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"Methodology for improvement of data retention in floating gate flash ..."

Pyung Moon et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun:
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. Microelectron. Reliab. 53(9-11): 1338-1341 (2013)

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