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@article{DBLP:journals/mr/AckaertCDVSMVBIBVR08,
author = {Jan Ackaert and
R. Charavel and
K. Dhondt and
B. Vlachakis and
Luc De Schepper and
M. Millecam and
E. Vandevelde and
P. Bogaert and
A. Iline and
Eddy De Backer and
Alexandru Vlad and
Jean{-}Pierre Raskin},
title = {{MIMC} reliability and electrical behavior defined by a physical layer
property of the dielectric},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1553--1556},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.043},
doi = {10.1016/J.MICROREL.2008.06.043},
timestamp = {Wed, 21 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AckaertCDVSMVBIBVR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhmetNKNTSHI08,
author = {Parhat Ahmet and
Kentaro Nakagawa and
Kuniyuki Kakushima and
Hiroshi Nohira and
Kazuo Tsutsui and
Nobuyuki Sugii and
Takeo Hattori and
Hiroshi Iwai},
title = {Electrical characteristics of MOSFETs with La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
gate stack},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1769--1771},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.004},
doi = {10.1016/J.MICROREL.2008.09.004},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AhmetNKNTSHI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AichingerNG08,
author = {Thomas Aichinger and
Michael Nelhiebel and
Tibor Grasser},
title = {On the temperature dependence of {NBTI} recovery},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1178--1184},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.018},
doi = {10.1016/J.MICROREL.2008.06.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AichingerNG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Alam08,
author = {Muhammad Ashraful Alam},
title = {Reliability- and process-variation aware design of integrated circuits},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1114--1122},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.039},
doi = {10.1016/J.MICROREL.2008.07.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Alam08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AltesTRSN08,
author = {Andreas Altes and
Rainer Tilgner and
Markus Reissner and
Grazyna Steckert and
Gerald Neumann},
title = {Advanced thermal failure analysis and reliability investigations -
Industrial demands and related limitations},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1273--1278},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.020},
doi = {10.1016/J.MICROREL.2008.06.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AltesTRSN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Amagai08,
author = {Masazumi Amagai},
title = {A study of nanoparticles in Sn-Ag based lead free solders},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {1--16},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.004},
doi = {10.1016/J.MICROREL.2007.05.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Amagai08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AresuPGG08,
author = {Stefano Aresu and
Reinhard Pufall and
Michael Goroll and
Wolfgang Gustin},
title = {{NBTI} on smart power technologies: {A} detailed analysis of two concurrent
effects using a re-examined on-the-fly technique},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1310--1312},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.015},
doi = {10.1016/J.MICROREL.2008.07.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AresuPGG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArpatzanisHTDTOK08,
author = {N. Arpatzanis and
Argyrios T. Hatzopoulos and
Dimitrios H. Tassis and
C. A. Dimitriadis and
Fran{\c{c}}ois Templier and
Maher Oudwan and
G. Kamarinos},
title = {Degradation of n-channel a-Si: H/nc-Si: {H} bilayer thin-film transistors
under {DC} electrical stress},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {531--536},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.11.003},
doi = {10.1016/J.MICROREL.2007.11.003},
timestamp = {Tue, 13 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ArpatzanisHTDTOK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaPN08,
author = {Elena Atanassova and
Albena Paskaleva and
Nenad Novkovski},
title = {Effects of the metal gate on the stress-induced traps in Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)/SiO\({}_{\mbox{2}}\)
stacks},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {514--525},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.11.002},
doi = {10.1016/J.MICROREL.2007.11.002},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaPN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaSP08,
author = {Elena Atanassova and
Ninoslav Stojadinovic and
Albena Paskaleva},
title = {Degradation behavior of Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\) stacks
and its dependence on the gate electrode},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1193--1197},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.006},
doi = {10.1016/J.MICROREL.2008.07.006},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaSP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AubertMR08,
author = {A. Aubert and
Lionel Dantas de Morais and
J. P. Rebrasse},
title = {Laser decapsulation of plastic packages for failure analysis: Process
control and artefact investigations},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1144--1148},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.004},
doi = {10.1016/J.MICROREL.2008.07.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AubertMR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaishyaMS08,
author = {Srimanta Baishya and
Abhijit Mallik and
Chandan Kumar Sarkar},
title = {A threshold voltage model for short-channel MOSFETs taking into account
the varying depth of channel depletion layers around the source and
drain},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {17--22},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.01.086},
doi = {10.1016/J.MICROREL.2007.01.086},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaishyaMS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BanuBJMGM08,
author = {Viorel Banu and
Pierre Brosselard and
Xavier Jord{\`{a}} and
Josep Montserrat and
Philippe Godignon and
Jos{\'{e}} Mill{\'{a}}n},
title = {Behaviour of 1.2 kV SiC {JBS} diodes under repetitive high power stress},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1444--1448},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.054},
doi = {10.1016/J.MICROREL.2008.07.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BanuBJMGM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarbierJ08,
author = {Fr{\'{e}}d{\'{e}}ric Barbier and
S{\'{e}}bastien Jacqueline},
title = {{ESD} sensitivity investigation on a wide range of high density embedded
capacitors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1422--1426},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.023},
doi = {10.1016/J.MICROREL.2008.07.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarbierJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BareisaJMS08,
author = {Eduardas Bareisa and
Vacius Jusas and
Kestutis Motiejunas and
Rimantas Seinauskas},
title = {Test generation at the algorithm-level for gate-level fault coverage},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1093--1101},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.017},
doi = {10.1016/J.MICROREL.2008.03.017},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BareisaJMS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelarniLPBGSPP08,
author = {A. Belarni and
Mohamed Lamhamdi and
Patrick Pons and
Laurent Boudou and
Jean Guastavino and
Y. Segui and
George J. Papaioannou and
Robert Plana},
title = {Kelvin probe microscopy for reliability investigation of {RF-MEMS}
capacitive switches},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1232--1236},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.046},
doi = {10.1016/J.MICROREL.2008.07.046},
timestamp = {Thu, 07 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BelarniLPBGSPP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelashovS08,
author = {O. Belashov and
Jan K. Spelt},
title = {Thermal stress concentration factors for defects in plated-through-vias},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {225--244},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.04.012},
doi = {10.1016/J.MICROREL.2007.04.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BelashovS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BendidaKBBWGN08,
author = {S. Bendida and
J. J. Koning and
J. J. M. Bontemps and
J. T. M. van Beek and
D. Wu and
Marcel A. J. van Gils and
S. Nath},
title = {Temperature stability of a piezoresistive {MEMS} resonator including
self-heating},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1227--1231},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.049},
doi = {10.1016/J.MICROREL.2008.06.049},
timestamp = {Wed, 18 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BendidaKBBWGN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeraM08,
author = {M. K. Bera and
Chinmay K. Maiti},
title = {Reliability of ultra thin ZrO\({}_{\mbox{2}}\) films on strained-Si},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {682--692},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.001},
doi = {10.1016/J.MICROREL.2008.01.001},
timestamp = {Tue, 23 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BeraM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeylierBBG08,
author = {Gaelle Beylier and
Sylvie Bruy{\`{e}}re and
Darcy Benoit and
G{\'{e}}rard Ghibaudo},
title = {Impact of silicon nitride {CESL} on {NLDEMOS} transistor reliability},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1539--1543},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.035},
doi = {10.1016/J.MICROREL.2008.07.035},
timestamp = {Thu, 29 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeylierBBG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BhattacharyyaBMS08,
author = {Partha Bhattacharyya and
Palash Kumar Basu and
Biplob Mondal and
H. Saha},
title = {A low power {MEMS} gas sensor based on nanocrystalline ZnO thin films
for sensing methane},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1772--1779},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.063},
doi = {10.1016/J.MICROREL.2008.07.063},
timestamp = {Sat, 20 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BhattacharyyaBMS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BibergerBSBG08,
author = {Roland Biberger and
Guenther Benstetter and
Thomas Schweinb{\"{o}}ck and
Peter Breitschopf and
