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@article{DBLP:journals/mr/Bairi16,
  author       = {Abderrahmane Ba{\"{\i}}ri},
  title        = {Free convective heat transfer coefficient for high powered and tilted
                  {QFN64} electronic device},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {85--91},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.009},
  doi          = {10.1016/J.MICROREL.2016.09.009},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Bairi16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BouguezziAG16,
  author       = {Sihem Bouguezzi and
                  Moez Ayadi and
                  Moez Ghariani},
  title        = {Developing a Simplified Analytical Thermal Model of Multi-chip Power
                  Module},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {64--77},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.022},
  doi          = {10.1016/J.MICROREL.2016.09.022},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BouguezziAG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/DurandKBC16,
  author       = {Camille Durand and
                  Markus Klingler and
                  Maxence Bigerelle and
                  Daniel Coutellier},
  title        = {Solder fatigue failures in a new designed power module under Power
                  Cycling},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {122--133},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.002},
  doi          = {10.1016/J.MICROREL.2016.10.002},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DurandKBC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HuangLZC16,
  author       = {Bo Huang and
                  Xunbo Li and
                  Zhi Zeng and
                  Nanbo Chen},
  title        = {Mechanical behavior and fatigue life estimation on fretting wear for
                  micro-rectangular electrical connector},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {106--112},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.013},
  doi          = {10.1016/J.MICROREL.2016.09.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangLZC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/JayawardenaN16,
  author       = {Asiri Jayawardena and
                  Nadarajah Narendran},
  title        = {Analysis of electrical parameters of InGaN-based {LED} packages with
                  aging},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {22--31},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.012},
  doi          = {10.1016/J.MICROREL.2016.09.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JayawardenaN16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/JiWL16,
  author       = {Hongjun Ji and
                  Jiao Wang and
                  Mingyu Li},
  title        = {Microstructure and reliability of hybrid interconnects by Au stud
                  bump with Sn-0.7Cu solder for flip chip power device packaging},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {134--142},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.003},
  doi          = {10.1016/J.MICROREL.2016.10.003},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JiWL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/KnetzgerMDGF16,
  author       = {Michael Knetzger and
                  Elke Meissner and
                  Joff Derluyn and
                  Marianne Germain and
                  Jochen Friedrich},
  title        = {Correlation of carbon doping variations with the vertical breakdown
                  of GaN-on-Si for power electronics},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {16--21},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.014},
  doi          = {10.1016/J.MICROREL.2016.09.014},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KnetzgerMDGF16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiXLWW16,
  author       = {Lingling Li and
                  Yahui Xu and
                  Zhigang Li and
                  Pengchong Wang and
                  Bing Wang},
  title        = {The effect of electro-thermal parameters on {IGBT} junction temperature
                  with the aging of module},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {58--63},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.016},
  doi          = {10.1016/J.MICROREL.2016.09.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiXLWW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiZGG16,
  author       = {Fan Li and
                  Wenguo Zhang and
                  Li{-}Lan Gao and
                  Hong Gao},
  title        = {The coupled effects of salt-spray corrosion, electrical current and
                  mechanical load on the electrical and fatigue properties of {COG}
                  assembly},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {92--97},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.010},
  doi          = {10.1016/J.MICROREL.2016.10.010},
  timestamp    = {Tue, 01 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LiZGG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiangDLMKKL16,
  author       = {Wei Liang and
                  Aihua Dong and
                  Hang Li and
                  Meng Miao and
                  Chung{-}Chen Kuo and
                  Maxim Klebanov and
                  Juin J. Liou},
  title        = {Characteristics of {ESD} protection devices operated under elevated
                  temperatures},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {46--51},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.008},
  doi          = {10.1016/J.MICROREL.2016.10.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiangDLMKKL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiaoLL16,
  author       = {Changjun Liao and
                  Jizhi Liu and
                  Zhiwei Liu},
  title        = {New fast turn-on speed {SCR} device for electrostatic discharge protection},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {38--45},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.006},
  doi          = {10.1016/J.MICROREL.2016.09.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiaoLL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiuCFSXYY16,
