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Publication search results
found 103 matches
- 2002
- Robert C. Aitken, Donald L. Wheater:
Guest Editors' Introduction: Stressing the Fundamentals. IEEE Des. Test Comput. 19(5): 54-55 (2002) - Chouki Aktouf:
A Complete Strategy for Testing an On-Chip Multiprocessor Architecture. IEEE Des. Test Comput. 19(1): 18-28 (2002) - Xavier Aragonès, José Luis González, Francesc Moll, Antonio Rubio:
Noise Generation and Coupling Mechanisms in Deep-Submicron ICs. IEEE Des. Test Comput. 19(5): 27-35 (2002) - Peter J. Ashenden:
What Makes a Good Standard? IEEE Des. Test Comput. 19(3): 114-115 (2002) - Peter J. Ashenden:
Standards: Technical activities in Accellera. IEEE Des. Test Comput. 19(6): 106, 109 (2002) - Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera:
Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Des. Test Comput. 19(5): 65-72 (2002) - Ismet Bayraktaroglu, Alex Orailoglu:
Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST. IEEE Des. Test Comput. 19(1): 42-53 (2002) - Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
DFT and BIST of a Multichip Module for High-Energy Physics Experiments. IEEE Des. Test Comput. 19(3): 94-105 (2002) - David T. Blaauw, Luciano Lavagno:
Guest Editors' Introduction: Hot Topics at This Year's Design Automation Conference. IEEE Des. Test Comput. 19(4): 72-73 (2002) - Jim Bordelon, Ben Tranchina, Vipin Madangarli, Mark Craig:
A Strategy for Mixed-Signal Yield Improvement. IEEE Des. Test Comput. 19(3): 14-23 (2002) - Yi Cai, Bernd Laquai, Kent Luehman:
Jitter Testing for Gigabit Serial Communication Transceivers. IEEE Des. Test Comput. 19(1): 66-74 (2002) - Andrew E. Caldwell, Igor L. Markov:
Toward CAD-IP Reuse: A Web Bookshelf of Fundamental Algorithms. IEEE Des. Test Comput. 19(3): 72-81 (2002) - Wander O. Cesário, Damien Lyonnard, Gabriela Nicolescu, Yanick Paviot, Sungjoo Yoo, Ahmed Amine Jerraya, Lovic Gauthier, Mario Diaz-Nava:
Multiprocessor SoC Platforms: A Component-Based Design Approach. IEEE Des. Test Comput. 19(6): 52-63 (2002) - Krishnendu Chakrabarty, Erik Jan Marinissen:
How Useful are the ITC 02 SoC Test Benchmarks? IEEE Des. Test Comput. 19(5): 120, 119 (2002) - Zhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy:
IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions. IEEE Des. Test Comput. 19(2): 24-33 (2002) - Amit Chowdhary, Rajesh K. Gupta:
A Methodology for Synthesis of Data Path Circuitse. IEEE Des. Test Comput. 19(6): 90-100 (2002) - W. Robert Daasch, James McNames, Robert Madge, Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Des. Test Comput. 19(5): 74-81 (2002) - Marcello Dalpasso, Alessandro Bogliolo, Luca Benini:
Virtual Simulation of Distributed IP-Based Designs. IEEE Des. Test Comput. 19(5): 92-104 (2002) - Eric Dupont, Michael Nicolaidis, Peter Rohr:
Embedded Robustness IPs for Transient-Error-Free ICs. IEEE Des. Test Comput. 19(3): 56-70 (2002) - Michele Favalli, Cecilia Metra:
Online Testing Approach for Very Deep-Submicron ICs. IEEE Des. Test Comput. 19(2): 16-23 (2002) - Carlos Galup-Montoro, Márcio C. Schneider, Rafael M. Coitinho:
Resizing Rules for MOS Analog-Design Reuse. IEEE Des. Test Comput. 19(2): 50-58 (2002) - Patrick Girard:
Survey of Low-Power Testing of VLSI Circuits. IEEE Des. Test Comput. 19(3): 82-92 (2002) - Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich:
High Defect Coverage with Low-Power Test Sequences in a BIST Environment. IEEE Des. Test Comput. 19(5): 44-52 (2002) - Aarti Gupta:
Assertion-based verification turns the corner. IEEE Des. Test Comput. 19(4): 131-132 (2002) - Rajesh Gupta:
Sustaining an Industry Obsession. IEEE Des. Test Comput. 19(5): 1- (2002) - Rajesh Gupta:
EIC Message: The Neglected Community. IEEE Des. Test Comput. 19(6): 3- (2002) - Ing-Jer Huang, Chung-Fu Kao, Hsin-Ming Chen, Ching-Nan Juan, Tai-An Lu:
A Retargetable Embedded In-Circuit Emulation Module for Microprocessors. IEEE Des. Test Comput. 19(4): 28-38 (2002) - Chenn-Jung Huang, Chua-Chin Wang, Chi-Feng Wu:
Image Processing Techniques for Wafer Defect Cluster Identification. IEEE Des. Test Comput. 19(2): 44-48 (2002) - Gloria Huertas, Diego Vázquez, Eduardo J. Peralías, Adoración Rueda, José Luis Huertas:
Practical Oscillation-Based Test of Integrated Filters. IEEE Des. Test Comput. 19(6): 64-72 (2002) - Gloria Huertas, Diego Vázquez, Eduardo J. Peralías, Adoración Rueda, José Luis Huertas:
Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell. IEEE Des. Test Comput. 19(6): 73-82 (2002)
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