Holger Goebel},
title = {Intermittent-contact scanning capacitance microscopy versus contact
mode {SCM} applied to 2D dopant profiling},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1339--1342},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.013},
doi = {10.1016/J.MICROREL.2008.06.013},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BibergerBSBG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoehmeW08,
author = {Bjoern Boehme and
Klaus{-}J{\"{u}}rgen Wolter},
title = {Study of temperature dependent properties of organic substrate materials},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {876--880},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.023},
doi = {10.1016/J.MICROREL.2008.03.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoehmeW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BorthenW08,
author = {Peter Borthen and
Gerhard K. M. Wachutka},
title = {Testing semiconductor devices at extremely high operating temperatures},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1440--1443},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.037},
doi = {10.1016/J.MICROREL.2008.07.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BorthenW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BourquiBGDVHROT08,
author = {M. L. Bourqui and
Laurent B{\'{e}}chou and
Olivier Gilard and
Yannick Deshayes and
Pamela Del Vecchio and
L. S. How and
F. Rosala and
Yves Ousten and
Andr{\'{e}} Touboul},
title = {Reliability investigations of 850 nm silicon photodiodes under proton
irradiation for space applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1202--1207},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.012},
doi = {10.1016/J.MICROREL.2008.07.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BourquiBGDVHROT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BouyaMLCPCLB08,
author = {Mohsine Bouya and
Nathalie Malbert and
Nathalie Labat and
D. Carisetti and
Philippe Perdu and
J. C. Clement and
Benoit Lambert and
M. Bonnet},
title = {Analysis of traps effect on AlGaN/GaN {HEMT} by luminescence techniques},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1366--1369},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.052},
doi = {10.1016/J.MICROREL.2008.07.052},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BouyaMLCPCLB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrandBMD08,
author = {Jeroen van den Brand and
Johan de Baets and
T. van Mol and
Andreas Dietzel},
title = {Systems-in-foil - Devices, fabrication processes and reliability issues},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1123--1128},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.030},
doi = {10.1016/J.MICROREL.2008.06.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrandBMD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BreglioINRSHNU08,
author = {Giovanni Breglio and
Andrea Irace and
Ettore Napoli and
Michele Riccio and
Paolo Spirito and
K. Hamada and
T. Nishijima and
T. Ueta},
title = {Detection of localized {UIS} failure on IGBTs with the aid of lock-in
thermography},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1432--1434},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.042},
doi = {10.1016/J.MICROREL.2008.06.042},
timestamp = {Fri, 01 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BreglioINRSHNU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BroujiBVBW08,
author = {H. El Brouji and
Olivier Briat and
Jean{-}Michel Vinassa and
Nicolas Bertrand and
Eric Woirgard},
title = {Comparison between changes of ultracapacitors model parameters during
calendar life and power cycling ageing tests},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1473--1478},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.022},
doi = {10.1016/J.MICROREL.2008.07.022},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BroujiBVBW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BukhoriRA08,
author = {Muhammad Faiz Bukhori and
Scott Roy and
Asen Asenov},
title = {Statistical aspects of reliability in bulk MOSFETs with multiple defect
states and random discrete dopants},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1549--1552},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.029},
doi = {10.1016/J.MICROREL.2008.06.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BukhoriRA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoAAI08,
author = {Giovanni Busatto and
Carmine Abbate and
B. Abbate and
Francesco Iannuzzo},
title = {{IGBT} modules robustness during turn-off commutation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1435--1439},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.027},
doi = {10.1016/J.MICROREL.2008.07.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoAAI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoCIPSV08,
author = {Giovanni Busatto and
Giuseppe Curr{\`{o}} and
Francesco Iannuzzo and
Alberto Porzio and
Annunziata Sanseverino and
Francesco Velardi},
title = {Experimental evidence of "latent gate oxide damages" in medium voltage
power {MOSFET} as a result of heavy ions exposure},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1306--1309},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.030},
doi = {10.1016/J.MICROREL.2008.07.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoCIPSV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaoZZLK08,
author = {Zigui Cao and
Bo Zhang and
Xiong Zhang and
Elton Lee and
Weiran Kong},
title = {Investigation of charge trapping/de-trapping induced operation lifetime
degradation in triple SuperFlash\({}^{\mbox{{\textregistered}}}\)
memory cell},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1809--1814},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.001},
doi = {10.1016/J.MICROREL.2008.09.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaoZZLK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CastellazziC08,
author = {Alberto Castellazzi and
Mauro Ciappa},
title = {Novel simulation approach for transient analysis and reliable thermal
management of power devices},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1500--1504},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.041},
doi = {10.1016/J.MICROREL.2008.07.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CastellazziC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Chen08,
author = {Cheng{-}fu Chen},
title = {Effect of underfill filler settling on thermo-mechanical fatigue analysis
of flip-chip eutectic solders},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1040--1051},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.022},
doi = {10.1016/J.MICROREL.2008.03.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Chen08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenBHSA08,
author = {Fen Chen and
O. Bravo and
Dave Harmon and
Michael A. Shinosky and
J. Aitken},
title = {Cu/low-k dielectric {TDDB} reliability issues for advanced {CMOS}
technologies},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1375--1383},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.037},
doi = {10.1016/J.MICROREL.2008.06.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenBHSA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenTL08,
author = {K. M. Chen and
K. H. Tang and
J. S. Liu},
title = {Reliability evaluation of {BOAC} and normal pad stacked-chip packaging
using low-K wafers},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {408--415},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.07.013},
doi = {10.1016/J.MICROREL.2007.07.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenTL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWY08,
author = {Y. S. Chen and
C. S. Wang and
Y. J. Yang},
title = {Combining vibration test with finite element analysis for the fatigue
life estimation of {PBGA} components},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {638--644},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.11.006},
doi = {10.1016/J.MICROREL.2007.11.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenWY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChengFCCLC08,
author = {Shiou{-}Ying Cheng and
Ssu{-}I Fu and
Kuei{-}Yi Chu and
Tzu{-}Pin Chen and
Wen{-}Chau Liu and
Li{-}Yang Chen},
title = {Improved performances of a two-step passivated heterojunction bipolar
transistor},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {200--203},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.04.002},
doi = {10.1016/J.MICROREL.2007.04.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChengFCCLC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiangFHCYL08,
author = {Yen{-}Ting Chiang and
Yean{-}Kuen Fang and
Y. J. Huang and
Tse{-}Heng Chou and
S. Y. Yeh and
C. S. Lin},
title = {Effect of the pre-gate oxide cleaning temperature on the reliability
of {GOI} and devices performances in deep submicron {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1786--1790},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.08.004},
doi = {10.1016/J.MICROREL.2008.08.004},
timestamp = {Tue, 23 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChiangFHCYL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChienCLHWY08,
author = {Chi{-}Hui Chien and
Thaiping Chen and
Wei{-}Bang Lin and
Chi{-}Chang Hsieh and
Yii{-}Der Wu and
Cheng{-}Hsiu Yeh},
title = {Experimental and statistical study in adhesion features of bonded
interfaces of {IC} packages},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {140--148},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.03.002},
doi = {10.1016/J.MICROREL.2007.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChienCLHWY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChinLYT08,
author = {Y. T. Chin and
P. K. Lam and
H. K. Yow and
Teck Yong Tou},
title = {Investigation of mechanical shock testing of lead-free {SAC} solder
joints in fine pitch {BGA} package},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1079--1086},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.003},
doi = {10.1016/J.MICROREL.2008.04.003},
timestamp = {Wed, 05 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChinLYT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Cho08,
author = {Seung Hyun Cho},
title = {Heat dissipation effect of Al plate embedded substrate in network
system},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1696--1702},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.018},
doi = {10.1016/J.MICROREL.2008.04.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Cho08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoCJSKY08,
author = {Han Seo Cho and
Sukhyeon Cho and
