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@inproceedings{DBLP:conf/vts/AppelloBGGPRR09,
author = {Davide Appello and
Paolo Bernardi and
Simone Gerardin and
Michelangelo Grosso and
Alessandro Paccagnella and
Paolo Rech and
Matteo Sonza Reorda},
title = {DfT Reuse for Low-Cost Radiation Testing of SoCs: {A} Case Study},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {276--281},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.26},
doi = {10.1109/VTS.2009.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AppelloBGGPRR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AraiSINSHA09,
author = {Masayuki Arai and
Akifumi Suto and
Kazuhiko Iwasaki and
Katsuyuki Nakano and
Michihiro Shintani and
Kazumi Hatayama and
Takashi Aikyo},
title = {Small Delay Fault Model for Intra-Gate Resistive Open Defects},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {27--32},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.25},
doi = {10.1109/VTS.2009.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AraiSINSHA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BabaM09,
author = {A. Hakan Baba and
Subhasish Mitra},
title = {Testing for Transistor Aging},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {215--220},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.56},
doi = {10.1109/VTS.2009.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BabaM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BiswasB09,
author = {Sounil Biswas and
Ronald D. Blanton},
title = {Maintaining Accuracy of Test Compaction through Adaptive Re-learning},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {257--263},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.59},
doi = {10.1109/VTS.2009.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BiswasB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BlakkanS09,
author = {Kenneth Blakkan and
Mani Soma},
title = {A Time Domain Method to Measure Oscillator Phase Noise},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {297--302},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.54},
doi = {10.1109/VTS.2009.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BlakkanS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CanivetLCVR09,
author = {Gaetan Canivet and
R{\'{e}}gis Leveugle and
Jessy Cl{\'{e}}di{\`{e}}re and
Fr{\'{e}}d{\'{e}}ric Valette and
Marc Renaudin},
title = {Characterization of Effective Laser Spots during Attacks in the Configuration
of a Virtex-II {FPGA}},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {327--332},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.19},
doi = {10.1109/VTS.2009.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CanivetLCVR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandranZ09,
author = {Unni Chandran and
Dan Zhao},
title = {{SS-KTC:} {A} High-Testability Low-Overhead Scan Architecture with
Multi-level Security Integration},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {321--326},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.20},
doi = {10.1109/VTS.2009.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandranZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangCLC09,
author = {Hsiu{-}Ming Chang and
Chin{-}Hsuan Chen and
Kuan{-}Yu Lin and
Kwang{-}Ting Cheng},
title = {Calibration and Testing Time Reduction Techniques for a Digitally-Calibrated
Pipelined {ADC}},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {291--296},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.48},
doi = {10.1109/VTS.2009.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChangCLC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenHHW09,
author = {Te{-}Hsuan Chen and
Yu{-}Ying Hsiao and
Yu{-}Tsao Hsing and
Cheng{-}Wen Wu},
title = {An Adaptive-Rate Error Correction Scheme for {NAND} Flash Memory},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {53--58},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.24},
doi = {10.1109/VTS.2009.24},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChenHHW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenXY09,
author = {Zhen Chen and
Dong Xiang and
Boxue Yin},
title = {The {ATPG} Conflict-Driven Scheme for High Transition Fault Coverage
and Low Test Cost},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {146--151},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.15},
doi = {10.1109/VTS.2009.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChenXY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChunKKK09,
author = {Sunghoon Chun and
YongJoon Kim and
Taejin Kim and
Sungho Kang},
title = {A High-Level Signal Integrity Fault Model and Test Methodology for
Long On-Chip Interconnections},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {152--157},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.38},
doi = {10.1109/VTS.2009.38},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChunKKK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChungA09,
author = {Jaeyong Chung and
Jacob A. Abraham},
title = {Recursive Path Selection for Delay Fault Testing},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {65--70},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.50},
doi = {10.1109/VTS.2009.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChungA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChungG09,
author = {Kun Young Chung and
Sandeep K. Gupta},
title = {Efficient Scheduling of Path Delay Tests for Latch-Based Circuits},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {103--110},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.41},
doi = {10.1109/VTS.2009.41},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChungG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CourtoisS09,
author = {Bernard Courtois and
Ali Shakouri},
title = {Microscale and Nanoscale Thermal Characterization of Integrated Circuit
Chips},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {241},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.73},
doi = {10.1109/VTS.2009.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CourtoisS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CourtoisV09,
author = {Bernard Courtois and
