Hung-Chih Lin

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Cheng-Wen Wu

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Publications

2017
[j8]
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Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package. IEEE Des. Test 34(3): 50-58 (2017)
[j7]
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Hsuan-Hung Liu, Bing-Yang Lin, Cheng-Wen Wu, Wan-Ting Chiang, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
A Built-Off Self-Repair Scheme for Channel-Based 3D Memories. IEEE Trans. Computers 66(8): 1293-1301 (2017)
2016
[j6]
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Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement. IEEE Des. Test 33(2): 30-39 (2016)
[j5]
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Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
A Local Parallel Search Approach for Memory Failure Pattern Identification. IEEE Trans. Computers 65(3): 770-780 (2016)
[c16]
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  - conf/dac/HuangLWLCLPW16
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Yu-Chieh Huang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package. DAC 2016: 58:1-58:6
2014
[j4]
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  - journals/dt/ChiLWWLP14
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Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng:
On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs. IEEE Des. Test 31(4): 16-26 (2014)
[c13]
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  - conf/itc/LinCWLLPW14
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Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
Redundancy architectures for channel-based 3D DRAM yield improvement. ITC 2014: 1-7
2013
[c10]
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  - conf/vts/ChiWWL13
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Chun-Chuan Chi, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin:
3D-IC interconnect test, diagnosis, and repair. VTS 2013: 1-6
2012
[c8]
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  - conf/itc/WuCLLWTLCPW12
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Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang:
A memory yield improvement scheme combining built-in self-repair and error correction codes. ITC 2012: 1-9

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