Jihong Jo and
Haenam Seo and
Byongmoon Kim and
Jegwang Yoo},
title = {Highly reliable processes for embedding discrete passive components
into organic substrates},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {739--743},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.006},
doi = {10.1016/J.MICROREL.2007.12.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoCJSKY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoCL08,
author = {Seunghyun Cho and
Soonjin Cho and
Joseph Y. Lee},
title = {Estimation of warpage and thermal stress of IVHs in flip-chip ball
grid arrays package by {FEM}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {300--309},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.001},
doi = {10.1016/J.MICROREL.2007.06.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoCL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouHYYYC08,
author = {Chan{-}Yen Chou and
Tuan{-}Yu Hung and
Shin{-}Yueh Yang and
Ming{-}Chih Yew and
Wen{-}Kun Yang and
Kuo{-}Ning Chiang},
title = {Solder joint and trace line failure simulation and experimental validation
of fan-out type wafer level packaging subjected to drop impact},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1149--1154},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.024},
doi = {10.1016/J.MICROREL.2008.06.024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChouHYYYC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChuangYJHZLLCC08,
author = {Chun{-}Chih Chuang and
Tsung{-}Fu Yang and
Jin{-}Ye Juang and
Yin{-}Po Hung and
Chau{-}Jie Zhan and
Yu{-}Min Lin and
Ching{-}Tsung Lin and
Pei{-}Chen Chang and
Tao{-}Chih Chang},
title = {Influence of underfill materials on the reliability of coreless flip
chip package},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1875--1881},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.005},
doi = {10.1016/J.MICROREL.2008.09.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChuangYJHZLLCC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CortesFFHR08,
author = {Ignasi Cort{\'{e}}s and
Pablo Fern{\'{a}}ndez{-}Mart{\'{\i}}nez and
David Flores and
Salvador Hidalgo and
Jos{\'{e}} Rebollo},
title = {Analysis of punch-through breakdown in bulk silicon {RF} power {LDMOS}
transistors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {173--180},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.004},
doi = {10.1016/J.MICROREL.2007.06.004},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CortesFFHR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaDM08,
author = {Paolo Cova and
Nicola Delmonte and
Roberto Menozzi},
title = {Thermal modeling of high frequency {DC-DC} switching modules: Electromagnetic
and thermal simulation of magnetic components},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1468--1472},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.046},
doi = {10.1016/J.MICROREL.2008.06.046},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CovaDM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CretinonHADD08,
author = {Laurent Cr{\'{e}}tinon and
M. El Hadachi and
F. Augereau and
L. Doireau and
G. Despaux},
title = {Influence of the organic pollution on the reliability of {HE9} connectors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1129--1132},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.053},
doi = {10.1016/J.MICROREL.2008.07.053},
timestamp = {Tue, 26 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CretinonHADD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CroesCZT08,
author = {Kristof Croes and
G. Cannat{\'{a}} and
L. Zhao and
Zsolt T{\"{o}}kei},
title = {Study of copper drift during {TDDB} of intermetal dielectrics by using
fully passivated {MOS} capacitors as test vehicle},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1384--1387},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.047},
doi = {10.1016/J.MICROREL.2008.07.047},
timestamp = {Fri, 02 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CroesCZT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CuadrasGMF08,
author = {Angel Cuadras and
B. Garrido and
J. R. Morante and
Luis Fonseca},
title = {Leakage currents and dielectric breakdown of Si\({}_{\mbox{1-x-y}}\)Ge\({}_{\mbox{x}}\)C\({}_{\mbox{y}}\)
thermal oxides},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1635--1640},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.061},
doi = {10.1016/J.MICROREL.2008.07.061},
timestamp = {Tue, 11 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CuadrasGMF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DaiKYLCY08,
author = {M. Z. Dai and
S. I. Kim and
Andrew Yap and
Shaohua Liu and
Arthur Cheng and
Leeward Yi},
title = {A unification of interface-state generation and hole-injection for
hot-carrier-injection stress in low and high-voltage {NMOSFET}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {504--507},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.09.007},
doi = {10.1016/J.MICROREL.2007.09.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DaiKYLCY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dakhel08,
author = {A. A. Dakhel},
title = {dc-Conduction mechanism in lanthanum-manganese oxide films grown on
p-Si substrate},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {395--400},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.003},
doi = {10.1016/J.MICROREL.2007.08.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dakhel08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DanesinTZMZCLLPR08,
author = {Francesca Danesin and
Augusto Tazzoli and
Franco Zanon and
Gaudenzio Meneghesso and
Enrico Zanoni and
Antonio Cetronio and
Claudio Lanzieri and
Simone Lavanga and
Marco Peroni and
Paolo Romanini},
title = {Thermal storage effects on AlGaN/GaN {HEMT}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1361--1365},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.008},
doi = {10.1016/J.MICROREL.2008.07.008},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DanesinTZMZCLLPR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DankovicMDDGS08,
author = {Danijel Dankovic and
Ivica Manic and
Vojkan Davidovic and
Snezana Djoric{-}Veljkovic and
Snezana Golubovic and
Ninoslav Stojadinovic},
title = {Negative bias temperature instability in n-channel power VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1313--1317},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.015},
doi = {10.1016/J.MICROREL.2008.06.015},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DankovicMDDGS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DeshayesBBAMBRO08,
author = {Yannick Deshayes and
Isabelle Bord{-}Majek and
G. Barreau and
M. Aiche and
Philippe Moretto and
Laurent B{\'{e}}chou and
A. C. Roehrig and
Yves Ousten},
title = {Selective activation of failure mechanisms in packaged double-heterostructure
light emitting diodes using controlled neutron energy irradiation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1354--1360},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.044},
doi = {10.1016/J.MICROREL.2008.06.044},
timestamp = {Thu, 13 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DeshayesBBAMBRO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DingK08,
author = {Yong Ding and
Jang{-}Kyo Kim},
title = {Numerical analysis of ultrasonic wire bonding: Part 2. Effects of
bonding parameters on temperature rise},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {149--157},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.01.083},
doi = {10.1016/J.MICROREL.2007.01.083},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DingK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DiopRMMCG08,
author = {Malick Diop and
Nathalie Revil and
M. Marin and
Frederic Monsieur and
Pascal Chevalier and
G{\'{e}}rard Ghibaudo},
title = {Impact of inside spacer process on fully self-aligned 250 GHz SiGe:
{C} HBTs reliability performances: a-Si vs. nitride},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1198--1201},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.045},
doi = {10.1016/J.MICROREL.2008.06.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DiopRMMCG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DominkovicsH08,
author = {Csaba Dominkovics and
G{\'{a}}bor Hars{\'{a}}nyi},
title = {Fractal description of dendrite growth during electrochemical migration},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1628--1634},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.010},
doi = {10.1016/J.MICROREL.2008.06.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DominkovicsH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DonovalFGKK08,
author = {D. Donoval and
Martin Florovic and
Dagmar Gregusov{\'{a}} and
Jaroslav Kov{\'{a}}c and
Peter Kordos},
title = {High-temperature performance of AlGaN/GaN HFETs and MOSHFETs},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1669--1672},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.017},
doi = {10.1016/J.MICROREL.2008.04.017},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DonovalFGKK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DowhanWD08,
author = {Lukasz Dowhan and
Artur Wymyslowski and
Rainer Dudek},
title = {An approach of numerical multi-objective optimization in stacked packaging},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {851--857},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.010},
doi = {10.1016/J.MICROREL.2008.04.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DowhanWD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DrielYZ08,
author = {W. D. van Driel and
Dao{-}Guo Yang and
G. Q. Zhang},
title = {On chip-package stress interaction},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1268--1272},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.039},
doi = {10.1016/J.MICROREL.2008.06.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DrielYZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuDHLHLCHW08,
author = {Xiaoyang Du and
Shurong Dong and
Yan Han and
Juin J. Liou and
Mingxu Huo and
You Li and
Qiang Cui and
Dahai Huang and
Demiao Wang},
title = {Evaluation of {RF} electrostatic discharge {(ESD)} protection in 0.18-{\(\mathrm{\mu}\)}m
{CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {995--999},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.005},
doi = {10.1016/J.MICROREL.2008.04.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuDHLHLCHW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic08,
author = {Andrzej Dziedzic},
title = {{IMAPS} Poland 2007 - Guest Editorial},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {859},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.014},
