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@article{DBLP:journals/mr/0003BY09,
author = {Hua Lu and
Chris Bailey and
Chunyan Yin},
title = {Design for reliability of power electronics modules},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1250--1255},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.055},
doi = {10.1016/J.MICROREL.2009.07.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/0003BY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AchmatowiczKZWBJ09,
author = {Selim Achmatowicz and
Konrad Kielbasinski and
Elzbieta Zwierkowska and
Iwona Wyzkiewicz and
Valentinas Baltrusaitis and
Malgorzata Jakubowska},
title = {A new photoimageable platinum conductor},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {579--584},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.016},
doi = {10.1016/J.MICROREL.2009.02.016},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AchmatowiczKZWBJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlaeddineKDM09,
author = {A. Alaeddine and
M. Kadi and
K. Daoud and
B. Mazari},
title = {Effects of electromagnetic near-field stress on SiGe HBT's reliability},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1029--1032},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.014},
doi = {10.1016/J.MICROREL.2009.07.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlaeddineKDM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlamoJ09,
author = {Jes{\'{u}}s A. del Alamo and
Jungwoo Joh},
title = {GaN {HEMT} reliability},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1200--1206},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.003},
doi = {10.1016/J.MICROREL.2009.07.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlamoJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AllersBBGKL09,
author = {K.{-}H. Allers and
Josef B{\"{o}}ck and
S. Boguth and
K. Goller and
Herbert Knapp and
Rudolf Lachner},
title = {Dielectric thinning model applied to metal insulator metal capacitors
with Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) dielectric},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1520--1528},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.027},
doi = {10.1016/J.MICROREL.2009.07.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AllersBBGKL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AltuntasASO09,
author = {H. Altuntas and
S. Altindal and
H. Shtrikman and
Suleyman {\"{O}}z{\c{c}}elik},
title = {A detailed study of current-voltage characteristics in Au/SiO\({}_{\mbox{2}}\)/n-GaAs
in wide temperature range},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {904--911},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.003},
doi = {10.1016/J.MICROREL.2009.06.003},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AltuntasASO09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlvarezCRALGEHS09,
author = {David Alvarez and
Kiran V. Chatty and
Christian Russ and
Michel J. Abou{-}Khalil and
Junjun Li and
Robert Gauthier and
Kai Esmark and
Ralph Halbach and
Christopher Seguin},
title = {Design optimization of gate-silicided {ESD} NMOSFETs in a 45 nm bulk
{CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1417--1423},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.051},
doi = {10.1016/J.MICROREL.2009.06.051},
timestamp = {Thu, 02 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlvarezCRALGEHS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Amin09,
author = {Ahmed Amin},
title = {Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood,
Sokrates T. Pantelides, Ronald D. Schrimpf (Eds.). Taylor and Francis
Group LLC, Boca Raton, FL, {USA}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {821--822},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.017},
doi = {10.1016/J.MICROREL.2009.03.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Amin09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AminLSRA09,
author = {Nowshad Amin and
Victor Lim and
Foong Chee Seng and
Rozaidi Razid and
Ibrahim Ahmad},
title = {A practical investigation on nickel plated copper heat spreader with
different catalytic activation processes for flip-chip ball grid array
packages},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {537--543},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.013},
doi = {10.1016/J.MICROREL.2009.02.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AminLSRA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AmyAR09,
author = {Robin Alastair Amy and
Guglielmo S. Aglietti and
Guy Richardson},
title = {Sensitivity analysis of simplified Printed Circuit Board finite element
models},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {791--799},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.002},
doi = {10.1016/J.MICROREL.2009.04.002},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AmyAR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AugusteHJAP09,
author = {Manoubi Auguste Bahi and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Jean{-}Pierre Landesman and
Annabelle Gentil and
Pascal Lecuyer},
title = {A new methodology for the identification of ball bond degradation
during high-temperature aging tests on devices in standard plastic
packages},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1273--1277},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.009},
doi = {10.1016/J.MICROREL.2009.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AugusteHJAP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Baishya09,
author = {S. Baishya},
title = {A surface potential and quasi-Fermi potential based drain current
model for pocket-implanted {MOS} transistors in subthreshold regime},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {681--688},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.001},
doi = {10.1016/J.MICROREL.2009.05.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Baishya09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BansalRKZSC09,
author = {Aditya Bansal and
Rahul M. Rao and
Jae{-}Joon Kim and
Sufi Zafar and
James H. Stathis and
Ching{-}Te Chuang},
title = {Impacts of {NBTI} and {PBTI} on {SRAM} static/dynamic noise margins
and cell failure probability},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {642--649},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.016},
doi = {10.1016/J.MICROREL.2009.03.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BansalRKZSC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaoSLL09,
author = {Haifei Bao and
Zhaohui Song and
Deren Lu and
Xinxin Li},
title = {A simple estimation of transverse response of high-g accelerometers
by a free-drop-bar method},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {66--73},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.012},
doi = {10.1016/J.MICROREL.2008.10.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaoSLL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BareisaJMS09,
author = {Eduardas Bareisa and
Vacius Jusas and
Kestutis Motiejunas and
Rimantas Seinauskas},
title = {Functional delay test generation based on software prototype},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1578--1585},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.050},
doi = {10.1016/J.MICROREL.2009.06.050},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BareisaJMS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BashirM09,
author = {Muhammad Bashir and
Linda S. Milor},
title = {A methodology to extract failure rates for low-k dielectric breakdown
with multiple geometries and in the presence of die-to-die linewidth
variation},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1096--1102},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.033},
doi = {10.1016/J.MICROREL.2009.07.033},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BashirM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeldaFFWJ09,
author = {C. Belda and
M. Fritsch and
Claudia Feller and
D. Westphal and
G. Jung},
title = {Stability of solid electrolyte based thick-film CO\({}_{\mbox{2}}\)
sensors},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {614--620},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.014},
doi = {10.1016/J.MICROREL.2009.02.014},
timestamp = {Thu, 22 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BeldaFFWJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelmehdiABDW09,
author = {Yassine Belmehdi and
Stephane Azzopardi and
A. Benmansour and
Jean{-}Yves Del{\'{e}}tage and
Eric Woirgard},
title = {Uni-axial mechanical stress effect on Trench Punch through {IGBT}
under short-circuit operation},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1398--1403},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.037},
doi = {10.1016/J.MICROREL.2009.06.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BelmehdiABDW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenardMFOG09,
author = {Christelle B{\'{e}}nard and
Ga{\"{e}}tan Math and
Pascal Fornara and
Jean{-}Luc Ogier and
Didier Goguenheim},
title = {Influence of various process steps on the reliability of PMOSFETs
submitted to negative bias temperature instabilities},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1008--1012},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.022},
doi = {10.1016/J.MICROREL.2009.06.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BenardMFOG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BerbelFG09,
author = {N{\'{e}}stor Berbel and
Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and
Ignacio Gil},
title = {Modelling and experimental verification of the impact of negative
bias temperature instability on {CMOS} inverter},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1048--1051},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.027},
doi = {10.1016/J.MICROREL.2009.06.027},
timestamp = {Mon, 28 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BerbelFG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Berenyi09,
author = {Rich{\'{a}}rd Ber{\'{e}}nyi},
title = {Prototyping of a reliable 3D flexible {IC} cube package by laser micromachining},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {800--805},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.015},
doi = {10.1016/J.MICROREL.2009.03.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Berenyi09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BerkaniLBKFFH09,
author = {Mounira Berkani and
St{\'{e}}phane Lefebvre and
Narjes Boughrara and
Zoubir Khatir and
Jean{-}Claude Faugi{\`{e}}res and
Peter Friedrichs and
Ali Haddouche},
title = {Estimation of SiC {JFET} temperature during short-circuit operations},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1358--1362},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.024},
doi = {10.1016/J.MICROREL.2009.06.024},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BerkaniLBKFFH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BernardoniCDM09,
author = {Mirko Bernardoni and
Paolo Cova and
Nicola Delmonte and
Roberto Menozzi},
title = {Heat management for power converters in sealed enclosures: {A} numerical
study},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1293--1298},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.028},
doi = {10.1016/J.MICROREL.2009.06.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BernardoniCDM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BernouxEJD09,
author = {B. Bernoux and
Ren{\'{e}} Escoffier and
P. Jalbaud and
Jean{-}Marie Dorkel},
title = {Source electrode evolution of a low voltage power {MOSFET} under avalanche
cycling},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1341--1345},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.035},
doi = {10.1016/J.MICROREL.2009.06.035},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BernouxEJD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BerthouRFGJ09,
author = {Maxime Berthou and
P. Retailleau and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Alexandrine Gu{\'{e}}don{-}Gracia and
C. J{\'{e}}phos{-}Davennel},
title = {Microstructure evolution observation for {SAC} solder joint: Comparison
between thermal cycling and thermal storage},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1267--1272},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.040},
doi = {10.1016/J.MICROREL.2009.07.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BerthouRFGJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BertoluzzaDM09,
author = {Fulvio Bertoluzza and
Nicola Delmonte and
Roberto Menozzi},
title = {Three-dimensional finite-element thermal simulation of GaN-based HEMTs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {468--473},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.009},
doi = {10.1016/J.MICROREL.2009.02.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BertoluzzaDM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BestoryMDL09,
author = {Corinne Bestory and
Fran{\c{c}}ois Marc and
S. Duzellier and
Herv{\'{e}} Levi},
title = {Electrical aging behavioral modeling for reliability analyses of ionizing
dose effects on an n-MOS simple current mirror},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {946--951},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.025},
doi = {10.1016/J.MICROREL.2009.07.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BestoryMDL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BianHZZC09,
author = {Wei Bian and
Jin He and
Lining Zhang and
Jian Zhang and
Mansun Chan},
title = {Sub-threshold behavior of long channel undoped cylindrical surrounding-gate
MOSFETs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {897--903},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.008},
doi = {10.1016/J.MICROREL.2009.05.008},
timestamp = {Fri, 01 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BianHZZC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BibergerBG09,
author = {Roland Biberger and
Guenther Benstetter and
Holger Goebel},
title = {Displacement current sensor for contact and intermittent contact scanning
capacitance microscopy},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1192--1195},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.007},
doi = {10.1016/J.MICROREL.2009.07.007},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BibergerBG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BornBBDGHKLV09,
author = {V. Born and
M. Beck and
O. Bosholm and
D. Dalleau and
S. Glenz and
I. Haverkamp and
G. Kurz and
F. Lange and
Anja Vest},
title = {Extended metallization reliability testing: Combining standard wafer
level with product tests to increase test sensitivity},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {74--78},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.017},
doi = {10.1016/J.MICROREL.2008.10.017},
timestamp = {Tue, 14 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BornBBDGHKLV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrodbeckES09,
author = {Tilo Brodbeck and
Kai Esmark and
Wolfgang Stadler},