Chandu Visweswariah},
title = {Special Session 8: New Topics: At-Speed Testing in the Face of Process
Variations},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {237},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.72},
doi = {10.1109/VTS.2009.72},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CourtoisV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DattaT09,
author = {Rudrajit Datta and
Nur A. Touba},
title = {Exploiting Unused Spare Columns to Improve Memory {ECC}},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {47--52},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.52},
doi = {10.1109/VTS.2009.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DattaT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ErdoganO09,
author = {Erdem Serkan Erdogan and
Sule Ozev},
title = {A Packet Based 2x-Site Test Solution for {GSM} Transceivers with Limited
Tester Resources},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {303--308},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.44},
doi = {10.1109/VTS.2009.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ErdoganO09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FangCJPT09,
author = {Hongxia Fang and
Krishnendu Chakrabarty and
Abhijit Jas and
Srinivas Patil and
Chandra Tirumurti},
title = {RT-Level Deviation-Based Grading of Functional Test Sequences},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {264--269},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.12},
doi = {10.1109/VTS.2009.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FangCJPT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FlaniganTA09,
author = {Edward Flanigan and
Spyros Tragoudas and
Arkan Abdulrahman},
title = {Scalable Compact Test Pattern Generation for Path Delay Faults Based
on Functions},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {140--145},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.22},
doi = {10.1109/VTS.2009.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FlaniganTA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GaoHL09,
author = {Jianliang Gao and
Yinhe Han and
Xiaowei Li},
title = {A New Post-Silicon Debug Approach Based on Suspect Window},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {85--90},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.35},
doi = {10.1109/VTS.2009.35},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/GaoHL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GoelDT09,
author = {Sandeep Kumar Goel and
Narendra Devta{-}Prasanna and
Ritesh P. Turakhia},
title = {Effective and Efficient Test Pattern Generation for Small Delay Defect},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {111--116},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.28},
doi = {10.1109/VTS.2009.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GoelDT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HakmiHWSHG09,
author = {Abdul Wahid Hakmi and
Stefan Holst and
Hans{-}Joachim Wunderlich and
J{\"{u}}rgen Schl{\"{o}}ffel and
Friedrich Hapke and
Andreas Glowatz},
title = {Restrict Encoding for Mixed-Mode {BIST}},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {179--184},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.43},
doi = {10.1109/VTS.2009.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HakmiHWSHG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HouarcheCRCEPB09,
author = {Nicolas Houarche and
Mariane Comte and
Michel Renovell and
Alejandro Czutro and
Piet Engelke and
Ilia Polian and
Bernd Becker},
title = {An Electrical Model for the Fault Simulation of Small Delay Faults
Caused by Crosstalk Aggravated Resistive Short Defects},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.57},
doi = {10.1109/VTS.2009.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HouarcheCRCEPB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HuHL09,
author = {Yong{-}Jyun Hu and
Yu{-}Jen Huang and
Jin{-}Fu Li},
title = {Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {15--20},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.18},
doi = {10.1109/VTS.2009.18},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/HuHL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JenkinsL09,
author = {Keith A. Jenkins and
Lionel Li},
title = {A Scalable, Digital {BIST} Circuit for Measurement and Compensation
of Static Phase Offset},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {185--188},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.36},
doi = {10.1109/VTS.2009.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/JenkinsL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Kapoor09,
author = {Bhanu Kapoor},
title = {Special Session 11C: Embedded Tutorial: System-on-a-Chip Power Management
Implications on Validation and Testing},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {333},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.64},
doi = {10.1109/VTS.2009.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Kapoor09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KhocheKLLAPZLRZ09,
author = {Ajay Khoche and
Jay Katz and
Sauro Landini and
Kochen Liao and
Neetu Agrawal and
Glenn Plowman and
Songlin Zuo and
Liyang Lai and
John Rowe and
Thomas Zanon},
title = {{STDF} Memory Fail Datalog Standard},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {209--214},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.29},
doi = {10.1109/VTS.2009.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KhocheKLLAPZLRZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Kim09,
author = {Kee Sup Kim},
title = {Panel: Apprentice - {VTS} Edition: Season 2},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {119},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.62},
doi = {10.1109/VTS.2009.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Kim09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Konuk09,
author = {Haluk Konuk},
title = {Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture
in Sense-Amplifier-Based Flip-Flop Testing},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {33--38},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.39},
