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ORCIDJournal of Electronic Testing, Volume 2
Volume 2, Number 1, March 1991
- R. G. Bennetts, A. Osseyran:
IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status. 11-25 - Colin M. Maunder, Rodham E. Tulloss:
An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1. 27-42 - Kenneth P. Parker, Stig Oresjo:
A language for describing boundary scan devices. 43-75 - Frans Jong, José S. Matos
, José M. Ferreira:
Boundary scan test, test methodology, and fault modeling. 77-88 - Don Sterba, Andy Halliday, Don McClean:
ATPG and diagnostics for boards implementing boundary scan. 89-98 - Matthew L. Fichtenbaum, Gordon D. Robinson:
Scan test architectures for digital board testers. 99-105 - Bulent I. Dervisoglu:
Features of a Scan and Clock Resource chip for providing access to board-level test functions. 107-115 - Jung-Cheun Lien, Melvin A. Breuer:
An optimal scheduling algorithm for testing interconnect using boundary scan. 117-130
Volume 2, Number 2, June 1991
- Sumit Ghosh, Tapan J. Chakraborty:
On behavior fault modeling for digital designs. 135-151 - Geetani Edirisooriya, John P. Robinson:
Cyclic code weight spectra and BIST aliasing. 153-163 - Kwanghyun Kim, Joseph G. Tront, Dong Sam Ha:
BIDES: A BIST design expert system. 165-179 - Michele Favalli, Piero Olivo, Bruno Riccò, Fabio Somenzi:
Fault simulation for general FCMOS ICs. 181-190 - Wilfried Daehn:
Fault simulation using small fault samples. 191-203 - Kanji Hirabayashi:
Self-checking CMOS circuits using pass-transistor logic. 205-208
Volume 2, Number 3, August 1991
- Bjørg Reppen, Einar J. Aas:
Combined probabilistic testability calculation and compact test generation for PLAs. 215-227 - Marie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch:
Fault modeling and fault equivalence in CMOS technology. 229-241 - Don E. Ross, Kenneth M. Butler, M. Ray Mercer:
Exact ordered binary decision diagram size when representing classes of symmetric functions. 243-259 - Sandeep Pagey, Sunil D. Sherlekar, G. Venkatesh:
A methodology for the design of SFS/SCD circuits for a class of unordered codes. 261-277 - Patrick Kam Lui, Jon C. Muzio:
Constrained parity testing. 279-291 - Bruno Ciciani:
Redundancy effect on yield of binary tree RAMs. 293-306 - R. Kh. Latypov:
Comments on "optimizing error masking in BIST by output data modification". 307-308
Volume 2, Number 4, November 1991
- George Markowsky:
Bounding fault detection probabilities in combinational circuits. 315-323 - Warren H. Debany Jr., Carlos R. P. Hartmann:
Bounds on the sizes of irredundant test sets and sequences for combinational logic networks. 325-338 - Irith Pomeranz, Zvi Kohavi:
The minimum test set problem for circuits with nonreconvergent fanout. 339-349 - Abhijit Chatterjee, Jacob A. Abraham:
Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling. 351-372 - Wen-Ben Jone, Anita Gleason:
Analysis of Hamming count compaction scheme. 373-384 - Meryem Marzouki:
Model-based reasoning for electron-beam debugging of VLSI circuits. 385-394 - Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen:
Checkpoints in irredundant two-level combinational circuits. 395-397
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