title = {{CDM} tests on interface test chips for the verification of {ESD}
protection concepts},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1470--1475},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.053},
doi = {10.1016/J.MICROREL.2009.06.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrodbeckES09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BroujiBVHW09,
author = {H. El Brouji and
Olivier Briat and
Jean{-}Michel Vinassa and
Herv{\'{e}} Henry and
Eric Woirgard},
title = {Analysis of the dynamic behavior changes of supercapacitors during
calendar life test under several voltages and temperatures conditions},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1391--1397},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.033},
doi = {10.1016/J.MICROREL.2009.06.033},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BroujiBVHW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrusamarelloWS09,
author = {Lucas Brusamarello and
Gilson I. Wirth and
Roberto da Silva},
title = {Statistical {RTS} model for digital circuits},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1064--1069},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.025},
doi = {10.1016/J.MICROREL.2009.06.025},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BrusamarelloWS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoAIC09,
author = {Giovanni Busatto and
Carmine Abbate and
Francesco Iannuzzo and
P. Cristofaro},
title = {Instable mechanisms during unclamped operation of high power {IGBT}
modules},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1363--1369},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.026},
doi = {10.1016/J.MICROREL.2009.07.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoAIC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoCIPSV09,
author = {Giovanni Busatto and
Giuseppe Curr{\`{o}} and
Francesco Iannuzzo and
Alberto Porzio and
Annunziata Sanseverino and
Francesco Velardi},
title = {Experimental study about gate oxide damages in patterned {MOS} capacitor
irradiated with heavy ions},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1033--1037},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.012},
doi = {10.1016/J.MICROREL.2009.07.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoCIPSV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CantinGP09,
author = {C. Cantin and
G. Gove and
G. Polisski},
title = {Verification and reduction of surface charging during high/medium
current implantations by implementing plasma damage monitoring},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {215--220},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.015},
doi = {10.1016/J.MICROREL.2008.10.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CantinGP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CantinLG09,
author = {C. Cantin and
C. Laviron and
G. Gove},
title = {Charging control on high energy implanters: {A} process requirement
demonstrated by plasma damage monitoring},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {209--214},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.012},
doi = {10.1016/J.MICROREL.2008.11.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CantinLG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CarastroCCJBW09,
author = {Fabio Carastro and
Alberto Castellazzi and
Jon C. Clare and
M. C. Johnson and
Michael J. Bland and
Patrick W. Wheeler},
title = {Reliability considerations in pulsed power resonant conversion},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1352--1357},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.039},
doi = {10.1016/J.MICROREL.2009.06.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CarastroCCJBW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Celik-ButlerDTTZ09,
author = {Zeynep {\c{C}}elik{-}Butler and
Siva Prasad Devireddy and
Hsing{-}Huang Tseng and
Philip J. Tobin and
Ania Zlotnicka},
title = {A low-frequency noise model for advanced gate-stack MOSFETs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {103--112},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.005},
doi = {10.1016/J.MICROREL.2008.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Celik-ButlerDTTZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Chang09,
author = {Kuei{-}Hu Chang},
title = {Evaluate the orderings of risk for failure problems using a more general
{RPN} methodology},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1586--1596},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.057},
doi = {10.1016/J.MICROREL.2009.07.057},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Chang09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChaoZCH09,
author = {Brook Huang{-}Lin Chao and
Xuefeng Zhang and
Seung{-}Hyun Chae and
Paul S. Ho},
title = {Recent advances on kinetic analysis of electromigration enhanced intermetallic
growth and damage formation in Pb-free solder joints},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {253--263},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.006},
doi = {10.1016/J.MICROREL.2009.01.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChaoZCH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CheP09,
author = {F. X. Che and
John H. L. Pang},
title = {Vibration reliability test and finite element analysis for flip chip
solder joints},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {754--760},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.022},
doi = {10.1016/J.MICROREL.2009.03.022},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CheP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenL09,
author = {Jiunn Chen and
Yi{-}Shao Lai},
title = {Towards elastic anisotropy and strain-induced void formation in Cu-Sn
crystalline phases},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {264--268},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.018},
doi = {10.1016/J.MICROREL.2008.10.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChentirJVBVA09,
author = {Mohamed{-}Tahar Chentir and
J.{-}B. Jullien and
B. Valtchanov and
Emilien Bouyssou and
Laurent Ventura and
Christine Anceau},
title = {Percolation theory applied to {PZT} thin films capacitors breakdown
mechanisms},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1074--1078},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.048},
doi = {10.1016/J.MICROREL.2009.07.048},
timestamp = {Sat, 12 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChentirJVBVA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Chiang09,
author = {Te{-}Kuang Chiang},
title = {A new two-dimensional analytical subthreshold behavior model for short-channel
tri-material gate-stack {SOI} MOSFET's},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {113--119},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.005},
doi = {10.1016/J.MICROREL.2008.11.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Chiang09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Chiang09a,
author = {Te{-}Kuang Chiang},
title = {A new two-dimensional subthreshold behavior model for the short-channel
asymmetrical dual-material double-gate {(ADMDG)} MOSFET's},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {693--698},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.006},
doi = {10.1016/J.MICROREL.2009.05.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Chiang09a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChidambaramHH09,
author = {Vivek Chidambaram and
John Hald and
Jesper Henri Hattel},
title = {Development of gold based solder candidates for flip chip assembly},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {323--330},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.012},
doi = {10.1016/J.MICROREL.2008.12.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChidambaramHH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoiYHKCL09,
author = {Chel{-}Jong Choi and
Ha{-}Yong Yang and
Hyo{-}Bong Hong and
Jin{-}Gyu Kim and
Sung{-}Yong Chang and
Jouhahn Lee},
title = {Characteristics of metal-oxide-semiconductor {(MOS)} device with Er
metal gate on SiO\({}_{\mbox{2}}\) film},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {463--465},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.014},
doi = {10.1016/J.MICROREL.2008.12.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoiYHKCL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouHHYC09,
author = {Tsung{-}Lin Chou and
Chien{-}Fu Huang and
Cheng{-}Nan Han and
Shin{-}Yueh Yang and
Kuo{-}Ning Chiang},
title = {Fabrication process simulation and reliability improvement of high-brightness
LEDs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1244--1249},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.028},
doi = {10.1016/J.MICROREL.2009.07.028},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChouHHYC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChowdhuryWBYRM09,
author = {N. A. Chowdhury and
X. Wang and
Gennadi Bersuker and
Chadwin D. Young and
N. Rahim and
Durga Misra},
title = {Temperature dependent time-to-breakdown (T\({}_{\mbox{BD}}\)) of TiN/HfO\({}_{\mbox{2}}\)
n-channel {MOS} devices in inversion},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {495--498},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.003},
doi = {10.1016/J.MICROREL.2009.02.003},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChowdhuryWBYRM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiappaMSOF09,
author = {Mauro Ciappa and
Luigi Mangiacapra and
Maria Stangoni and
Stephan Ott and
Wolfgang Fichtner},
title = {Ensuring the reliability of electron beam crosslinked electric cables
by the optimization of the dose depth distribution with Monte Carlo
simulation},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {972--976},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.035},
doi = {10.1016/J.MICROREL.2009.07.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CiappaMSOF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiptokusumoWA09,
author = {Joharsyah Ciptokusumo and
Kirsten Weide{-}Zaage and
Oliver Aubel},
title = {Investigation of stress distribution in via bottom of Cu-via structures
with different via form by means of submodeling},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1090--1095},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.043},
doi = {10.1016/J.MICROREL.2009.07.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CiptokusumoWA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Crespo-YepesMRNA09,
author = {Albert Crespo{-}Yepes and
Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Reversible dielectric breakdown in ultrathin Hf based high-k stacks
under current-limited stresses},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1024--1028},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.029},
doi = {10.1016/J.MICROREL.2009.06.029},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Crespo-YepesMRNA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DammannPWBQMMAWMRBBRFS09,
author = {Maximilian Dammann and
W. Pletschen and
Patrick Waltereit and
Wolfgang Bronner and
R{\"{u}}diger Quay and
Stefan M{\"{u}}ller and
Michael Mikulla and
Oliver Ambacher and
P. J. van der Wel and
S. Murad and
T. R{\"{o}}dle and
R. Behtash and
F. Bourgeois and
K. Riepe and
Martin Fagerlind and
Einar {\"{O}}rn Sveinbj{\"{o}}rnsson},
title = {Reliability and degradation mechanism of AlGaN/GaN HEMTs for next
generation mobile communication systems},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {474--477},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.005},
doi = {10.1016/J.MICROREL.2009.02.005},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DammannPWBQMMAWMRBBRFS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DiattaBTMROB09,
author = {Marianne Diatta and
Emilien Bouyssou and
David Tr{\'{e}}mouilles and
P. Martinez and
F. Roqueta and
O. Ory and
Marise Bafleur},
title = {Failure mechanisms of discrete protection device subjected to repetitive
electrostatic discharges {(ESD)}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1103--1106},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.010},
doi = {10.1016/J.MICROREL.2009.06.010},
timestamp = {Fri, 29 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DiattaBTMROB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DjeffalGDL09,
author = {Fay{\c{c}}al Djeffal and
Z. Ghoggali and
Zohir Dibi and
N. Lakhdar},
title = {Analytical analysis of nanoscale multiple gate MOSFETs including effects
of hot-carrier induced interface charges},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {377--381},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.011},
doi = {10.1016/J.MICROREL.2008.12.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DjeffalGDL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DudekDBM09,
author = {Rainer Dudek and
Ralf D{\"{o}}ring and
Christine Bombach and
Bernd Michel},
title = {Simulation based analysis of secondary effects on solder fatigue},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {839--845},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.014},
doi = {10.1016/J.MICROREL.2009.03.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DudekDBM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DupontCKM09,
author = {Laurent Dupont and
Gerard Coquery and
K. Kriegel and
A. Melkonyan},
title = {Accelerated active ageing test on SiC JFETs power module with silver
joining technology for high temperature application},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1375--1380},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.050},
doi = {10.1016/J.MICROREL.2009.07.050},
timestamp = {Thu, 25 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DupontCKM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic09,
author = {Andrzej Dziedzic},
title = {{IMAPS-CPMT} Poland 2008 - Guest Editorial},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {567--568},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.020},
doi = {10.1016/J.MICROREL.2009.03.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dziedzic09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM09,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {467},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.003},
doi = {10.1016/J.MICROREL.2009.03.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ErslandM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ExarchosPJB09,
author = {M. A. Exarchos and
George J. Papaioannou and
Jalal Jomaah and
Francis Balestra},
title = {Investigation of defects introduced by static and dynamic hot carrier
stress on {SOI} partially depleted body-contact MOSFETs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1018--1023},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.024},
doi = {10.1016/J.MICROREL.2009.07.024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ExarchosPJB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanLH09,
author = {X. J. Fan and
S. W. Ricky Lee and
Q. Han},
