Search dblp for Publications

export results for "toc:db/journals/mr/mr57.bht:"

 download as .bib file

@article{DBLP:journals/mr/BarlettaN16,
  author       = {Giacomo Barletta and
                  V. C. Ngwan},
  title        = {Study of gate leakage mechanism in advanced charge-coupled {MOSFET}
                  {(CC-MOSFET)} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {20--23},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.11.019},
  doi          = {10.1016/J.MICROREL.2015.11.019},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BarlettaN16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ChaoHCLHKL16,
  author       = {Shin{-}Hua Chao and
                  Chih{-}Ping Hung and
                  Mark Chen and
                  Youru Lee and
                  Joey Huang and
                  Golden Kao and
                  Ding{-}Bang Luh},
  title        = {An embedded trace {FCCSP} substrate without glass cloth},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {101--110},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.11.016},
  doi          = {10.1016/J.MICROREL.2015.11.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChaoHCLHKL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/DengYWHW16,
  author       = {Tengfei Deng and
                  Cong Ye and
                  Jiaji Wu and
                  Pin He and
                  Hao Wang},
  title        = {Improved performance of ITO/TiO\({}_{\mbox{2}}\)/HfO\({}_{\mbox{2}}\)/Pt
                  random resistive accessory memory by nitrogen annealing treatment},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {34--38},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.11.018},
  doi          = {10.1016/J.MICROREL.2015.11.018},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DengYWHW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HuangHZWTBZ16,
  author       = {Huixiang Huang and
                  Yanyan Huang and
                  Jiachun Zheng and
                  Sufen Wei and
                  Kai Tang and
                  Dawei Bi and
                  Zhengxuan Zhang},
  title        = {Hardening silicon-on-insulator nMOSFETs by multiple-step Si\({}^{\mbox{+}}\)
                  implantation},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {1--9},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.015},
  doi          = {10.1016/J.MICROREL.2015.12.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangHZWTBZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/JanAHKAS16,
  author       = {Mohammad Tariq Jan and
                  Farooq Ahmad and
                  Nor Hisham Hamid and
                  Mohd Haris M. Khir and
                  Khalid Ashraf and
                  Muhammad Shoaib},
  title        = {Temperature dependent Young's modulus and quality factor of {CMOS-MEMS}
                  resonator: Modelling and experimental approach},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {64--70},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.003},
  doi          = {10.1016/J.MICROREL.2015.12.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JanAHKAS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/JiXLTL16,
  author       = {Feng Ji and
                  Jing{-}Ping Xu and
                  Lu Liu and
                  Wing Man Tang and
                  Pui To Lai},
  title        = {A 2-D analytical threshold-voltage model for GeOI/GeON {MOSFET} with
                  high-k gate dielectric},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {24--33},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.004},
  doi          = {10.1016/J.MICROREL.2015.12.004},
  timestamp    = {Thu, 06 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/JiXLTL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/KamalXPAS16,
  author       = {Mehdi Kamal and
                  Qing Xie and
                  Massoud Pedram and
                  Ali Afzali{-}Kusha and
                  Saeed Safari},
  title        = {An efficient temperature dependent hot carrier injection reliability
                  simulation flow},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {10--19},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.008},
  doi          = {10.1016/J.MICROREL.2015.12.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KamalXPAS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/MingYMSX16,
  author       = {Ming Zhou and
                  Xiao De Yuan and
                  Peng Shi Min and
                  Hong Zhong Shan and
                  Shu Yi Xie},
  title        = {Experimental study of multilayer SiCN barrier film in 45/40 nm technological
                  node and beyond},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {86--92},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.001},
  doi          = {10.1016/J.MICROREL.2015.12.001},
  timestamp    = {Thu, 23 Dec 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MingYMSX16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ParkK16,
  author       = {Sung{-}Ho Park and
                  Jae Hoon Kim},
  title        = {Lifetime estimation of {LED} lamp using gamma process model},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {71--78},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.006},
  doi          = {10.1016/J.MICROREL.2015.12.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ParkK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ParkLYB16,
  author       = {Kyungbae Park and
                  Chul Seung Lim and
                  Donghyuk Yun and
                  Sanghyeon Baeg},
  title        = {Experiments and root cause analysis for active-precharge hammering
                  fault in {DDR3} {SDRAM} under 3 {\texttimes} nm technology},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {39--46},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.027},
  doi          = {10.1016/J.MICROREL.2015.12.027},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ParkLYB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SalmanFCEB16,
  author       = {Akram A. Salman and
                  Farzan Farbiz and
                  Ann Concannon and
                  Hal Edwards and
                  Gianluca Boselli},
  title        = {Improved inductive-system-level {IEC} {ESD} performance for automotive
                  applications using mutual ballasted {ESD} protection technique},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {47--52},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.011},
  doi          = {10.1016/J.MICROREL.2015.12.011},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SalmanFCEB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ScholzCHL16,
  author       = {Mirko Scholz and
                  Shih{-}Hung Chen and
                  Geert Hellings and
                  Dimitri Linten},
  title        = {Impact of on- and off-chip protection on the transient-induced latch-up
                  sensitivity of {CMOS} {IC}},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {53--58},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.009},
  doi          = {10.1016/J.MICROREL.2015.12.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ScholzCHL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SrivastavaWQM16,
  author       = {Ankit Srivastava and
                  Gene Worley and
                  Xiaohong Quan and
                  Guoqing Miao},
  title        = {{ESD} protection for negative charge pump {(CP)} using {CP} internal
                  switches},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {59--63},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.012},
  doi          = {10.1016/J.MICROREL.2015.12.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SrivastavaWQM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WangHCE16,
  author       = {Ran Wang and
                  Jie Han and
                  Bruce F. Cockburn and
                  Duncan G. Elliott},
  title        = {Design, evaluation and fault-tolerance analysis of stochastic {FIR}
                  filters},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {111--127},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.11.017},
  doi          = {10.1016/J.MICROREL.2015.11.017},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WangHCE16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WangZMCLLCZS16,
  author       = {X. Y. Wang and
                  H. Zhang and
                  X. P. Ma and
                  Q. Cheng and
                  C. G. Li and
                  M. X. Li and
                  T. N. Chen and
                  P. Zhang and
                  J. Q. Shao},
  title        = {Degradation behavior and mechanism of polymer films for high-ohmic
                  resistor protection in a heat and humid environment},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {79--85},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.005},
  doi          = {10.1016/J.MICROREL.2015.12.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WangZMCLLCZS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/YimK16,
  author       = {Byung{-}seung Yim and
                  Jong{-}Min Kim},
  title        = {Thermo-mechanical reliability of a multi-walled carbon nanotube-incorporated
                  solderable isotropic conductive adhesive},
  journal      = {Microelectron. Reliab.},
  volume       = {57},
  pages        = {93--100},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.014},
  doi          = {10.1016/J.MICROREL.2015.12.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YimK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.