Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "toc:db/journals/mr/mr58.bht:"
download as .bib file
@article{DBLP:journals/mr/AndresenBL16,
author = {Markus Andresen and
Giampaolo Buticchi and
Marco Liserre},
title = {Study of reliability-efficiency tradeoff of active thermal control
for power electronic systems},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {119--125},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.017},
doi = {10.1016/J.MICROREL.2015.12.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AndresenBL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bensoussan16,
author = {Alain Bensoussan},
title = {How to quantify and predict long term multiple stress operation: Application
to Normally-Off Power GaN transistor technologies},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {103--112},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.020},
doi = {10.1016/J.MICROREL.2015.12.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bensoussan16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CastellazziFRYR16,
author = {Alberto Castellazzi and
Asad Fayyaz and
Gianpaolo Romano and
Li Yang and
Michele Riccio and
Andrea Irace},
title = {SiC power MOSFETs performance, robustness and technology maturity},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {164--176},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.034},
doi = {10.1016/J.MICROREL.2015.12.034},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CastellazziFRYR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiozziBDC16,
author = {Diego Chiozzi and
Mirko Bernardoni and
Nicola Delmonte and
Paolo Cova},
title = {A simple 1-D finite elements approach to model the effect of {PCB}
in electronic assemblies},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {126--132},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.029},
doi = {10.1016/J.MICROREL.2015.11.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiozziBDC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CzernyK16,
author = {Bernhard Czerny and
Golta Khatibi},
title = {Interface reliability and lifetime prediction of heavy aluminum wire
bonds},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {65--72},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.028},
doi = {10.1016/J.MICROREL.2015.11.028},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CzernyK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EfthymiouRW16,
author = {E. Efthymiou and
P. Rutter and
P. Whiteley},
title = {A methodology for projecting SiO\({}_{\mbox{2}}\) thick gate oxide
reliability on trench power MOSFETs and its application on MOSFETs
V\({}_{\mbox{GS}}\) rating},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {26--32},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.021},
doi = {10.1016/J.MICROREL.2015.11.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EfthymiouRW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GagricaMU16,
author = {Ognjen Gagrica and
Mateusz Marzec and
Tadeusz Uhl},
title = {Comparison of reliability impacts of two active power curtailment
methods for {PV} micro-inverters},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {133--140},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.031},
doi = {10.1016/J.MICROREL.2015.11.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GagricaMU16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhimireTMR16,
author = {Pramod Ghimire and
Ionut Trintis and
Stig Munk{-}Nielsen and
Bj{\o}rn Rannestad},
title = {On-state voltage drop based derating/uprating on a {MW} converter
to improve reliability},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {90--94},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.032},
doi = {10.1016/J.MICROREL.2015.11.032},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GhimireTMR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeroldFBSL16,
author = {Christian Herold and
J{\"{o}}rg Franke and
Riteshkumar Bhojani and
Andre Schleicher and
Josef Lutz},
title = {Requirements in power cycling for precise lifetime estimation},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {82--89},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.035},
doi = {10.1016/J.MICROREL.2015.12.035},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HeroldFBSL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IannuzzoC16,
author = {Francesco Iannuzzo and
Mauro Ciappa},
title = {Reliability issues in power electronics},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {1--2},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.01.012},
doi = {10.1016/J.MICROREL.2016.01.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IannuzzoC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IbrahimOLK16,
author = {Ali Ibrahim and
Jean{-}Pierre Ousten and
Richard Lallemand and
Zoubir Khatir},
title = {Power cycling issues and challenges of SiC-MOSFET power modules in
high temperature conditions},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {204--210},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.030},
doi = {10.1016/J.MICROREL.2015.11.030},
timestamp = {Fri, 05 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IbrahimOLK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KikuchiC16,
author = {Takuo Kikuchi and
Mauro Ciappa},
title = {Modeling the threshold voltage instability in SiC MOSFETs by multiphonon-assisted
tunneling},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {33--38},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.01.011},
doi = {10.1016/J.MICROREL.2016.01.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KikuchiC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KusumotoOHTNUKS16,
author = {Osamu Kusumoto and
Atsushi Ohoka and
Nobuyuki Horikawa and
Kohtaro Tanaka and
Masahiko Niwayama and
Masao Uchida and
Yoshihiko Kanzawa and
Kazuyuki Sawada and
Tetsuzo Ueda},
title = {Reliability of Diode-Integrated SiC Power MOSFET(DioMOS)},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {158--163},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.033},
doi = {10.1016/J.MICROREL.2015.11.033},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KusumotoOHTNUKS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeonCM16,
author = {Susana de Leon and
Hugo Calleja and
Jes{\'{u}}s Mina},
title = {Reliability of photovoltaic systems using seasonal mission profiles
and the {FIDES} methodology},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {95--102},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.023},
doi = {10.1016/J.MICROREL.2015.11.023},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeonCM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuoIRBLH16,
author = {Haoze Luo and
Francesco Iannuzzo and
Paula Diaz Reigosa and
Frede Blaabjerg and
Wuhua Li and
Xiangning He},
title = {Modern {IGBT} gate driving methods for enhancing reliability of high-power
converters - An overview},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {141--150},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.022},