title = {Experimental investigations and model study of moisture behaviors
in polymeric materials},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {861--871},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.006},
doi = {10.1016/J.MICROREL.2009.03.006},
timestamp = {Fri, 25 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FanLH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarbizR09,
author = {Farzan Farbiz and
Elyse Rosenbaum},
title = {A new compact model for external latchup},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1447--1454},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.003},
doi = {10.1016/J.MICROREL.2008.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FarbizR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarrisPLKVTMSBWG09,
author = {Andrew Farris and
Jianbiao Pan and
Albert A. Liddicoat and
Michael Krist and
Nicholas A. Vickers and
Brian J. Toleno and
Dan Maslyk and
Dongkai Shangguan and
Jasbir Bath and
Dennis Willie and
David A. Geiger},
title = {Drop impact reliability of edge-bonded lead-free chip scale packages},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {761--770},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.003},
doi = {10.1016/J.MICROREL.2009.05.003},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FarrisPLKVTMSBWG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FelczakWM09,
author = {Mariusz Felczak and
Boguslaw Wiecek and
Gilbert De Mey},
title = {Optimal placement of electronic devices in forced convective cooling
conditions},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1537--1545},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.007},
doi = {10.1016/J.MICROREL.2009.06.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FelczakWM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fernandez-GarciaKG09,
author = {R. Fern{\'{a}}ndez{-}Garc{\'{\i}}a and
Ben Kaczer and
Guido Groeseneken},
title = {A {CMOS} circuit for evaluating the {NBTI} over a wide frequency range},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {885--891},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.009},
doi = {10.1016/J.MICROREL.2009.05.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fernandez-GarciaKG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FukaiKKIYE09,
author = {Yoshino K. Fukai and
Kenji Kurishima and
Norihide Kashio and
Minoru Ida and
Shoji Yamahata and
Takatomo Enoki},
title = {Emitter-metal-related degradation in InP-based HBTs operating at high
current density and its suppression by refractory metal},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {357--364},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.005},
doi = {10.1016/J.MICROREL.2009.01.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FukaiKKIYE09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GainCSWY09,
author = {Asit Kumar Gain and
Y. C. Chan and
Ahmed Sharif and
N. B. Wong and
Winco K. C. Yung},
title = {Interfacial microstructure and shear strength of Ag nano particle
doped Sn-9Zn solder in ball grid array packages},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {746--753},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.004},
doi = {10.1016/J.MICROREL.2009.05.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GainCSWY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalyDVREJPB09,
author = {Philippe Galy and
Sylvain Dudit and
Michel Vallet and
Corinne Richier and
Christophe Entringer and
Frank Jezequel and
E. Petit and
J. Beltritti},
title = {Impact and damage on deep sub-micron {CMOS} technology induced by
substrate current due to {ESD} stress},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1107--1110},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.039},
doi = {10.1016/J.MICROREL.2009.07.039},
timestamp = {Wed, 08 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GalyDVREJPB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoNTQ09,
author = {Feng Gao and
Hiroshi Nishikawa and
Tadashi Takemoto and
Jianmin Qu},
title = {Mechanical properties versus temperature relation of individual phases
in Sn-3.0Ag-0.5Cu lead-free solder alloy},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {296--302},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.010},
doi = {10.1016/J.MICROREL.2008.10.010},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GaoNTQ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoWWYL09,
author = {Chao Gao and
Jun Wang and
Lei Wang and
Andrew Yap and
Hong Li},
title = {Two-stage hot-carrier degradation behavior of 0.18 {\(\mathrm{\mu}\)}m
18 {V} n-type {DEMOS} and its recovery effect},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {8--12},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.09.009},
doi = {10.1016/J.MICROREL.2008.09.009},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GaoWWYL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GarrosCRFRMWB09,
author = {Xavier Garros and
Mika{\"{e}}l Cass{\'{e}} and
M. Rafik and
Claire Fenouillet{-}B{\'{e}}ranger and
Gilles Reimbold and
Fran{\c{c}}ois Martin and
Claudia Wiemer and
F. Boulanger},
title = {Process dependence of {BTI} reliability in advanced {HK} {MG} stacks},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {982--988},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.047},
doi = {10.1016/J.MICROREL.2009.06.047},
timestamp = {Tue, 09 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GarrosCRFRMWB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhisiFMZ09,
author = {Aldo Ghisi and
Fabio Fachin and
Stefano Mariani and
Sarah Zerbini},
title = {Multi-scale analysis of polysilicon {MEMS} sensors subject to accidental
drops: Effect of packaging},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {340--349},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.010},
doi = {10.1016/J.MICROREL.2008.12.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhisiFMZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GilEL09,
author = {C. Gil and
Peter Ersland and
A. Li},
title = {Determining {DC/RF} survivability limits of GaAs semiconductor circuits},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {484--487},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.004},
doi = {10.1016/J.MICROREL.2009.02.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GilEL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GlowackiLBIBPLWT09,
author = {Arkadiusz Glowacki and
Piotr Laskowski and
Christian Boit and
Ponky Ivo and
Eldad Bahat{-}Treidel and
Reza Pazirandeh and
Richard Lossy and
Joachim W{\"{u}}rfl and
G{\"{u}}nther Tr{\"{a}}nkle},
title = {Characterization of stress degradation effects and thermal properties
of AlGaN/GaN HEMTs with photon emission spectral signatures},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1211--1215},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.022},
doi = {10.1016/J.MICROREL.2009.07.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GlowackiLBIBPLWT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GodlewskiPLL09,
author = {C. Godlewski and
Vincent Pouget and
Dean Lewis and
Mathieu Lisart},
title = {Electrical modeling of the effect of beam profile for pulsed laser
fault injection},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1143--1147},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.037},
doi = {10.1016/J.MICROREL.2009.07.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GodlewskiPLL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GonzalezVNARG09,
author = {Jos{\'{e}} Ram{\'{o}}n Gonz{\'{a}}lez and
Manuel V{\'{a}}zquez and
Neftal{\'{\i}} N{\'{u}}{\~{n}}ez and
Carlos Algora and
Ignacio Rey{-}Stolle and
Beatriz Galiana},
title = {Reliability analysis of temperature step-stress tests on {III-V} high
concentrator solar cells},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {673--680},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.001},
doi = {10.1016/J.MICROREL.2009.04.001},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GonzalezVNARG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Gorecki09,
author = {Krzysztof G{\'{o}}recki},
title = {Non-linear average electrothermal models of buck and boost converters
for {SPICE}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {431--437},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.009},
doi = {10.1016/J.MICROREL.2009.01.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Gorecki09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoreckiZ09,
author = {Krzysztof G{\'{o}}recki and
Janusz Zarebski},
title = {Electrothermal analysis of the self-excited push-pull {DC-DC} converter},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {424--430},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.007},
doi = {10.1016/J.MICROREL.2009.01.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoreckiZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrosDML09,
author = {Jean{-}Baptiste Gros and
Genevi{\`{e}}ve Duchamp and
Alain Meresse and
Jean{-}Luc Levant},
title = {Electromagnetic immunity model of an {ADC} for microcontroller's reliability
improvement},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {963--966},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.013},
doi = {10.1016/J.MICROREL.2009.06.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GrosDML09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaberfehlnerBDHPPSGP09,
author = {Georg Haberfehlner and
Sergey Bychikhin and
Viktor Dubec and
Michael Heer and
A. Podgaynaya and
M. Pfost and
Matthias Stecher and
Erich Gornik and
Dionyz Pogany},
title = {Thermal imaging of smart power {DMOS} transistors in the thermally
unstable regime using a compact transient interferometric mapping
system},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1346--1351},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.032},
doi = {10.1016/J.MICROREL.2009.07.032},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaberfehlnerBDHPPSGP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HallerMLP09,
author = {G{\'{e}}rald Haller and
Aziz Machouat and
Dean Lewis and
Vincent Pouget},
title = {Net integrity checking by optical localization techniques},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1175--1181},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.021},
doi = {10.1016/J.MICROREL.2009.07.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HallerMLP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HartmannW09,
author = {Claus Hartmann and
M. Wieberneit},
title = {Investigation on marginal failure characteristics and related defects
analysed by soft defect localization},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1137--1142},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.036},
doi = {10.1016/J.MICROREL.2009.07.036},
timestamp = {Fri, 04 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HartmannW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HasseKS09,
author = {Lech Hasse and
Alicja Konczakowska and
Janusz M. Smulko},
title = {Classification of high-voltage varistors into groups of differentiated
quality},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1483--1490},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.008},
doi = {10.1016/J.MICROREL.2009.06.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HasseKS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HautefeuilleOPO09,
author = {Mathieu Hautefeuille and
Brendan O'Flynn and
Frank H. Peters and
Conor O'Mahony},
title = {Miniaturised multi-MEMS sensor development},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {621--626},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.017},
doi = {10.1016/J.MICROREL.2009.02.017},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HautefeuilleOPO09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HayesCF09,
author = {S. M. Hayes and
Nikhilesh Chawla and
D. R. Frear},
title = {Interfacial fracture toughness of Pb-free solders},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {269--287},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.004},
doi = {10.1016/J.MICROREL.2008.11.004},
timestamp = {Thu, 10 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HayesCF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerDEGPGS09,
author = {Michael Heer and
Krzysztof Domanski and
Kai Esmark and
Ulrich Glaser and
Dionyz Pogany and
Erich Gornik and
Wolfgang Stadler},
title = {Transient interferometric mapping of carrier plasma during external
transient latch-up phenomena in latch-up test structures and {I/O}
cells processed in {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1455--1464},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.052},
doi = {10.1016/J.MICROREL.2009.06.052},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerDEGPGS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HehenbergerWRG09,
author = {Ph. Hehenberger and
P.{-}J. Wagner and
Hans Reisinger and
Tibor Grasser},
title = {On the temperature and voltage dependence of short-term negative bias
temperature stress},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1013--1017},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.040},
doi = {10.1016/J.MICROREL.2009.06.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HehenbergerWRG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeldF09,
author = {Marcel Held and
Klaus Fritz},
title = {Comparison and evaluation of newest failure rate prediction models:
{FIDES} and {RIAC} 217Plus},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {967--971},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.031},
doi = {10.1016/J.MICROREL.2009.07.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeldF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HertlWL09,
author = {Michael Hertl and
Diane Weidmann and
Jean{-}Claude Lecomte},
title = {An advanced quality and reliability assessment approach applied to
thermal stress issues in electronic components and assemblies},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1148--1152},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.045},
doi = {10.1016/J.MICROREL.2009.07.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HertlWL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HisakaSNHYVAHA09,
author = {Takayuki Hisaka and
Hajime Sasaki and
Yoichi Nogami and
Kenji Hosogi and
Naohito Yoshida and
Anita A. Villanueva and
Jes{\'{u}}s A. del Alamo and
Shigehiko Hasegawa and
Hajime Asahi},
title = {Corrosion-induced degradation of GaAs PHEMTs under operation in high
humidity conditions},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1515--1519},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.046},
doi = {10.1016/J.MICROREL.2009.07.046},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HisakaSNHYVAHA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoCLLW09,
author = {Chia{-}Huai Ho and
Kuei{-}Shu Chang{-}Liao and
Chun{-}Yuan Lu and
Chun{-}Chang Lu and
Tien{-}Ko Wang},
title = {Employing vertical dielectric layers to improve the operation performance
