"Test power reductions through computationally efficient, decoupled scan ..."

Ozgur Sinanoglu, Alex Orailoglu (2005)

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DOI: 10.1109/TR.2005.847276

access: closed

type: Journal Article

metadata version: 2020-12-29

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Ozgur Sinanoglu, Alex Orailoglu:
Test power reductions through computationally efficient, decoupled scan chain modifications. IEEE Trans. Reliab. 54(2): 215-223 (2005)

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