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@article{DBLP:journals/dt/AbramoviciMM84,
  author       = {Miron Abramovici and
                  Prem R. Menon and
                  David T. Miller},
  title        = {Critical Path Tracing: An Alternative to Fault Simulation},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {1},
  pages        = {83--93},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005582},
  doi          = {10.1109/MDT.1984.5005582},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/AbramoviciMM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Anderson84,
  author       = {Robert E. Anderson},
  title        = {Linking Design{\&}Test},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {27--31},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005604},
  doi          = {10.1109/MDT.1984.5005604},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Anderson84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BanerjeeA84,
  author       = {Prithviraj Banerjee and
                  Jacob A. Abraham},
  title        = {Characterization and Testing of Physical Failures in {MOS} Logic Circuits},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {3},
  pages        = {76--86},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005655},
  doi          = {10.1109/MDT.1984.5005655},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/BanerjeeA84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Barber84,
  author       = {Mark R. Barber},
  title        = {Fundamental Timing Problems in Testing {MOS} {VLSI} on Modern {ATE}},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {3},
  pages        = {90--97},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005657},
  doi          = {10.1109/MDT.1984.5005657},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Barber84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BarzilaiHSTW84,
  author       = {Zeev Barzilai and
                  Leendert M. Huisman and
                  Gabriel M. Silberman and
                  Donald T. Tang and
                  Lin S. Woo},
  title        = {Fast Pass-Transistor Simulation for Custom {MOS} Circuits},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {1},
  pages        = {71--81},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005579},
  doi          = {10.1109/MDT.1984.5005579},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/BarzilaiHSTW84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Bending84,
  author       = {Michael J. Bending},
  title        = {Hitest: {A} Knowledge-Based Test Generation System},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {83--92},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005617},
  doi          = {10.1109/MDT.1984.5005617},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Bending84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BlackleyJJ84,
  author       = {William S. Blackley and
                  Mervyn A. Jack and
                  James R. Jordan},
  title        = {A Digital Polarity Correlator with Built-in Self Test and Self Repair},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {42--49},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005607},
  doi          = {10.1109/MDT.1984.5005607},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/BlackleyJJ84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Blank84,
  author       = {Tom Blank},
  title        = {A Survey of Hardware Accelerators Used in Computer-Aided Design},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {3},
  pages        = {21--39},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005647},
  doi          = {10.1109/MDT.1984.5005647},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Blank84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Dunn84,
  author       = {Larry N. Dunn},
  title        = {IBM'S Engineering Design System Support for {VLSI} Design and Verification},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {1},
  pages        = {30--40},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005573},
  doi          = {10.1109/MDT.1984.5005573},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Dunn84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/FlorcikLR84,
  author       = {David Florcik and
                  David Low and
                  Martin Roche},
  title        = {Prototype Debug using {ATE}},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {94--99},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005619},
  doi          = {10.1109/MDT.1984.5005619},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/FlorcikLR84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Frome84,
  author       = {Francine S. Frome},
  title        = {Improving color {CAD} Systems for Users: Some Suggestions from Human
                  Factors Studies},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {1},
  pages        = {18--27},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005571},
  doi          = {10.1109/MDT.1984.5005571},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Frome84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Garcia84,
  author       = {Rudy Garcia},
  title        = {The Fairchild Sentry 50 Tester: Establishing New {ATE} Performance
                  Limits},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {101--109},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005621},
  doi          = {10.1109/MDT.1984.5005621},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Garcia84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HellerHM84,
  author       = {W. R. Heller and
                  C. George Hsi and
                  Wadie F. Mikhaill},
  title        = {Wirability-designing wiring space for chips and chip packages},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {3},
  pages        = {43--51},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005649},
  doi          = {10.1109/MDT.1984.5005649},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/HellerHM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Hill84,
  author       = {Dwight D. Hill},
  title        = {Icon: {A} Tool for Design at Schematic, Virtual Grid, and Layout Levels},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {4},
  pages        = {53--60},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005690},
  doi          = {10.1109/MDT.1984.5005690},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Hill84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KanopoulosM84,
  author       = {Nikos Kanopoulos and
                  G. Thomas Mitchell},
  title        = {Design for Testability and Self-Testing Approaches for Bit-Serial