of flash memory devices},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {371--376},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.004},
doi = {10.1016/J.MICROREL.2008.12.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoCLLW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsiaoK09,
author = {Yuan{-}Wen Hsiao and
Ming{-}Dou Ker},
title = {Low-capacitance {ESD} protection design for high-speed {I/O} interfaces
in a 130-nm {CMOS} process},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {650--659},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.011},
doi = {10.1016/J.MICROREL.2009.03.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HsiaoK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsiehWCSLCH09,
author = {Zhen{-}Ying Hsieh and
Mu{-}Chun Wang and
Chih Chen and
Jia{-}Min Shieh and
Yu{-}Ting Lin and
Shuang{-}Yuan Chen and
Heng{-}Sheng Huang},
title = {Trend transformation of drain-current degradation under drain-avalanche
hot-carrier stress for {CLC} n-TFTs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {892--896},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.011},
doi = {10.1016/J.MICROREL.2009.05.011},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HsiehWCSLCH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HwangKKSK09,
author = {Jin{-}Sang Hwang and
Ju{-}Yeol Kim and
Seok{-}Chan Kang and
Dong{-}Sung Seo and
Younghwan Kwon},
title = {Feasibility study of non-conductive film {(NCF)} for plasma display
panel {(PDP)} application},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {806--812},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.021},
doi = {10.1016/J.MICROREL.2009.03.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HwangKKSK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HwangKSWM09,
author = {Jin{-}Sang Hwang and
Myeong{-}Hwan Kim and
Dong{-}Sung Seo and
Jong{-}Woo Won and
Doo{-}Kyung Moon},
title = {Effects of soft segment mixtures with different molecular weight on
the properties and reliability of {UV} curable adhesives for electrodes
protection of plasma display panel {(PDP)}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {517--522},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.001},
doi = {10.1016/J.MICROREL.2009.02.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HwangKSWM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IlleSPGBERACGB09,
author = {Adrien Ille and
Wolfgang Stadler and
Thomas Pompl and
Harald Gossner and
Tilo Brodbeck and
Kai Esmark and
Philipp Riess and
David Alvarez and
Kiran V. Chatty and
Robert Gauthier and
Alain Bravaix},
title = {Reliability aspects of gate oxide under {ESD} pulse stress},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1407--1416},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.054},
doi = {10.1016/J.MICROREL.2009.06.054},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IlleSPGBERACGB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/InfantePL09,
author = {Fulvio Infante and
Philippe Perdu and
Dean Lewis},
title = {Magnetic microscopy for 3D devices: Defect localization with high
resolution and long working distance on complex system in package},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1169--1174},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.041},
doi = {10.1016/J.MICROREL.2009.06.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/InfantePL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IrreraPPRV09,
author = {Fernanda Irrera and
Ivan Piccoli and
Giuseppina Puzzilli and
Massimo Rossini and
Tommaso Vali},
title = {Reliability improvements in 50 nm {MLC} {NAND} flash memory using
short voltage programming pulses},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {135--138},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.006},
doi = {10.1016/J.MICROREL.2008.11.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IrreraPPRV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IwamotoKS09,
author = {Nancy Iwamoto and
Ahila Krishnamoorthy and
Richard Spear},
title = {Performance properties in thick film silicate dielectric layers using
molecular modeling},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {877--883},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.010},
doi = {10.1016/J.MICROREL.2009.03.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IwamotoKS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobKKNLMP09,
author = {Peter Jacob and
Willy Knecht and
Albert Kunz and
Giovanni Nicoletti and
Thomas Lautenschlager and
Moreno Mondada and
Damien Pachoud},
title = {Reading distance degradation mechanisms of near-field {RFID} devices},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1288--1292},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.012},
doi = {10.1016/J.MICROREL.2009.06.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JacobKKNLMP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JansenQEBKPS09,
author = {Kaspar M. B. Jansen and
C. Qian and
Leo J. Ernst and
C. Bohm and
A. Kessler and
Harald Preu and
Matthias Stecher},
title = {Modeling and characterization of molding compound properties during
cure},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {872--876},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.007},
doi = {10.1016/J.MICROREL.2009.03.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JansenQEBKPS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JavaheriS09,
author = {M. Reza Javaheri and
Reza Sedaghat},
title = {Multi-valued logic mapping of resistive short and open delay-fault
testing in deep sub-micron technologies},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {178--185},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.010},
doi = {10.1016/J.MICROREL.2008.11.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JavaheriS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JenLL09,
author = {Ming{-}Hwa R. Jen and
Lee{-}Cheng Liu and
Yi{-}Shao Lai},
title = {Electromigration on void formation of Sn3Ag1.5Cu {FCBGA} solder joints},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {734--745},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.008},
doi = {10.1016/J.MICROREL.2009.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JenLL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JenqCLT09,
author = {S. T. Jenq and
Hsuan{-}Hu Chang and
Yi{-}Shao Lai and
Tsung{-}Yueh Tsai},
title = {High strain rate compression behavior for Sn-37Pb eutectic alloy,
lead-free Sn-1Ag-0.5Cu and Sn-3Ag-0.5Cu alloys},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {310--317},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.002},
doi = {10.1016/J.MICROREL.2009.01.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JenqCLT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeonKYCIP09,
author = {Yong Woo Jeon and
Dae Hyun Ka and
Chong{-}Gun Yu and
Won{-}Ju Cho and
M. Saif Islam and
Jong Tae Park},
title = {{NBTI} and hot carrier effect of {SOI} p-MOSFETs fabricated in strained
Si {SOI} wafer},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {994--997},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.015},
doi = {10.1016/J.MICROREL.2009.06.015},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JeonKYCIP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongP09,
author = {Jae{-}Seong Jeong and
Sang{-}Deuk Park},
title = {Failure analysis of video processor defined as No Fault Found {(NFF):}
Reproduction in system level and advanced analysis technique in {IC}
level},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1153--1157},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.049},
doi = {10.1016/J.MICROREL.2009.07.049},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JinZXCSH09,
author = {Dongyue Jin and
Wanrong Zhang and
Hongyun Xie and
Liang Chen and
Pei Shen and
Ning Hu},
title = {Structure optimization of multi-finger power SiGe HBTs for thermal
stability improvement},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {382--386},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.008},
doi = {10.1016/J.MICROREL.2009.01.008},
timestamp = {Wed, 28 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JinZXCSH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JinkaDGL09,
author = {K. K. Jinka and
A. Dasgupta and
S. Ganesan and
S. Ling},
title = {Chip-on board technology for low temperature environment. Part {II:}
Thermomechanical stresses in encapsulated ball-wedge bond wires},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {523--529},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.008},
doi = {10.1016/J.MICROREL.2009.02.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JinkaDGL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KangKCKK09,
author = {Jeung{-}Mo Kang and
Jae{-}Wook Kim and
Jeong{-}Hyeon Choi and
Du{-}Hyun Kim and
Ho{-}Ki Kwon},
title = {Life-time estimation of high-power blue light-emitting diode chips},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1231--1235},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.052},
doi = {10.1016/J.MICROREL.2009.07.052},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KangKCKK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KatsetosB09,
author = {Anastasios A. Katsetos and
Andrew C. Brendler},
title = {{NBTI} model development with regression analysis},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1498--1502},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.009},
doi = {10.1016/J.MICROREL.2009.06.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KatsetosB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KawaiDW09,
author = {Nozomu Kawai and
Yasuhiro Dohi and
Nobuyuki Wakai},
title = {Study for pulse stress {NBTI} characteristics degradation stress},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {989--993},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.004},
doi = {10.1016/J.MICROREL.2009.07.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KawaiDW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhatibiWWI09,
author = {Golta Khatibi and
W. Wroczewski and
Brigitte Weiss and
H. Ipser},
title = {A novel accelerated test technique for assessment of mechanical reliability
of solder interconnects},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1283--1287},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.021},
doi = {10.1016/J.MICROREL.2009.06.021},
timestamp = {Tue, 15 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhatibiWWI09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KingG09,
author = {Sean W. King and
J. A. Gradner},
title = {Intrinsic stress fracture energy measurements for {PECVD} thin films
in the SiO\({}_{\mbox{x}}\)C\({}_{\mbox{y}}\)N\({}_{\mbox{z}}\): {H}
system},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {721--726},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.006},
doi = {10.1016/J.MICROREL.2009.04.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KingG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KisielS09,
author = {Ryszard Kisiel and
Zbigniew Szczepanski},
title = {Die-attachment solutions for SiC power devices},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {627--629},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.009},
doi = {10.1016/J.MICROREL.2009.03.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KisielS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KockKDGP09,
author = {Helmut K{\"{o}}ck and
Vladim{\'{\i}}r Kosel and
Christian Djelassi and
Michael Glavanovics and
Dionyz Pogany},
title = {{IR} thermography and {FEM} simulation analysis of on-chip temperature
during thermal-cycling power-metal reliability testing using in situ
heated structures},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1132--1136},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.032},
doi = {10.1016/J.MICROREL.2009.06.032},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KockKDGP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KokkoHHK09,
author = {Kati Kokko and
Hanna Harjunp{\"{a}}{\"{a}} and
Pekka Heino and
Minna Kellom{\"{a}}ki},
title = {Influence of medical sterilization on {ACA} flip chip joints using
conformal coating},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {92--98},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.016},
doi = {10.1016/J.MICROREL.2008.10.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KokkoHHK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kontoleon09,
author = {John Kontoleon},
title = {Soft error recovery in simplex and triplex memory systems},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {410--423},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.009},
doi = {10.1016/J.MICROREL.2008.12.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kontoleon09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KshirsagarP09,
author = {Ravindra V. Kshirsagar and
Rajendra M. Patrikar},
title = {Design of a novel fault-tolerant voter circuit for {TMR} implementation
to improve reliability in digital circuits},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1573--1577},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.08.001},
doi = {10.1016/J.MICROREL.2009.08.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KshirsagarP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuanLC09,
author = {Wei{-}Chih Kuan and
S. W. Liang and
Chih Chen},
title = {Effect of bump size on current density and temperature distributions
in flip-chip solder joints},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {544--550},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.001},
doi = {10.1016/J.MICROREL.2009.03.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KuanLC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuboCMF09,
author = {Haruka Kubo and
Mauro Ciappa and
Takayuki Masunaga and
Wolfgang Fichtner},
title = {Multiscale simulation of aluminum thin films for the design of highly-reliable
{MEMS} devices},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1278--1282},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.034},
doi = {10.1016/J.MICROREL.2009.07.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KuboCMF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kuehl09,
author = {Reiner W. Kuehl},
title = {Stability of thin film resistors - Prediction and differences base
on time-dependent Arrhenius law},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {51--58},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.013},
doi = {10.1016/J.MICROREL.2008.10.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kuehl09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KwonKPHJS09,
author = {Sangwook Kwon and
Jongseok Kim and
Gilsu Park and
Youngtack Hong and
Byeong{-}Kwon Ju and
Insang Song},
title = {{RF} device package method using Au to Au direct bonding technology},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {99--102},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.007},
doi = {10.1016/J.MICROREL.2008.10.007},