doi = {10.1016/J.MICROREL.2008.04.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dziedzic08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EjlaliM08,
author = {Alireza Ejlali and
Seyed Ghassem Miremadi},
title = {Error propagation analysis using FPGA-based SEU-fault injection},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {319--328},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.04.003},
doi = {10.1016/J.MICROREL.2007.04.003},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EjlaliM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM08,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {957},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.015},
doi = {10.1016/J.MICROREL.2008.04.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ErslandM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EstradaOSPBK08,
author = {D. Estrada and
M. L. Ogas and
R. G. Southwick III and
P. M. Price and
R. J. Baker and
W. B. Knowlton},
title = {Impact of single pMOSFET dielectric degradation on {NAND} circuit
performance},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {354--363},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.09.002},
doi = {10.1016/J.MICROREL.2007.09.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EstradaOSPBK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FaccioBCFGMS08,
author = {Federico Faccio and
Hugh J. Barnaby and
Xiao J. Chen and
Daniel M. Fleetwood and
Laura Gonella and
Michael L. McLain and
Ronald D. Schrimpf},
title = {Total ionizing dose effects in shallow trench isolation oxides},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1000--1007},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.004},
doi = {10.1016/J.MICROREL.2008.04.004},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FaccioBCFGMS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FellerHS08,
author = {Lydia Feller and
Samuel Hartmann and
Daniel Schneider},
title = {Lifetime analysis of solder joints in high power {IGBT} modules for
increasing the reliability for operation at 150 degreeC},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1161--1166},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.019},
doi = {10.1016/J.MICROREL.2008.07.019},
timestamp = {Thu, 03 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FellerHS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FerrignoMPLHG08,
author = {Julie Ferrigno and
Aziz Machouat and
Philippe Perdu and
Dean Lewis and
G{\'{e}}rald Haller and
Vincent Goubier},
title = {Generic simulator for faulty {IC}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1592--1596},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.013},
doi = {10.1016/J.MICROREL.2008.07.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FerrignoMPLHG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fock-Sui-TooCATMM08,
author = {Jean{-}Luc Fock Sui Too and
B. Chauchat and
Patrick Austin and
Patrick Tounsi and
Michel Mermet{-}Guyennet and
R{\'{e}}gis Meuret},
title = {Performance and reliability testing of modern {IGBT} devices under
typical operating conditions of aeronautic applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1453--1458},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.051},
doi = {10.1016/J.MICROREL.2008.07.051},
timestamp = {Mon, 22 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fock-Sui-TooCATMM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FrancoVNN08,
author = {Denis Teixeira Franco and
Ma{\'{\i}} Correia Vasconcelos and
Lirida A. B. Naviner and
Jean{-}Fran{\c{c}}ois Naviner},
title = {Signal probability for reliability evaluation of logic circuits},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1586--1591},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.002},
doi = {10.1016/J.MICROREL.2008.07.002},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FrancoVNN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoB08,
author = {Liming Gao and
Christian Burmer},
title = {{PLL} soft functional failure analysis in advanced logic product using
fault based analogue simulation and soft defect localization},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1349--1353},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.012},
doi = {10.1016/J.MICROREL.2008.06.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GaoB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GauffierDG08,
author = {A. Gauffier and
Jean{-}Pierre David and
Olivier Gilard},
title = {Analytical model for multi-junction solar cells prediction in space
environment},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1494--1499},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.049},
doi = {10.1016/J.MICROREL.2008.07.049},
timestamp = {Wed, 10 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GauffierDG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GautierLJNGD08,
author = {Christian Gautier and
Sophie Ledain and
S{\'{e}}bastien Jacqueline and
Matthieu Nongaillard and
Vincent Georgel and
Karine Danilo},
title = {Silicon based system in package: Improvement of passive integration
process to avoid {TBMS} failure},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1258--1262},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.033},
doi = {10.1016/J.MICROREL.2008.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GautierLJNGD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GawAM08,
author = {Craig A. Gaw and
Thomas Arnold and
Karen Moore},
title = {Intrinsic reliability of a 12 {V} field plate pHEMT},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {974--984},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.009},
doi = {10.1016/J.MICROREL.2008.03.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GawAM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GiraultTN08,
author = {Valerie Girault and
F. Terrier and
D. Ney},
title = {Reservoir effect in SiCN capped copper/SiO\({}_{\mbox{2}}\) interconnects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {219--224},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.007},
doi = {10.1016/J.MICROREL.2007.05.007},
timestamp = {Tue, 16 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GiraultTN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GonzalezABBVV08,
author = {Mario Gonzalez and
Fabrice Axisa and
Mathieu Vanden Bulcke and
Dominique Brosteaux and
Bart Vandevelde and
Jan Vanfleteren},
title = {Design of metal interconnects for stretchable electronic circuits},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {825--832},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.025},
doi = {10.1016/J.MICROREL.2008.03.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GonzalezABBVV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Gorecki08,
author = {Krzysztof G{\'{o}}recki},
title = {A new electrothermal average model of the diode-transistor switch},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {51--58},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.02.024},
doi = {10.1016/J.MICROREL.2007.02.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Gorecki08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GorollPAG08,
author = {Michael Goroll and
Reinhard Pufall and
Stefano Aresu and
Wolfgang Gustin},
title = {New aspects for lifetime prediction of bipolar transistors in automotive
power wafer technologies by using a power law fitting procedure},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1509--1512},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.010},
doi = {10.1016/J.MICROREL.2008.07.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GorollPAG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoswamiH08,
author = {Arindam Goswami and
Bongtae Han},
title = {On the applicability of MIL-Spec-based helium fine leak test to packages
with sub-micro liter cavity volumes},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1815--1821},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.067},
doi = {10.1016/J.MICROREL.2008.07.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoswamiH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Goto08,
author = {Yasunori Goto},
title = {Defect analysis concerning variation in characteristics of {PIN} diode
for Hybrid Vehicles},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1485--1489},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.020},
doi = {10.1016/J.MICROREL.2008.07.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Goto08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GraubySLCCD08,
author = {St{\'{e}}phane Grauby and
M. Amine Salhi and
Luis David Pati{\~{n}}o Lopez and
Wilfrid Claeys and
Beno{\^{\i}}t Charlot and
Stefan Dilhaire},
title = {Comparison of thermoreflectance and scanning thermal microscopy for
microelectronic device temperature variation imaging: Calibration
and resolution issues},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {204--211},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.04.008},
doi = {10.1016/J.MICROREL.2007.04.008},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GraubySLCCD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrekovZFAS08,
author = {A. Grekov and
Qingchun Zhang and
Fatima Husna and
Anant Agarwal and
Tangali S. Sudarshan},
title = {Effect of crystallographic defects on the reverse performance of 4H-SiC
{JBS} diodes},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1664--1668},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.05.001},
doi = {10.1016/J.MICROREL.2008.05.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GrekovZFAS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GroesenekenWMB08,
author = {Guido Groeseneken and
Ingrid De Wolf and
A. J. Mouthaan and
Jaap Bisschop},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1111},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.058},
doi = {10.1016/J.MICROREL.2008.07.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GroesenekenWMB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HamadaR08,
author = {Dorothy June M. Hamada and
William J. Roesch},
title = {A wafer-level approach to device lifetesting},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {985--989},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.020},
doi = {10.1016/J.MICROREL.2008.04.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HamadaR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HangWMTZW08,
author = {Chunjing Hang and
Chunqing Wang and
M. Mayer and
Yanhong Tian and
Norman Y. Zhou and
Honghui Wang},