doi = {10.1109/VTS.2009.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Konuk09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Konuk09a,
author = {Haluk Konuk},
title = {{DFT} and Test Problems from the Trenches},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {120},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.63},
doi = {10.1109/VTS.2009.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Konuk09a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinEB09,
author = {Yen{-}Tzu Lin and
Chukwuemeka U. Ezekwe and
Ronald D. Blanton},
title = {Physically-Aware N-Detect Test Relaxation},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {197--202},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.47},
doi = {10.1109/VTS.2009.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinEB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinKL09,
author = {Sheng Lin and
Yong{-}Bin Kim and
Fabrizio Lombardi},
title = {Soft-Error Hardening Designs of Nanoscale {CMOS} Latches},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {41--46},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.10},
doi = {10.1109/VTS.2009.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinKL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LizarragaMS09,
author = {Livier Lizarraga and
Salvador Mir and
Gilles Sicard},
title = {Experimental Validation of a {BIST} Techcnique for {CMOS} Active Pixel
Sensors},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {189--194},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.30},
doi = {10.1109/VTS.2009.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LizarragaMS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LvLL09,
author = {Tao Lv and
Huawei Li and
Xiaowei Li},
title = {Automatic Selection of Internal Observation Signals for Design Verification},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {203--208},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.21},
doi = {10.1109/VTS.2009.21},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/LvLL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MaLT09,
author = {Junxia Ma and
Jeremy Lee and
Mohammad Tehranipoor},
title = {Layout-Aware Pattern Generation for Maximizing Supply Noise Effects
on Critical Paths},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.45},
doi = {10.1109/VTS.2009.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MaLT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MakrisS09,
author = {Yiorgos Makris and
Haralampos{-}G. D. Stratigopoulos},
title = {Special Session 7C: {TTTC} 2009 Best Doctoral Thesis Contest},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {233},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.71},
doi = {10.1109/VTS.2009.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MakrisS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ManiatakosKTJM09,
author = {Michail Maniatakos and
Naghmeh Karimi and
Chandra Tirumurti and
Abhijit Jas and
Yiorgos Makris},
title = {Instruction-Level Impact Comparison of {RT-} vs. Gate-Level Faults
in a Modern Microprocessor Controller},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.32},
doi = {10.1109/VTS.2009.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ManiatakosKTJM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/McLaughlinVL09,
author = {Richard McLaughlin and
Srikanth Venkataraman and
Carlston Lim},
title = {Automated Debug of Speed Path Failures Using Functional Tests},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {91--96},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.53},
doi = {10.1109/VTS.2009.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/McLaughlinVL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MenonSA09,
author = {Sreekumar Menon and
Adit D. Singh and
Vishwani D. Agrawal},
title = {Output Hazard-Free Transition Delay Fault Test Generation},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {97--102},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.40},
doi = {10.1109/VTS.2009.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MenonSA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiMRCT09,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Dariusz Czysz and
Jerzy Tyszer},
title = {Highly X-Tolerant Selective Compaction of Test Responses},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.11},
doi = {10.1109/VTS.2009.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiMRCT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PantZ09,
author = {Pankaj Pant and
Joshua Zelman},
title = {Understanding Power Supply Droop during At-Speed Scan Testing},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {227--232},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.46},
doi = {10.1109/VTS.2009.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PantZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Piziali09,
author = {Andrew Piziali},
title = {Panel: Functional Verification Planning and Management - Are Good
Intentions Good Enough?},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {338},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.66},
doi = {10.1109/VTS.2009.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Piziali09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ShamshiriC09,
author = {Saeed Shamshiri and
Kwang{-}Ting Cheng},
title = {Yield and Cost Analysis of a Reliable NoC},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {173--178},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.34},
doi = {10.1109/VTS.2009.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ShamshiriC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SinhaMG09,
author = {Arani Sinha and
Amitava Majumdar and
Vasu Ganti},
title = {Panel: Analog Characterization and Test: The Long Road to Realization},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {337},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.65},
doi = {10.1109/VTS.2009.65},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/SinhaMG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SuenagaBPIRG09,
author = {Kay Suenaga and
Sebasti{\`{a}} A. Bota and
Rodrigo Picos and
Eugeni Isern and
Miquel Roca and
