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Publication search results
found 117 matches
- 2015
- Felipe Aguirre, Mohamed Sallak, Walter Schön:
An Efficient Method for Reliability Analysis of Systems Under Epistemic Uncertainty Using Belief Function Theory. IEEE Trans. Reliab. 64(3): 893-909 (2015) - Syed Taha Ali, Vijay Sivaraman, Adam Radford, Sanjay Jha:
A Survey of Securing Networks Using Software Defined Networking. IEEE Trans. Reliab. 64(3): 1086-1097 (2015) - Guanghan Bai, Ming Jian Zuo, Zhigang Tian:
Ordering Heuristics for Reliability Evaluation of Multistate Networks. IEEE Trans. Reliab. 64(3): 1015-1023 (2015) - Amparo Baíllo, Javier Cárcamo, Sofia Nieto:
A Test for Convex Dominance With Respect to the Exponential Class Based on an L1 Distance. IEEE Trans. Reliab. 64(1): 71-82 (2015) - Narayanaswamy Balakrishnan, Abedin Haidari, Khaled Masoumifard:
Stochastic Comparisons of Series and Parallel Systems With Generalized Exponential Components. IEEE Trans. Reliab. 64(1): 333-348 (2015) - Narayanaswamy Balakrishnan, Nan Jiang, Tzong-Ru Tsai, Yuhlong Lio, Ding-Geng Chen:
Reliability Inference on Composite Dynamic Systems Based on Burr Type-XII Distribution. IEEE Trans. Reliab. 64(1): 144-153 (2015) - Piero Baraldi, Francesco Di Maio, Davide Genini, Enrico Zio:
Comparison of Data-Driven Reconstruction Methods For Fault Detection. IEEE Trans. Reliab. 64(3): 852-860 (2015) - Ismihan Bayramoglu, C. Murat Ozkut:
The Reliability of Coherent Systems Subjected to Marshall-Olkin Type Shocks. IEEE Trans. Reliab. 64(1): 435-443 (2015) - María Dolores Berrade, Philip A. Scarf, Cristiano A. V. Cavalcante:
Some Insights Into the Effect of Maintenance Quality for a Protection System. IEEE Trans. Reliab. 64(2): 661-672 (2015) - Suparna Chakraborty, Neeraj Kumar Goyal:
Irredundant Subset Cut Enumeration for Reliability Evaluation of Flow Networks. IEEE Trans. Reliab. 64(4): 1194-1202 (2015) - Nai-Wen Chang, Wei-Hao Deng, Sun-Yuan Hsieh:
Conditional Diagnosability of (n, k)-Star Networks Under the Comparison Diagnosis Model. IEEE Trans. Reliab. 64(1): 132-143 (2015) - Ting Chen, Xiaosong Zhang, Xiao-li Ji, Cong Zhu, Yang Bai, Yue Wu:
Test Generation for Embedded Executables via Concolic Execution in a Real Environment. IEEE Trans. Reliab. 64(1): 284-296 (2015) - Michele Compare, Enrico Zio:
Genetic Algorithms in the Framework of Dempster-Shafer Theory of Evidence for Maintenance Optimization Problems. IEEE Trans. Reliab. 64(2): 645-660 (2015) - Matteo Corbetta, Claudio Sbarufatti, Andrea Manes, Marco Giglio:
Real-Time Prognosis of Crack Growth Evolution Using Sequential Monte Carlo Methods and Statistical Model Parameters. IEEE Trans. Reliab. 64(2): 736-753 (2015) - Lirong Cui, Cong Lin, Shijia Du:
m-Consecutive-k, l-Out-of-n Systems. IEEE Trans. Reliab. 64(1): 386-393 (2015) - Leonard Daus, Valeriu Beiu:
Lower and Upper Reliability Bounds for Consecutive-k-Out-of-n: F Systems. IEEE Trans. Reliab. 64(3): 1128-1135 (2015) - Hongyan Dui, Shubin Si, Ming Jian Zuo, Shudong Sun:
Semi-Markov Process-Based Integrated Importance Measure for Multi-State Systems. IEEE Trans. Reliab. 64(2): 754-765 (2015) - Aiman H. El-Maleh, Khaled A. Daud:
Simulation-Based Method for Synthesizing Soft Error Tolerant Combinational Circuits. IEEE Trans. Reliab. 64(3): 935-948 (2015) - Basima Elshqeirat, Sieteng Soh, Suresh Rai, Mihai M. Lazarescu:
Topology Design with Minimal Cost Subject to Network Reliability Constraint. IEEE Trans. Reliab. 64(1): 118-131 (2015) - Serkan Eryilmaz:
Mixture Representations for Three-State Systems With Three-State Components. IEEE Trans. Reliab. 64(2): 829-834 (2015) - Serkan Eryilmaz, Altan Tuncel:
Computing the Signature of a Generalized k-Out-of-n System. IEEE Trans. Reliab. 64(2): 766-771 (2015) - Tsai-Hung Fan, Tsung-Ming Hsu:
Statistical Inference of a Two-Component Series System With Correlated Log-Normal Lifetime Distribution Under Multiple Type-I Censoring. IEEE Trans. Reliab. 64(1): 376-385 (2015) - Mohammad Javad Feizollahi, Roya Soltani, Hadi Feyzollahi:
The Robust Cold Standby Redundancy Allocation in Series-Parallel Systems With Budgeted Uncertainty. IEEE Trans. Reliab. 64(2): 799-806 (2015) - Olga Fink, Enrico Zio, Ulrich Weidmann:
Fuzzy Classification With Restricted Boltzman Machines and Echo-State Networks for Predicting Potential Railway Door System Failures. IEEE Trans. Reliab. 64(3): 861-868 (2015) - Olga Fink, Enrico Zio, Ulrich Weidmann:
A Classification Framework for Predicting Components' Remaining Useful Life Based on Discrete-Event Diagnostic Data. IEEE Trans. Reliab. 64(3): 1049-1056 (2015) - Ayon Ganguly, Debasis Kundu, Sanjit Kumar Mitra:
Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes. IEEE Trans. Reliab. 64(1): 473-485 (2015) - Mohamed T. Ghoneim, Jhonathan P. Rojas, Chadwin D. Young, Gennadi Bersuker, Muhammad Mustafa Hussain:
Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon. IEEE Trans. Reliab. 64(2): 579-585 (2015) - Massimiliano Giorgio, Maurizio Guida, Gianpaolo Pulcini:
A New Class of Markovian Processes for Deteriorating Units With State Dependent Increments and Covariates. IEEE Trans. Reliab. 64(2): 562-578 (2015) - Lise Guérineau, Evans Gouno:
Inference for a Failure Counting Process Partially Observed. IEEE Trans. Reliab. 64(1): 311-319 (2015) - Jing Guo, Liyi Xiao, Tianqi Wang, Shanshan Liu, Xu Wang, Zhigang Mao:
Soft Error Hardened Memory Design for Nanoscale Complementary Metal Oxide Semiconductor Technology. IEEE Trans. Reliab. 64(2): 596-602 (2015)
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