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"A Novel Noise-assisted Prognostic Method for Linear Analog Circuits."

Liyue Yan et al. (2017)

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DOI: 10.1007/S10836-017-5688-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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  dblp key:
  - journals/et/YanWLZL17
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  - https://dblp.org/rec/journals/et/YanWLZL17
Liyue Yan, Houjun Wang, Zhen Liu, Jingyu Zhou, Bing Long:
A Novel Noise-assisted Prognostic Method for Linear Analog Circuits. J. Electron. Test. 33(5): 559-572 (2017)

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