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@article{DBLP:journals/mr/0003BY09, author = {Hua Lu and Chris Bailey and Chunyan Yin}, title = {Design for reliability of power electronics modules}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1250--1255}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.055}, doi = {10.1016/J.MICROREL.2009.07.055}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/0003BY09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AchmatowiczKZWBJ09, author = {Selim Achmatowicz and Konrad Kielbasinski and Elzbieta Zwierkowska and Iwona Wyzkiewicz and Valentinas Baltrusaitis and Malgorzata Jakubowska}, title = {A new photoimageable platinum conductor}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {579--584}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.016}, doi = {10.1016/J.MICROREL.2009.02.016}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AchmatowiczKZWBJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AlaeddineKDM09, author = {A. Alaeddine and M. Kadi and K. Daoud and B. Mazari}, title = {Effects of electromagnetic near-field stress on SiGe HBT's reliability}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1029--1032}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.014}, doi = {10.1016/J.MICROREL.2009.07.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AlaeddineKDM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AlamoJ09, author = {Jes{\'{u}}s A. del Alamo and Jungwoo Joh}, title = {GaN {HEMT} reliability}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1200--1206}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.003}, doi = {10.1016/J.MICROREL.2009.07.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AlamoJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AllersBBGKL09, author = {K.{-}H. Allers and Josef B{\"{o}}ck and S. Boguth and K. Goller and Herbert Knapp and Rudolf Lachner}, title = {Dielectric thinning model applied to metal insulator metal capacitors with Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) dielectric}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1520--1528}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.027}, doi = {10.1016/J.MICROREL.2009.07.027}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AllersBBGKL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AltuntasASO09, author = {H. Altuntas and S. Altindal and H. Shtrikman and Suleyman {\"{O}}z{\c{c}}elik}, title = {A detailed study of current-voltage characteristics in Au/SiO\({}_{\mbox{2}}\)/n-GaAs in wide temperature range}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {904--911}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.003}, doi = {10.1016/J.MICROREL.2009.06.003}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AltuntasASO09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AlvarezCRALGEHS09, author = {David Alvarez and Kiran V. Chatty and Christian Russ and Michel J. Abou{-}Khalil and Junjun Li and Robert Gauthier and Kai Esmark and Ralph Halbach and Christopher Seguin}, title = {Design optimization of gate-silicided {ESD} NMOSFETs in a 45 nm bulk {CMOS} technology}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1417--1423}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.051}, doi = {10.1016/J.MICROREL.2009.06.051}, timestamp = {Thu, 02 Feb 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AlvarezCRALGEHS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Amin09, author = {Ahmed Amin}, title = {Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf (Eds.). Taylor and Francis Group LLC, Boca Raton, FL, {USA}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {821--822}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.017}, doi = {10.1016/J.MICROREL.2009.03.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Amin09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AminLSRA09, author = {Nowshad Amin and Victor Lim and Foong Chee Seng and Rozaidi Razid and Ibrahim Ahmad}, title = {A practical investigation on nickel plated copper heat spreader with different catalytic activation processes for flip-chip ball grid array packages}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {537--543}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.013}, doi = {10.1016/J.MICROREL.2009.02.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AminLSRA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AmyAR09, author = {Robin Alastair Amy and Guglielmo S. Aglietti and Guy Richardson}, title = {Sensitivity analysis of simplified Printed Circuit Board finite element models}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {791--799}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.002}, doi = {10.1016/J.MICROREL.2009.04.002}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AmyAR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AugusteHJAP09, author = {Manoubi Auguste Bahi and H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and Jean{-}Pierre Landesman and Annabelle Gentil and Pascal Lecuyer}, title = {A new methodology for the identification of ball bond degradation during high-temperature aging tests on devices in standard plastic packages}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1273--1277}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.009}, doi = {10.1016/J.MICROREL.2009.07.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AugusteHJAP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Baishya09, author = {S. Baishya}, title = {A surface potential and quasi-Fermi potential based drain current model for pocket-implanted {MOS} transistors in subthreshold regime}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {681--688}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.001}, doi = {10.1016/J.MICROREL.2009.05.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Baishya09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BansalRKZSC09, author = {Aditya Bansal and Rahul M. Rao and Jae{-}Joon Kim and Sufi Zafar and James H. Stathis and Ching{-}Te Chuang}, title = {Impacts of {NBTI} and {PBTI} on {SRAM} static/dynamic noise margins and cell failure probability}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {642--649}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.016}, doi = {10.1016/J.MICROREL.2009.03.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BansalRKZSC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BaoSLL09, author = {Haifei Bao and Zhaohui Song and Deren Lu and Xinxin Li}, title = {A simple estimation of transverse response of high-g accelerometers by a free-drop-bar method}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {66--73}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.012}, doi = {10.1016/J.MICROREL.2008.10.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BaoSLL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BareisaJMS09, author = {Eduardas Bareisa and Vacius Jusas and Kestutis Motiejunas and Rimantas Seinauskas}, title = {Functional delay test generation based on software prototype}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1578--1585}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.050}, doi = {10.1016/J.MICROREL.2009.06.050}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BareisaJMS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BashirM09, author = {Muhammad Bashir and Linda S. Milor}, title = {A methodology to extract failure rates for low-k dielectric breakdown with multiple geometries and in the presence of die-to-die linewidth variation}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1096--1102}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.033}, doi = {10.1016/J.MICROREL.2009.07.033}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BashirM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BeldaFFWJ09, author = {C. Belda and M. Fritsch and Claudia Feller and D. Westphal and G. Jung}, title = {Stability of solid electrolyte based thick-film CO\({}_{\mbox{2}}\) sensors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {614--620}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.014}, doi = {10.1016/J.MICROREL.2009.02.014}, timestamp = {Thu, 22 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BeldaFFWJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BelmehdiABDW09, author = {Yassine Belmehdi and Stephane Azzopardi and A. Benmansour and Jean{-}Yves Del{\'{e}}tage and Eric Woirgard}, title = {Uni-axial mechanical stress effect on Trench Punch through {IGBT} under short-circuit operation}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1398--1403}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.037}, doi = {10.1016/J.MICROREL.2009.06.037}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BelmehdiABDW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BenardMFOG09, author = {Christelle B{\'{e}}nard and Ga{\"{e}}tan Math and Pascal Fornara and Jean{-}Luc Ogier and Didier Goguenheim}, title = {Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1008--1012}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.022}, doi = {10.1016/J.MICROREL.2009.06.022}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BenardMFOG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BerbelFG09, author = {N{\'{e}}stor Berbel and Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and Ignacio Gil}, title = {Modelling and experimental verification of the impact of negative bias temperature instability on {CMOS} inverter}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1048--1051}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.027}, doi = {10.1016/J.MICROREL.2009.06.027}, timestamp = {Mon, 28 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BerbelFG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Berenyi09, author = {Rich{\'{a}}rd Ber{\'{e}}nyi}, title = {Prototyping of a reliable 3D flexible {IC} cube package by laser micromachining}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {800--805}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.015}, doi = {10.1016/J.MICROREL.2009.03.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Berenyi09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BerkaniLBKFFH09, author = {Mounira Berkani and St{\'{e}}phane Lefebvre and Narjes Boughrara and Zoubir Khatir and Jean{-}Claude Faugi{\`{e}}res and Peter Friedrichs and Ali Haddouche}, title = {Estimation of SiC {JFET} temperature during short-circuit operations}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1358--1362}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.024}, doi = {10.1016/J.MICROREL.2009.06.024}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BerkaniLBKFFH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BernardoniCDM09, author = {Mirko Bernardoni and Paolo Cova and Nicola Delmonte and Roberto Menozzi}, title = {Heat management for power converters in sealed enclosures: {A} numerical study}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1293--1298}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.028}, doi = {10.1016/J.MICROREL.2009.06.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BernardoniCDM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BernouxEJD09, author = {B. Bernoux and Ren{\'{e}} Escoffier and P. Jalbaud and Jean{-}Marie Dorkel}, title = {Source electrode evolution of a low voltage power {MOSFET} under avalanche cycling}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1341--1345}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.035}, doi = {10.1016/J.MICROREL.2009.06.035}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BernouxEJD09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BerthouRFGJ09, author = {Maxime Berthou and P. Retailleau and H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and Alexandrine Gu{\'{e}}don{-}Gracia and C. J{\'{e}}phos{-}Davennel}, title = {Microstructure evolution observation for {SAC} solder joint: Comparison between thermal cycling and thermal storage}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1267--1272}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.040}, doi = {10.1016/J.MICROREL.2009.07.040}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BerthouRFGJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BertoluzzaDM09, author = {Fulvio Bertoluzza and Nicola Delmonte and Roberto Menozzi}, title = {Three-dimensional finite-element thermal simulation of GaN-based HEMTs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {468--473}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.009}, doi = {10.1016/J.MICROREL.2009.02.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BertoluzzaDM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BestoryMDL09, author = {Corinne Bestory and Fran{\c{c}}ois Marc and S. Duzellier and Herv{\'{e}} Levi}, title = {Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {946--951}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.025}, doi = {10.1016/J.MICROREL.2009.07.025}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BestoryMDL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BianHZZC09, author = {Wei Bian and Jin He and Lining Zhang and Jian Zhang and Mansun Chan}, title = {Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {897--903}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.008}, doi = {10.1016/J.MICROREL.2009.05.008}, timestamp = {Fri, 01 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BianHZZC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BibergerBG09, author = {Roland Biberger and Guenther Benstetter and Holger Goebel}, title = {Displacement current sensor for contact and intermittent contact scanning capacitance microscopy}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1192--1195}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.007}, doi = {10.1016/J.MICROREL.2009.07.007}, timestamp = {Wed, 07 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BibergerBG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BornBBDGHKLV09, author = {V. Born and M. Beck and O. Bosholm and D. Dalleau and S. Glenz and I. Haverkamp and G. Kurz and F. Lange and Anja Vest}, title = {Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {74--78}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.017}, doi = {10.1016/J.MICROREL.2008.10.017}, timestamp = {Tue, 14 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BornBBDGHKLV09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrodbeckES09, author = {Tilo Brodbeck and Kai Esmark and Wolfgang Stadler}, title = {{CDM} tests on interface test chips for the verification of {ESD} protection concepts}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1470--1475}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.053}, doi = {10.1016/J.MICROREL.2009.06.053}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrodbeckES09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BroujiBVHW09, author = {H. El Brouji and Olivier Briat and Jean{-}Michel Vinassa and Herv{\'{e}} Henry and Eric Woirgard}, title = {Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditions}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1391--1397}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.033}, doi = {10.1016/J.MICROREL.2009.06.033}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BroujiBVHW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrusamarelloWS09, author = {Lucas Brusamarello and Gilson I. Wirth and Roberto da Silva}, title = {Statistical {RTS} model for digital circuits}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1064--1069}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.025}, doi = {10.1016/J.MICROREL.2009.06.025}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BrusamarelloWS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BusattoAIC09, author = {Giovanni Busatto and Carmine Abbate and Francesco Iannuzzo and P. Cristofaro}, title = {Instable mechanisms during unclamped operation of high power {IGBT} modules}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1363--1369}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.026}, doi = {10.1016/J.MICROREL.2009.07.026}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BusattoAIC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BusattoCIPSV09, author = {Giovanni Busatto and Giuseppe Curr{\`{o}} and Francesco Iannuzzo and Alberto Porzio and Annunziata Sanseverino and Francesco Velardi}, title = {Experimental study about gate oxide damages in patterned {MOS} capacitor irradiated with heavy ions}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1033--1037}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.012}, doi = {10.1016/J.MICROREL.2009.07.