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Keum-Whan Noh

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Journal Articles

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2015
[j2]
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  dblp key:
  - journals/mr/MoonLYNY15
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  - https://dblp.org/rec/journals/mr/MoonLYNY15
Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun:
Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. Microelectron. Reliab. 55(5): 795-798 (2015)
2013
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Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun:
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. Microelectron. Reliab. 53(9-11): 1338-1341 (2013)

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