timestamp = {Thu, 27 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KwonKPHJS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiTT09,
author = {Yi{-}Shao Lai and
Ho{-}Ming Tong and
King{-}Ning Tu},
title = {Recent research advances in Pb-free solders},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {221--222},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.007},
doi = {10.1016/J.MICROREL.2009.02.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiTT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LallHBMV09,
author = {Pradeep Lall and
Madhura Hande and
Chandan Bhat and
Vikrant More and
Rahul Vaidya},
title = {Prognostication of system-state in lead-free electronics equipment
under cyclic and steady-state thermo-mechanical loads},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {825--838},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.024},
doi = {10.1016/J.MICROREL.2009.03.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LallHBMV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LangfelderLZCGM09,
author = {Giacomo Langfelder and
Antonio Longoni and
Federico Zaraga and
Alberto Corigliano and
Aldo Ghisi and
A. Merassi},
title = {A new on-chip test structure for real time fatigue analysis in polysilicon
{MEMS}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {120--126},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.009},
doi = {10.1016/J.MICROREL.2008.11.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LangfelderLZCGM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LanzaPNAGS09,
author = {Mario Lanza and
Marc Porti and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
G. Ghidini and
A. Sebastiani},
title = {Trapped charge and stress induced leakage current {(SILC)} in tunnel
SiO\({}_{\mbox{2}}\) layers of de-processed {MOS} non-volatile memory
devices observed at the nanoscale},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1188--1191},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.016},
doi = {10.1016/J.MICROREL.2009.06.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LanzaPNAGS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauTS09,
author = {W. S. Lau and
Joy B. H. Tan and
B. P. Singh},
title = {Formation of Ohmic contacts in AlGaN/GaN {HEMT} structures at 500
degreeC by Ohmic contact recess etching},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {558--561},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.010},
doi = {10.1016/J.MICROREL.2009.02.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LauTS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauYCHLSC09,
author = {W. S. Lau and
Peizhen Yang and
Jason Zhiwei Chian and
V. Ho and
C. H. Loh and
S. Y. Siah and
L. Chan},
title = {Drain current saturation at high drain voltage due to pinch off instead
of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {1--7},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.006},
doi = {10.1016/J.MICROREL.2008.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LauYCHLSC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaurilaHVK09,
author = {Tomi Laurila and
J. Hurtig and
Vesa Vuorinen and
Jorma K. Kivilahti},
title = {Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic
compound layers},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {242--247},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.08.007},
doi = {10.1016/J.MICROREL.2008.08.007},
timestamp = {Tue, 24 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaurilaHVK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeFAYDRCP09,
author = {Chi{-}Woo Lee and
Isabelle Ferain and
Aryan Afzalian and
Ran Yan and
Nima Dehdashti and
Pedram Razavi and
Jean{-}Pierre Colinge and
Jong Tae Park},
title = {{NBTI} and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1044--1047},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.011},
doi = {10.1016/J.MICROREL.2009.06.011},
timestamp = {Fri, 22 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeFAYDRCP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LefebvreGB09,
author = {Jean Luc Lefebvre and
Christian Gautier and
Fr{\'{e}}d{\'{e}}ric Barbier},
title = {Correlation between {EOS} customer return failure cases and Over Voltage
Stress {(OVS)} test method},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {952--957},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.030},
doi = {10.1016/J.MICROREL.2009.07.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LefebvreGB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LewisL09,
author = {Dean Lewis and
Nathalie Labat},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {935--936},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.041},
doi = {10.1016/J.MICROREL.2009.07.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LewisL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoTS09,
author = {Jie Liao and
Cher Ming Tan and
Geert Spierings},
title = {Behavior of hot carrier generation in power {SOI} {LDNMOS} with shallow
trench isolation {(STI)}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1038--1043},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.044},
doi = {10.1016/J.MICROREL.2009.06.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoTS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoTSKLMNL09,
author = {Joy Y. Liao and
Tung Ton and
Nathan Slattengren and
Steven Kasapi and
William K. Lo and
Howard L. Marks and
Yin S. Ng and
Ted R. Lundquist},
title = {Jitter analysis of PLL-generated clock propagation using Jitter Mitigation
techniques with laser voltage probing},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1127--1131},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.017},
doi = {10.1016/J.MICROREL.2009.07.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoTSKLMNL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinPLL09,
author = {Ta{-}Hsuan Lin and
Stephen Paul and
Susan S. Lu and
Huitian Lu},
title = {A study on the performance and reliability of magnetostatic actuated
{RF} {MEMS} switches},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {59--65},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.07.072},
doi = {10.1016/J.MICROREL.2008.07.072},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinPLL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinSLCLU09,
author = {Li{-}Wei Lin and
Jenn{-}Ming Song and
Yi{-}Shao Lai and
Ying{-}Ta Chiu and
Ning{-}Cheng Lee and
Jun{-}Yen Uan},
title = {Alloying modification of Sn-Ag-Cu solders by manganese and titanium},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {235--241},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.001},
doi = {10.1016/J.MICROREL.2008.10.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinSLCLU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LintenTBDTSNWDG09,
author = {Dimitri Linten and
Steven Thijs and
Jonathan Borremans and
Morin Dehan and
David Tr{\'{e}}mouilles and
Mirko Scholz and
M. I. Natarajan and
Piet Wambacq and
Stefaan Decoutere and
Guido Groeseneken},
title = {A plug-and-play wideband {RF} circuit {ESD} protection methodology:
T-diodes},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1440--1446},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.10.011},
doi = {10.1016/J.MICROREL.2009.10.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LintenTBDTSNWDG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuKDDSZ09,
author = {Y. Liu and
F. J. H. G. Kessels and
Willem D. van Driel and
J. A. S. van Driel and
F. L. Sun and
G. Q. Zhang},
title = {Comparing drop impact test method using strain gauge measurements},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1299--1303},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.008},
doi = {10.1016/J.MICROREL.2009.07.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuKDDSZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuMSYW09,
author = {Xiaoxiao Liu and
Guangsheng Ma and
Jingbo Shao and
Zhi Yang and
Guanjun Wang},
title = {Interconnect crosstalk noise evaluation in deep-submicron technologies},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {170--177},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.013},
doi = {10.1016/J.MICROREL.2008.11.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuMSYW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuMZZ09,
author = {Fang Liu and
Guang Meng and
Mei Zhao and
Jun feng Zhao},
title = {Experimental and numerical analysis of {BGA} lead-free solder joint
reliability under board-level drop impact},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {79--85},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.014},
doi = {10.1016/J.MICROREL.2008.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuMZZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuTWF09,
author = {Jun Liu and
Wing{-}Shan Tam and
Hei Wong and
Valeriu Filip},
title = {Temperature-dependent light-emitting characteristics of InGaN/GaN
diodes},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {38--41},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.002},
doi = {10.1016/J.MICROREL.2008.10.002},
timestamp = {Sat, 11 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuTWF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuX09,
author = {Meng Liu and
Ai{-}Ping Xian},
title = {Tin whisker growth on bulk Sn-Pb eutectic doping with Nd},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {667--672},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.012},
doi = {10.1016/J.MICROREL.2009.03.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuX09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuXCL09,
author = {Lu Liu and
Jing{-}Ping Xu and
L. L. Chen and
Pui To Lai},
title = {A study on the improved programming characteristics of flash memory
with Si\({}_{\mbox{3}}\)N\({}_{\mbox{4}}\)/SiO\({}_{\mbox{2}}\) stacked
tunneling dielectric},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {912--915},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.010},
doi = {10.1016/J.MICROREL.2009.05.010},
timestamp = {Thu, 06 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuXCL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaestroR09,
author = {Juan Antonio Maestro and
Pedro Reviriego},
title = {A method to eliminate the event accumulation problem from a memory
affected by multiple bit upsets},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {707--715},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.002},
doi = {10.1016/J.MICROREL.2009.05.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaestroR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MahdaviM09,
author = {Seyyed Javad Seyyed Mahdavi and
Karim Mohammadi},
title = {Evolutionary derivation of optimal test sets for neural network based
analog and mixed signal circuits fault diagnosis approach},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {199--208},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.002},
doi = {10.1016/J.MICROREL.2008.12.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MahdaviM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MahdaviM09a,
author = {Seyyed Javad Seyyed Mahdavi and
Karim Mohammadi},
title = {{SCRAP:} Sequential circuits reliability analysis program},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {924--933},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.001},
doi = {10.1016/J.MICROREL.2009.06.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MahdaviM09a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaksimovicBNSK09,
author = {Dejan M. Maksimovic and
Fabrice Blanc and
Guido Notermans and
Theo Smedes and
Thomas Keller},
title = {An {ESD} test reduction method for complex devices},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1465--1469},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.10.010},
doi = {10.1016/J.MICROREL.2009.10.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaksimovicBNSK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MalandruccoloCRF09,
author = {Vezio Malandruccolo and
Mauro Ciappa and
Hubert Rothleitner and
Wolfgang Fichtner},
title = {A new built-in screening methodology to achieve zero defects in the
automotive environment},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1334--1340},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.016},
doi = {10.1016/J.MICROREL.2009.07.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MalandruccoloCRF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MalbertLCSHJDDDOBBC09,
author = {Nathalie Malbert and
Nathalie Labat and
Arnaud Curutchet and
C. Sury and
V. Hoel and
J.{-}C. de Jaeger and
Nicolas Defrance and
Y. Douvry and
Christian Dua and
Mourad Oualli and
C. Bru{-}Chevallier and
Jean{-}Marie Bluet and
W. Chikhaoui},
title = {Characterisation and modelling of parasitic effects and failure mechanisms
in AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1216--1221},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.015},
doi = {10.1016/J.MICROREL.2009.07.015},
timestamp = {Thu, 16 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MalbertLCSHJDDDOBBC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MalechaG09,
author = {Karol Malecha and
Leszek J. Golonka},
title = {Three-dimensional structuration of zero-shrinkage {LTCC} ceramics
for microfluidic applications},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {585--591},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.020},
doi = {10.1016/J.MICROREL.2009.02.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MalechaG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ManicDDDGS09,
author = {Ivica Manic and
Danijel Dankovic and
Snezana Djoric{-}Veljkovic and
Vojkan Davidovic and
Snezana Golubovic and
Ninoslav Stojadinovic},
title = {Effects of low gate bias annealing in {NBT} stressed p-channel power
VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1003--1007},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.010},
doi = {10.1016/J.MICROREL.2009.07.010},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ManicDDDGS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ManouvrierFLNA09,
author = {Jean{-}Robert Manouvrier and
Pascal Fonteneau and
Charles{-}Alexandre Legrand and
Pascal Nouet and
Florence Aza{\"{\i}}s},
title = {Characterization of the transient behavior of gated/STI diodes and
their associated {BJT} in the {CDM} time domain},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1424--1432},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.056},
doi = {10.1016/J.MICROREL.2009.06.056},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ManouvrierFLNA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin-PalmaPL09,
author = {Ra{\'{u}}l Jos{\'{e}} Mart{\'{\i}}n{-}Palma and
Carlo G. Pantano and
Akhlesh Lakhtakia},
title = {Towards the use of the conformal-evaporated-film-by-rotation technique
in fabricating microelectronic circuits and microsystems},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {460--462},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.003},