title = {Growth behavior of Cu/Al intermetallic compounds and cracks in copper
ball bonds during isothermal aging},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {416--424},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.008},
doi = {10.1016/J.MICROREL.2007.06.008},
timestamp = {Sat, 03 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HangWMTZW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HartmannW08,
author = {Claus Hartmann and
M. Wieberneit},
title = {Layout analysis as supporting tool for failure localization: Basic
principles and case studies},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1343--1348},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.056},
doi = {10.1016/J.MICROREL.2008.07.056},
timestamp = {Fri, 04 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HartmannW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HautefeuilleOOKP08,
author = {Mathieu Hautefeuille and
Conor O'Mahony and
Brendan O'Flynn and
Krimo Khalfi and
Frank H. Peters},
title = {A MEMS-based wireless multisensor module for environmental monitoring},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {906--910},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.007},
doi = {10.1016/J.MICROREL.2008.03.007},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HautefeuilleOOKP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeGL08,
author = {Jun He and
Yongjin Guo and
Zhongqin Lin},
title = {Theoretical and numerical analysis of the effect of constant velocity
on thermosonic bond strength},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {594--601},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.10.001},
doi = {10.1016/J.MICROREL.2007.10.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeGL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerGHP08,
author = {Michael Heer and
P. Grombach and
A. Heid and
Dionyz Pogany},
title = {Hot spot analysis during thermal shutdown of {SOI} {BCDMOS} half bridge
driver for automotive applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1525--1528},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.009},
doi = {10.1016/J.MICROREL.2008.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerGHP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HellerC08,
author = {E. R. Heller and
A. Crespo},
title = {Electro-thermal modeling of multifinger AlGaN/GaN {HEMT} device operation
including thermal substrate effects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {45--50},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.01.090},
doi = {10.1016/J.MICROREL.2007.01.090},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HellerC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Hofmann08,
author = {Peter Hofmann},
title = {Voltage acceleration of time dependent breakdown of ultra-thin {NO}
and {NON} dielectrics},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1189--1192},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.014},
doi = {10.1016/J.MICROREL.2008.06.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Hofmann08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsuFYL08,
author = {Chia{-}Wei Hsu and
Yean{-}Kuen Fang and
Wen{-}Kuan Yeh and
Chien{-}Ting Lin},
title = {Significantly improving sub-90 nm {CMOSFET} performances with notch-gate
enhanced high tensile-stress contact etch stop layer},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1791--1794},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.08.002},
doi = {10.1016/J.MICROREL.2008.08.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HsuFYL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuZY08,
author = {Yu{-}Qun Hu and
Ya{-}Pu Zhao and
Tongxi Yu},
title = {Tensile tests of micro anchors anodically bonded between Pyrex glass
and aluminum thin film coated on silicon wafer},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1720--1723},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.016},
doi = {10.1016/J.MICROREL.2008.04.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuZY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangCHHLC08,
author = {Sheng{-}Yi Huang and
Kun{-}Ming Chen and
Guo{-}Wei Huang and
Cheng{-}Chou Hung and
Wen{-}Shiang Liao and
Chun{-}Yen Chang},
title = {Electrical stress effect on {RF} power characteristics of SiGe hetero-junction
bipolar transistors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {193--199},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.008},
doi = {10.1016/J.MICROREL.2007.05.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangCHHLC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Hwang08,
author = {J. S. Hwang},
title = {Filler size and content effects on the composite properties of anisotropic
conductive films (ACFs) and reliability of flip chip assembly using
ACFs},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {645--651},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.10.004},
doi = {10.1016/J.MICROREL.2007.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Hwang08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HwangYP08,
author = {J. S. Hwang and
M. J. Yim and
K. W. Paik},
title = {Effects of bonding temperature on the properties and reliabilities
of anisotropic conductive films (ACFs) for flip chip on organic substrate
application},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {293--299},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.07.097},
doi = {10.1016/J.MICROREL.2006.07.097},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HwangYP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Iannuzzo08,
author = {Francesco Iannuzzo},
title = {High performance, FPGA-based test apparatus for unclamped inductive
switching of IGBTs},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1449--1452},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.025},
doi = {10.1016/J.MICROREL.2008.07.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Iannuzzo08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IllesH08,
author = {Bal{\'{a}}zs Ill{\'{e}}s and
G{\'{a}}bor Hars{\'{a}}nyi},
title = {3D thermal model to investigate component displacement phenomenon
during reflow soldering},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1062--1068},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.007},
doi = {10.1016/J.MICROREL.2008.04.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IllesH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IsakovTGPZB08,
author = {D. Isakov and
A. A. B. Tio and
T. Geinzer and
J. C. H. Phang and
Y. Zhang and
L. J. Balk},
title = {Near-field detection of photon emission from silicon with 30 nm spatial
resolution},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1285--1288},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.021},
doi = {10.1016/J.MICROREL.2008.07.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IsakovTGPZB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jacob08,
author = {Peter Jacob},
title = {Surface {ESD} {(ESDFOS)} in assembly fab machineries as a functional
and reliability risk - Failure analysis, tool diagnosis and on-site-remedies},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1608--1612},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.021},
doi = {10.1016/J.MICROREL.2008.06.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jacob08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobR08,
author = {Peter Jacob and
Werner Rothkirch},
title = {Unusual defects, generated by wafer sawing: Diagnosis, mechanisms
and how to distinguish from related failures},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1253--1257},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.040},
doi = {10.1016/J.MICROREL.2008.06.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JacobR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JakubowskaABMWZ08,
author = {Malgorzata Jakubowska and
Selim Achmatowicz and
Valentinas Baltrusaitis and
Anna Mlozniak and
Iwona Wyzkiewicz and
Elzbieta Zwierkowska},
title = {Investigation on a new silver photoimageable conductor},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {860--865},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.006},
doi = {10.1016/J.MICROREL.2008.04.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JakubowskaABMWZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JanczykBSG08,
author = {Grzegorz Janczyk and
Tomasz Bieniek and
Jerzy Szynka and
Piotr Grabiec},
title = {Reliability issues of e-Cubes heterogeneous system integration},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1133--1138},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.023},
doi = {10.1016/J.MICROREL.2008.06.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JanczykBSG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangCLP08,
author = {Kyung{-}Woon Jang and
Chang{-}Kyu Chung and
Woong{-}Sun Lee and
Kyung{-}Wook Paik},
title = {Material properties of anisotropic conductive films (ACFs) and their
flip chip assembly reliability in {NAND} flash memory applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1052--1061},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.002},
doi = {10.1016/J.MICROREL.2008.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JangCLP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangPILMS08,
author = {Changsoo Jang and
Seungbae Park and
Bill Infantolino and
Lawrence Lehman and
Ryan Morgan and
Dipak Sengupta},
title = {Failure analysis of contact probe pins for SnPb and Sn applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {942--947},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.015},
doi = {10.1016/J.MICROREL.2008.03.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JangPILMS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jankowski-MihulowiczKP08,
author = {Piotr Jankowski{-}Mihulowicz and
Wlodzimierz Kalita and
Bartosz Pawlowicz},
title = {Problem of dynamic change of tags location in anticollision {RFID}
systems},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {911--918},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.006},
doi = {10.1016/J.MICROREL.2008.03.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jankowski-MihulowiczKP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeonKI08,
author = {Insu Jeon and
Ki{-}Ju Kang and
Seyoung Im},
title = {Stress intensities at the triple junction of a multilevel thin film
package},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {749--756},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.004},
doi = {10.1016/J.MICROREL.2007.12.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeonKI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongJP08,