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BusattoCIPSV09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CantinGP09, author = {C. Cantin and G. Gove and G. Polisski}, title = {Verification and reduction of surface charging during high/medium current implantations by implementing plasma damage monitoring}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {215--220}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.015}, doi = {10.1016/J.MICROREL.2008.10.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CantinGP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CantinLG09, author = {C. Cantin and C. Laviron and G. Gove}, title = {Charging control on high energy implanters: {A} process requirement demonstrated by plasma damage monitoring}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {209--214}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.012}, doi = {10.1016/J.MICROREL.2008.11.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CantinLG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CarastroCCJBW09, author = {Fabio Carastro and Alberto Castellazzi and Jon C. Clare and M. C. Johnson and Michael J. Bland and Patrick W. Wheeler}, title = {Reliability considerations in pulsed power resonant conversion}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1352--1357}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.039}, doi = {10.1016/J.MICROREL.2009.06.039}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CarastroCCJBW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Celik-ButlerDTTZ09, author = {Zeynep {\c{C}}elik{-}Butler and Siva Prasad Devireddy and Hsing{-}Huang Tseng and Philip J. Tobin and Ania Zlotnicka}, title = {A low-frequency noise model for advanced gate-stack MOSFETs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {103--112}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.005}, doi = {10.1016/J.MICROREL.2008.12.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Celik-ButlerDTTZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Chang09, author = {Kuei{-}Hu Chang}, title = {Evaluate the orderings of risk for failure problems using a more general {RPN} methodology}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1586--1596}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.057}, doi = {10.1016/J.MICROREL.2009.07.057}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Chang09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChaoZCH09, author = {Brook Huang{-}Lin Chao and Xuefeng Zhang and Seung{-}Hyun Chae and Paul S. Ho}, title = {Recent advances on kinetic analysis of electromigration enhanced intermetallic growth and damage formation in Pb-free solder joints}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {253--263}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.006}, doi = {10.1016/J.MICROREL.2009.01.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChaoZCH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CheP09, author = {F. X. Che and John H. L. Pang}, title = {Vibration reliability test and finite element analysis for flip chip solder joints}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {754--760}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.022}, doi = {10.1016/J.MICROREL.2009.03.022}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/CheP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenL09, author = {Jiunn Chen and Yi{-}Shao Lai}, title = {Towards elastic anisotropy and strain-induced void formation in Cu-Sn crystalline phases}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {264--268}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.018}, doi = {10.1016/J.MICROREL.2008.10.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChentirJVBVA09, author = {Mohamed{-}Tahar Chentir and J.{-}B. Jullien and B. Valtchanov and Emilien Bouyssou and Laurent Ventura and Christine Anceau}, title = {Percolation theory applied to {PZT} thin films capacitors breakdown mechanisms}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1074--1078}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.048}, doi = {10.1016/J.MICROREL.2009.07.048}, timestamp = {Sat, 12 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChentirJVBVA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Chiang09, author = {Te{-}Kuang Chiang}, title = {A new two-dimensional analytical subthreshold behavior model for short-channel tri-material gate-stack {SOI} MOSFET's}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {113--119}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.005}, doi = {10.1016/J.MICROREL.2008.11.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Chiang09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Chiang09a, author = {Te{-}Kuang Chiang}, title = {A new two-dimensional subthreshold behavior model for the short-channel asymmetrical dual-material double-gate {(ADMDG)} MOSFET's}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {693--698}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.006}, doi = {10.1016/J.MICROREL.2009.05.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Chiang09a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChidambaramHH09, author = {Vivek Chidambaram and John Hald and Jesper Henri Hattel}, title = {Development of gold based solder candidates for flip chip assembly}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {323--330}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.012}, doi = {10.1016/J.MICROREL.2008.12.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChidambaramHH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChoiYHKCL09, author = {Chel{-}Jong Choi and Ha{-}Yong Yang and Hyo{-}Bong Hong and Jin{-}Gyu Kim and Sung{-}Yong Chang and Jouhahn Lee}, title = {Characteristics of metal-oxide-semiconductor {(MOS)} device with Er metal gate on SiO\({}_{\mbox{2}}\) film}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {463--465}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.014}, doi = {10.1016/J.MICROREL.2008.12.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChoiYHKCL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChouHHYC09, author = {Tsung{-}Lin Chou and Chien{-}Fu Huang and Cheng{-}Nan Han and Shin{-}Yueh Yang and Kuo{-}Ning Chiang}, title = {Fabrication process simulation and reliability improvement of high-brightness LEDs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1244--1249}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.028}, doi = {10.1016/J.MICROREL.2009.07.028}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChouHHYC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChowdhuryWBYRM09, author = {N. A. Chowdhury and X. Wang and Gennadi Bersuker and Chadwin D. Young and N. Rahim and Durga Misra}, title = {Temperature dependent time-to-breakdown (T\({}_{\mbox{BD}}\)) of TiN/HfO\({}_{\mbox{2}}\) n-channel {MOS} devices in inversion}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {495--498}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.003}, doi = {10.1016/J.MICROREL.2009.02.003}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChowdhuryWBYRM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CiappaMSOF09, author = {Mauro Ciappa and Luigi Mangiacapra and Maria Stangoni and Stephan Ott and Wolfgang Fichtner}, title = {Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {972--976}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.035}, doi = {10.1016/J.MICROREL.2009.07.035}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CiappaMSOF09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CiptokusumoWA09, author = {Joharsyah Ciptokusumo and Kirsten Weide{-}Zaage and Oliver Aubel}, title = {Investigation of stress distribution in via bottom of Cu-via structures with different via form by means of submodeling}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1090--1095}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.043}, doi = {10.1016/J.MICROREL.2009.07.043}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CiptokusumoWA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Crespo-YepesMRNA09, author = {Albert Crespo{-}Yepes and Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and Rosana Rodr{\'{\i}}guez and Montserrat Nafr{\'{\i}}a and Xavier Aymerich}, title = {Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1024--1028}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.029}, doi = {10.1016/J.MICROREL.2009.06.029}, timestamp = {Fri, 09 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/Crespo-YepesMRNA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DammannPWBQMMAWMRBBRFS09, author = {Maximilian Dammann and W. Pletschen and Patrick Waltereit and Wolfgang Bronner and R{\"{u}}diger Quay and Stefan M{\"{u}}ller and Michael Mikulla and Oliver Ambacher and P. J. van der Wel and S. Murad and T. R{\"{o}}dle and R. Behtash and F. Bourgeois and K. Riepe and Martin Fagerlind and Einar {\"{O}}rn Sveinbj{\"{o}}rnsson}, title = {Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {474--477}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.005}, doi = {10.1016/J.MICROREL.2009.02.005}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DammannPWBQMMAWMRBBRFS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DiattaBTMROB09, author = {Marianne Diatta and Emilien Bouyssou and David Tr{\'{e}}mouilles and P. Martinez and F. Roqueta and O. Ory and Marise Bafleur}, title = {Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges {(ESD)}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1103--1106}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.010}, doi = {10.1016/J.MICROREL.2009.06.010}, timestamp = {Fri, 29 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DiattaBTMROB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DjeffalGDL09, author = {Fay{\c{c}}al Djeffal and Z. Ghoggali and Zohir Dibi and N. Lakhdar}, title = {Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {377--381}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.011}, doi = {10.1016/J.MICROREL.2008.12.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DjeffalGDL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DudekDBM09, author = {Rainer Dudek and Ralf D{\"{o}}ring and Christine Bombach and Bernd Michel}, title = {Simulation based analysis of secondary effects on solder fatigue}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {839--845}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.014}, doi = {10.1016/J.MICROREL.2009.03.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DudekDBM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DupontCKM09, author = {Laurent Dupont and Gerard Coquery and K. Kriegel and A. Melkonyan}, title = {Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1375--1380}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.050}, doi = {10.1016/J.MICROREL.2009.07.050}, timestamp = {Thu, 25 Jan 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DupontCKM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Dziedzic09, author = {Andrzej Dziedzic}, title = {{IMAPS-CPMT} Poland 2008 - Guest Editorial}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {567--568}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.020}, doi = {10.1016/J.MICROREL.2009.03.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Dziedzic09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ErslandM09, author = {Peter Ersland and Roberto Menozzi}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {467}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.003}, doi = {10.1016/J.MICROREL.2009.03.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ErslandM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ExarchosPJB09, author = {M. A. Exarchos and George J. Papaioannou and Jalal Jomaah and Francis Balestra}, title = {Investigation of defects introduced by static and dynamic hot carrier stress on {SOI} partially depleted body-contact MOSFETs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1018--1023}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.024}, doi = {10.1016/J.MICROREL.2009.07.024}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ExarchosPJB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FanLH09, author = {X. J. Fan and S. W. Ricky Lee and Q. Han}, title = {Experimental investigations and model study of moisture behaviors in polymeric materials}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {861--871}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.006}, doi = {10.1016/J.MICROREL.2009.03.006}, timestamp = {Fri, 25 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FanLH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FarbizR09, author = {Farzan Farbiz and Elyse Rosenbaum}, title = {A new compact model for external latchup}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1447--1454}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.003}, doi = {10.1016/J.MICROREL.2008.12.