"A novel test optimizing algorithm for sequential fault diagnosis."

Chenglin Yang et al. (2014)

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DOI: 10.1016/J.MEJO.2014.03.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chenglin Yang, Junhao Yan, Bing Long, Zhen Liu:
A novel test optimizing algorithm for sequential fault diagnosis. Microelectron. J. 45(6): 719-727 (2014)

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