author = {Jae{-}Seong Jeong and
Jin{-}Kyu Jung and
Sang{-}Deuk Park},
title = {Reliability improvement of InGaN {LED} backlight module by accelerated
life test {(ALT)} and screen policy of potential leakage {LED}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1216--1220},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.029},
doi = {10.1016/J.MICROREL.2008.07.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongJP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiXLG08,
author = {F. Ji and
Jing{-}Ping Xu and
Pui{-}To Lai and
J. G. Guan},
title = {A fringing-capacitance model for deep-submicron {MOSFET} with high-k
gate dielectric},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {693--697},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.007},
doi = {10.1016/J.MICROREL.2008.01.007},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JiXLG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiangX08,
author = {Bo Jiang and
Ai{-}Ping Xian},
title = {Whisker growth on tin finishes of different electrolytes},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {105--110},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.02.002},
doi = {10.1016/J.MICROREL.2007.02.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiangX08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiangYZXW08,
author = {Li Jiang and
Keling Yang and
Jiemin Zhou and
Ke Xiang and
Wenjie Wang},
title = {Quantification of creep strain in small lead-free solder joints with
the in situ micro electronic-resistance measurement},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {438--444},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.004},
doi = {10.1016/J.MICROREL.2007.08.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiangYZXW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JohannessenOS08,
author = {Rolf Johannessen and
Fr{\o}ydis Oldervoll and
Frode Strisland},
title = {High temperature reliability of aluminium wire-bonds to thin film,
thick film and low temperature co-fired ceramic {(LTCC)} substrate
metallization},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1711--1719},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.008},
doi = {10.1016/J.MICROREL.2008.06.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JohannessenOS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JongF08,
author = {Marc de Jong and
Druc Freeman},
title = {Bridging the business model gap between the semiconductor industry
and the automotive industry with respect to quality and reliability},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1112--1113},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.038},
doi = {10.1016/J.MICROREL.2008.07.038},
timestamp = {Wed, 05 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JongF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KalicinskiWW08,
author = {Stanislaw Kalicinski and
Martine Wevers and
Ingrid De Wolf},
title = {Charging and discharging phenomena in electrostatically-driven single-crystal-silicon
{MEM} resonators: {DC} bias dependence and influence on the series
resonance frequency},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1221--1226},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.024},
doi = {10.1016/J.MICROREL.2008.07.024},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KalicinskiWW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KalitaKW08,
author = {Wlodzimierz Kalita and
Dariusz Klepacki and
Mariusz Weglarski},
title = {Simulation of transient thermal states in layered electronic microstructures},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1021--1026},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.019},
doi = {10.1016/J.MICROREL.2008.03.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KalitaKW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KandasamyM08,
author = {Ravi Kandasamy and
A. S. Mujumdar},
title = {Thermal analysis of a flip chip ceramic ball grid array {(CBGA)} package},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {261--273},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.005},
doi = {10.1016/J.MICROREL.2007.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KandasamyM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Katsetos08,
author = {Anastasios A. Katsetos},
title = {Negative bias temperature instability {(NBTI)} recovery with bake},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1655--1659},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.012},
doi = {10.1016/J.MICROREL.2008.04.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Katsetos08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhatibiWWL08,
author = {Golta Khatibi and
W. Wroczewski and
Brigitte Weiss and
T. Licht},
title = {A fast mechanical test technique for life time estimation of micro-joints},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1822--1830},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.003},
doi = {10.1016/J.MICROREL.2008.09.003},
timestamp = {Tue, 15 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhatibiWWL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimCSLCY08,
author = {Hyun{-}Ho Kim and
Sang{-}Hyun Choi and
Sang{-}Hyun Shin and
Young{-}Ki Lee and
Seok{-}Moon Choi and
Sung Yi},
title = {Thermal transient characteristics of die attach in high power {LED}
{PKG}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {445--454},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.009},
doi = {10.1016/J.MICROREL.2007.08.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimCSLCY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimJHHKJ08,
author = {Jong{-}Woong Kim and
Jin{-}Kyu Jang and
Sang{-}Ok Ha and
Sang{-}Su Ha and
Dae{-}Gon Kim and
Seung{-}Boo Jung},
title = {Effect of high-speed loading conditions on the fracture mode of the
{BGA} solder joint},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1882--1889},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.066},
doi = {10.1016/J.MICROREL.2008.07.066},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimJHHKJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimLJKCJ08,
author = {Jong{-}Seok Kim and
Sang{-}Woo Lee and
Kyu{-}Dong Jung and
Woon{-}Bae Kim and
Sung{-}Hoon Choa and
Byeong{-}Kwon Ju},
title = {Quality factor measurement of micro gyroscope structure according
to vacuum level and desired Q-factor range package method},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {948--952},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.001},
doi = {10.1016/J.MICROREL.2008.03.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimLJKCJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimO08,
author = {Kyungmee O. Kim and
Hee{-}Seok Oh},
title = {Reliability functions estimated from commonly used yield models},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {481--489},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.001},
doi = {10.1016/J.MICROREL.2007.08.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimRSKKLCPPCSKK08,
author = {Se Woon Kim and
Kang Seob Roh and
Seung Hwan Seo and
Kwan Young Kim and
Gu Cheol Kang and
Sunyeong Lee and
Chang Min Choi and
So Ra Park and
Jun Hyun Park and
Ki Chan Chun and
Kwan Jae Song and
Dae Hwan Kim and
Dong Myong Kim},
title = {Extraction of interface states at emitter-base heterojunctions in
AlGaAs/GaAs heterostructure bipolar transistors using sub-bandgap
photonic excitation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {382--388},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.09.005},
doi = {10.1016/J.MICROREL.2007.09.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimRSKKLCPPCSKK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimS08,
author = {Eun{-}Kyung Kim and
Jaeyong Sung},
title = {Yield challenges in wafer stacking technology},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1102--1105},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.010},
doi = {10.1016/J.MICROREL.2008.03.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimYHYK08,
author = {Kyung{-}Seob Kim and
C. H. Yu and
S. W. Han and
K. C. Yang and
J. H. Kim},
title = {Investigation of relation between intermetallic and tin whisker growths
under ambient condition},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {111--118},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.01.088},
doi = {10.1016/J.MICROREL.2007.01.088},
timestamp = {Thu, 31 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimYHYK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KindereitBKKINL08,
author = {Ulrike Kindereit and
Christian Boit and
Uwe Kerst and
Steven Kasapi and
Radu Ispasoiu and
Roy Ng and
William K. Lo},
title = {Comparison of laser voltage probing and mapping results in oversized
and minimum size devices of 120 nm and 65 nm technology},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1322--1326},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.040},
doi = {10.1016/J.MICROREL.2008.07.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KindereitBKKINL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KiyanBB08,
author = {Tuba Kiyan and
Christof Brillert and
Christian Boit},
title = {Timing analysis of scan design integrated circuits using stimulation
by an infrared diode laser in externally triggered pulsing condition},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1327--1332},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.028},
doi = {10.1016/J.MICROREL.2008.07.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KiyanBB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KlimiecZZGSP08,
author = {Ewa Klimiec and
Wieslaw Zaraska and
Krzysztof Zaraska and
Kazimierz P. Gasiorski and
Tadeusz Sadowski and
Michal Pajda},
title = {Piezoelectric polymer films as power converters for human powered
electronics},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {897--901},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.001},
doi = {10.1016/J.MICROREL.2008.04.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KlimiecZZGSP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoganemaruIM08,
author = {Masaaki Koganemaru and
Toru Ikeda and
Noriyuki Miyazaki},
title = {Residual stress evaluation in resin-molded {IC} chips using finite
element analysis and piezoresistive gauges},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {923--932},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.02.004},
doi = {10.1016/J.MICROREL.2008.02.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KoganemaruIM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Konczakowska08,