Eugenio Garc{\'{\i}}a{-}Moreno},
title = {Predictive Test Technique for Diagnosis of {RF} {CMOS} Receivers},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {129--133},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.13},
doi = {10.1109/VTS.2009.13},
timestamp = {Wed, 20 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/SuenagaBPIRG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TasiCJW09,
author = {Meng{-}Jai Tasi and
Mango Chia{-}Tso Chao and
Jing{-}Yang Jou and
Meng{-}Chen Wu},
title = {Multiple-Fault Diagnosis Using Faulty-Region Identification},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {123--128},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.31},
doi = {10.1109/VTS.2009.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TasiCJW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TurakhiaWGB09,
author = {Ritesh P. Turakhia and
Mark Ward and
Sandeep Kumar Goel and
Brady Benware},
title = {Bridging {DFM} Analysis and Volume Diagnostics for Yield Learning
- {A} Case Study},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {167--172},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.37},
doi = {10.1109/VTS.2009.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TurakhiaWGB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VazquezCHS09,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Chuck Hawkins and
Jaume Segura},
title = {Stuck-Open Fault Leakage and Testing in Nanometer Technologies},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {315--320},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.33},
doi = {10.1109/VTS.2009.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VazquezCHS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VelamatiD09,
author = {Naveen Velamati and
Robert Daasch},
title = {Analytical Model for Multi-site Efficiency with Parallel to Serial
Test Times, Yield and Clustering},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {270--275},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.42},
doi = {10.1109/VTS.2009.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VelamatiD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangW09,
author = {Zheng Wang and
Duncan M. Hank Walker},
title = {Compact Delay Test Generation with a Realistic Low Cost Fault Coverage
Metric},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {59--64},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.55},
doi = {10.1109/VTS.2009.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WangW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/XiangYC09,
author = {Dong Xiang and
Boxue Yin and
Kwang{-}Ting Cheng},
title = {Dynamic Test Compaction for Transition Faults in Broadside Scan Testing
Based on an Influence Cone Measure},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {251--256},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.14},
doi = {10.1109/VTS.2009.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/XiangYC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/XieDSS09,
author = {Lin Xie and
Azadeh Davoodi and
Kewal K. Saluja and
Abhishek A. Sinkar},
title = {False Path Aware Timing Yield Estimation under Variability},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.17},
doi = {10.1109/VTS.2009.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/XieDSS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/XuC09,
author = {Tao Xu and
Krishnendu Chakrabarty},
title = {Design-for-Testability for Digital Microfluidic Biochips},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {309--314},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.16},
doi = {10.1109/VTS.2009.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/XuC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YangT09,
author = {Joon{-}Sung Yang and
Nur A. Touba},
title = {Automated Selection of Signals to Observe for Efficient Silicon Debug},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {79--84},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.51},
doi = {10.1109/VTS.2009.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YangT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YoshikawaOIF09,
author = {Yuki Yoshikawa and
Satoshi Ohtake and
Tomoo Inoue and
Hideo Fujiwara},
title = {A Synthesis Method to Alleviate Over-Testing of Delay Faults Based
on {RTL} Don't Care Path Identification},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {71--76},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.27},
doi = {10.1109/VTS.2009.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YoshikawaOIF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YuLTPB09,
author = {Xiaochun Yu and
Yen{-}Tzu Lin and
Wing Chiu Tam and
Osei Poku and
Ronald D. Blanton},
title = {Controlling {DPPM} through Volume Diagnosis},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {134--139},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.49},
doi = {10.1109/VTS.2009.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YuLTPB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhangGA09,
author = {Chaoming Zhang and
Ranjit Gharpurey and
Jacob A. Abraham},
title = {On-Line Calibration and Power Optimization of {RF} Systems Using a
Built-In Detector},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {285--290},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.23},
doi = {10.1109/VTS.2009.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZhangGA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZiajaT09,
author = {Thomas A. Ziaja and
Poh J. Tan},
title = {Efficient Array Characterization in the UltraSPARC {T2}},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {3--8},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.58},
doi = {10.1109/VTS.2009.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZiajaT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2009,
title = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://ieeexplore.ieee.org/xpl/conhome/5116585/proceeding},
isbn = {978-0-7695-3598-2},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/2009.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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