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@inproceedings{DBLP:conf/natw/ChauhanKO16,
  author       = {Hari Chauhan and
                  Vladimir Kvartenko and
                  Marvin Onabajo},
  title        = {A Tuning Technique for Temperature and Process Variation Compensation
                  of Power Amplifiers with Digital Predistortion},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {38--45},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.12},
  doi          = {10.1109/NATW.2016.12},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/ChauhanKO16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/ChoiKJ16,
  author       = {Yongsuk Choi and
                  Yong{-}Bin Kim and
                  In{-}Seok Jung},
  title        = {A 100MS/s 10-bit Split-SAR {ADC} with Capacitor Mismatch Compensation
                  Using Built-In Calibration},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.9},
  doi          = {10.1109/NATW.2016.9},
  timestamp    = {Fri, 26 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/ChoiKJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/GhoshO16,
  author       = {Malinky Ghosh and
                  Kelly A. Ockunzzi},
  title        = {Automated and Reusable {IP} Functional Test Rule Development across
                  Multiple {IP} Instances within and across Asic Designs},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {34--37},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.13},
  doi          = {10.1109/NATW.2016.13},
  timestamp    = {Fri, 26 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/GhoshO16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/IslamK16,
  author       = {Md. Nazmul Islam and
                  Sandip Kundu},
  title        = {Modeling Residual Life of an {IC} Considering Multiple Aging Mechanisms},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {24--27},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.17},
  doi          = {10.1109/NATW.2016.17},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/natw/IslamK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/LiuYQHF16,
  author       = {Xiao Liu and
                  Changkai Yu and
                  Yu Qi and
                  Yu Huang and
                  James Fu},
  title        = {Case Study of Testing a SoC Design with Mixed {EDT} Channel Sharing
                  and Channel Broadcasting},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {12--17},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.10},
  doi          = {10.1109/NATW.2016.10},
  timestamp    = {Fri, 26 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/LiuYQHF16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/NguyenTBLCCGCG16,
  author       = {Joseph Nguyen and
                  David Turgis and
                  David Bonciani and
                  Brice Lhomme and
                  Yann Carminati and
                  Olivier Callen and
                  Guillaume Guirleo and
                  Lorenzo Ciampolini and
                  G{\'{e}}rard Ghibaudo},
  title        = {{RAPIDO} Testing and Modeling of Assisted Write and Read Operations
                  for SRAMs},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {28--33},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.14},
  doi          = {10.1109/NATW.2016.14},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/natw/NguyenTBLCCGCG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/ShahshahaniTZ16,
  author       = {Amirhossein Shahshahani and
                  Andrey Tolstikhin and
                  Zeljko Zilic},
  title        = {Enabling Debug in IoT Wireless Development and Deployment with Security
                  Considerations},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {53--58},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.16},
  doi          = {10.1109/NATW.2016.16},
  timestamp    = {Fri, 26 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/ShahshahaniTZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/Venkatasubramanian16,
  author       = {Muralidharan Venkatasubramanian and
                  Vishwani D. Agrawal},
  title        = {Failures Guide Probabilistic Search for a Hard-to-Find Test},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {18--23},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.18},
  doi          = {10.1109/NATW.2016.18},
  timestamp    = {Fri, 26 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/Venkatasubramanian16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/ZhangJCKK16,
  author       = {Chen Zhang and
                  Gyunam Jeon and
                  Yongsuk Choi and
                  Yong{-}Bin Kim and
                  Kyung Ki Kim},
  title        = {An Area Efficient 4Gb/s Half-Rate 3-Tap {DFE} with Current-Integrating
                  Summer for Data Correction},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {6--11},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.11},
  doi          = {10.1109/NATW.2016.11},
  timestamp    = {Fri, 26 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/ZhangJCKK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/ZhangSSNDMGBCP16,
  author       = {Fanchen Zhang and
                  Yi Sun and
                  Xi Shen and
                  Kundan Nepal and
                  Jennifer Dworak and
                  Theodore W. Manikas and
                  Ping Gui and
                  R. Iris Bahar and
                  Al Crouch and
                  John C. Potter},
  title        = {Using Existing Reconfigurable Logic in 3D Die Stacks for Test},
  booktitle    = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  pages        = {46--52},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NATW.2016.15},
  doi          = {10.1109/NATW.2016.15},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/natw/ZhangSSNDMGBCP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/natw/2016,
  title        = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
                  RI, USA, May 9-11, 2016},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/7557345/proceeding},
  isbn         = {978-1-4673-8949-5},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/2016.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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