, Justin Gaither, Elizabeth Ortynska:
A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS. ISSCC 2010: 198-199
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