  author       = {Yang Liu and
                  Changchun Chai and
                  Qingyang Fan and
                  ChunLei Shi and
                  Xiaowen Xi and
                  Xinhai Yu and
                  Yintang Yang},
  title        = {Ku band damage characteristics of GaAs pHEMT induced by a front-door
                  coupling microwave pulse},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {32--37},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.002},
  doi          = {10.1016/J.MICROREL.2016.09.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuCFSXYY16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/NgAIAA16,
  author       = {Fei Chong Ng and
                  Aizat Abas and
                  Muhammad Hafifi Hafiz Ishak and
                  Mohd Zulkifly Abdullah and
                  M. S. Abdul Aziz},
  title        = {Effect of thermocapillary action in the underfill encapsulation of
                  multi-stack ball grid array},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {143--160},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.001},
  doi          = {10.1016/J.MICROREL.2016.10.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NgAIAA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ParkCP16,
  author       = {Ah{-}Young Park and
                  Satish C. Chaparala and
                  Seungbae Park},
  title        = {Risk assessment of the crack propagation and delamination of the Cu-to-Cu
                  direct bonded (CuDB) interface},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {113--121},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.015},
  doi          = {10.1016/J.MICROREL.2016.09.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ParkCP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SouariTBV16,
  author       = {Anis Souari and
                  Claude Thibeault and
                  Yves Blaqui{\`{e}}re and
                  Raoul Velazco},
  title        = {Towards an efficient {SEU} effects emulation on SRAM-based FPGAs},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {173--182},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.007},
  doi          = {10.1016/J.MICROREL.2016.09.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SouariTBV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SwaminathanSIS16,
  author       = {Shrikant Swaminathan and
                  Kamal K. Sikka and
                  Richard F. Indyk and
                  Tuhin Sinha},
  title        = {Measurement of underfill interfacial and bulk fracture toughness in
                  flip-chip packages},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {161--172},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.008},
  doi          = {10.1016/J.MICROREL.2016.09.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SwaminathanSIS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ThambiTSLW16,
  author       = {J. Thambi and
                  U. Tetzlaff and
                  Andreas Schiessl and
                  Klaus{-}Dieter Lang and
                  M. Waltz},
  title        = {High cycle fatigue behaviour and generalized fatigue model development
                  of lead-free solder alloy based on local stress approach},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {98--105},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.004},
  doi          = {10.1016/J.MICROREL.2016.10.004},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ThambiTSLW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WangLQZSGHCZ16,
  author       = {YanLing Wang and
                  Xiaojin Li and
                  Jian Qing and
                  Yan Zeng and
                  Yanling Shi and
                  Ao Guo and
                  ShaoJian Hu and
                  Shoumian Chen and
                  Yuhang Zhao},
  title        = {Analytical parameter extraction for {NBTI} reaction diffusion and
                  trapping/detrapping models},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {10--15},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.005},
  doi          = {10.1016/J.MICROREL.2016.10.005},
  timestamp    = {Wed, 19 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WangLQZSGHCZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/YamaneKSTSMM16,
  author       = {Daisuke Yamane and
                  Toshifumi Konishi and
                  Teruaki Safu and
                  Hiroshi Toshiyoshi and
                  Masato Sone and
                  Kazuya Masu and
                  Katsuyuki Machida},
  title        = {Evaluation and modeling of adhesion layer in shock-protection structure
                  for {MEMS} accelerometer},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {78--84},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.018},
  doi          = {10.1016/J.MICROREL.2016.09.018},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YamaneKSTSMM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ZhaiLGL16,
  author       = {Yuwei Zhai and
                  Faguo Liang and
                  Chunsheng Guo and
                  Yan Liu},
  title        = {Transient dual interface measurement of junction-to-case thermal resistance
                  in AlGaN/GaN {HEMT} utilizing an improved infrared microscope},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {52--57},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.006},
  doi          = {10.1016/J.MICROREL.2016.10.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhaiLGL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ZhouHHYP16,
  author       = {Wu Zhou and
                  Jiangbo He and
                  Xiao{-}Ping He and
                  Huijun Yu and
                  Bei Peng},
  title        = {Dielectric charging induced drift in micro device reliability-a review},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {1--9},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.004},
  doi          = {10.1016/J.MICROREL.2016.09.004},
  timestamp    = {Wed, 19 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ZhouHHYP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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