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FarbizR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FarrisPLKVTMSBWG09, author = {Andrew Farris and Jianbiao Pan and Albert A. Liddicoat and Michael Krist and Nicholas A. Vickers and Brian J. Toleno and Dan Maslyk and Dongkai Shangguan and Jasbir Bath and Dennis Willie and David A. Geiger}, title = {Drop impact reliability of edge-bonded lead-free chip scale packages}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {761--770}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.003}, doi = {10.1016/J.MICROREL.2009.05.003}, timestamp = {Mon, 07 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FarrisPLKVTMSBWG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FelczakWM09, author = {Mariusz Felczak and Boguslaw Wiecek and Gilbert De Mey}, title = {Optimal placement of electronic devices in forced convective cooling conditions}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1537--1545}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.007}, doi = {10.1016/J.MICROREL.2009.06.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FelczakWM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Fernandez-GarciaKG09, author = {R. Fern{\'{a}}ndez{-}Garc{\'{\i}}a and Ben Kaczer and Guido Groeseneken}, title = {A {CMOS} circuit for evaluating the {NBTI} over a wide frequency range}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {885--891}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.009}, doi = {10.1016/J.MICROREL.2009.05.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Fernandez-GarciaKG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FukaiKKIYE09, author = {Yoshino K. Fukai and Kenji Kurishima and Norihide Kashio and Minoru Ida and Shoji Yamahata and Takatomo Enoki}, title = {Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {357--364}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.005}, doi = {10.1016/J.MICROREL.2009.01.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FukaiKKIYE09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GainCSWY09, author = {Asit Kumar Gain and Y. C. Chan and Ahmed Sharif and N. B. Wong and Winco K. C. Yung}, title = {Interfacial microstructure and shear strength of Ag nano particle doped Sn-9Zn solder in ball grid array packages}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {746--753}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.004}, doi = {10.1016/J.MICROREL.2009.05.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GainCSWY09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GalyDVREJPB09, author = {Philippe Galy and Sylvain Dudit and Michel Vallet and Corinne Richier and Christophe Entringer and Frank Jezequel and E. Petit and J. Beltritti}, title = {Impact and damage on deep sub-micron {CMOS} technology induced by substrate current due to {ESD} stress}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1107--1110}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.039}, doi = {10.1016/J.MICROREL.2009.07.039}, timestamp = {Wed, 08 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GalyDVREJPB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GaoNTQ09, author = {Feng Gao and Hiroshi Nishikawa and Tadashi Takemoto and Jianmin Qu}, title = {Mechanical properties versus temperature relation of individual phases in Sn-3.0Ag-0.5Cu lead-free solder alloy}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {296--302}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.010}, doi = {10.1016/J.MICROREL.2008.10.010}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GaoNTQ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GaoWWYL09, author = {Chao Gao and Jun Wang and Lei Wang and Andrew Yap and Hong Li}, title = {Two-stage hot-carrier degradation behavior of 0.18 {\(\mathrm{\mu}\)}m 18 {V} n-type {DEMOS} and its recovery effect}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {8--12}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.09.009}, doi = {10.1016/J.MICROREL.2008.09.009}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GaoWWYL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GarrosCRFRMWB09, author = {Xavier Garros and Mika{\"{e}}l Cass{\'{e}} and M. Rafik and Claire Fenouillet{-}B{\'{e}}ranger and Gilles Reimbold and Fran{\c{c}}ois Martin and Claudia Wiemer and F. Boulanger}, title = {Process dependence of {BTI} reliability in advanced {HK} {MG} stacks}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {982--988}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.047}, doi = {10.1016/J.MICROREL.2009.06.047}, timestamp = {Tue, 09 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GarrosCRFRMWB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GhisiFMZ09, author = {Aldo Ghisi and Fabio Fachin and Stefano Mariani and Sarah Zerbini}, title = {Multi-scale analysis of polysilicon {MEMS} sensors subject to accidental drops: Effect of packaging}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {340--349}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.010}, doi = {10.1016/J.MICROREL.2008.12.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GhisiFMZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GilEL09, author = {C. Gil and Peter Ersland and A. Li}, title = {Determining {DC/RF} survivability limits of GaAs semiconductor circuits}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {484--487}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.004}, doi = {10.1016/J.MICROREL.2009.02.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GilEL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GlowackiLBIBPLWT09, author = {Arkadiusz Glowacki and Piotr Laskowski and Christian Boit and Ponky Ivo and Eldad Bahat{-}Treidel and Reza Pazirandeh and Richard Lossy and Joachim W{\"{u}}rfl and G{\"{u}}nther Tr{\"{a}}nkle}, title = {Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1211--1215}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.022}, doi = {10.1016/J.MICROREL.2009.07.022}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GlowackiLBIBPLWT09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GodlewskiPLL09, author = {C. Godlewski and Vincent Pouget and Dean Lewis and Mathieu Lisart}, title = {Electrical modeling of the effect of beam profile for pulsed laser fault injection}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1143--1147}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.037}, doi = {10.1016/J.MICROREL.2009.07.037}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GodlewskiPLL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GonzalezVNARG09, author = {Jos{\'{e}} Ram{\'{o}}n Gonz{\'{a}}lez and Manuel V{\'{a}}zquez and Neftal{\'{\i}} N{\'{u}}{\~{n}}ez and Carlos Algora and Ignacio Rey{-}Stolle and Beatriz Galiana}, title = {Reliability analysis of temperature step-stress tests on {III-V} high concentrator solar cells}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {673--680}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.001}, doi = {10.1016/J.MICROREL.2009.04.001}, timestamp = {Sat, 05 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GonzalezVNARG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Gorecki09, author = {Krzysztof G{\'{o}}recki}, title = {Non-linear average electrothermal models of buck and boost converters for {SPICE}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {431--437}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.009}, doi = {10.1016/J.MICROREL.2009.01.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Gorecki09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GoreckiZ09, author = {Krzysztof G{\'{o}}recki and Janusz Zarebski}, title = {Electrothermal analysis of the self-excited push-pull {DC-DC} converter}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {424--430}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.007}, doi = {10.1016/J.MICROREL.2009.01.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GoreckiZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GrosDML09, author = {Jean{-}Baptiste Gros and Genevi{\`{e}}ve Duchamp and Alain Meresse and Jean{-}Luc Levant}, title = {Electromagnetic immunity model of an {ADC} for microcontroller's reliability improvement}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {963--966}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.013}, doi = {10.1016/J.MICROREL.2009.06.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GrosDML09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HaberfehlnerBDHPPSGP09, author = {Georg Haberfehlner and Sergey Bychikhin and Viktor Dubec and Michael Heer and A. Podgaynaya and M. Pfost and Matthias Stecher and Erich Gornik and Dionyz Pogany}, title = {Thermal imaging of smart power {DMOS} transistors in the thermally unstable regime using a compact transient interferometric mapping system}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1346--1351}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.032}, doi = {10.1016/J.MICROREL.2009.07.032}, timestamp = {Wed, 16 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HaberfehlnerBDHPPSGP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HallerMLP09, author = {G{\'{e}}rald Haller and Aziz Machouat and Dean Lewis and Vincent Pouget}, title = {Net integrity checking by optical localization techniques}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1175--1181}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.021}, doi = {10.1016/J.MICROREL.2009.07.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HallerMLP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HartmannW09, author = {Claus Hartmann and M. Wieberneit}, title = {Investigation on marginal failure characteristics and related defects analysed by soft defect localization}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1137--1142}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.036}, doi = {10.1016/J.MICROREL.2009.07.036}, timestamp = {Fri, 04 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HartmannW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HasseKS09, author = {Lech Hasse and Alicja Konczakowska and Janusz M. Smulko}, title = {Classification of high-voltage varistors into groups of differentiated quality}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1483--1490}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.008}, doi = {10.1016/J.MICROREL.2009.06.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HasseKS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HautefeuilleOPO09, author = {Mathieu Hautefeuille and Brendan O'Flynn and Frank H. Peters and Conor O'Mahony}, title = {Miniaturised multi-MEMS sensor development}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {621--626}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.017}, doi = {10.1016/J.MICROREL.2009.02.017}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HautefeuilleOPO09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HayesCF09, author = {S. M. Hayes and Nikhilesh Chawla and D. R. Frear}, title = {Interfacial fracture toughness of Pb-free solders}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {269--287}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.004}, doi = {10.1016/J.MICROREL.2008.11.004}, timestamp = {Thu, 10 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HayesCF09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeerDEGPGS09, author = {Michael Heer and Krzysztof Domanski and Kai Esmark and Ulrich Glaser and Dionyz Pogany and Erich Gornik and Wolfgang Stadler}, title = {Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and {I/O} cells processed in {CMOS} technology}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1455--1464}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.052}, doi = {10.1016/J.MICROREL.2009.06.052}, timestamp = {Wed, 16 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeerDEGPGS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HehenbergerWRG09, author = {Ph. Hehenberger and P.{-}J. Wagner and Hans Reisinger and Tibor Grasser}, title = {On the temperature and voltage dependence of short-term negative bias temperature stress}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1013--1017}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.040}, doi = {10.1016/J.MICROREL.2009.06.040}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HehenbergerWRG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeldF09, author = {Marcel Held and Klaus Fritz}, title = {Comparison and evaluation of newest failure rate prediction models: {FIDES} and {RIAC} 217Plus}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {967--971}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.031}, doi = {10.1016/J.MICROREL.2009.07.031}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeldF09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HertlWL09, author = {Michael Hertl and Diane Weidmann and Jean{-}Claude Lecomte}, title = {An advanced quality and reliability assessment approach applied to thermal stress issues in electronic components and assemblies}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1148--1152}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.045}, doi = {10.1016/J.MICROREL.2009.07.045}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HertlWL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HisakaSNHYVAHA09, author = {Takayuki Hisaka and Hajime Sasaki and Yoichi Nogami and Kenji Hosogi and Naohito Yoshida and Anita A. Villanueva and Jes{\'{u}}s A. del Alamo and Shigehiko Hasegawa and Hajime Asahi}, title = {Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1515--1519}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.046}, doi = {10.1016/J.MICROREL.2009.07.046}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HisakaSNHYVAHA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HoCLLW09, author = {Chia{-}Huai Ho and Kuei{-}Shu Chang{-}Liao and Chun{-}Yuan Lu and Chun{-}Chang Lu and Tien{-}Ko Wang}, title = {Employing vertical dielectric layers to improve the operation performance of flash memory devices}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {371--376}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.004}, doi = {10.1016/J.MICROREL.2008.12.