"Fault simulation for general FCMOS ICs."

Michele Favalli et al. (1991)

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DOI: 10.1007/BF00133502

access: closed

type: Journal Article

metadata version: 2020-09-11

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Michele Favalli, Piero Olivo, Bruno Riccò, Fabio Somenzi:
Fault simulation for general FCMOS ICs. J. Electron. Test. 2(2): 181-190 (1991)

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