"Test generation, design-for-testability and built-in self-test for ..."

Abhijit Chatterjee, Jacob A. Abraham (1991)

> Home

Details and statistics

DOI: 10.1007/BF00135230

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/ChatterjeeA91
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/ChatterjeeA91
Abhijit Chatterjee, Jacob A. Abraham:
Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling. J. Electron. Test. 2(4): 351-372 (1991)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.