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HoCLLW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HsiaoK09, author = {Yuan{-}Wen Hsiao and Ming{-}Dou Ker}, title = {Low-capacitance {ESD} protection design for high-speed {I/O} interfaces in a 130-nm {CMOS} process}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {650--659}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.011}, doi = {10.1016/J.MICROREL.2009.03.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HsiaoK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HsiehWCSLCH09, author = {Zhen{-}Ying Hsieh and Mu{-}Chun Wang and Chih Chen and Jia{-}Min Shieh and Yu{-}Ting Lin and Shuang{-}Yuan Chen and Heng{-}Sheng Huang}, title = {Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for {CLC} n-TFTs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {892--896}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.011}, doi = {10.1016/J.MICROREL.2009.05.011}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HsiehWCSLCH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HwangKKSK09, author = {Jin{-}Sang Hwang and Ju{-}Yeol Kim and Seok{-}Chan Kang and Dong{-}Sung Seo and Younghwan Kwon}, title = {Feasibility study of non-conductive film {(NCF)} for plasma display panel {(PDP)} application}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {806--812}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.021}, doi = {10.1016/J.MICROREL.2009.03.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HwangKKSK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HwangKSWM09, author = {Jin{-}Sang Hwang and Myeong{-}Hwan Kim and Dong{-}Sung Seo and Jong{-}Woo Won and Doo{-}Kyung Moon}, title = {Effects of soft segment mixtures with different molecular weight on the properties and reliability of {UV} curable adhesives for electrodes protection of plasma display panel {(PDP)}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {517--522}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.001}, doi = {10.1016/J.MICROREL.2009.02.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HwangKSWM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IlleSPGBERACGB09, author = {Adrien Ille and Wolfgang Stadler and Thomas Pompl and Harald Gossner and Tilo Brodbeck and Kai Esmark and Philipp Riess and David Alvarez and Kiran V. Chatty and Robert Gauthier and Alain Bravaix}, title = {Reliability aspects of gate oxide under {ESD} pulse stress}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1407--1416}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.054}, doi = {10.1016/J.MICROREL.2009.06.054}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/IlleSPGBERACGB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/InfantePL09, author = {Fulvio Infante and Philippe Perdu and Dean Lewis}, title = {Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1169--1174}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.041}, doi = {10.1016/J.MICROREL.2009.06.041}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/InfantePL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IrreraPPRV09, author = {Fernanda Irrera and Ivan Piccoli and Giuseppina Puzzilli and Massimo Rossini and Tommaso Vali}, title = {Reliability improvements in 50 nm {MLC} {NAND} flash memory using short voltage programming pulses}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {135--138}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.006}, doi = {10.1016/J.MICROREL.2008.11.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IrreraPPRV09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IwamotoKS09, author = {Nancy Iwamoto and Ahila Krishnamoorthy and Richard Spear}, title = {Performance properties in thick film silicate dielectric layers using molecular modeling}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {877--883}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.010}, doi = {10.1016/J.MICROREL.2009.03.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IwamotoKS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JacobKKNLMP09, author = {Peter Jacob and Willy Knecht and Albert Kunz and Giovanni Nicoletti and Thomas Lautenschlager and Moreno Mondada and Damien Pachoud}, title = {Reading distance degradation mechanisms of near-field {RFID} devices}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1288--1292}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.012}, doi = {10.1016/J.MICROREL.2009.06.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JacobKKNLMP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JansenQEBKPS09, author = {Kaspar M. B. Jansen and C. Qian and Leo J. Ernst and C. Bohm and A. Kessler and Harald Preu and Matthias Stecher}, title = {Modeling and characterization of molding compound properties during cure}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {872--876}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.007}, doi = {10.1016/J.MICROREL.2009.03.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JansenQEBKPS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JavaheriS09, author = {M. Reza Javaheri and Reza Sedaghat}, title = {Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {178--185}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.010}, doi = {10.1016/J.MICROREL.2008.11.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JavaheriS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JenLL09, author = {Ming{-}Hwa R. Jen and Lee{-}Cheng Liu and Yi{-}Shao Lai}, title = {Electromigration on void formation of Sn3Ag1.5Cu {FCBGA} solder joints}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {734--745}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.008}, doi = {10.1016/J.MICROREL.2009.04.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JenLL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JenqCLT09, author = {S. T. Jenq and Hsuan{-}Hu Chang and Yi{-}Shao Lai and Tsung{-}Yueh Tsai}, title = {High strain rate compression behavior for Sn-37Pb eutectic alloy, lead-free Sn-1Ag-0.5Cu and Sn-3Ag-0.5Cu alloys}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {310--317}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.002}, doi = {10.1016/J.MICROREL.2009.01.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JenqCLT09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JeonKYCIP09, author = {Yong Woo Jeon and Dae Hyun Ka and Chong{-}Gun Yu and Won{-}Ju Cho and M. Saif Islam and Jong Tae Park}, title = {{NBTI} and hot carrier effect of {SOI} p-MOSFETs fabricated in strained Si {SOI} wafer}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {994--997}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.015}, doi = {10.1016/J.MICROREL.2009.06.015}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/JeonKYCIP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JeongP09, author = {Jae{-}Seong Jeong and Sang{-}Deuk Park}, title = {Failure analysis of video processor defined as No Fault Found {(NFF):} Reproduction in system level and advanced analysis technique in {IC} level}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1153--1157}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.049}, doi = {10.1016/J.MICROREL.2009.07.049}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JeongP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JinZXCSH09, author = {Dongyue Jin and Wanrong Zhang and Hongyun Xie and Liang Chen and Pei Shen and Ning Hu}, title = {Structure optimization of multi-finger power SiGe HBTs for thermal stability improvement}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {382--386}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.008}, doi = {10.1016/J.MICROREL.2009.01.008}, timestamp = {Wed, 28 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/JinZXCSH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JinkaDGL09, author = {K. K. Jinka and A. Dasgupta and S. Ganesan and S. Ling}, title = {Chip-on board technology for low temperature environment. Part {II:} Thermomechanical stresses in encapsulated ball-wedge bond wires}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {523--529}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.008}, doi = {10.1016/J.MICROREL.2009.02.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JinkaDGL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KangKCKK09, author = {Jeung{-}Mo Kang and Jae{-}Wook Kim and Jeong{-}Hyeon Choi and Du{-}Hyun Kim and Ho{-}Ki Kwon}, title = {Life-time estimation of high-power blue light-emitting diode chips}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1231--1235}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.052}, doi = {10.1016/J.MICROREL.2009.07.052}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KangKCKK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KatsetosB09, author = {Anastasios A. Katsetos and Andrew C. Brendler}, title = {{NBTI} model development with regression analysis}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1498--1502}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.009}, doi = {10.1016/J.MICROREL.2009.06.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KatsetosB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KawaiDW09, author = {Nozomu Kawai and Yasuhiro Dohi and Nobuyuki Wakai}, title = {Study for pulse stress {NBTI} characteristics degradation stress}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {989--993}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.004}, doi = {10.1016/J.MICROREL.2009.07.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KawaiDW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KhatibiWWI09, author = {Golta Khatibi and W. Wroczewski and Brigitte Weiss and H. Ipser}, title = {A novel accelerated test technique for assessment of mechanical reliability of solder interconnects}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1283--1287}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.021}, doi = {10.1016/J.MICROREL.2009.06.021}, timestamp = {Tue, 15 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KhatibiWWI09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KingG09, author = {Sean W. King and J. A. Gradner}, title = {Intrinsic stress fracture energy measurements for {PECVD} thin films in the SiO\({}_{\mbox{x}}\)C\({}_{\mbox{y}}\)N\({}_{\mbox{z}}\): {H} system}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {721--726}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.006}, doi = {10.1016/J.MICROREL.2009.04.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KingG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KisielS09, author = {Ryszard Kisiel and Zbigniew Szczepanski}, title = {Die-attachment solutions for SiC power devices}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {627--629}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.009}, doi = {10.1016/J.MICROREL.2009.03.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KisielS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KockKDGP09, author = {Helmut K{\"{o}}ck and Vladim{\'{\i}}r Kosel and Christian Djelassi and Michael Glavanovics and Dionyz Pogany}, title = {{IR} thermography and {FEM} simulation analysis of on-chip temperature during thermal-cycling power-metal reliability testing using in situ heated structures}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1132--1136}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.032}, doi = {10.1016/J.MICROREL.2009.06.032}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KockKDGP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KokkoHHK09, author = {Kati Kokko and Hanna Harjunp{\"{a}}{\"{a}} and Pekka Heino and Minna Kellom{\"{a}}ki}, title = {Influence of medical sterilization on {ACA} flip chip joints using conformal coating}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {92--98}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.016}, doi = {10.1016/J.MICROREL.2008.10.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KokkoHHK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Kontoleon09, author = {John Kontoleon}, title = {Soft error recovery in simplex and triplex memory systems}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {410--423}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.009}, doi = {10.1016/J.MICROREL.2008.12.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Kontoleon09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KshirsagarP09, author = {Ravindra V. Kshirsagar and Rajendra M. Patrikar}, title = {Design of a novel fault-tolerant voter circuit for {TMR} implementation to improve reliability in digital circuits}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1573--1577}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.08.001}, doi = {10.1016/J.MICROREL.2009.08.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KshirsagarP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KuanLC09, author = {Wei{-}Chih Kuan and S. W. Liang and Chih Chen}, title = {Effect of bump size on current density and temperature distributions in flip-chip solder joints}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {544--550}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.001}, doi = {10.1016/J.MICROREL.2009.03.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KuanLC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KuboCMF09, author = {Haruka Kubo and Mauro Ciappa and Takayuki Masunaga and Wolfgang Fichtner}, title = {Multiscale simulation of aluminum thin films for the design of highly-reliable {MEMS} devices}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1278--1282}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.034}, doi = {10.1016/J.MICROREL.2009.07.034}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KuboCMF09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Kuehl09, author = {Reiner W. Kuehl}, title = {Stability of thin film resistors - Prediction and differences base on time-dependent Arrhenius law}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {51--58}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.013}, doi = {10.1016/J.MICROREL.2008.10.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Kuehl09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KwonKPHJS09, author = {Sangwook Kwon and Jongseok Kim and Gilsu Park and Youngtack Hong and Byeong{-}Kwon Ju and Insang Song}, title = {{RF} device package method using Au to Au direct bonding technology}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {99--102}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.007}, doi = {10.1016/J.MICROREL.2008.10.007}, timestamp = {Thu, 27 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KwonKPHJS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiTT09, author = {Yi{-}Shao Lai and Ho{-}Ming Tong and King{-}Ning Tu}, title = {Recent research advances in Pb-free solders}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {221--222}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.007}, doi = {10.1016/J.MICROREL.2009.02.