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"Extending integrated-circuit yield-models to estimate early-life reliability."

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson (2003)

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DOI: 10.1109/TR.2003.816418

access: closed

type: Journal Article

metadata version: 2020-07-09

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  - journals/tr/BarnettSN03
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Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Extending integrated-circuit yield-models to estimate early-life reliability. IEEE Trans. Reliab. 52(3): 296-300 (2003)

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