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"High Defect Coverage with Low-Power Test Sequences in a BIST Environment."

Patrick Girard et al. (2002)

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DOI: 10.1109/MDT.2002.1033791

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/GirardLPVW02
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  persistent URL:
  - https://dblp.org/rec/journals/dt/GirardLPVW02
Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich:
High Defect Coverage with Low-Power Test Sequences in a BIST Environment. IEEE Des. Test Comput. 19(5): 44-52 (2002)

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