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiTT09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LallHBMV09, author = {Pradeep Lall and Madhura Hande and Chandan Bhat and Vikrant More and Rahul Vaidya}, title = {Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {825--838}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.024}, doi = {10.1016/J.MICROREL.2009.03.024}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LallHBMV09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LangfelderLZCGM09, author = {Giacomo Langfelder and Antonio Longoni and Federico Zaraga and Alberto Corigliano and Aldo Ghisi and A. Merassi}, title = {A new on-chip test structure for real time fatigue analysis in polysilicon {MEMS}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {120--126}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.009}, doi = {10.1016/J.MICROREL.2008.11.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LangfelderLZCGM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LanzaPNAGS09, author = {Mario Lanza and Marc Porti and Montserrat Nafr{\'{\i}}a and Xavier Aymerich and G. Ghidini and A. Sebastiani}, title = {Trapped charge and stress induced leakage current {(SILC)} in tunnel SiO\({}_{\mbox{2}}\) layers of de-processed {MOS} non-volatile memory devices observed at the nanoscale}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1188--1191}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.016}, doi = {10.1016/J.MICROREL.2009.06.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LanzaPNAGS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LauTS09, author = {W. S. Lau and Joy B. H. Tan and B. P. Singh}, title = {Formation of Ohmic contacts in AlGaN/GaN {HEMT} structures at 500 degreeC by Ohmic contact recess etching}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {558--561}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.010}, doi = {10.1016/J.MICROREL.2009.02.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LauTS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LauYCHLSC09, author = {W. S. Lau and Peizhen Yang and Jason Zhiwei Chian and V. Ho and C. H. Loh and S. Y. Siah and L. Chan}, title = {Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {1--7}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.006}, doi = {10.1016/J.MICROREL.2008.10.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LauYCHLSC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaurilaHVK09, author = {Tomi Laurila and J. Hurtig and Vesa Vuorinen and Jorma K. Kivilahti}, title = {Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {242--247}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.08.007}, doi = {10.1016/J.MICROREL.2008.08.007}, timestamp = {Tue, 24 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaurilaHVK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LeeFAYDRCP09, author = {Chi{-}Woo Lee and Isabelle Ferain and Aryan Afzalian and Ran Yan and Nima Dehdashti and Pedram Razavi and Jean{-}Pierre Colinge and Jong Tae Park}, title = {{NBTI} and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1044--1047}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.011}, doi = {10.1016/J.MICROREL.2009.06.011}, timestamp = {Fri, 22 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LeeFAYDRCP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LefebvreGB09, author = {Jean Luc Lefebvre and Christian Gautier and Fr{\'{e}}d{\'{e}}ric Barbier}, title = {Correlation between {EOS} customer return failure cases and Over Voltage Stress {(OVS)} test method}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {952--957}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.030}, doi = {10.1016/J.MICROREL.2009.07.030}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LefebvreGB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LewisL09, author = {Dean Lewis and Nathalie Labat}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {935--936}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.041}, doi = {10.1016/J.MICROREL.2009.07.041}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LewisL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiaoTS09, author = {Jie Liao and Cher Ming Tan and Geert Spierings}, title = {Behavior of hot carrier generation in power {SOI} {LDNMOS} with shallow trench isolation {(STI)}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1038--1043}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.044}, doi = {10.1016/J.MICROREL.2009.06.044}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiaoTS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiaoTSKLMNL09, author = {Joy Y. Liao and Tung Ton and Nathan Slattengren and Steven Kasapi and William K. Lo and Howard L. Marks and Yin S. Ng and Ted R. Lundquist}, title = {Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1127--1131}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.017}, doi = {10.1016/J.MICROREL.2009.07.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiaoTSKLMNL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LinPLL09, author = {Ta{-}Hsuan Lin and Stephen Paul and Susan S. Lu and Huitian Lu}, title = {A study on the performance and reliability of magnetostatic actuated {RF} {MEMS} switches}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {59--65}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.07.072}, doi = {10.1016/J.MICROREL.2008.07.072}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LinPLL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LinSLCLU09, author = {Li{-}Wei Lin and Jenn{-}Ming Song and Yi{-}Shao Lai and Ying{-}Ta Chiu and Ning{-}Cheng Lee and Jun{-}Yen Uan}, title = {Alloying modification of Sn-Ag-Cu solders by manganese and titanium}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {235--241}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.001}, doi = {10.1016/J.MICROREL.2008.10.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LinSLCLU09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LintenTBDTSNWDG09, author = {Dimitri Linten and Steven Thijs and Jonathan Borremans and Morin Dehan and David Tr{\'{e}}mouilles and Mirko Scholz and M. I. Natarajan and Piet Wambacq and Stefaan Decoutere and Guido Groeseneken}, title = {A plug-and-play wideband {RF} circuit {ESD} protection methodology: T-diodes}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1440--1446}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.10.011}, doi = {10.1016/J.MICROREL.2009.10.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LintenTBDTSNWDG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuKDDSZ09, author = {Y. Liu and F. J. H. G. Kessels and Willem D. van Driel and J. A. S. van Driel and F. L. Sun and G. Q. Zhang}, title = {Comparing drop impact test method using strain gauge measurements}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1299--1303}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.008}, doi = {10.1016/J.MICROREL.2009.07.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuKDDSZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuMSYW09, author = {Xiaoxiao Liu and Guangsheng Ma and Jingbo Shao and Zhi Yang and Guanjun Wang}, title = {Interconnect crosstalk noise evaluation in deep-submicron technologies}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {170--177}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.013}, doi = {10.1016/J.MICROREL.2008.11.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuMSYW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuMZZ09, author = {Fang Liu and Guang Meng and Mei Zhao and Jun feng Zhao}, title = {Experimental and numerical analysis of {BGA} lead-free solder joint reliability under board-level drop impact}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {79--85}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.014}, doi = {10.1016/J.MICROREL.2008.10.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuMZZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuTWF09, author = {Jun Liu and Wing{-}Shan Tam and Hei Wong and Valeriu Filip}, title = {Temperature-dependent light-emitting characteristics of InGaN/GaN diodes}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {38--41}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.002}, doi = {10.1016/J.MICROREL.2008.10.002}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuTWF09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuX09, author = {Meng Liu and Ai{-}Ping Xian}, title = {Tin whisker growth on bulk Sn-Pb eutectic doping with Nd}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {667--672}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.012}, doi = {10.1016/J.MICROREL.2009.03.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuX09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuXCL09, author = {Lu Liu and Jing{-}Ping Xu and L. L. Chen and Pui To Lai}, title = {A study on the improved programming characteristics of flash memory with Si\({}_{\mbox{3}}\)N\({}_{\mbox{4}}\)/SiO\({}_{\mbox{2}}\) stacked tunneling dielectric}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {912--915}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.010}, doi = {10.1016/J.MICROREL.2009.05.010}, timestamp = {Thu, 06 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LiuXCL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MaestroR09, author = {Juan Antonio Maestro and Pedro Reviriego}, title = {A method to eliminate the event accumulation problem from a memory affected by multiple bit upsets}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {707--715}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.002}, doi = {10.1016/J.MICROREL.2009.05.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MaestroR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MahdaviM09, author = {Seyyed Javad Seyyed Mahdavi and Karim Mohammadi}, title = {Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {199--208}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.002}, doi = {10.1016/J.MICROREL.2008.12.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MahdaviM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MahdaviM09a, author = {Seyyed Javad Seyyed Mahdavi and Karim Mohammadi}, title = {{SCRAP:} Sequential circuits reliability analysis program}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {924--933}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.001}, doi = {10.1016/J.MICROREL.2009.06.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MahdaviM09a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MaksimovicBNSK09, author = {Dejan M. Maksimovic and Fabrice Blanc and Guido Notermans and Theo Smedes and Thomas Keller}, title = {An {ESD} test reduction method for complex devices}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1465--1469}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.10.010}, doi = {10.1016/J.MICROREL.2009.10.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MaksimovicBNSK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MalandruccoloCRF09, author = {Vezio Malandruccolo and Mauro Ciappa and Hubert Rothleitner and Wolfgang Fichtner}, title = {A new built-in screening methodology to achieve zero defects in the automotive environment}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1334--1340}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.016}, doi = {10.1016/J.MICROREL.2009.07.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MalandruccoloCRF09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MalbertLCSHJDDDOBBC09, author = {Nathalie Malbert and Nathalie Labat and Arnaud Curutchet and C. Sury and V. Hoel and J.{-}C. de Jaeger and Nicolas Defrance and Y. Douvry and Christian Dua and Mourad Oualli and C. Bru{-}Chevallier and Jean{-}Marie Bluet and W. Chikhaoui}, title = {Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1216--1221}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.015}, doi = {10.1016/J.MICROREL.2009.07.015}, timestamp = {Thu, 16 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MalbertLCSHJDDDOBBC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MalechaG09, author = {Karol Malecha and Leszek J. Golonka}, title = {Three-dimensional structuration of zero-shrinkage {LTCC} ceramics for microfluidic applications}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {585--591}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.020}, doi = {10.1016/J.MICROREL.2009.02.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MalechaG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ManicDDDGS09, author = {Ivica Manic and Danijel Dankovic and Snezana Djoric{-}Veljkovic and Vojkan Davidovic and Snezana Golubovic and Ninoslav Stojadinovic}, title = {Effects of low gate bias annealing in {NBT} stressed p-channel power VDMOSFETs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1003--1007}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.010}, doi = {10.1016/J.MICROREL.2009.07.010}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ManicDDDGS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ManouvrierFLNA09, author = {Jean{-}Robert Manouvrier and Pascal Fonteneau and Charles{-}Alexandre Legrand and Pascal Nouet and Florence Aza{\"{\i}}s}, title = {Characterization of the transient behavior of gated/STI diodes and their associated {BJT} in the {CDM} time domain}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1424--1432}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.056}, doi = {10.1016/J.MICROREL.2009.06.056}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ManouvrierFLNA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Martin-PalmaPL09, author = {Ra{\'{u}}l Jos{\'{e}} Mart{\'{\i}}n{-}Palma and Carlo G. Pantano and Akhlesh Lakhtakia}, title = {Towards the use of the conformal-evaporated-film-by-rotation technique in fabricating microelectronic circuits and microsystems}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {460--462}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.003}, doi = {10.1016/J.MICROREL.2009.01.