doi = {10.1016/J.MICROREL.2015.12.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuoIRBLH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghessoMBRWH16,
author = {Gaudenzio Meneghesso and
Matteo Meneghini and
Davide Bisi and
Isabella Rossetto and
Tian{-}Li Wu and
Marleen Van Hove and
Denis Marcon and
Steve Stoffels and
Stefaan Decoutere and
Enrico Zanoni},
title = {Trapping and reliability issues in GaN-based {MIS} HEMTs with partially
recessed gate},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {151--157},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.024},
doi = {10.1016/J.MICROREL.2015.11.024},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeneghessoMBRWH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghiniHFSCSP16,
author = {Matteo Meneghini and
Oliver Hilt and
Cl{\'{e}}ment Fleury and
Riccardo Silvestri and
Mattia Capriotti and
Gottfried Strasser and
Dionyz Pogany and
Eldad Bahat{-}Treidel and
Frank Brunner and
A. Knauer and
Joachim W{\"{u}}rfl and
Isabella Rossetto and
Enrico Zanoni and
Gaudenzio Meneghesso and
Stefano Dalcanale},
title = {Normally-off GaN-HEMTs with p-type gate: Off-state degradation, forward
gate stress and {ESD} failure},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {177--184},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.026},
doi = {10.1016/J.MICROREL.2015.11.026},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeneghiniHFSCSP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MironeMRBI16,
author = {Paolo Mirone and
Luca Maresca and
Michele Riccio and
Giovanni Breglio and
Andrea Irace},
title = {On the avalanche ruggedness of optimized termination structure for
600 {V} punch-through IGBTs},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {17--25},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.027},
doi = {10.1016/J.MICROREL.2015.11.027},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MironeMRBI16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PengWSLWBLL16,
author = {Zhaoyang Peng and
Yiyu Wang and
Huajun Shen and
Chengzhan Li and
Jia Wu and
Yun Bai and
Kean Liu and
Xinyu Liu},
title = {Effects of combined {NO} and forming gas annealing on interfacial
properties and oxide reliability of 4H-SiC {MOS} structures},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {192--196},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.022},
doi = {10.1016/J.MICROREL.2015.11.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PengWSLWBLL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PopokPKP16,
author = {Vladimir N. Popok and
Kristian Bonderup Pedersen and
Peter Kj{\ae}r Kristensen and
Kjeld Pedersen},
title = {Comprehensive physical analysis of bond wire interfaces in power modules},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {58--64},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.025},
doi = {10.1016/J.MICROREL.2015.11.025},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PopokPKP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RacitiMCP16,
author = {Angelo Raciti and
Salvatore Musumeci and
Filippo Chimento and
Giovanni Privitera},
title = {A new thermal model for power {MOSFET} devices accounting for the
behavior in unclamped inductive switching},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {3--11},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.020},
doi = {10.1016/J.MICROREL.2015.11.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RacitiMCP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RahimoRFVKCGBBB16,
author = {Munaf Rahimo and
Frank Richter and
Fabian Fischer and
Umamaheswara Vemulapati and
Arnost Kopta and
Chiara Corvasce and
Silvan Geissmann and
Marco Bellini and
Martin J. Bayer and
Friedhelm Bauer},
title = {The impact on power semiconductor device operation due to local electric
field alterations in the planar junction termination},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {51--57},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.021},
doi = {10.1016/J.MICROREL.2015.12.021},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RahimoRFVKCGBBB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SaritasKPDAY16,
author = {Resul Saritas and
Mahmoud E. Khater and
Sangtak Park and
T. Dagdelen and
Eihab M. Abdel{-}Rahman and
Mustafa Yavuz},
title = {Techniques for dynamic analysis of bonding wire},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {73--81},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.018},
doi = {10.1016/J.MICROREL.2015.12.018},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SaritasKPDAY16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SatoYEN16,
author = {Soshi Sato and
Kikuo Yamabe and
Tetsuo Endoh and
Masaaki Niwa},
title = {Formation mechanism of concave by dielectric breakdown on silicon
carbide metal-oxide-semiconductor capacitor},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {185--191},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.09.016},
doi = {10.1016/J.MICROREL.2015.09.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SatoYEN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SmithHGSLW16,
author = {K. V. Smith and
J. Haller and
Josep M. Guerrero and
R. P. Smith and
R. Lal and
YiFeng Wu},
title = {Lifetime tests of 600-V GaN-on-Si power switches and HEMTs},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {197--203},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.016},
doi = {10.1016/J.MICROREL.2015.12.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SmithHGSLW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Solkner16,
author = {Gerald S{\"{o}}lkner},
title = {Ensuring the reliability of power electronic devices with regard to
terrestrial cosmic radiation},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {39--50},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.019},
doi = {10.1016/J.MICROREL.2015.12.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Solkner16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuzukiC16,
author = {Hiroshi Suzuki and
Mauro Ciappa},
title = {Electro-thermal simulation of current sharing in silicon and silicon
carbide power modules under short circuit condition of types {I} and
{II}},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {12--16},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.01.010},
doi = {10.1016/J.MICROREL.2016.01.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuzukiC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangCZ16,
author = {Xiang Wang and
Alberto Castellazzi and
Pericle Zanchetta},
title = {Observer based dynamic adaptive cooling system for power modules},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {113--118},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.01.020},
doi = {10.1016/J.MICROREL.2016.01.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangCZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-08-29 19:43 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
