- 2003
- Abdul-Rahman M. Abouammoh, Isa S. Qamber:
New better than renewal-used classes of life distributions. IEEE Trans. Reliab. 52(2): 150-153 (2003) - W. P. M. Allen, Donald G. Bailey, Serge N. Demidenko, Vincenzo Piuri:
Analysis and application of digital spectral warping in analog and mixed-signal testing. IEEE Trans. Reliab. 52(4): 444-457 (2003) - J. D. Andrews, Sally Beeson:
Birnbaum's measure of component importance for noncoherent systems. IEEE Trans. Reliab. 52(2): 213-219 (2003) - N. Balakrishnan, N. Kannan, Chien-Tai Lin, H. K. T. Ng:
Point and interval estimation for Gaussian distribution, based on progressively Type-II censored samples. IEEE Trans. Reliab. 52(1): 90-95 (2003) - Alexandru O. Balan, Lorenzo Traldi:
Preprocessing minpaths for sum of disjoint products. IEEE Trans. Reliab. 52(3): 289-295 (2003) - Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Extending integrated-circuit yield-models to estimate early-life reliability. IEEE Trans. Reliab. 52(3): 296-300 (2003) - Anne Barros, Christophe Bérenguer, Antoine Grall:
Optimization of replacement times using imperfect monitoring information. IEEE Trans. Reliab. 52(4): 523-533 (2003) - Sally Beeson, J. D. Andrews:
Importance measures for noncoherent-system analysis. IEEE Trans. Reliab. 52(3): 301-310 (2003) - Michael G. H. Bell:
The use of game theory to measure the vulnerability of stochastic networks. IEEE Trans. Reliab. 52(1): 63-68 (2003) - Thomas R. Bennett, Jane M. Booker, Sallie Keller-McNulty, Nozer D. Singpurwalla:
Testing the untestable: reliability in the 21st century. IEEE Trans. Reliab. 52(1): 118-124 (2003) - Rebecca A. Betensky, Emily C. Martin:
Commentary: failure-rate functions for doubly-truncated random variables. IEEE Trans. Reliab. 52(1): 7-8 (2003) - Alessandro Birolini:
Commentary: author reply to a book review. IEEE Trans. Reliab. 52(1): 9 (2003) - Atanu Biswas, Jyotirmoy Sarkar, Sahadeb Sarkar:
Availability of a periodically inspected system, maintained under an imperfect-repair policy. IEEE Trans. Reliab. 52(3): 311-318 (2003) - Philip J. Boland, Harshinder Singh:
A birth-process approach to Moranda's geometric software-reliability model. IEEE Trans. Reliab. 52(2): 168-174 (2003) - Cristiana Bolchini:
A software methodology for detecting hardware faults in VLIW data paths. IEEE Trans. Reliab. 52(4): 458-468 (2003) - Alenka Brezavscek, Alenka Hudoklin:
Joint optimization of block-replacement and periodic-review spare-provisioning policy. IEEE Trans. Reliab. 52(1): 112-117 (2003) - Héctor Cancela, Mohamed El Khadiri:
The recursive variance-reduction simulation algorithm for network reliability evaluation. IEEE Trans. Reliab. 52(2): 207-212 (2003) - Gian Carlo Cardarilli, A. Leandri, P. Marinucci, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano:
Design of a fault tolerant solid state mass memory. IEEE Trans. Reliab. 52(4): 476-491 (2003) - Juan A. Carrasco:
Solving dependability/performability irreducible Markov models using regenerative randomization. IEEE Trans. Reliab. 52(3): 319-329 (2003) - John A. Connor:
Commentary: getting real about reliability, through wit and humor. IEEE Trans. Reliab. 52(1): 10-13 (2003) - Cristian Constantinescu:
Experimental evaluation of error-detection mechanisms. IEEE Trans. Reliab. 52(1): 53-57 (2003) - Nader B. Ebrahimi:
Indirect assessment of system reliability. IEEE Trans. Reliab. 52(1): 58-62 (2003) - A. O. C. Elegbede, Chengbin Chu, Kondo H. Adjallah, Farouk Yalaoui:
Reliability allocation through cost minimization. IEEE Trans. Reliab. 52(1): 106-111 (2003) - Ralph A. Evans:
Editorial reasonable engineering guess. IEEE Trans. Reliab. 52(1): 1 (2003) - Ralph A. Evans:
Editorial genuine imitation Bayesian. IEEE Trans. Reliab. 52(1): 2 (2003) - Ralph A. Evans:
Editorial confidence intervals for discrete variables. IEEE Trans. Reliab. 52(1): 3 (2003) - Ralph A. Evans:
Editorials-from 1978. IEEE Trans. Reliab. 52(3): 273-276 (2003) - Ralph A. Evans:
Editorials-from 1979. IEEE Trans. Reliab. 52(3): 277-280 (2003) - Ralph A. Evans:
Editorials-from 1980. IEEE Trans. Reliab. 52(3): 281-284 (2003) - Ralph A. Evans:
Editorials-from 1981. IEEE Trans. Reliab. 52(3): 285-288 (2003)