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Martin-PalmaPL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MartineauMLDLV09, author = {Donatien Martineau and Thomas Mazeaud and Marc Legros and Philippe Dupuy and Colette Levade and G. Vanderschaeve}, title = {Characterization of ageing failures on power {MOSFET} devices by electron and ion microscopies}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1330--1333}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.011}, doi = {10.1016/J.MICROREL.2009.07.011}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MartineauMLDLV09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MatmatCMPEFE09, author = {Mohamed Matmat and Fabio Coccetti and Antoine Marty and Robert Plana and Christophe Escriba and Jean{-}Yves Fourniols and Daniel Est{\`{e}}ve}, title = {Capacitive {RF} {MEMS} analytical predictive reliability and lifetime characterization}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1304--1308}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.049}, doi = {10.1016/J.MICROREL.2009.06.049}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MatmatCMPEFE09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MayerMP09, author = {M. Mayer and J. T. Moon and John Persic}, title = {Measuring stress next to Au ball bond during high temperature aging}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {771--781}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.018}, doi = {10.1016/J.MICROREL.2009.03.018}, timestamp = {Tue, 20 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MayerMP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MerilampiLR09, author = {Sari Merilampi and Teija Laine{-}Ma and Pekka Ruuskanen}, title = {The characterization of electrically conductive silver ink patterns on flexible substrates}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {782--790}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.004}, doi = {10.1016/J.MICROREL.2009.04.004}, timestamp = {Tue, 14 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MerilampiLR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MicolMDMK09, author = {Alexandre Micol and Carmen Martin and Olivier Dalverny and Michel Mermet{-}Guyennet and Moussa Karama}, title = {Reliability of lead-free solder in power module with stochastic uncertainty}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {631--641}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.025}, doi = {10.1016/J.MICROREL.2009.02.025}, timestamp = {Thu, 16 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MicolMDMK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MicolZLAWDK09, author = {Alexandre Micol and A. Zeanh and T. Lhommeau and Stephane Azzopardi and Eric Woirgard and Olivier Dalverny and Moussa Karama}, title = {An investigation into the reliability of power modules considering baseplate solders thermal fatigue in aeronautical applications}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1370--1374}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.046}, doi = {10.1016/J.MICROREL.2009.06.046}, timestamp = {Thu, 25 Mar 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MicolZLAWDK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MilovanovicNSM09, author = {Emina I. Milovanovic and Tatjana R. Nikolic and Mile K. Stojcev and Igor Z. Milovanovic}, title = {Multi-functional systolic array with reconfigurable micro-power processing elements}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {813--820}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.019}, doi = {10.1016/J.MICROREL.2009.03.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MilovanovicNSM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MirandaMOHCCMLOH09, author = {Enrique Miranda and Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and Eamon O'Connor and G. Hughes and P. Casey and Karim Cherkaoui and S. Monaghan and R. Long and D. O'Connell and Paul K. Hurley}, title = {Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1052--1055}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.017}, doi = {10.1016/J.MICROREL.2009.06.017}, timestamp = {Tue, 11 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MirandaMOHCCMLOH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MisDM09, author = {Edward Mis and Andrzej Dziedzic and Witold Mielcarek}, title = {Microvaristors in thick-film and {LTCC} circuits}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {607--613}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.002}, doi = {10.1016/J.MICROREL.2009.03.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MisDM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MitsuiSL09, author = {Yasuhiro Mitsui and Takeshi Sunaoshi and Jon C. Lee}, title = {A study of electrical characteristic changes in {MOSFET} by electron beam irradiation}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1182--1187}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.019}, doi = {10.1016/J.MICROREL.2009.07.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MitsuiSL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MohankumarSS09, author = {N. Mohankumar and Binit Syamal and Chandan Kumar Sarkar}, title = {Investigation of novel attributes of single halo dual-material double gate MOSFETs for analog/RF applications}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1491--1497}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.006}, doi = {10.1016/J.MICROREL.2009.06.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MohankumarSS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MoliereFPB09, author = {F. Moli{\`{e}}re and B. Foucher and Philippe Perdu and Alain Bravaix}, title = {Analysis of deep submicron {VLSI} technological risks: {A} new qualification process for professional electronics}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1381--1385}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.001}, doi = {10.1016/J.MICROREL.2009.07.001}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MoliereFPB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MonfraixBMDC09, author = {Philippe Monfraix and Regis Barbaste and Jean Luc Muraro and Claude Drevon and Jean Louis Cazaux}, title = {Quasi hermetic packaging for new generation of spaceborn microwave equipment}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1326--1329}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.051}, doi = {10.1016/J.MICROREL.2009.07.051}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MonfraixBMDC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MuraV09, author = {Giovanna Mura and Massimo Vanzi}, title = {Lot reliability issues in commercial off the shelf {(COTS)} microelectronic devices}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1196--1199}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.042}, doi = {10.1016/J.MICROREL.2009.06.042}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MuraV09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MuzykovKZCBAS09, author = {Peter G. Muzykov and Robert M. Kennedy and Qingchun Zhang and Craig Capell and Al Burk and Anant Agarwal and Tangali S. Sudarshan}, title = {Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {32--37}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.009}, doi = {10.1016/J.MICROREL.2008.10.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MuzykovKZCBAS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NikolicSD09, author = {Tatjana R. Nikolic and Mile K. Stojcev and Goran Lj. Djordjevic}, title = {{CDMA} bus-based on-chip interconnect infrastructure}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {448--459}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.002}, doi = {10.1016/J.MICROREL.2009.02.002}, timestamp = {Wed, 11 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NikolicSD09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NogueiraVN09, author = {Eduardo Nogueira and Manuel V{\'{a}}zquez and Neftal{\'{\i}} N{\'{u}}{\~{n}}ez}, title = {Evaluation of AlGaInP LEDs reliability based on accelerated tests}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1240--1243}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.031}, doi = {10.1016/J.MICROREL.2009.06.031}, timestamp = {Sat, 05 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/NogueiraVN09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NoijenSTZ09, author = {S. P. M. Noijen and Olaf van der Sluis and P. H. M. Timmermans and G. Q. Zhang}, title = {Numerical prediction of failure paths at a roughened metal/polymer interface}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1315--1318}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.019}, doi = {10.1016/J.MICROREL.2009.06.019}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/NoijenSTZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NotermansQHMBZSKJ09, author = {Guido Notermans and Olivier Quittard and Anco Heringa and Zeljko Mrcarica and Fabrice Blanc and Hans van Zwol and Theo Smedes and Thomas Keller and Peter C. de Jong}, title = {{ESD} robust high-voltage active clamps}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1433--1439}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.055}, doi = {10.1016/J.MICROREL.2009.06.055}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NotermansQHMBZSKJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NowakMDK09, author = {Damian Nowak and Edward Mis and Andrzej Dziedzic and Jaroslaw Kita}, title = {Fabrication and electrical properties of laser-shaped thick-film and {LTCC} microresistors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {600--606}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.019}, doi = {10.1016/J.MICROREL.2009.02.019}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NowakMDK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/OngHOWVLYCTSHC09, author = {Xuefen Ong and Soon Wee Ho and Yue Ying Ong and Leong Ching Wai and Kripesh Vaidyanathan and Yeow Kheng Lim and David Yeo and Kai Chong Chan and Juan Boon Tan and Dong Kyun Sohn and Liang Choo Hsia and Zhong Chen}, title = {Underfill selection methodology for fine pitch Cu/low-k {FCBGA} packages}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {150--162}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.015}, doi = {10.1016/J.MICROREL.2008.11.015}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/OngHOWVLYCTSHC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Ortiz-CondeGMMRHL09, author = {Adelmo Ortiz{-}Conde and Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and Juan Muci and Denise C. Lugo Mu{\~{n}}oz and {\'{A}}lvaro D. Latorre Rey and Ching{-}Sung Ho and Juin J. Liou}, title = {Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in {MOSFET} parameter extraction}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {689--692}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.005}, doi = {10.1016/J.MICROREL.2009.05.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Ortiz-CondeGMMRHL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ParkFCJLBSBK09, author = {S. Y. Park and Carlo Floresca and Uttiya Chowdhury and Jose L. Jimenez and Cathy Lee and Edward Beam and Paul Saunier and Tony Balistreri and Moon J. Kim}, title = {Physical degradation of GaN {HEMT} devices under high drain bias reliability testing}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {478--483}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.015}, doi = {10.1016/J.MICROREL.2009.02.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ParkFCJLBSBK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ParkKS09, author = {Jong Kang Park and Jong Tae Kim and Myong{-}Chul Shin}, title = {A CORDIC-based digital protective relay and its architecture}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {438--447}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.008}, doi = {10.1016/J.MICROREL.2008.12.008}, timestamp = {Mon, 13 Feb 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ParkKS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Peng09, author = {Weiqun Peng}, title = {An investigation of Sn pest in pure Sn and Sn-based solders}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {86--91}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.001}, doi = {10.1016/J.MICROREL.2008.11.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Peng09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PiazzaDOMCW09, author = {Michele Piazza and Christian Dua and Mourad Oualli and Erwan Morvan and Dominique Carisetti and Fr{\'{e}}d{\'{e}}ric Wyczisk}, title = {Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1222--1225}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.043}, doi = {10.1016/J.MICROREL.2009.06.043}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PiazzaDOMCW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PietranicoPLKB09, author = {S. Pietranico and S. Pommier and St{\'{e}}phane Lefebvre and Zoubir Khatir and S. Bontemps}, title = {Characterisation of power modules ceramic substrates for reliability aspects}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1260--1266}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.026}, doi = {10.1016/J.MICROREL.2009.06.026}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PietranicoPLKB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Postel-PellerinLCBJBV09, author = {J{\'{e}}r{\'{e}}my Postel{-}Pellerin and Fr{\'{e}}d{\'{e}}ric Lalande and Pierre Canet and Rachid Bouchakour and F. Jeuland and B. Bertello and B. Villard}, title = {Extraction of 3D parasitic capacitances in 90 nm and 22 nm {NAND} flash memories}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1056--1059}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.020}, doi = {10.1016/J.MICROREL.2009.06.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Postel-PellerinLCBJBV09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Postel-PellerinLCBJM09, author = {J{\'{e}}r{\'{e}}my Postel{-}Pellerin and Fr{\'{e}}d{\'{e}}ric Lalande and Pierre Canet and Rachid Bouchakour and F. Jeuland and L. Morancho}, title = {Modeling charge variation during data retention of {MLC} Flash memories}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1060--1063}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.034}, doi = {10.1016/J.MICROREL.2009.06.034}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Postel-PellerinLCBJM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RahmanEAD09, author = {M. S. Rahman and E. K. Evangelou and I. I. Androulidakis and Athanasios Dimoulas}, title = {Study of stress-induced leakage current {(SILC)} in HfO\({}_{\mbox{2}}\)/Dy\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) high-kappa gate stacks on germanium}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {26--31}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.005}, doi = {10.1016/J.MICROREL.2008.10.005}, timestamp = {Thu, 05 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RahmanEAD09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RathiJGG09, author = {Servin Rathi and Jyotika Jogi and Mridula Gupta and R. S. Gupta}, title = {Modeling of hetero-interface potential and threshold voltage for tied and separate nanoscale InAlAs-InGaAs symmetric double-gate {HEMT}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1508--1514}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.044}, doi = {10.1016/J.MICROREL.2009.07.044}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RathiJGG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RegardGFPMJ09, author = {Charles Regard and Christian Gautier and H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and Patrick Poirier and Xiaosong Ma and Kaspar M. B. Jansen}, title = {Fast reliability qualification of SiP products}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {958--962}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.042}, doi = {10.1016/J.MICROREL.2009.07.042}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RegardGFPMJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RhewJLYY09, author = {Keun Ho Rhew and Su Chang Jeon and Dae Hee Lee and Byueng{-}Su Yoo and Ilgu Yun}, title = {Reliability assessment of 1.55-{\(\mathrm{\mu}\)}m vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {42--50}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.008}, doi = {10.1016/J.MICROREL.2008.10.