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@article{DBLP:journals/et/AbadirA94,
author = {Magdy S. Abadir and
Tony Ambler},
title = {Introduction},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {129--130},
year = {1994},
url = {https://doi.org/10.1007/BF00972073},
doi = {10.1007/BF00972073},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AbadirA94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AbadirPBSM94,
author = {Magdy S. Abadir and
Ashish Parikh and
Linda Bal and
Peter Sandborn and
Cynthia F. Murphy},
title = {High Level Test Economics Advisor (Hi-TEA)},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {195--206},
year = {1994},
url = {https://doi.org/10.1007/BF00972079},
doi = {10.1007/BF00972079},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AbadirPBSM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal94,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {5},
year = {1994},
url = {https://doi.org/10.1007/BF00971956},
doi = {10.1007/BF00971956},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal94a,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {127},
year = {1994},
url = {https://doi.org/10.1007/BF00972072},
doi = {10.1007/BF00972072},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal94a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal94b,
author = {Vishwani D. Agrawal},
title = {A tale of two designs: the cheapest and the most economic},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {131--135},
year = {1994},
url = {https://doi.org/10.1007/BF00972074},
doi = {10.1007/BF00972074},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal94b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal94c,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {5},
number = {4},
pages = {317},
year = {1994},
url = {https://doi.org/10.1007/BF00972515},
doi = {10.1007/BF00972515},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal94c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AlexanderSE94,
author = {Mathew Alexander and
K. Sr{\'{\i}}hari and
C. Robert Emerson},
title = {Cost based surface mount {PCB} design evaluation},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {229--238},
year = {1994},
url = {https://doi.org/10.1007/BF00972082},
doi = {10.1007/BF00972082},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AlexanderSE94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BusabaL94,
author = {Fadi Y. Busaba and
Parag K. Lala},
title = {Self-checking combinational circuit design for single and unidirectional
multibit error},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {19--28},
year = {1994},
url = {https://doi.org/10.1007/BF00971960},
doi = {10.1007/BF00971960},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BusabaL94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChakrabortyM94,
author = {Kanad Chakraborty and
Pinaki Mazumder},
title = {Technology and layout-related testing of static random-access memories},
journal = {J. Electron. Test.},
volume = {5},
number = {4},
pages = {347--365},
year = {1994},
url = {https://doi.org/10.1007/BF00972519},
doi = {10.1007/BF00972519},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChakrabortyM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChakradharAB94,
author = {Srimat T. Chakradhar and
Vishwani D. Agrawal and
Michael L. Bushnell},
title = {Energy minimization and design for testability},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {57--66},
year = {1994},
url = {https://doi.org/10.1007/BF00971963},
doi = {10.1007/BF00971963},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChakradharAB94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChowdhurySC94,
author = {Dipanwita Roy Chowdhury and
Indranil Sengupta and
Parimal Pal Chaudhuri},
title = {A class of two-dimensional cellular automata and their applications
in random pattern testing},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {67--82},
year = {1994},
url = {https://doi.org/10.1007/BF00971964},
doi = {10.1007/BF00971964},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChowdhurySC94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Cockburn94,
author = {Bruce F. Cockburn},
title = {Deterministic tests for detecting single\emph{V}-coupling faults in
RAMs},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {91--113},
year = {1994},
url = {https://doi.org/10.1007/BF00971966},
doi = {10.1007/BF00971966},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Cockburn94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Cockburn94a,
author = {Bruce F. Cockburn},
title = {Tutorial on semiconductor memory testing},
journal = {J. Electron. Test.},
volume = {5},
number = {4},
pages = {321--336},
year = {1994},
url = {https://doi.org/10.1007/BF00972517},
doi = {10.1007/BF00972517},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Cockburn94a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Davis94,
author = {Brendan Davis},
title = {Economic modeling of board test strategies},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {157--169},
year = {1994},
url = {https://doi.org/10.1007/BF00972076},
doi = {10.1007/BF00972076},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Davis94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DearDAD94,
author = {I. D. Dear and
Chryssa Dislis and
Anthony P. Ambler and
J. H. Dick},
title = {Test strategy planning using economic analysis},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {137--155},
year = {1994},
url = {https://doi.org/10.1007/BF00972075},
doi = {10.1007/BF00972075},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DearDAD94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DickTDA94,
author = {J. H. Dick and
Erwin Trischler and
Chryssa Dislis and
Anthony P. Ambler},
title = {Sensitivity analysis in economics based test strategy planning},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {239--251},
year = {1994},
url = {https://doi.org/10.1007/BF00972083},
doi = {10.1007/BF00972083},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DickTDA94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FaresK94,
author = {Mounir Fares and
Bozena Kaminska},
title = {Fuzzy optimization models for analog test decisions},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {299--305},
year = {1994},
url = {https://doi.org/10.1007/BF00972089},
doi = {10.1007/BF00972089},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FaresK94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GoorZ94,
author = {Ad J. van de Goor and
Yervant Zorian},
title = {Effective march algorithms for testing single-order addressed memories},
journal = {J. Electron. Test.},
volume = {5},
number = {4},
pages = {337--345},
year = {1994},
url = {https://doi.org/10.1007/BF00972518},
doi = {10.1007/BF00972518},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GoorZ94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KebichiYN94,
author = {O. Kebichi and
Vyacheslav N. Yarmolik and
Michael Nicolaidis},
title = {Zero aliasing {ROM} {BIST}},
journal = {J. Electron. Test.},
volume = {5},
number = {4},
pages = {377--388},
year = {1994},
