"A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS."

Eric G. Soenen et al. (2010)

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DOI: 10.1109/ISSCC.2010.5433987

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Eric G. Soenen, Alan Roth, Justin Shi, Martin Kinyua, Justin Gaither, Elizabeth Ortynska:
A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS. ISSCC 2010: 198-199

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