author = {Alicja Konczakowska},
title = {Methodology of semiconductor devices classification into groups of
differentiated quality},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {37--44},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.12.002},
doi = {10.1016/J.MICROREL.2006.12.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Konczakowska08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoningLSSJ08,
author = {J. J. Koning and
S. Lecaudey and
E. Spaan and
M. Stoutjesdijk and
J. H. J. Janssen},
title = {Thermal heating within {SOI}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1505--1508},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.057},
doi = {10.1016/J.MICROREL.2008.07.057},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KoningLSSJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KovacRMRRA08,
author = {Urban Kovac and
Dave Reid and
Campbell Millar and
Gareth Roy and
Scott Roy and
Asen Asenov},
title = {Statistical simulation of random dopant induced threshold voltage
fluctuations for 35 nm channel length {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1572--1575},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.027},
doi = {10.1016/J.MICROREL.2008.06.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KovacRMRRA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuC08,
author = {Hsiao{-}Tung Ku and
Kuo{-}Ning Chiang},
title = {The mechanical stress resistance capability of stress buffer structures
in analog devices},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {716--723},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.007},
doi = {10.1016/J.MICROREL.2007.12.007},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KuC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuangCYY08,
author = {Weidong Kuang and
Lizhi Cao and
Chuanzhao Yu and
Jiann{-}Shiun Yuan},
title = {{PMOS} breakdown effects on digital circuits - Modeling and analysis},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1597--1600},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.019},
doi = {10.1016/J.MICROREL.2008.06.019},
timestamp = {Fri, 10 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KuangCYY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumarC08,
author = {T. Nandha Kumar and
Wai Chong Chia},
title = {An automated approach for locating multiple faulty LUTs in an {FPGA}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1900--1906},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.08.001},
doi = {10.1016/J.MICROREL.2008.08.001},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KumarC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kuper08,
author = {Fred G. Kuper},
title = {Automotive {IC} reliability: Elements of the battle towards zero defects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1459--1463},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.026},
doi = {10.1016/J.MICROREL.2008.06.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kuper08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiYY08,
author = {Yi{-}Shao Lai and
Po{-}Chuan Yang and
Chang{-}Lin Yeh},
title = {Effects of different drop test conditions on board-level reliability
of chip-scale packages},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {274--281},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.03.005},
doi = {10.1016/J.MICROREL.2007.03.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiYY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LamhamdiPZBCGSPP08,
author = {Mohamed Lamhamdi and
Patrick Pons and
Usama Zaghloul and
Laurent Boudou and
Fabio Coccetti and
Jean Guastavino and
Y. Segui and
George J. Papaioannou and
Robert Plana},
title = {Voltage and temperature effect on dielectric charging for {RF-MEMS}
capacitive switches reliability investigation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1248--1252},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.017},
doi = {10.1016/J.MICROREL.2008.07.017},
timestamp = {Thu, 07 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LamhamdiPZBCGSPP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaskowskiGB08,
author = {Piotr Laskowski and
Arkadiusz Glowacki and
Christian Boit},
title = {Detectability of dynamic photon emission in static Si {CCD} for signal
path determination in integrated circuits},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1295--1299},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.014},
doi = {10.1016/J.MICROREL.2008.07.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaskowskiGB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauGTS08,
author = {Wai Shing Lau and
S. Gunawan and
Joy B. H. Tan and
B. P. Singh},
title = {The application of polyimide/silicon nitride dual passivation to Al\({}_{\mbox{x}}\)Ga\({}_{\mbox{1-x}}\)N/GaN
high electron mobility transistors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {187--192},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.003},
doi = {10.1016/J.MICROREL.2007.05.003},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LauGTS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauSEAJTLQKCC08,
author = {W. S. Lau and
K. S. See and
C. W. Eng and
W. K. Aw and
Kang{-}Hyun Jo and
K. C. Tee and
James Y. M. Lee and
Elgin K. B. Quek and
H. S. Kim and
Simon T. H. Chan and
L. Chan},
title = {Anomalous narrow width effect in p-channel metal-oxide-semiconductor
surface channel transistors using shallow trench isolation technology},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {919--922},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.02.005},
doi = {10.1016/J.MICROREL.2008.02.005},
timestamp = {Fri, 23 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LauSEAJTLQKCC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauWTS08,
author = {W. S. Lau and
W. T. Wong and
Joy B. H. Tan and
B. P. Singh},
title = {Effect of a trace of water vapor on Ohmic contact formation for AlGaN/GaN
epitaxial wafers},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {794--797},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.006},
doi = {10.1016/J.MICROREL.2008.01.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LauWTS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauYEHLSVC08,
author = {W. S. Lau and
Peizhen Yang and
C. W. Eng and
V. Ho and
C. H. Loh and
S. Y. Siah and
D. Vigar and
L. Chan},
title = {A study of the linearity between I\({}_{\mbox{on}}\) and log I\({}_{\mbox{off}}\)
of modern {MOS} transistors and its application to stress engineering},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {497--503},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.10.002},
doi = {10.1016/J.MICROREL.2007.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LauYEHLSVC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauYHTLSC08,
author = {W. S. Lau and
Peizhen Yang and
V. Ho and
L. F. Toh and
Y. Liu and
S. Y. Siah and
L. Chan},
title = {An explanation of the dependence of the effective saturation velocity
on gate voltage in sub-0.1 {\(\mathrm{\mu}\)}m metal-oxide-semiconductor
transistors by quasi-ballistic transport theory},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1641--1648},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.005},
doi = {10.1016/J.MICROREL.2008.06.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LauYHTLSC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLLWSL08,
author = {S. Lee and
J. P. Long and
Gerald Lucovsky and
J. L. Whitten and
H. Seo and
J. L{\"{u}}ning},
title = {Suppression of Ge-O and Ge-N bonding at Ge-HfO\({}_{\mbox{2}}\) and
Ge-TiO\({}_{\mbox{2}}\) interfaces by deposition onto plasma-nitrided
passivated Ge substrates: Integration issues Ge gate stacks into advanced
devices},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {364--369},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.07.068},
doi = {10.1016/J.MICROREL.2007.07.068},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeLLWSL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLZJ08,
author = {Young Woo Lee and
Ki Ju Lee and
Norman Y. Zhou and
Jae Pil Jung},
title = {Characteristics of Sn8Zn3Bi solder joints and crack resistance with
various {PCB} and lead coatings},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {631--637},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.10.005},
doi = {10.1016/J.MICROREL.2007.10.005},
timestamp = {Mon, 13 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeLZJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeS08,
author = {Peter Ming{-}Han Lee and
Reza Sedaghat},
title = {FPGA-based switch-level fault emulation using module-based dynamic
partial reconfiguration},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1724--1733},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.003},
doi = {10.1016/J.MICROREL.2008.06.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeWLYC08,
author = {Ying{-}Chih Lee and
Bor{-}Tsuen Wang and
Yi{-}Shao Lai and
Chang{-}Lin Yeh and
Rong{-}Sheng Chen},
title = {Finite element model verification for packaged printed circuit board
by experimental modal analysis},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1837--1846},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.068},
doi = {10.1016/J.MICROREL.2008.07.068},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeWLYC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Li08,
author = {Deng{-}Feng Li},
title = {A note on "using intuitionistic fuzzy sets for fault-tree analysis
on printed circuit board assembly"},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1741},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.059},
doi = {10.1016/J.MICROREL.2008.07.059},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Li08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiGBKPZ08,
author = {Q. Li and
J. F. L. Goosen and
J. T. M. van Beek and
Fred van Keulen and
K. L. Phan and
G. Q. Zhang},
title = {Failure analysis of a thin-film nitride {MEMS} package},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1557--1561},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.036},
doi = {10.1016/J.MICROREL.2008.07.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiGBKPZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLV08,
author = {You Li and
Juin J. Liou and
Jim Vinson},
title = {Investigation of diode geometry and metal line pattern for robust
{ESD} protection applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1660--1663},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.019},
doi = {10.1016/J.MICROREL.2008.04.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiLV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiMN08,
