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Hitoshi Kume
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2000 – 2009
- 2007
- [j5]Hideaki Kurata, Satoshi Noda, Yoshitaka Sasago, Kazuo Otsuga, Tsuyoshi Arigane, Tetsufumi Kawamura, Takashi Kobayashi, Hitoshi Kume, Kazuki Homma, Teruhiko Ito, Yoshinori Sakamoto, Masahiro Shimizu, Yoshinori Ikeda, Osamu Tsuchiya, Kazunori Furusawa:
A 126 mm2 4-Gb Multilevel AG-AND Flash Memory with Inversion-Layer-Bit-Line Technology. IEICE Trans. Electron. 90-C(11): 2146-2156 (2007)
1990 – 1999
- 1999
- [j4]Atsushi Nozoe, Hiroaki Kotani, Tetsuya Tsujikawa, Keiichi Yoshida, Kazunori Furusawa, Masataka Kato, Toshiaki Nishimoto, Hitoshi Kume, Hideaki Kurata, Naoki Miyamoto, Shoji Kubono, Michitaro Kanamitsu, Kenji Koda, Takeshi Nakayama, Yasuhiro Kouro, Akira Hosogane, Natsuo Ajika, Kiyoteru Kobayashi
:
A 256-Mb multilevel flash memory with 2-MB/s program rate for mass storage applications. IEEE J. Solid State Circuits 34(11): 1544-1550 (1999) - 1996
- [j3]Takayuki Kawahara
, Takashi Kobayashi, Yusuke Jyouno, Syun-ichi Saeki, Naoki Miyamoto, T. Adachi, Masataka Kato, Akihiko Sato, J. Yugami, Hitoshi Kume, Katsutaka Kimura:
Bit-line clamped sensing multiplex and accurate high voltage generator for quarter-micron flash memories. IEEE J. Solid State Circuits 31(11): 1590-1600 (1996) - 1993
- [j2]Takeshi Nakajo, Ichiro Yamaguchi, Hitoshi Kume:
A test-path determination method based on define-use chains: Test conditions and program fault overlooks. Syst. Comput. Jpn. 24(5): 14-29 (1993) - 1991
- [j1]Takeshi Nakajo, Hitoshi Kume:
A Case History Analysis of Software Error Cause-Effect Relationships. IEEE Trans. Software Eng. 17(8): 830-838 (1991)
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