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RhewJLYY09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RocaLMLP09, author = {M. Roca and Romain Laffont and Gilles Micolau and Fr{\'{e}}d{\'{e}}ric Lalande and O. Pizzuto}, title = {A Modelisation of the temperature dependence of the Fowler-Nordheim current in {EEPROM} memories}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1070--1073}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.036}, doi = {10.1016/J.MICROREL.2009.06.036}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RocaLMLP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RonchiZSTZM09, author = {Nicolo Ronchi and Franco Zanon and Antonio Stocco and Augusto Tazzoli and Enrico Zanoni and Gaudenzio Meneghesso}, title = {Reliability analysis of AlGaN/GaN {HEMT} on SopSiC composite substrate under long-term DC-life test}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1207--1210}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.018}, doi = {10.1016/J.MICROREL.2009.07.018}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RonchiZSTZM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RossiRNIBS09, author = {Lucio Rossi and Michele Riccio and Ettore Napoli and Andrea Irace and Giovanni Breglio and Paolo Spirito}, title = {1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1386--1390}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.038}, doi = {10.1016/J.MICROREL.2009.07.038}, timestamp = {Fri, 01 Dec 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RossiRNIBS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoyHT09, author = {Arijit Roy and Yuejin Hou and Cher Ming Tan}, title = {Electromigration in width transition copper interconnect}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1086--1089}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.038}, doi = {10.1016/J.MICROREL.2009.06.038}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoyHT09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RuanNPTPVICP09, author = {Jinyu Jason Ruan and Nicolas Nolhier and George J. Papaioannou and David Tr{\'{e}}mouilles and Vincent Puyal and C. Villeneuve and T. Idda and Fabio Coccetti and Robert Plana}, title = {Accelerated lifetime test of {RF-MEMS} switches under {ESD} stress}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1256--1259}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.023}, doi = {10.1016/J.MICROREL.2009.06.023}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RuanNPTPVICP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SabatCA09, author = {Samrat L. Sabat and Leandro dos Santos Coelho and Ajith Abraham}, title = {{MESFET} {DC} model parameter extraction using Quantum Particle Swarm Optimization}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {660--666}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.005}, doi = {10.1016/J.MICROREL.2009.03.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SabatCA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SanchezE09, author = {J. C. S{\'{a}}nchez and Magali Estrada}, title = {Stability of the {J-V} characteristics of (BEHP-PPV)-co-(MEH-PPV) based light-emitting diodes}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1503--1507}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.053}, doi = {10.1016/J.MICROREL.2009.07.053}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SanchezE09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SarkarMS09, author = {Partha Sarkar and Abhijit Mallik and Chandan Kumar Sarkar}, title = {Study on the performance of sub 100 nm {LACLATI} MOSFETs for digital application}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {392--396}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.015}, doi = {10.1016/J.MICROREL.2008.12.015}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SarkarMS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SauveplaneSD09, author = {Jean{-}Baptiste Sauveplane and Emmanuel Scheid and A. Deram}, title = {On the accurate determination of the thermomechanical properties of micro-scale material: Application to AlSi\({}_{\mbox{1{\%}}}\) chip metallization of a power semiconductor device}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {499--505}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.012}, doi = {10.1016/J.MICROREL.2009.02.012}, timestamp = {Fri, 06 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SauveplaneSD09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Scheuermann09, author = {Uwe Scheuermann}, title = {Reliability challenges of automotive power electronics}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1319--1325}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.045}, doi = {10.1016/J.MICROREL.2009.06.045}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Scheuermann09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchlangenLKLEB09, author = {Rudolf Schlangen and Reiner Leihkauf and Uwe Kerst and Ted R. Lundquist and Peter Egger and Christian Boit}, title = {Physical analysis, trimming and editing of nanoscale {IC} function with backside {FIB} processing}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1158--1164}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.048}, doi = {10.1016/J.MICROREL.2009.06.048}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchlangenLKLEB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SeoKSL09, author = {Sun{-}Kyoung Seo and Sung K. Kang and Da{-}Yuan Shih and Hyuck Mo Lee}, title = {The evolution of microstructure and microhardness of Sn-Ag and Sn-Cu solders during high temperature aging}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {288--295}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.014}, doi = {10.1016/J.MICROREL.2008.11.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SeoKSL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShanHH09, author = {Yi Shan and John He and Wen Huang}, title = {New substrate-triggered {ESD} protection structures in a 0.18-{\(\mathrm{\mu}\)}m {CMOS} process without extra mask}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {17--25}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.003}, doi = {10.1016/J.MICROREL.2008.10.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ShanHH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SharmaGGG09, author = {Rupendra Kumar Sharma and Ritesh Gupta and Mridula Gupta and R. S. Gupta}, title = {Dynamic performance of graded channel {DG} {FD} {SOI} n-MOSFETs for minimizing the gate misalignment effect}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {699--706}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.023}, doi = {10.1016/J.MICROREL.2009.03.023}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SharmaGGG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShenC09, author = {Jun Shen and Y. C. Chan}, title = {Research advances in nano-composite solders}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {223--234}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.004}, doi = {10.1016/J.MICROREL.2008.10.004}, timestamp = {Wed, 17 Nov 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ShenC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShihY09, author = {Meng{-}Fu Shih and Wen{-}Bin Young}, title = {Experimental study of filling behaviors in the underfill encapsulation of a flip-chip}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1555--1562}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.056}, doi = {10.1016/J.MICROREL.2009.07.056}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ShihY09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SilvaRR09, author = {Digeorgia N. da Silva and Andr{\'{e}} In{\'{a}}cio Reis and Renato P. Ribas}, title = {{CMOS} logic gate performance variability related to transistor network arrangements}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {977--981}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.023}, doi = {10.1016/J.MICROREL.2009.07.023}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SilvaRR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SinkovicsK09, author = {B{\'{a}}lint Sinkovics and Oliv{\'{e}}r Krammer}, title = {Board level investigation of {BGA} solder joint deformation strength}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {573--578}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.021}, doi = {10.1016/J.MICROREL.2009.02.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SinkovicsK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SiuWTKI09, author = {Sik{-}Lam Siu and Hei Wong and Wing{-}Shan Tam and Kuniyuki Kakushima and Hiroshi Iwai}, title = {Subthreshold parameters of radio-frequency multi-finger nanometer {MOS} transistors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {387--391}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.004}, doi = {10.1016/J.MICROREL.2009.01.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SiuWTKI09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SkwarekWR09, author = {Agata Skwarek and Krzysztof Witek and Jacek Ratajczak}, title = {Risk of whiskers formation on the surface of commercially available tin-rich alloys under thermal shocks}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {569--572}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.026}, doi = {10.1016/J.MICROREL.2009.02.026}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SkwarekWR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SluisETZ09, author = {Olaf van der Sluis and R. A. B. Engelen and P. H. M. Timmermans and G. Q. Zhang}, title = {Numerical analysis of delamination and cracking phenomena in multi-layered flexible electronics}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {853--860}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.013}, doi = {10.1016/J.MICROREL.2009.03.013}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SluisETZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Smedes09, author = {Theo Smedes}, title = {{ESD} testing of devices, ICs and systems}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {941--945}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.013}, doi = {10.1016/J.MICROREL.2009.07.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Smedes09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SmetanaBSLS09, author = {Walter Smetana and Bruno Balluch and G{\"{u}}nther Stangl and Sigrid L{\"{u}}ftl and Sabine Seidler}, title = {Processing procedures for the realization of fine structured channel arrays and bridging elements by LTCC-Technology}, journal = {Microelectron. Reliab.}, volume = {49}, number = {6}, pages = {592--599}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.023}, doi = {10.1016/J.MICROREL.2009.02.023}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SmetanaBSLS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SokolovicLZ09, author = {Miljana Sokolovic and Vanco B. Litovski and Mark Zwolinski}, title = {New concepts of worst-case delay and yield estimation in asynchronous {VLSI} circuits}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {186--198}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.007}, doi = {10.1016/J.MICROREL.2008.11.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SokolovicLZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SrivastavaSS09, author = {A. Srivastava and Partha Sarkar and Chandan Kumar Sarkar}, title = {Study of gate dielectric permittivity variation with different equivalent oxide thickness on channel engineered deep sub-micrometer n-MOSFET device for mixed signal applications}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {365--370}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.008}, doi = {10.1016/J.MICROREL.2008.11.008}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SrivastavaSS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/StadlerBGG09, author = {Wolfgang Stadler and Tilo Brodbeck and Reinhold G{\"{a}}rtner and Harald Gossner}, title = {Do {ESD} fails in systems correlate with {IC} {ESD} robustness?}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1079--1085}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.029}, doi = {10.1016/J.MICROREL.2009.07.029}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/StadlerBGG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TahooriAMK09, author = {Mehdi Baradaran Tahoori and Hossein Asadi and Brian Mullins and David R. Kaeli}, title = {Obtaining {FPGA} soft error rate in high performance information systems}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {551--557}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.004}, doi = {10.1016/J.MICROREL.2009.03.004}, timestamp = {Fri, 14 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TahooriAMK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanCXL09, author = {Cher Ming Tan and Boon Khai Eric Chen and Gan Xu and Yuanjie Liu}, title = {Analysis of humidity effects on the degradation of high-power white LEDs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1226--1230}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.005}, doi = {10.1016/J.MICROREL.2009.07.