doi = {10.1016/J.MICROREL.2009.01.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Martin-PalmaPL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartineauMLDLV09,
author = {Donatien Martineau and
Thomas Mazeaud and
Marc Legros and
Philippe Dupuy and
Colette Levade and
G. Vanderschaeve},
title = {Characterization of ageing failures on power {MOSFET} devices by electron
and ion microscopies},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1330--1333},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.011},
doi = {10.1016/J.MICROREL.2009.07.011},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MartineauMLDLV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MatmatCMPEFE09,
author = {Mohamed Matmat and
Fabio Coccetti and
Antoine Marty and
Robert Plana and
Christophe Escriba and
Jean{-}Yves Fourniols and
Daniel Est{\`{e}}ve},
title = {Capacitive {RF} {MEMS} analytical predictive reliability and lifetime
characterization},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1304--1308},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.049},
doi = {10.1016/J.MICROREL.2009.06.049},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MatmatCMPEFE09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MayerMP09,
author = {M. Mayer and
J. T. Moon and
John Persic},
title = {Measuring stress next to Au ball bond during high temperature aging},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {771--781},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.018},
doi = {10.1016/J.MICROREL.2009.03.018},
timestamp = {Tue, 20 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MayerMP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MerilampiLR09,
author = {Sari Merilampi and
Teija Laine{-}Ma and
Pekka Ruuskanen},
title = {The characterization of electrically conductive silver ink patterns
on flexible substrates},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {782--790},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.004},
doi = {10.1016/J.MICROREL.2009.04.004},
timestamp = {Tue, 14 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MerilampiLR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MicolMDMK09,
author = {Alexandre Micol and
Carmen Martin and
Olivier Dalverny and
Michel Mermet{-}Guyennet and
Moussa Karama},
title = {Reliability of lead-free solder in power module with stochastic uncertainty},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {631--641},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.025},
doi = {10.1016/J.MICROREL.2009.02.025},
timestamp = {Thu, 16 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MicolMDMK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MicolZLAWDK09,
author = {Alexandre Micol and
A. Zeanh and
T. Lhommeau and
Stephane Azzopardi and
Eric Woirgard and
Olivier Dalverny and
Moussa Karama},
title = {An investigation into the reliability of power modules considering
baseplate solders thermal fatigue in aeronautical applications},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1370--1374},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.046},
doi = {10.1016/J.MICROREL.2009.06.046},
timestamp = {Thu, 25 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MicolZLAWDK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MilovanovicNSM09,
author = {Emina I. Milovanovic and
Tatjana R. Nikolic and
Mile K. Stojcev and
Igor Z. Milovanovic},
title = {Multi-functional systolic array with reconfigurable micro-power processing
elements},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {813--820},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.019},
doi = {10.1016/J.MICROREL.2009.03.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MilovanovicNSM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MirandaMOHCCMLOH09,
author = {Enrique Miranda and
Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Eamon O'Connor and
G. Hughes and
P. Casey and
Karim Cherkaoui and
S. Monaghan and
R. Long and
D. O'Connell and
Paul K. Hurley},
title = {Effects of the electrical stress on the conduction characteristics
of metal gate/MgO/InP stacks},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1052--1055},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.017},
doi = {10.1016/J.MICROREL.2009.06.017},
timestamp = {Tue, 11 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MirandaMOHCCMLOH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MisDM09,
author = {Edward Mis and
Andrzej Dziedzic and
Witold Mielcarek},
title = {Microvaristors in thick-film and {LTCC} circuits},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {607--613},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.002},
doi = {10.1016/J.MICROREL.2009.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MisDM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MitsuiSL09,
author = {Yasuhiro Mitsui and
Takeshi Sunaoshi and
Jon C. Lee},
title = {A study of electrical characteristic changes in {MOSFET} by electron
beam irradiation},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1182--1187},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.019},
doi = {10.1016/J.MICROREL.2009.07.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MitsuiSL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MohankumarSS09,
author = {N. Mohankumar and
Binit Syamal and
Chandan Kumar Sarkar},
title = {Investigation of novel attributes of single halo dual-material double
gate MOSFETs for analog/RF applications},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1491--1497},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.006},
doi = {10.1016/J.MICROREL.2009.06.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MohankumarSS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoliereFPB09,
author = {F. Moli{\`{e}}re and
B. Foucher and
Philippe Perdu and
Alain Bravaix},
title = {Analysis of deep submicron {VLSI} technological risks: {A} new qualification
process for professional electronics},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1381--1385},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.001},
doi = {10.1016/J.MICROREL.2009.07.001},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MoliereFPB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MonfraixBMDC09,
author = {Philippe Monfraix and
Regis Barbaste and
Jean Luc Muraro and
Claude Drevon and
Jean Louis Cazaux},
title = {Quasi hermetic packaging for new generation of spaceborn microwave
equipment},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1326--1329},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.051},
doi = {10.1016/J.MICROREL.2009.07.051},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MonfraixBMDC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuraV09,
author = {Giovanna Mura and
Massimo Vanzi},
title = {Lot reliability issues in commercial off the shelf {(COTS)} microelectronic
devices},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1196--1199},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.042},
doi = {10.1016/J.MICROREL.2009.06.042},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuraV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuzykovKZCBAS09,
author = {Peter G. Muzykov and
Robert M. Kennedy and
Qingchun Zhang and
Craig Capell and
Al Burk and
Anant Agarwal and
Tangali S. Sudarshan},
title = {Physical phenomena affecting performance and reliability of 4H-SiC
bipolar junction transistors},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {32--37},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.009},
doi = {10.1016/J.MICROREL.2008.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuzykovKZCBAS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NikolicSD09,
author = {Tatjana R. Nikolic and
Mile K. Stojcev and
Goran Lj. Djordjevic},
title = {{CDMA} bus-based on-chip interconnect infrastructure},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {448--459},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.002},
doi = {10.1016/J.MICROREL.2009.02.002},
timestamp = {Wed, 11 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NikolicSD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NogueiraVN09,
author = {Eduardo Nogueira and
Manuel V{\'{a}}zquez and
Neftal{\'{\i}} N{\'{u}}{\~{n}}ez},
title = {Evaluation of AlGaInP LEDs reliability based on accelerated tests},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1240--1243},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.031},
doi = {10.1016/J.MICROREL.2009.06.031},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NogueiraVN09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NoijenSTZ09,
author = {S. P. M. Noijen and
Olaf van der Sluis and
P. H. M. Timmermans and
G. Q. Zhang},
title = {Numerical prediction of failure paths at a roughened metal/polymer
interface},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1315--1318},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.019},
doi = {10.1016/J.MICROREL.2009.06.019},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NoijenSTZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NotermansQHMBZSKJ09,
author = {Guido Notermans and
Olivier Quittard and
Anco Heringa and
Zeljko Mrcarica and
Fabrice Blanc and
Hans van Zwol and
Theo Smedes and
Thomas Keller and
Peter C. de Jong},
title = {{ESD} robust high-voltage active clamps},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1433--1439},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.055},
doi = {10.1016/J.MICROREL.2009.06.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NotermansQHMBZSKJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NowakMDK09,
author = {Damian Nowak and
Edward Mis and
Andrzej Dziedzic and
Jaroslaw Kita},
title = {Fabrication and electrical properties of laser-shaped thick-film and
{LTCC} microresistors},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {600--606},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.019},
doi = {10.1016/J.MICROREL.2009.02.019},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NowakMDK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OngHOWVLYCTSHC09,
author = {Xuefen Ong and
Soon Wee Ho and
Yue Ying Ong and
Leong Ching Wai and
Kripesh Vaidyanathan and
Yeow Kheng Lim and
David Yeo and
Kai Chong Chan and
Juan Boon Tan and
Dong Kyun Sohn and
Liang Choo Hsia and
Zhong Chen},
title = {Underfill selection methodology for fine pitch Cu/low-k {FCBGA} packages},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {150--162},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.015},
doi = {10.1016/J.MICROREL.2008.11.015},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OngHOWVLYCTSHC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ortiz-CondeGMMRHL09,
author = {Adelmo Ortiz{-}Conde and
Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and
Juan Muci and
Denise C. Lugo Mu{\~{n}}oz and
{\'{A}}lvaro D. Latorre Rey and
Ching{-}Sung Ho and
Juin J. Liou},
title = {Indirect fitting procedure to separate the effects of mobility degradation
and source-and-drain resistance in {MOSFET} parameter extraction},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {689--692},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.005},
doi = {10.1016/J.MICROREL.2009.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ortiz-CondeGMMRHL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkFCJLBSBK09,
author = {S. Y. Park and
Carlo Floresca and
Uttiya Chowdhury and
Jose L. Jimenez and
Cathy Lee and
Edward Beam and
Paul Saunier and
Tony Balistreri and
Moon J. Kim},
title = {Physical degradation of GaN {HEMT} devices under high drain bias reliability
testing},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {478--483},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.015},
doi = {10.1016/J.MICROREL.2009.02.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkFCJLBSBK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkKS09,
author = {Jong Kang Park and
Jong Tae Kim and
Myong{-}Chul Shin},
title = {A CORDIC-based digital protective relay and its architecture},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {438--447},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.008},
doi = {10.1016/J.MICROREL.2008.12.008},
timestamp = {Mon, 13 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkKS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Peng09,
author = {Weiqun Peng},
title = {An investigation of Sn pest in pure Sn and Sn-based solders},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {86--91},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.001},
doi = {10.1016/J.MICROREL.2008.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Peng09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PiazzaDOMCW09,
author = {Michele Piazza and
Christian Dua and
Mourad Oualli and
Erwan Morvan and
Dominique Carisetti and
Fr{\'{e}}d{\'{e}}ric Wyczisk},
title = {Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1222--1225},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.043},
doi = {10.1016/J.MICROREL.2009.06.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PiazzaDOMCW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PietranicoPLKB09,
author = {S. Pietranico and
S. Pommier and
St{\'{e}}phane Lefebvre and
Zoubir Khatir and
S. Bontemps},
title = {Characterisation of power modules ceramic substrates for reliability
aspects},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1260--1266},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.026},
doi = {10.1016/J.MICROREL.2009.06.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PietranicoPLKB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Postel-PellerinLCBJBV09,
author = {J{\'{e}}r{\'{e}}my Postel{-}Pellerin and
Fr{\'{e}}d{\'{e}}ric Lalande and
Pierre Canet and
Rachid Bouchakour and
F. Jeuland and
B. Bertello and
B. Villard},
title = {Extraction of 3D parasitic capacitances in 90 nm and 22 nm {NAND}
flash memories},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1056--1059},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.020},
doi = {10.1016/J.MICROREL.2009.06.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Postel-PellerinLCBJBV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Postel-PellerinLCBJM09,
author = {J{\'{e}}r{\'{e}}my Postel{-}Pellerin and
Fr{\'{e}}d{\'{e}}ric Lalande and
Pierre Canet and
Rachid Bouchakour and
F. Jeuland and
L. Morancho},
title = {Modeling charge variation during data retention of {MLC} Flash memories},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1060--1063},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.034},
doi = {10.1016/J.MICROREL.2009.06.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Postel-PellerinLCBJM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RahmanEAD09,
author = {M. S. Rahman and
E. K. Evangelou and
I. I. Androulidakis and
Athanasios Dimoulas},
title = {Study of stress-induced leakage current {(SILC)} in HfO\({}_{\mbox{2}}\)/Dy\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