author = {Yuan Li and
Leo van Marwijk and
Som Nath},
title = {Fast electromigration wafer mapping for wafer fab process monitoring
and improvement},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1388--1392},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.048},
doi = {10.1016/J.MICROREL.2008.07.048},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiMN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiZLXC08,
author = {C. X. Li and
X. Zou and
Pui{-}To Lai and
Jing{-}Ping Xu and
C. L. Chan},
title = {Effects of Ti content and wet-N\({}_{\mbox{2}}\) anneal on Ge {MOS}
capacitors with HfTiO gate dielectric},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {526--530},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.11.004},
doi = {10.1016/J.MICROREL.2007.11.004},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiZLXC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinL08,
author = {Chih{-}Kuang Lin and
Tung{-}Hsien Lin},
title = {Effects of continuously applied stress on tin whisker growth},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1737--1740},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.013},
doi = {10.1016/J.MICROREL.2008.04.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinLFC08,
author = {Chao{-}Ming Lin and
Tzu{-}Chao Lin and
Te{-}Hua Fang and
Kuo{-}Sheng Chao},
title = {Failure analysis of pad-height effects in the fine-pitch interconnection
of the anisotropic conductive films},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1087--1092},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.014},
doi = {10.1016/J.MICROREL.2008.03.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinLFC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinLW08,
author = {M. H. Lin and
M. T. Lin and
Tahui Wang},
title = {Effects of length scaling on electromigration in dual-damascene copper
interconnects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {569--577},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.10.007},
doi = {10.1016/J.MICROREL.2007.10.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinLW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLIL08,
author = {Yong Liu and
Lihua Liang and
Scott Irving and
Timwah Luk},
title = {3D Modeling of electromigration combined with thermal-mechanical effect
for {IC} device and package},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {811--824},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.021},
doi = {10.1016/J.MICROREL.2008.03.021},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuLIL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuYL08,
author = {Xiang Liu and
Jiann{-}Shiun Yuan and
Juin J. Liou},
title = {InGaP/GaAs heterojunction bipolar transistor and {RF} power amplifier
reliability},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1212--1215},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.009},
doi = {10.1016/J.MICROREL.2008.06.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuYL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LucatGCDM08,
author = {Claude Lucat and
Patrick Ginet and
Christophe Castille and
H{\'{e}}l{\`{e}}ne Deb{\'{e}}da and
Francis M{\'{e}}nil},
title = {Microsystems elements based on free-standing thick-films made with
a new sacrificial layer process},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {872--875},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.016},
doi = {10.1016/J.MICROREL.2008.03.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LucatGCDM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MachouatHGLPPFE08,
author = {Aziz Machouat and
G{\'{e}}rald Haller and
Vincent Goubier and
Dean Lewis and
Philippe Perdu and
Vincent Pouget and
Pascal Fouillat and
Fabien Essely},
title = {Effect of physical defect on shmoos in {CMOS} {DSM} technologies},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1333--1338},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.043},
doi = {10.1016/J.MICROREL.2008.07.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MachouatHGLPPFE08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaederAJCR08,
author = {Thomas Maeder and
Gr{\'{e}}gory Affolter and
Niklaus Johner and
Giancarlo Corradini and
Peter Ryser},
title = {Optimisation of a thick-film 10-400 {N} force sensor},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {902--905},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.005},
doi = {10.1016/J.MICROREL.2008.03.005},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaederAJCR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MalechaG08,
author = {Karol Malecha and
Leszek J. Golonka},
title = {Microchannel fabrication process in {LTCC} ceramics},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {866--871},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.013},
doi = {10.1016/J.MICROREL.2008.03.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MalechaG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaoC08,
author = {Chao{-}Yang Mao and
Rong{-}Sheng Chen},
title = {Packaging parameter analysis and optimization design on solder joint
reliability for twin die stacked packages by variance in strain energy
density {(SED)} of each solder joint},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {119--131},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.01.087},
doi = {10.1016/J.MICROREL.2007.01.087},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaoC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarchutW08,
author = {Leslie Marchut and
Charles S. Whitman},
title = {Acceleration factors for {THB} induced degradation of AlGaAs/InGaAs
pHEMT devices},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {990--993},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.004},
doi = {10.1016/J.MICROREL.2008.03.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MarchutW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaricauWG08,
author = {Elie Maricau and
Pieter De Wit and
Georges G. E. Gielen},
title = {An analytical model for hot carrier degradation in nanoscale {CMOS}
suitable for the simulation of degradation in analog {IC} applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1576--1580},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.016},
doi = {10.1016/J.MICROREL.2008.06.016},
timestamp = {Wed, 05 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MaricauWG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarkowskiD08,
author = {Piotr Markowski and
Andrzej Dziedzic},
title = {Planar and three-dimensional thick-film thermoelectric microgenerators},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {890--896},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.008},
doi = {10.1016/J.MICROREL.2008.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MarkowskiD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartensKMVW08,
author = {Stefan Martens and
B. Krueger and
Walter Mack and
Friedemann Voelklein and
J{\"{u}}rgen Wilde},
title = {Low-cost preparation method for exposing {IC} surfaces in stacked
die packages by micro-abrasive blasting},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1513--1516},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.033},
doi = {10.1016/J.MICROREL.2008.06.033},
timestamp = {Tue, 03 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MartensKMVW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Masana08,
author = {F. N. Masana},
title = {Thermal impedance measurements under non-equilibrium conditions. How
to extend its validity},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {563--568},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.11.005},
doi = {10.1016/J.MICROREL.2007.11.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Masana08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MejiaEA08,
author = {Israel Mejia and
Magali Estrada and
M. Avila},
title = {Improved upper contacts {PMMA} on {P3HT} {PTFTS} using photolithographic
processes},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1795--1799},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.08.005},
doi = {10.1016/J.MICROREL.2008.08.005},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MejiaEA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Miranda08,
author = {Enrique Miranda},
title = {Compact modeling of the non-linear post-breakdown current in thin
gate oxides using the generalized diode equation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1604--1607},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.007},
doi = {10.1016/J.MICROREL.2008.06.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Miranda08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MleczkoZSKDC08,
author = {Krzysztof Mleczko and
Zbigniew Zawislak and
Adam Witold Stadler and
Andrzej Kolek and
Andrzej Dziedzic and
Jacek Cichosz},
title = {Evaluation of conductive-to-resistive layers interaction in thick-film
resistors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {881--885},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.012},
doi = {10.1016/J.MICROREL.2008.03.012},
timestamp = {Wed, 27 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MleczkoZSKDC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Moensb08,
author = {Peter Moens and
Geert Van den Bosch},
title = {Reliability assessment of integrated power transistors: Lateral {DMOS}
versus vertical {DMOS}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1300--1305},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.048},
doi = {10.1016/J.MICROREL.2008.06.048},
timestamp = {Wed, 24 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Moensb08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MohammadS08,
author = {Mohammad Gh. Mohammad and
Kewal K. Saluja},
title = {Analysis and test procedures for {NOR} flash memory defects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {698--709},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.004},
doi = {10.1016/J.MICROREL.2008.01.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MohammadS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MohammadiM08,
author = {Karim Mohammadi and
Seyyed Javad Seyyed Mahdavi},
title = {On improving training time of neural networks in mixed signal circuit
fault diagnosis applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {781--793},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.009},
doi = {10.1016/J.MICROREL.2007.12.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MohammadiM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoschouEKPAV08,
author = {Despina C. