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Publication search results
found 14 matches
- 2017
- Abderrahmane Baïri, Luís M. Roseiro, Alexander Martín-Garín, Kemi Adeyeye, J. A. Millán-García:
Thermal state of electronic assemblies applied to smart building equipped with QFN64 device subjected to natural convection. Microelectron. Reliab. 70: 79-83 (2017) - Cagan Diyaroglu, Selda Oterkus, Erkan Oterkus, Erdogan Madenci, S. Han, Y. Hwang:
Peridynamic wetness approach for moisture concentration analysis in electronic packages. Microelectron. Reliab. 70: 103-111 (2017) - Chong Leong Gan, Mohamad Zainudeen Moideen:
Book Review: Carbon Nanotubes for Interconnects: Process, Design and Applications (2017), Springer, ISBN: ISBN 978-3-319-29744-6 (Print) ISBN 978-3-319-29746-0 (Online). Microelectron. Reliab. 70: 122-123 (2017) - Mohammad Khaled Hassan, Kaushik Roy:
Investigation of dependence between time-zero and time-dependent variability in high-κ NMOS transistors. Microelectron. Reliab. 70: 22-31 (2017) - Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe:
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface. Microelectron. Reliab. 70: 12-21 (2017) - Morteza Khoshvaght-Aliabadi, Seyedmasoud Hassani, Seyed Hossein Mazloumi:
Comparison of hydrothermal performance between plate fins and plate-pin fins subject to nanofluid-cooled corrugated miniature heat sinks. Microelectron. Reliab. 70: 84-96 (2017) - Seyed Amir Paknejad, Samjid H. Mannan:
Review of silver nanoparticle based die attach materials for high power/temperature applications. Microelectron. Reliab. 70: 1-11 (2017) - Yuanxing Pan, Fei Li, Hu He, Junhui Li, Wenhui Zhu:
Effects of dimension parameters and defect on TSV thermal behavior for 3D IC packaging. Microelectron. Reliab. 70: 97-102 (2017) - Xiaohong Su, Shuai Wang, Michael G. Pecht, Lingling Zhao, Zhe Ye:
Interacting multiple model particle filter for prognostics of lithium-ion batteries. Microelectron. Reliab. 70: 59-69 (2017) - Patrick G. Whiting, M. R. Holzworth, A. G. Lind, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren, Y. Xin:
Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 70: 32-40 (2017) - Patrick G. Whiting, Nicholas G. Rudawski, M. R. Holzworth, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren:
Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts. Microelectron. Reliab. 70: 41-48 (2017) - Huaping Xiong, Chuanhai Gan, Xiaobing Yang, Zhigang Hu, Haiyan Niu, Jianfeng Li, Jianfang Si, Pengfei Xing, Xuetao Luo:
Corrosion behavior of crystalline silicon solar cells. Microelectron. Reliab. 70: 49-58 (2017) - Chenglin Yang, Ruoshan Su, Bing Long:
Methods of sequential test optimization in dynamic environment. Microelectron. Reliab. 70: 112-121 (2017) - Fangfang Yang, Dong Wang, Yinjiao Xing, Kwok-Leung Tsui:
Prognostics of Li(NiMnCo)O2-based lithium-ion batteries using a novel battery degradation model. Microelectron. Reliab. 70: 70-78 (2017)
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