                  signal Processors},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {52--59},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005609},
  doi          = {10.1109/MDT.1984.5005609},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/KanopoulosM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KimMS84,
  author       = {Jin H. Kim and
                  John McDermott and
                  Daniel P. Siewiorek},
  title        = {Exploiting Domain Knowledge in {IC} Cell Layout},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {3},
  pages        = {52--64},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005651},
  doi          = {10.1109/MDT.1984.5005651},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/KimMS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KowalskiT84,
  author       = {Thaddeus J. Kowalski and
                  Donald E. Thomas},
  title        = {The {VLSI} Design Automation Assistant: An {IBM} System/370 Design},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {1},
  pages        = {60--69},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005577},
  doi          = {10.1109/MDT.1984.5005577},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/KowalskiT84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Kroeger84,
  author       = {Robert C. Kroeger},
  title        = {Testability Emphasis in the General Electric {A/VLSI} Program},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {61--65},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005612},
  doi          = {10.1109/MDT.1984.5005612},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Kroeger84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KubanB84,
  author       = {John R. Kuban and
                  William C. Bruce},
  title        = {Self-Testing the Motorola {MC6804P2}},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {33--41},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005606},
  doi          = {10.1109/MDT.1984.5005606},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/KubanB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LeBlanc84,
  author       = {Johnny J. LeBlanc},
  title        = {{LOCST:} {A} Built-In Self-Test Technique},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {4},
  pages        = {45--52},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005689},
  doi          = {10.1109/MDT.1984.5005689},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/LeBlanc84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MalaiyaN84,
  author       = {Yashwant K. Malaiya and
                  Ramesh Narayanaswamy},
  title        = {Modeling and Testing for Timing Faults in Synchronous Sequential Circuits},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {4},
  pages        = {62--74},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005692},
  doi          = {10.1109/MDT.1984.5005692},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/MalaiyaN84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MotoharaF84,
  author       = {Akira Motohara and
                  Hideo Fujiwara},
  title        = {Design for Testability for Complete Test Coverage},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {4},
  pages        = {25--32},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005686},
  doi          = {10.1109/MDT.1984.5005686},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/MotoharaF84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Ofek84,
  author       = {Hillel Ofek},
  title        = {Guest Editor's Introduction Design Automation},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {1},
  pages        = {16--17},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005570},
  doi          = {10.1109/MDT.1984.5005570},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Ofek84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Parker84,
  author       = {Alice C. Parker},
  title        = {Automated Synthesis of Digital systems},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {4},
  pages        = {75--81},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005693},
  doi          = {10.1109/MDT.1984.5005693},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Parker84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RobachMM84,
  author       = {Chantal Robach and
                  Philippe Malecha and
                  Gilles Michel},
  title        = {{CATA:} {A} Computer-Aided Test Analysis System},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {2},
  pages        = {68--79},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005614},
  doi          = {10.1109/MDT.1984.5005614},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/RobachMM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RoseOD84,
  author       = {Charles W. Rose and
                  Greg M. Ordy and
                  Paul J. Drongowski},
  title        = {N.mPc: {A} Study in University-Industry Technology Transfer},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {1},
  pages        = {44--56},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005575},
  doi          = {10.1109/MDT.1984.5005575},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/RoseOD84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Sapiro84,
  author       = {Steve Sapiro},
  title        = {The electronic workstation-an overview},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {4},
  pages        = {33--41},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005687},
  doi          = {10.1109/MDT.1984.5005687},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Sapiro84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SedmakT84,
  author       = {Richard M. Sedmak and
                  Donald E. Thomas},
  title        = {Probing the State of the Art},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {3},
  pages        = {18--19},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005645},
  doi          = {10.1109/MDT.1984.5005645},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/SedmakT84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Wadsack84,
  author       = {Ronald L. Wadsack},
  title        = {Design Verification and Testing of the {WE} 32100 CPUs},
  journal      = {{IEEE} Des. Test},
  volume       = {1},
  number       = {3},
  pages        = {66--75},
  year         = {1984},
  url          = {https://doi.org/10.1109/MDT.1984.5005653},
  doi          = {10.1109/MDT.1984.5005653},
  timestamp    = {Wed, 11 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Wadsack84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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