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@article{DBLP:journals/mr/BairiRMAM17,
  author       = {Abderrahmane Ba{\"{\i}}ri and
                  Lu{\'{\i}}s M. Roseiro and
                  Alexander Mart{\'{\i}}n{-}Gar{\'{\i}}n and
                  Kemi Adeyeye and
                  J. A. Mill{\'{a}}n{-}Garc{\'{\i}}a},
  title        = {Thermal state of electronic assemblies applied to smart building equipped
                  with {QFN64} device subjected to natural convection},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {79--83},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.002},
  doi          = {10.1016/J.MICROREL.2017.01.002},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BairiRMAM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/DiyarogluOOMHH17,
  author       = {Cagan Diyaroglu and
                  Selda Oterkus and
                  Erkan Oterkus and
                  Erdogan Madenci and
                  S. Han and
                  Y. Hwang},
  title        = {Peridynamic wetness approach for moisture concentration analysis in
                  electronic packages},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {103--111},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.008},
  doi          = {10.1016/J.MICROREL.2017.01.008},
  timestamp    = {Mon, 23 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DiyarogluOOMHH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GanM17,
  author       = {Chong Leong Gan and
                  Mohamad Zainudeen Moideen},
  title        = {Book Review: Carbon Nanotubes for Interconnects: Process, Design and
                  Applications (2017), Springer, {ISBN:} {ISBN} 978-3-319-29744-6 (Print)
                  {ISBN} 978-3-319-29746-0 (Online)},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {122--123},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.004},
  doi          = {10.1016/J.MICROREL.2017.01.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GanM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HassanR17,
  author       = {Mohammad Khaled Hassan and
                  Kaushik Roy},
  title        = {Investigation of dependence between time-zero and time-dependent variability
                  in high-{\(\kappa\)} {NMOS} transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {22--31},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.009},
  doi          = {10.1016/J.MICROREL.2017.01.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HassanR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HigashiTKSNTMMO17,
  author       = {Yusuke Higashi and
                  Riichiro Takaishi and
                  Koichi Kato and
                  Masamichi Suzuki and
                  Yasushi Nakasaki and
                  Mitsuhiro Tomita and
                  Yuichiro Mitani and
                  Masuaki Matsumoto and
                  Shohei Ogura and
                  Katsuyuki Fukutani and
                  Kikuo Yamabe},
  title        = {Mechanism of gate dielectric degradation by hydrogen migration from
                  the cathode interface},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {12--21},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.011},
  doi          = {10.1016/J.MICROREL.2017.01.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HigashiTKSNTMMO17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Khoshvaght-Aliabadi17,
  author       = {Morteza Khoshvaght{-}Aliabadi and
                  Seyedmasoud Hassani and
                  Seyed Hossein Mazloumi},
  title        = {Comparison of hydrothermal performance between plate fins and plate-pin
                  fins subject to nanofluid-cooled corrugated miniature heat sinks},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {84--96},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.005},
  doi          = {10.1016/J.MICROREL.2017.01.005},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Khoshvaght-Aliabadi17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PaknejadM17,
  author       = {Seyed Amir Paknejad and
                  Samjid H. Mannan},
  title        = {Review of silver nanoparticle based die attach materials for high
                  power/temperature applications},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {1--11},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.010},
  doi          = {10.1016/J.MICROREL.2017.01.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PaknejadM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PanLHLZ17,
  author       = {Yuanxing Pan and
                  Fei Li and
                  Hu He and
                  Junhui Li and
                  Wenhui Zhu},
  title        = {Effects of dimension parameters and defect on {TSV} thermal behavior
                  for 3D {IC} packaging},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {97--102},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.001},
  doi          = {10.1016/J.MICROREL.2017.02.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PanLHLZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SuWPZY17,
  author       = {Xiaohong Su and
                  Shuai Wang and
                  Michael G. Pecht and
                  Lingling Zhao and
                  Zhe Ye},
  title        = {Interacting multiple model particle filter for prognostics of lithium-ion
                  batteries},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {59--69},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.003},
  doi          = {10.1016/J.MICROREL.2017.02.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SuWPZY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WhitingHLPJLKRX17,
  author       = {Patrick G. Whiting and
                  M. R. Holzworth and
                  A. G. Lind and
                  Stephen J. Pearton and
                  Kevin S. Jones and
                  Lu Liu and
                  T. S. Kang and
                  Fan Ren and
                  Y. Xin},
  title        = {Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility
                  transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {32--40},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.007},
  doi          = {10.1016/J.MICROREL.2017.01.007},
  timestamp    = {Thu, 04 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WhitingHLPJLKRX17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WhitingRHPJLKR17,
  author       = {Patrick G. Whiting and
                  Nicholas G. Rudawski and
                  M. R. Holzworth and
                  Stephen J. Pearton and
                  Kevin S. Jones and
                  Lu Liu and
                  T. S. Kang and
                  Fan Ren},
  title        = {Nanocrack formation in AlGaN/GaN high electron mobility transistors
                  utilizing Ti/Al/Ni/Au ohmic contacts},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {41--48},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.005},
  doi          = {10.1016/J.MICROREL.2017.02.005},
  timestamp    = {Thu, 04 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WhitingRHPJLKR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/XiongGYHNLSXL17,
  author       = {Huaping Xiong and
                  Chuanhai Gan and
                  Xiaobing Yang and
                  Zhigang Hu and
                  Haiyan Niu and
                  Jianfeng Li and
                  Jianfang Si and
                  Pengfei Xing and
                  Xuetao Luo},
  title        = {Corrosion behavior of crystalline silicon solar cells},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {49--58},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.006},
  doi          = {10.1016/J.MICROREL.2017.01.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/XiongGYHNLSXL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/YangSL17,
  author       = {Chenglin Yang and
                  Ruoshan Su and
                  Bing Long},
  title        = {Methods of sequential test optimization in dynamic environment},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {112--121},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.12.017},
  doi          = {10.1016/J.MICROREL.2016.12.017},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangSL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/YangWXT17,
  author       = {Fangfang Yang and
                  Dong Wang and
                  Yinjiao Xing and
                  Kwok{-}Leung Tsui},
  title        = {Prognostics of Li(NiMnCo)O\({}_{\mbox{2}}\)-based lithium-ion batteries
                  using a novel battery degradation model},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {70--78},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.002},
  doi          = {10.1016/J.MICROREL.2017.02.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangWXT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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