high-kappa gate stacks on germanium},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {26--31},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.005},
doi = {10.1016/J.MICROREL.2008.10.005},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RahmanEAD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RathiJGG09,
author = {Servin Rathi and
Jyotika Jogi and
Mridula Gupta and
R. S. Gupta},
title = {Modeling of hetero-interface potential and threshold voltage for tied
and separate nanoscale InAlAs-InGaAs symmetric double-gate {HEMT}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1508--1514},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.044},
doi = {10.1016/J.MICROREL.2009.07.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RathiJGG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RegardGFPMJ09,
author = {Charles Regard and
Christian Gautier and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Patrick Poirier and
Xiaosong Ma and
Kaspar M. B. Jansen},
title = {Fast reliability qualification of SiP products},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {958--962},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.042},
doi = {10.1016/J.MICROREL.2009.07.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RegardGFPMJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RhewJLYY09,
author = {Keun Ho Rhew and
Su Chang Jeon and
Dae Hee Lee and
Byueng{-}Su Yoo and
Ilgu Yun},
title = {Reliability assessment of 1.55-{\(\mathrm{\mu}\)}m vertical cavity
surface emitting lasers with tunnel junction using high-temperature
aging tests},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {42--50},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.008},
doi = {10.1016/J.MICROREL.2008.10.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RhewJLYY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RocaLMLP09,
author = {M. Roca and
Romain Laffont and
Gilles Micolau and
Fr{\'{e}}d{\'{e}}ric Lalande and
O. Pizzuto},
title = {A Modelisation of the temperature dependence of the Fowler-Nordheim
current in {EEPROM} memories},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1070--1073},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.036},
doi = {10.1016/J.MICROREL.2009.06.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RocaLMLP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RonchiZSTZM09,
author = {Nicolo Ronchi and
Franco Zanon and
Antonio Stocco and
Augusto Tazzoli and
Enrico Zanoni and
Gaudenzio Meneghesso},
title = {Reliability analysis of AlGaN/GaN {HEMT} on SopSiC composite substrate
under long-term DC-life test},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1207--1210},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.018},
doi = {10.1016/J.MICROREL.2009.07.018},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RonchiZSTZM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RossiRNIBS09,
author = {Lucio Rossi and
Michele Riccio and
Ettore Napoli and
Andrea Irace and
Giovanni Breglio and
Paolo Spirito},
title = {1300 V, 2 ms pulse inductive load switching test circuit with 20 ns
selectable crowbar intervention},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1386--1390},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.038},
doi = {10.1016/J.MICROREL.2009.07.038},
timestamp = {Fri, 01 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RossiRNIBS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyHT09,
author = {Arijit Roy and
Yuejin Hou and
Cher Ming Tan},
title = {Electromigration in width transition copper interconnect},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1086--1089},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.038},
doi = {10.1016/J.MICROREL.2009.06.038},
timestamp = {Tue, 27 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RoyHT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RuanNPTPVICP09,
author = {Jinyu Jason Ruan and
Nicolas Nolhier and
George J. Papaioannou and
David Tr{\'{e}}mouilles and
Vincent Puyal and
C. Villeneuve and
T. Idda and
Fabio Coccetti and
Robert Plana},
title = {Accelerated lifetime test of {RF-MEMS} switches under {ESD} stress},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1256--1259},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.023},
doi = {10.1016/J.MICROREL.2009.06.023},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RuanNPTPVICP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SabatCA09,
author = {Samrat L. Sabat and
Leandro dos Santos Coelho and
Ajith Abraham},
title = {{MESFET} {DC} model parameter extraction using Quantum Particle Swarm
Optimization},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {660--666},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.005},
doi = {10.1016/J.MICROREL.2009.03.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SabatCA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanchezE09,
author = {J. C. S{\'{a}}nchez and
Magali Estrada},
title = {Stability of the {J-V} characteristics of (BEHP-PPV)-co-(MEH-PPV)
based light-emitting diodes},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1503--1507},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.053},
doi = {10.1016/J.MICROREL.2009.07.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SanchezE09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SarkarMS09,
author = {Partha Sarkar and
Abhijit Mallik and
Chandan Kumar Sarkar},
title = {Study on the performance of sub 100 nm {LACLATI} MOSFETs for digital
application},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {392--396},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.015},
doi = {10.1016/J.MICROREL.2008.12.015},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SarkarMS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SauveplaneSD09,
author = {Jean{-}Baptiste Sauveplane and
Emmanuel Scheid and
A. Deram},
title = {On the accurate determination of the thermomechanical properties of
micro-scale material: Application to AlSi\({}_{\mbox{1{\%}}}\) chip
metallization of a power semiconductor device},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {499--505},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.012},
doi = {10.1016/J.MICROREL.2009.02.012},
timestamp = {Fri, 06 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SauveplaneSD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Scheuermann09,
author = {Uwe Scheuermann},
title = {Reliability challenges of automotive power electronics},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1319--1325},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.045},
doi = {10.1016/J.MICROREL.2009.06.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Scheuermann09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenLKLEB09,
author = {Rudolf Schlangen and
Reiner Leihkauf and
Uwe Kerst and
Ted R. Lundquist and
Peter Egger and
Christian Boit},
title = {Physical analysis, trimming and editing of nanoscale {IC} function
with backside {FIB} processing},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1158--1164},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.048},
doi = {10.1016/J.MICROREL.2009.06.048},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchlangenLKLEB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeoKSL09,
author = {Sun{-}Kyoung Seo and
Sung K. Kang and
Da{-}Yuan Shih and
Hyuck Mo Lee},
title = {The evolution of microstructure and microhardness of Sn-Ag and Sn-Cu
solders during high temperature aging},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {288--295},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.014},
doi = {10.1016/J.MICROREL.2008.11.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SeoKSL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShanHH09,
author = {Yi Shan and
John He and
Wen Huang},
title = {New substrate-triggered {ESD} protection structures in a 0.18-{\(\mathrm{\mu}\)}m
{CMOS} process without extra mask},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {17--25},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.003},
doi = {10.1016/J.MICROREL.2008.10.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShanHH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SharmaGGG09,
author = {Rupendra Kumar Sharma and
Ritesh Gupta and
Mridula Gupta and
R. S. Gupta},
title = {Dynamic performance of graded channel {DG} {FD} {SOI} n-MOSFETs for
minimizing the gate misalignment effect},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {699--706},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.023},
doi = {10.1016/J.MICROREL.2009.03.023},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SharmaGGG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShenC09,
author = {Jun Shen and
Y. C. Chan},
title = {Research advances in nano-composite solders},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {223--234},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.004},
doi = {10.1016/J.MICROREL.2008.10.004},
timestamp = {Wed, 17 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShenC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShihY09,
author = {Meng{-}Fu Shih and
Wen{-}Bin Young},
title = {Experimental study of filling behaviors in the underfill encapsulation
of a flip-chip},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1555--1562},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.056},
doi = {10.1016/J.MICROREL.2009.07.056},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShihY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SilvaRR09,
author = {Digeorgia N. da Silva and
Andr{\'{e}} In{\'{a}}cio Reis and
Renato P. Ribas},
title = {{CMOS} logic gate performance variability related to transistor network
arrangements},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {977--981},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.023},
doi = {10.1016/J.MICROREL.2009.07.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SilvaRR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SinkovicsK09,
author = {B{\'{a}}lint Sinkovics and
Oliv{\'{e}}r Krammer},
title = {Board level investigation of {BGA} solder joint deformation strength},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {573--578},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.021},
doi = {10.1016/J.MICROREL.2009.02.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SinkovicsK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SiuWTKI09,
author = {Sik{-}Lam Siu and
Hei Wong and
Wing{-}Shan Tam and
Kuniyuki Kakushima and
Hiroshi Iwai},
title = {Subthreshold parameters of radio-frequency multi-finger nanometer
{MOS} transistors},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {387--391},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.004},
doi = {10.1016/J.MICROREL.2009.01.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SiuWTKI09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SkwarekWR09,
author = {Agata Skwarek and
Krzysztof Witek and
Jacek Ratajczak},
title = {Risk of whiskers formation on the surface of commercially available
tin-rich alloys under thermal shocks},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {569--572},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.026},
doi = {10.1016/J.MICROREL.2009.02.026},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SkwarekWR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SluisETZ09,
author = {Olaf van der Sluis and
R. A. B. Engelen and
P. H. M. Timmermans and
G. Q. Zhang},
title = {Numerical analysis of delamination and cracking phenomena in multi-layered
flexible electronics},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {853--860},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.013},
doi = {10.1016/J.MICROREL.2009.03.013},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SluisETZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Smedes09,
author = {Theo Smedes},
title = {{ESD} testing of devices, ICs and systems},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {941--945},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.013},
doi = {10.1016/J.MICROREL.2009.07.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Smedes09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SmetanaBSLS09,
author = {Walter Smetana and
Bruno Balluch and
G{\"{u}}nther Stangl and
Sigrid L{\"{u}}ftl and
Sabine Seidler},
title = {Processing procedures for the realization of fine structured channel
arrays and bridging elements by LTCC-Technology},
journal = {Microelectron. Reliab.},
volume = {49},
number = {6},
pages = {592--599},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.023},
doi = {10.1016/J.MICROREL.2009.02.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SmetanaBSLS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SokolovicLZ09,
author = {Miljana Sokolovic and
Vanco B. Litovski and
Mark Zwolinski},
title = {New concepts of worst-case delay and yield estimation in asynchronous
{VLSI} circuits},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {186--198},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.007},
doi = {10.1016/J.MICROREL.2008.11.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SokolovicLZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SrivastavaSS09,
author = {A. Srivastava and
Partha Sarkar and
Chandan Kumar Sarkar},
title = {Study of gate dielectric permittivity variation with different equivalent
oxide thickness on channel engineered deep sub-micrometer n-MOSFET
device for mixed signal applications},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {365--370},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.008},
doi = {10.1016/J.MICROREL.2008.11.008},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SrivastavaSS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StadlerBGG09,
author = {Wolfgang Stadler and
Tilo Brodbeck and
Reinhold G{\"{a}}rtner and
Harald Gossner},
title = {Do {ESD} fails in systems correlate with {IC} {ESD} robustness?},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1079--1085},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.029},
doi = {10.1016/J.MICROREL.2009.07.029},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StadlerBGG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TahooriAMK09,
author = {Mehdi Baradaran Tahoori and
Hossein Asadi and
Brian Mullins and
David R. Kaeli},
title = {Obtaining {FPGA} soft error rate in high performance information systems},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {551--557},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.004},
doi = {10.1016/J.MICROREL.2009.03.004},
timestamp = {Fri, 14 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TahooriAMK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCXL09,
author = {Cher Ming Tan and
Boon Khai Eric Chen and
Gan Xu and
Yuanjie Liu},
title = {Analysis of humidity effects on the degradation of high-power white
LEDs},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1226--1230},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.005},
