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2020 – today
- 2024
[j26]Wanyu Yang
, Kunping Wu, Bing Long, Shulin Tian:
A Novel Method for Remaining Useful Life Prediction of RF Circuits Based on the Gated Recurrent Unit-Convolutional Neural Network Model. Sensors 24(9): 2841 (2024)- 2023
- [j25]Bing Long:
Estimation and prediction for the Rayleigh distribution based on double Type-I hybrid censored data. Commun. Stat. Simul. Comput. 52(8): 3553-3567 (2023) - [c4]Bing Long, Kunping Wu, Ruyuan Xu, Meng Li, Zhiyuan Bu:
Multi-Signal Modeling and Parallel Diagnosis Method of Low Noise Amplifier. SAFEPROCESS 2023: 1-6 - 2022
- [j24]Jingyuan Wang, Zhen Liu, Jiahong Wang, Bing Long, Xiuyun Zhou:
A general enhancement method for test strategy generation for the sequential fault diagnosis of complex systems. Reliab. Eng. Syst. Saf. 228: 108754 (2022) - 2021
- [c3]Shuqin Zhang, Wei Jiang, Ning Yang, Bing Long, Jianan Zhu, Yi Zhou:
Time elasticity evaluation of flight turnaround ground service process. ICIT 2021: 519-524 - 2020
- [j23]Bing Long, Xiaoyu Gao, Pengcheng Li, Zhen Liu:
Multi-Parameter Optimization Method for Remaining Useful Life Prediction of Lithium-Ion Batteries. IEEE Access 8: 142557-142570 (2020)
2010 – 2019
- 2017
- [j22]Liyue Yan, Houjun Wang, Zhen Liu, Jingyu Zhou, Bing Long:
A Novel Noise-assisted Prognostic Method for Linear Analog Circuits. J. Electron. Test. 33(5): 559-572 (2017) - [j21]Chenglin Yang, Ruoshan Su, Bing Long:
Methods of sequential test optimization in dynamic environment. Microelectron. Reliab. 70: 112-121 (2017) - 2014
- [j20]Bing Long, Weiming Xian, Min Li, Houjun Wang:
Improved diagnostics for the incipient faults in analog circuits using LSSVM based on PSO algorithm with Mahalanobis distance. Neurocomputing 133: 237-248 (2014) - [j19]Chenglin Yang, Junhao Yan, Bing Long, Zhen Liu:
A novel test optimizing algorithm for sequential fault diagnosis. Microelectron. J. 45(6): 719-727 (2014) - [j18]Weiming Xian, Bing Long, Min Li, Houjun Wang:
Prognostics of Lithium-Ion Batteries Based on the Verhulst Model, Particle Swarm Optimization and Particle Filter. IEEE Trans. Instrum. Meas. 63(1): 2-17 (2014) - [c2]Jingyu Zhou, Shulin Tian, Bing Long, Chenglin Yang:
A Novel Prediction Method for Analog Circuits Based on Gaussian White Noise Estimation. CSE 2014: 105-112 - 2013
- [j17]Bing Long, Min Li, Houjun Wang, Shulin Tian:
Diagnostics of Analog Circuits Based on LS-SVM Using Time-Domain Features. Circuits Syst. Signal Process. 32(6): 2683-2706 (2013) - [j16]Min Li, Weiming Xian, Bing Long, Houjun Wang:
Prognostics of Analog Filters Based on Particle Filters Using Frequency Features. J. Electron. Test. 29(4): 567-584 (2013) - [j15]Jun Mei, Minghui Jiang, Bin Wang, Bing Long:
Finite-time parameter identification and adaptive synchronization between two chaotic neural networks. J. Frankl. Inst. 350(6): 1617-1633 (2013) - [j14]Bing Long, Weiming Xian, Lin Jiang, Zhen Liu:
An improved autoregressive model by particle swarm optimization for prognostics of lithium-ion batteries. Microelectron. Reliab. 53(6): 821-831 (2013) - [j13]Arvind Sai Sarathi Vasan, Bing Long, Michael G. Pecht:
Diagnostics and Prognostics Method for Analog Electronic Circuits. IEEE Trans. Ind. Electron. 60(11): 5277-5291 (2013) - 2012
- [j12]Bing Long, Shulin Tian, Houjun Wang:
Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features. J. Electron. Test. 28(3): 291-300 (2012) - [j11]Bing Long, Shulin Tian, Houjun Wang:
Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM. J. Electron. Test. 28(5): 745-755 (2012) - 2011
- [j10]Ting Long, Houjun Wang, Bing Long:
A Classical Parameter Identification Method and a Modern Test Generation Algorithm. Circuits Syst. Signal Process. 30(2): 391-412 (2011) - [j9]Ting Long, Houjun Wang, Bing Long:
Test generation algorithm for analog systems based on support vector machine. Signal Image Video Process. 5(4): 527-533 (2011) - [j8]Chenglin Yang, Shulin Tian, Bing Long, Fang Chen:
Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis. IEEE Trans. Instrum. Meas. 60(1): 176-185 (2011) - 2010
- [j7]Lijia Xu, Jianguo Huang, Houjun Wang, Bing Long:
A Novel Method for the Diagnosis of the Incipient Faults in Analog Circuits Based on LDA and HMM. Circuits Syst. Signal Process. 29(4): 577-600 (2010) - [j6]Ting Long, Houjun Wang, Shulin Tian, Jianguo Huang, Bing Long:
Test Generation Algorithm for Linear Systems Based on Genetic Algorithm. J. Electron. Test. 26(4): 419-428 (2010) - [j5]Chenglin Yang, Shulin Tian, Bing Long, Fang Chen:
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques. J. Electron. Test. 26(5): 523-534 (2010) - [j4]Hengsong Wang, Bing Long, Shulin Tian:
Spiral-Shaped Driveways: A Novel Method for Traffic Circles. IEEE Intell. Transp. Syst. Mag. 2(1): 18-23 (2010) - [j3]Ronghua Jiang, Houjun Wang, Shulin Tian, Bing Long:
Multidimensional Fitness Function DPSO Algorithm for Analog Test Point Selection. IEEE Trans. Instrum. Meas. 59(6): 1634-1641 (2010)
2000 – 2009
- 2009
- [j2]Chenglin Yang, Shulin Tian, Bing Long:
Test Points Selection for Analog Fault Dictionary Techniques. J. Electron. Test. 25(2-3): 157-168 (2009) - [j1]Chenglin Yang, Shulin Tian, Bing Long:
Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques. IEEE Trans. Instrum. Meas. 58(7): 2145-2158 (2009) - 2008
- [c1]Lijia Xu, Houjun Wang, Bing Long:
Study on State Prediction Method for Electronic System. PACIIA (2) 2008: 665-670
Coauthor Index
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