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanCXL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanZLT09, author = {Long Bin Tan and Xiaowu Zhang and Chwee Teck Lim and Vincent B. C. Tan}, title = {Mapping the failure envelope of board-level solder joints}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {397--409}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.013}, doi = {10.1016/J.MICROREL.2008.12.013}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanZLT09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Tanner09, author = {D. M. Tanner}, title = {{MEMS} reliability: Where are we now?}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {937--940}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.014}, doi = {10.1016/J.MICROREL.2009.06.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Tanner09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TazzoliCAM09, author = {Augusto Tazzoli and Lorenzo Cerati and A. Andreini and Gaudenzio Meneghesso}, title = {Breakdown characterization of gate oxides in 35 and 70 {\AA} {BCD8} smart power technology}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1111--1115}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.020}, doi = {10.1016/J.MICROREL.2009.07.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TazzoliCAM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ThangaduraiKME09, author = {P. Thangadurai and W. D. Kaplan and V. Mikhelashvili and Gadi Eisenstein}, title = {The influence of electron-beam irradiation on electrical characteristics of metal-insulator-semiconductor capacitors based on a high-k dielectric stack of HfTiSiO(N) and HfTiO(N) layers}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {716--720}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.003}, doi = {10.1016/J.MICROREL.2009.04.003}, timestamp = {Mon, 28 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ThangaduraiKME09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TiedemannKFHPB09, author = {A.{-}K. Tiedemann and K. Kurz and M. Fakhri and Ralf Heiderhoff and J. C. H. Phang and L. J. Balk}, title = {Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1165--1168}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.030}, doi = {10.1016/J.MICROREL.2009.06.030}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TiedemannKFHPB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TrivellinMMZOYTU09, author = {Nicola Trivellin and Matteo Meneghini and Gaudenzio Meneghesso and Enrico Zanoni and Kenji Orita and Masaaki Yuri and Tsuyoshi Tanaka and Daisuke Ueda}, title = {Reliability analysis of InGaN Blu-Ray laser diode}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1236--1239}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.002}, doi = {10.1016/J.MICROREL.2009.07.002}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TrivellinMMZOYTU09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TyaginovSSGG09, author = {Stanislav Tyaginov and Viktor Sverdlov and Ivan A. Starkov and Wolfgang G{\"{o}}s and Tibor Grasser}, title = {Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {998--1002}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.018}, doi = {10.1016/J.MICROREL.2009.06.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TyaginovSSGG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VassilevS09, author = {Vesselin K. Vassilev and Wolfgang Stadler}, title = {Editorial {ESD} reliability special section}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1405--1406}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.10.013}, doi = {10.1016/J.MICROREL.2009.10.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VassilevS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VriesJD09, author = {J. de Vries and M. Jansen and Willem D. van Driel}, title = {Solder-joint reliability of HVQFN-packages subjected to thermal cycling}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {331--339}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.007}, doi = {10.1016/J.MICROREL.2008.12.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VriesJD09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WangLK09, author = {Yi{-}Wun Wang and Y. W. Lin and C. Robert Kao}, title = {Kirkendall voids formation in the reaction between Ni-doped SnAg lead-free solders and different Cu substrates}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {248--252}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.09.010}, doi = {10.1016/J.MICROREL.2008.09.010}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/WangLK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Whitman09, author = {Charles S. Whitman}, title = {Prediction of transmission line lifetimes over temperature and current density}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {488--494}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.006}, doi = {10.1016/J.MICROREL.2009.02.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Whitman09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WolfGW09, author = {Heinrich Wolf and Horst A. Gieser and Dirk Walter}, title = {Investigating the {CDM} susceptibility of IC's at package and wafer level by capacitive coupled {TLP}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1476--1481}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.10.006}, doi = {10.1016/J.MICROREL.2009.10.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WolfGW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongFLY09, author = {Hei Wong and Y. Fu and Juin J. Liou and Y. Yue}, title = {Hot-carrier reliability and breakdown characteristics of multi-finger {RF} {MOS} transistors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {13--16}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.011}, doi = {10.1016/J.MICROREL.2008.10.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongFLY09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongM09, author = {Ee{-}Hua Wong and Yiu{-}Wing Mai}, title = {The damped dynamics of printed circuit board and analysis of distorted and deformed half-sine excitation}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {916--923}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.05.007}, doi = {10.1016/J.MICROREL.2009.05.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongM09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongSDCOL09, author = {Ee{-}Hua Wong and S. K. W. Seah and W. D. van Driel and J. F. J. M. Caers and N. Owens and Y.{-}S. Lai}, title = {Advances in the drop-impact reliability of solder joints for mobile applications}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {139--149}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.001}, doi = {10.1016/J.MICROREL.2008.12.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongSDCOL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongTSCLKW09, author = {Oi{-}Ying Wong and Wing{-}Shan Tam and Oi{-}Kan Shea and Shiu Hung Cheung and Jun Liu and Chi{-}Wah Kok and Hei Wong}, title = {Effects of periphery encapsulation material on the characteristics of micro vacuum dielectric capacitor}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {506--509}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.022}, doi = {10.1016/J.MICROREL.2009.02.022}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongTSCLKW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WuD09, author = {Albert T. Wu and Y. C. Ding}, title = {The suppression of tin whisker growth by the coating of tin oxide nano particles and surface treatment}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {318--322}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.002}, doi = {10.1016/J.MICROREL.2008.11.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WuD09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Wymyslowski09, author = {Artur Wymyslowski}, title = {Guest Editorial: 2008 EuroSimE international conference on thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {823--824}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.007}, doi = {10.1016/J.MICROREL.2009.04.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Wymyslowski09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/XieKLLZ09, author = {Huimin Xie and Satoshi Kishimoto and Yanjie Li and Qingjun Liu and Yapu Zhao}, title = {Fabrication of micro-moir{\'{e}} gratings on a strain sensor structure for deformation analysis with micro-moir{\'{e}} technique}, journal = {Microelectron. Reliab.}, volume = {49}, number = {7}, pages = {727--733}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.04.005}, doi = {10.1016/J.MICROREL.2009.04.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/XieKLLZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YamashitaOKMTMMMNN09, author = {Masatsugu Yamashita and Chiko Otani and Sunmi Kim and Hironaru Murakami and Masayoshi Tonouchi and Toru Matsumoto and Yoshihiro Midoh and Katsuyoshi Miura and Koji Nakamae and Kiyoshi Nikawa}, title = {Laser THz emission microscope as a novel tool for {LSI} failure analysis}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1116--1126}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.047}, doi = {10.1016/J.MICROREL.2009.07.047}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YamashitaOKMTMMMNN09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangB09, author = {Liyu Yang and Joseph B. Bernstein}, title = {Failure rate estimation of known failure mechanisms of electronic packages}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1563--1572}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.005}, doi = {10.1016/J.MICROREL.2009.06.005}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YangB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangBK09, author = {Liyu Yang and Joseph B. Bernstein and T. Koschmieder}, title = {Assessment of acceleration models used for {BGA} solder joint reliability studies}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1546--1554}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.054}, doi = {10.1016/J.MICROREL.2009.07.054}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YangBK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangHLC09, author = {Zunxian Yang and Yun Huang and Xinxin Li and Guonan Chen}, title = {Investigation and simulation on the dynamic shock response performance of packaged high-g {MEMS} accelerometer versus the impurity concentration of the piezoresistor}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {510--516}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.018}, doi = {10.1016/J.MICROREL.2009.02.018}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YangHLC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangP09, author = {Yue{-}Tzu Yang and Huan{-}Sen Peng}, title = {Investigation of planted pin fins for heat transfer enhancement in plate fin heat sink}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {163--169}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.011}, doi = {10.1016/J.MICROREL.2008.11.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YarimbiyikSAVZ09, author = {A. Emre Yarimbiyik and Harry A. Schafft and Richard A. Allen and Mark D. Vaudin and Mona E. Zaghloul}, title = {Experimental and simulation studies of resistivity in nanoscale copper films}, journal = {Microelectron. Reliab.}, volume = {49}, number = {2}, pages = {127--134}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.11.003}, doi = {10.1016/J.MICROREL.2008.11.003}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YarimbiyikSAVZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZaalHDZ09, author = {Jeroen J. M. Zaal and Hendrik Pieter Hochstenbach and Willem D. van Driel and G. Q. Zhang}, title = {Solder interconnect reliability under drop impact loading conditions using High-speed Cold Bump Pull}, journal = {Microelectron. Reliab.}, volume = {49}, number = {8}, pages = {846--852}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.03.008}, doi = {10.1016/J.MICROREL.2009.03.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZaalHDZ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZaghloulPCPP09, author = {Usama Zaghloul and George J. Papaioannou and Fabio Coccetti and Patrick Pons and Robert Plana}, title = {Dielectric charging in silicon nitride films for {MEMS} capacitive switches: Effect of film thickness and deposition conditions}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1309--1314}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.006}, doi = {10.1016/J.MICROREL.2009.07.006}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ZaghloulPCPP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhangDS09, author = {Bo Zhang and Han Ding and Xinjun Sheng}, title = {Reliability study of board-level lead-free interconnections under sequential thermal cycling and drop impact}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {530--536}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.024}, doi = {10.1016/J.MICROREL.2009.02.024}, timestamp = {Wed, 02 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhangDS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhangZGX09, author = {Ruihong Zhang and Ran Zhao and Fu Guo and Zhidong Xia}, title = {Interfacial reaction between the electroless nickel immersion gold substrate and Sn-based solders}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {303--309}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.12.016}, doi = {10.1016/J.MICROREL.2008.12.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhangZGX09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhaoP09, author = {Shufeng Zhao and Xingshou Pang}, title = {Investigation of delamination control in plastic package}, journal = {Microelectron. Reliab.}, volume = {49}, number = {3}, pages = {350--356}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.001}, doi = {10.1016/J.MICROREL.2009.01.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhaoP09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhuC09, author = {Jianxin Zhu and Zhihua Chen}, title = {High-accurate computation of wave propagation in complex waveguides for microchip optical interconnections}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {562--565}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.011}, doi = {10.1016/J.MICROREL.2009.02.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhuC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhuS09, author = {Jianxin Zhu and Rencheng Song}, title = {Fast and stable computation of optical propagation in micro-waveguides with loss}, journal = {Microelectron. Reliab.}, volume = {49}, number = {12}, pages = {1529--1536}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.004}, doi = {10.1016/J.MICROREL.2009.06.004}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhuS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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