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ORCIDIEEE Transactions on Reliability, Volume 54
Volume 54, Number 1, March 2005
- Suprasad V. Amari:
Comment on: a hazard function approximation used in reliability theory. 2 - Zehua Chen
, Shurong Zheng:
Lifetime distribution based degradation analysis. 3-10 - H. Hirose:
The trunsored model and its applications to lifetime analysis: unified censored and truncated models. 11-21 - Sangun Park:
Testing exponentiality based on the Kullback-Leibler information with the type II censored data. 22-26 - N. Balakrishnan, Chien-Tai Lin, Ping-Shing Chan:
A comparison of two simple prediction intervals for exponential distribution. 27-33 - A. A. Soliman:
Estimation of parameters of life from progressively censored data using Burr-XII model. 34-42 - Francis G. Pascual, Grace Montepiedra:
Lognormal and Weibull accelerated life test plans under distribution misspecification. 43-52 - Guangbin Yang:
Accelerated life tests at higher usage rates. 53-57 - Loon Ching Tang, Kai Xu:
A multiple objective framework for planning accelerated life tests. 58-63 - Abdulla A. Alhadeed, Shie-Shien Yang:
Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. 64-68 - Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis:
A concurrent built-in self-test architecture based on a self-testing RAM. 69-78 - Yoshihiro Saito, Tatsuya Hashinaga, Shigeru Nakajima:
Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal. 79-82 - Zhimin He, Han Tong Loh, Eng Hong Ong:
A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators. 83-91 - Ruey-Huei Yeh, Gaung-Cheng Chen, Ming-Yuh Chen:
Optimal age-replacement policy for nonrepairable products under renewing free-replacement warranty. 92-97 - Winfrid G. Schneeweiss:
Toward a deeper understanding of the availability of series-systems without aging during repairs. 98-99 - Yuan-Shun Dai, Min Xie, Kim-Leng Poh:
Modeling and analysis of correlated software failures of multiple types. 100-106 - Daniel R. Jeske, Xuemei Zhang, Loan Pham:
Adjusting software failure rates that are estimated from test data. 107-114 - Ing-Ray Chen, Baoshan Gu, Sapna E. George, Sheng-Tzong Cheng:
On failure recoverability of client-server applications in mobile wireless environments. 115-122 - Kyu-Seek Sohn, Seung Yeob Nam, Dan Keun Sung:
A spare bandwidth sharing scheme based on network reliability. 123-132 - Sieteng Soh, Suresh Rai:
An efficient cutset approach for evaluating communication-network reliability with heterogeneous link-capacities. 133-144 - Hosam M. F. AboElFotoh, S. Sitharama Iyengar, Krishnendu Chakrabarty:
Computing reliability and message delay for Cooperative wireless distributed sensor networks subject to random failures. 145-155 - Antoine Rauzy:
A m log m algorithm to compute the most probable configurations of a system with multi-mode independent components. 156-158 - Jian-Ping Li, G. Thompson:
A method to take account of inhomogeneity in mechanical component reliability calculations. 159-168 - Frank K. Hwang:
A hierarchy of importance indices. 169-172 - Kouroush Jenab, Balbir S. Dhillon:
Stochastic fault tree analysis with self-loop basic events. 173-180 - M. V. Frank:
View through the door of the SOFIA project. 181-188
Volume 54, Number 2, June 2005
- Wayne B. Nelson:
A bibliography of accelerated test plans. 194-197 - Ji Hwan Cha:
On optimal burn-in procedures - a generalized model. 198-206 - Kyungmee O. Kim, W. Kuo:
Some considerations on system burn-in. 207-214 - Ozgur Sinanoglu, Alex Orailoglu:
Test power reductions through computationally efficient, decoupled scan chain modifications. 215-223 - V. E. Johnson, A. Moosman, P. Cotter:
A hierarchical model for estimating the early reliability of complex systems. 224-231 - Xinyu Chen, Michael R. Lyu:
Reliability analysis for various communication schemes in wireless CORBA. 232-242 - Marzio Marseguerra, Enrico Zio, Luca Podofillini, David W. Coit:
Optimal design of reliable network systems in presence of uncertainty. 243-253 - Alice Yalaoui, Eric Châtelet, Chengbin Chu:
A new dynamic programming method for reliability & redundancy allocation in a parallel-series system. 254-261 - H. Gutierrez-Pulido, Víctor Aguirre-Torres, J. Andrés Christen:
A practical method for obtaining prior distributions in reliability. 262-269 - E. T. Wondmagegnehu, Jorge Navarro, P. J. Hernandez:
Bathtub shaped failure rates from mixtures: a practical point of view. 270-275 - Pasquale Erto, Biagio Palumbo:
Origins, properties, and parameters estimation of the hyperbolic reliability model. 276-281 - Chanseok Park:
Parameter estimation of incomplete data in competing risks using the EM algorithm. 282-290 - Liyang Xie, Jinyu Zhou, Xuemin Wang:
Data mapping and the prediction of common cause failure probability. 291-296 - Wenjian Li, Hoang Pham:
Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks. 297-303 - C. Richard Cassady, Erhan Kutanoglu:
Integrating preventive maintenance planning and production scheduling for a single machine. 304-309 - Wei Huang, D. L. Dietrich:
An alternative degradation reliability modeling approach using maximum likelihood estimation. 310-317 - Wenjian Li, Hoang Pham:
An inspection-maintenance model for systems with multiple competing processes. 318-327 - Yueqin Wu, Jiancheng Guan:
Repairable consecutive-k-out-of-n: G systems with r repairmen. 328-337 - Shaomin Wu, Derek Clements-Croome:
Optimal maintenance policies under different operational schedules. 338-346 - Shey-Huei Sheu, Yuh-Bin Lin, Gwo-Liang Liao:
Optimal policies with decreasing probability of imperfect maintenance. 347-357 - Hsing-Chung Liang, Wen-Chin Ho, Ming-Chieh Cheng:
Identify unrepairability to speed-up spare allocation for repairing memories. 358-365 - N. Balakrishnan, Chien-Tai Lin, Ping-Shing Chan:
Correction to "A Comparison of Two Simple Prediction Intervals for Exponential Distribution". 366
Volume 54, Number 3, September 2005
- Wayne B. Nelson:
A bibliography of accelerated test plans part II - references. 370-373 - H. K. T. Ng:
Parameter estimation for a modified Weibull distribution, for progressively type-II censored samples. 374-380 - Irad E. Ben-Gal:
On the use of data compression measures to analyze robust designs. 381-388 - S. Ejaz Ahmed, A. I. Volodin, A. A. Hussein:
Robust weighted likelihood estimation of exponential parameters. 389-395 - Ibrahim A. Ahmad, M. Kayid, Xiaohu Li:
The NBUT class of life distributions. 396-401 - Jie Wu, Feng Gao, Zhongcheng Li, Yinghua Min:
Optimal, and reliable communication in hypercubes using extended safety vectors. 402-411 - Li Bai:
Circular sequential k-out-of-n congestion system. 412-420 - Fang-Ming Shao, Xuemin Shen, Pin-Han Ho:
Reliability optimization of distributed access networks with constrained total cost. 421-430 - Yong Chen, Qingyu Yang:
Reliability of two-stage weighted-k-out-of-n systems with components in common. 431-440 - Viera Stopjaková, Pavol Malosek, Marek Matej, Vladislav Nagy, Martin Margala:
Defect detection in analog and mixed circuits by neural networks using wavelet analysis. 441-448 - Jie Wu, Zhen Jiang:
On constructing the minimum orthogonal convex polygon for the fault-tolerant routing in 2-D faulty meshes. 449-458 - Anurag Tiwari, Karen A. Tomko:
Enhanced reliability of finite-state machines in FPGA through efficient fault detection and correction. 459-467 - Cristian Constantinescu:
Dependability evaluation of a fault-tolerant processor by GSPN modeling. 468-474 - Yong Chen, Jionghua Jin:
Quality-reliability chain modeling for system-reliability analysis of complex manufacturing processes. 475-488 - Julie S. Ivy, Stephen M. Pollock:
Marginally monotonic maintenance policies for a multi-state deteriorating machine with probabilistic monitoring, and silent failures. 489-497 - Todd A. DeLong, D. Todd Smith, Barry W. Johnson:
Dependability metrics to assess safety-critical systems. 498-505 - Dazhi Wang, Kishor S. Trivedi:
Computing steady-state mean time to failure for non-coherent repairable systems. 506-516 - Jose Emmanuel Ramirez-Marquez, David W. Coit:
Composite importance measures for multi-state systems with multi-state components. 517-529 - Chanseok Park, William J. Padgett:
New cumulative damage models for failure using stochastic processes as initial damage. 530-540 - Yujuan Bao, Xiaobai Sun, Kishor S. Trivedi:
A workload-based analysis of software aging, and rejuvenation. 541-548 - Manju Agarwal, Rashika Gupta:
Penalty function approach in heuristic algorithms for constrained redundancy reliability optimization. 549-558
Volume 54, Number 4, December 2005
- Saralees Nadarajah, Samuel Kotz:
On some recent modifications of Weibull distribution. 561-562 - C. D. Lai, Min Xie, D. N. P. Murthy:
Reply to "On Some Recent Modifications of Weibull Distribution". 563 - C. Richard Cassady, Ilyas Mohamed Iyoob, Kelly Schneider, Edward A. Pohl:
A generic model of equipment availability under imperfect maintenance. 564-571 - Laura Attardi, Gianpaolo Pulcini:
A new model for repairable systems with bounded failure intensity. 572-582 - Chin-Yu Huang, Michael R. Lyu:
Optimal release time for software systems considering cost, testing-effort, and test efficiency. 583-591 - Chin-Yu Huang, Michael R. Lyu:
Optimal testing resource allocation, and sensitivity analysis in software development. 592-603 - John Quigley, Lesley Walls:
Nonparametric bootstrapping of the reliability function for multiple copies of a repairable item modeled by a birth process. 604-611 - Mark P. Kaminskiy, Vasiliy V. Krivtsov:
A simple procedure for Bayesian estimation of the Weibull distribution. 612-616
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