url = {https://doi.org/10.1007/BF00972521},
doi = {10.1007/BF00972521},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KebichiYN94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KunzmannB94,
author = {Arno Kunzmann and
Frank B{\"{o}}hland},
title = {Self-test of sequential circuits with deterministic test pattern sequences},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {307--312},
year = {1994},
url = {https://doi.org/10.1007/BF00972090},
doi = {10.1007/BF00972090},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KunzmannB94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaciiM94,
author = {Enrico Macii and
Angelo Raffaele Meo},
title = {A test generation program for sequential circuits},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {115--119},
year = {1994},
url = {https://doi.org/10.1007/BF00971967},
doi = {10.1007/BF00971967},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaciiM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MajumdarV94,
author = {Amitava Majumdar and
Sarma B. K. Vrudhula},
title = {Techniques for estimating test length under random test},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {285--297},
year = {1994},
url = {https://doi.org/10.1007/BF00972088},
doi = {10.1007/BF00972088},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MajumdarV94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Mazumder94,
author = {Pinaki Mazumder},
title = {Guest editor's introduction},
journal = {J. Electron. Test.},
volume = {5},
number = {4},
pages = {319--320},
year = {1994},
url = {https://doi.org/10.1007/BF00972516},
doi = {10.1007/BF00972516},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Mazumder94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Millman94,
author = {Steven D. Millman},
title = {Improving quality: Yield versus test coverage},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {253--261},
year = {1994},
url = {https://doi.org/10.1007/BF00972084},
doi = {10.1007/BF00972084},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Millman94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MujumdarJS94,
author = {Ashutosh Mujumdar and
Rajiv Jain and
Kewal K. Saluja},
title = {Incorporating testability considerations in high-level synthesis},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {43--55},
year = {1994},
url = {https://doi.org/10.1007/BF00971962},
doi = {10.1007/BF00971962},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MujumdarJS94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NicolaidisKA94,
author = {Michael Nicolaidis and
O. Kebichi and
Vladimir Castro Alves},
title = {Trade-offs in scan path and {BIST} implementations for RAMs},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {273--283},
year = {1994},
url = {https://doi.org/10.1007/BF00972087},
doi = {10.1007/BF00972087},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NicolaidisKA94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PilarskiIK94,
author = {Slawomir Pilarski and
Andr{\'{e}} Ivanov and
Tiko Kameda},
title = {On minimizing aliasing in scan-based compaction},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {83--90},
year = {1994},
url = {https://doi.org/10.1007/BF00971965},
doi = {10.1007/BF00971965},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PilarskiIK94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RaoHY94,
author = {Shekar Rao and
Bert Haskell and
Ian Yee},
title = {Trade-off analysis on cost and manufacturing technology of an electronic
product: Case study},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {219--228},
year = {1994},
url = {https://doi.org/10.1007/BF00972081},
doi = {10.1007/BF00972081},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RaoHY94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Reventlow94,
author = {Christian von Reventlow},
title = {Comparing quality assurance methods and the resulting design strategies:
Experiences from complex designs},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {269--272},
year = {1994},
url = {https://doi.org/10.1007/BF00972086},
doi = {10.1007/BF00972086},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Reventlow94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Saluja94,
author = {Kewal K. Saluja},
title = {On-chip testing of random access memories},
journal = {J. Electron. Test.},
volume = {5},
number = {4},
pages = {367--376},
year = {1994},
url = {https://doi.org/10.1007/BF00972520},
doi = {10.1007/BF00972520},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Saluja94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SandbornGDABP94,
author = {Peter Sandborn and
Rajarshi Ghosh and
Ken Drake and
Magdy S. Abadir and
Linda Bal and
Ashish Parikh},
title = {Multichip systems trade-off analysis tool},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {207--218},
year = {1994},
url = {https://doi.org/10.1007/BF00972080},
doi = {10.1007/BF00972080},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SandbornGDABP94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SasNPCVM94,
author = {Jos van Sas and
Chay Now{\'{e}} and
Didier Pollet and
Francky Catthoor and
Paul Vanoostende and
Hugo De Man},
title = {Design of a C-testable booth multiplier using a realistic fault model},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {29--41},
year = {1994},
url = {https://doi.org/10.1007/BF00971961},
doi = {10.1007/BF00971961},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SasNPCVM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VarmaG94,
author = {Prab Varma and
Tushar Gheewala},
title = {The economics of scan-path design for testability},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {179--193},
year = {1994},
url = {https://doi.org/10.1007/BF00972078},
doi = {10.1007/BF00972078},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/VarmaG94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WuM94,
author = {Angus Wu and
Jack L. Meador},
title = {Measurement selection for parametric {IC} fault diagnosis},
journal = {J. Electron. Test.},
volume = {5},
number = {1},
pages = {9--18},
year = {1994},
url = {https://doi.org/10.1007/BF00971959},
doi = {10.1007/BF00971959},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WuM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Zarrinfar94,
author = {Farzad Zarrinfar},
title = {Economics of "design for test" to remain competitive in the 90s},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {171--177},
year = {1994},
url = {https://doi.org/10.1007/BF00972077},
doi = {10.1007/BF00972077},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Zarrinfar94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZiajaS94,
author = {Thomas A. Ziaja and
Earl E. Swartzlander Jr.},
title = {Boundary scan in board manufacturing},
journal = {J. Electron. Test.},
volume = {5},
number = {2-3},
pages = {263--268},
year = {1994},
url = {https://doi.org/10.1007/BF00972085},
doi = {10.1007/BF00972085},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZiajaS94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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