doi = {10.1016/J.MICROREL.2009.07.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanCXL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanZLT09,
author = {Long Bin Tan and
Xiaowu Zhang and
Chwee Teck Lim and
Vincent B. C. Tan},
title = {Mapping the failure envelope of board-level solder joints},
journal = {Microelectron. Reliab.},
volume = {49},
number = {4},
pages = {397--409},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.013},
doi = {10.1016/J.MICROREL.2008.12.013},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanZLT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Tanner09,
author = {D. M. Tanner},
title = {{MEMS} reliability: Where are we now?},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {937--940},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.014},
doi = {10.1016/J.MICROREL.2009.06.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Tanner09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TazzoliCAM09,
author = {Augusto Tazzoli and
Lorenzo Cerati and
A. Andreini and
Gaudenzio Meneghesso},
title = {Breakdown characterization of gate oxides in 35 and 70 {\AA} {BCD8}
smart power technology},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1111--1115},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.020},
doi = {10.1016/J.MICROREL.2009.07.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TazzoliCAM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ThangaduraiKME09,
author = {P. Thangadurai and
W. D. Kaplan and
V. Mikhelashvili and
Gadi Eisenstein},
title = {The influence of electron-beam irradiation on electrical characteristics
of metal-insulator-semiconductor capacitors based on a high-k dielectric
stack of HfTiSiO(N) and HfTiO(N) layers},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {716--720},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.003},
doi = {10.1016/J.MICROREL.2009.04.003},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ThangaduraiKME09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TiedemannKFHPB09,
author = {A.{-}K. Tiedemann and
K. Kurz and
M. Fakhri and
Ralf Heiderhoff and
J. C. H. Phang and
L. J. Balk},
title = {Finite element analyses assisted Scanning Joule Expansion Microscopy
on interconnects for failure analysis and reliability investigations},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1165--1168},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.030},
doi = {10.1016/J.MICROREL.2009.06.030},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TiedemannKFHPB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TrivellinMMZOYTU09,
author = {Nicola Trivellin and
Matteo Meneghini and
Gaudenzio Meneghesso and
Enrico Zanoni and
Kenji Orita and
Masaaki Yuri and
Tsuyoshi Tanaka and
Daisuke Ueda},
title = {Reliability analysis of InGaN Blu-Ray laser diode},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1236--1239},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.002},
doi = {10.1016/J.MICROREL.2009.07.002},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TrivellinMMZOYTU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TyaginovSSGG09,
author = {Stanislav Tyaginov and
Viktor Sverdlov and
Ivan A. Starkov and
Wolfgang G{\"{o}}s and
Tibor Grasser},
title = {Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage
rate},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {998--1002},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.018},
doi = {10.1016/J.MICROREL.2009.06.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TyaginovSSGG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VassilevS09,
author = {Vesselin K. Vassilev and
Wolfgang Stadler},
title = {Editorial {ESD} reliability special section},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1405--1406},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.10.013},
doi = {10.1016/J.MICROREL.2009.10.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VassilevS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VriesJD09,
author = {J. de Vries and
M. Jansen and
Willem D. van Driel},
title = {Solder-joint reliability of HVQFN-packages subjected to thermal cycling},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {331--339},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.007},
doi = {10.1016/J.MICROREL.2008.12.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VriesJD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLK09,
author = {Yi{-}Wun Wang and
Y. W. Lin and
C. Robert Kao},
title = {Kirkendall voids formation in the reaction between Ni-doped SnAg lead-free
solders and different Cu substrates},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {248--252},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.09.010},
doi = {10.1016/J.MICROREL.2008.09.010},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangLK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Whitman09,
author = {Charles S. Whitman},
title = {Prediction of transmission line lifetimes over temperature and current
density},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {488--494},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.006},
doi = {10.1016/J.MICROREL.2009.02.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Whitman09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGW09,
author = {Heinrich Wolf and
Horst A. Gieser and
Dirk Walter},
title = {Investigating the {CDM} susceptibility of IC's at package and wafer
level by capacitive coupled {TLP}},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1476--1481},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.10.006},
doi = {10.1016/J.MICROREL.2009.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WolfGW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongFLY09,
author = {Hei Wong and
Y. Fu and
Juin J. Liou and
Y. Yue},
title = {Hot-carrier reliability and breakdown characteristics of multi-finger
{RF} {MOS} transistors},
journal = {Microelectron. Reliab.},
volume = {49},
number = {1},
pages = {13--16},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.10.011},
doi = {10.1016/J.MICROREL.2008.10.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongFLY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongM09,
author = {Ee{-}Hua Wong and
Yiu{-}Wing Mai},
title = {The damped dynamics of printed circuit board and analysis of distorted
and deformed half-sine excitation},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {916--923},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.007},
doi = {10.1016/J.MICROREL.2009.05.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongSDCOL09,
author = {Ee{-}Hua Wong and
S. K. W. Seah and
W. D. van Driel and
J. F. J. M. Caers and
N. Owens and
Y.{-}S. Lai},
title = {Advances in the drop-impact reliability of solder joints for mobile
applications},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {139--149},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.001},
doi = {10.1016/J.MICROREL.2008.12.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongSDCOL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongTSCLKW09,
author = {Oi{-}Ying Wong and
Wing{-}Shan Tam and
Oi{-}Kan Shea and
Shiu Hung Cheung and
Jun Liu and
Chi{-}Wah Kok and
Hei Wong},
title = {Effects of periphery encapsulation material on the characteristics
of micro vacuum dielectric capacitor},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {506--509},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.022},
doi = {10.1016/J.MICROREL.2009.02.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongTSCLKW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuD09,
author = {Albert T. Wu and
Y. C. Ding},
title = {The suppression of tin whisker growth by the coating of tin oxide
nano particles and surface treatment},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {318--322},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.002},
doi = {10.1016/J.MICROREL.2008.11.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wymyslowski09,
author = {Artur Wymyslowski},
title = {Guest Editorial: 2008 EuroSimE international conference on thermal,
mechanical and multi-physics simulation and experiments in micro-electronics
and micro-systems},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {823--824},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.007},
doi = {10.1016/J.MICROREL.2009.04.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wymyslowski09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XieKLLZ09,
author = {Huimin Xie and
Satoshi Kishimoto and
Yanjie Li and
Qingjun Liu and
Yapu Zhao},
title = {Fabrication of micro-moir{\'{e}} gratings on a strain sensor
structure for deformation analysis with micro-moir{\'{e}} technique},
journal = {Microelectron. Reliab.},
volume = {49},
number = {7},
pages = {727--733},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.04.005},
doi = {10.1016/J.MICROREL.2009.04.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XieKLLZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamashitaOKMTMMMNN09,
author = {Masatsugu Yamashita and
Chiko Otani and
Sunmi Kim and
Hironaru Murakami and
Masayoshi Tonouchi and
Toru Matsumoto and
Yoshihiro Midoh and
Katsuyoshi Miura and
Koji Nakamae and
Kiyoshi Nikawa},
title = {Laser THz emission microscope as a novel tool for {LSI} failure analysis},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1116--1126},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.047},
doi = {10.1016/J.MICROREL.2009.07.047},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YamashitaOKMTMMMNN09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangB09,
author = {Liyu Yang and
Joseph B. Bernstein},
title = {Failure rate estimation of known failure mechanisms of electronic
packages},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1563--1572},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.005},
doi = {10.1016/J.MICROREL.2009.06.005},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YangB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangBK09,
author = {Liyu Yang and
Joseph B. Bernstein and
T. Koschmieder},
title = {Assessment of acceleration models used for {BGA} solder joint reliability
studies},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1546--1554},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.054},
doi = {10.1016/J.MICROREL.2009.07.054},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YangBK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangHLC09,
author = {Zunxian Yang and
Yun Huang and
Xinxin Li and
Guonan Chen},
title = {Investigation and simulation on the dynamic shock response performance
of packaged high-g {MEMS} accelerometer versus the impurity concentration
of the piezoresistor},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {510--516},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.018},
doi = {10.1016/J.MICROREL.2009.02.018},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YangHLC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangP09,
author = {Yue{-}Tzu Yang and
Huan{-}Sen Peng},
title = {Investigation of planted pin fins for heat transfer enhancement in
plate fin heat sink},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {163--169},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.011},
doi = {10.1016/J.MICROREL.2008.11.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YarimbiyikSAVZ09,
author = {A. Emre Yarimbiyik and
Harry A. Schafft and
Richard A. Allen and
Mark D. Vaudin and
Mona E. Zaghloul},
title = {Experimental and simulation studies of resistivity in nanoscale copper
films},
journal = {Microelectron. Reliab.},
volume = {49},
number = {2},
pages = {127--134},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.11.003},
doi = {10.1016/J.MICROREL.2008.11.003},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YarimbiyikSAVZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZaalHDZ09,
author = {Jeroen J. M. Zaal and
Hendrik Pieter Hochstenbach and
Willem D. van Driel and
G. Q. Zhang},
title = {Solder interconnect reliability under drop impact loading conditions
using High-speed Cold Bump Pull},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {846--852},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.03.008},
doi = {10.1016/J.MICROREL.2009.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZaalHDZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZaghloulPCPP09,
author = {Usama Zaghloul and
George J. Papaioannou and
Fabio Coccetti and
Patrick Pons and
Robert Plana},
title = {Dielectric charging in silicon nitride films for {MEMS} capacitive
switches: Effect of film thickness and deposition conditions},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1309--1314},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.006},
doi = {10.1016/J.MICROREL.2009.07.006},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZaghloulPCPP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangDS09,
author = {Bo Zhang and
Han Ding and
Xinjun Sheng},
title = {Reliability study of board-level lead-free interconnections under
sequential thermal cycling and drop impact},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {530--536},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.024},
doi = {10.1016/J.MICROREL.2009.02.024},
timestamp = {Wed, 02 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangDS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangZGX09,
author = {Ruihong Zhang and
Ran Zhao and
Fu Guo and
Zhidong Xia},
title = {Interfacial reaction between the electroless nickel immersion gold
substrate and Sn-based solders},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {303--309},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.016},
doi = {10.1016/J.MICROREL.2008.12.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangZGX09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoP09,
author = {Shufeng Zhao and
Xingshou Pang},
title = {Investigation of delamination control in plastic package},
journal = {Microelectron. Reliab.},
volume = {49},
number = {3},
pages = {350--356},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.01.001},
doi = {10.1016/J.MICROREL.2009.01.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuC09,
author = {Jianxin Zhu and
Zhihua Chen},
title = {High-accurate computation of wave propagation in complex waveguides
for microchip optical interconnections},
journal = {Microelectron. Reliab.},
volume = {49},
number = {5},
pages = {562--565},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.02.011},
doi = {10.1016/J.MICROREL.2009.02.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuS09,
author = {Jianxin Zhu and
Rencheng Song},
title = {Fast and stable computation of optical propagation in micro-waveguides
with loss},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1529--1536},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.004},
doi = {10.1016/J.MICROREL.2009.06.004},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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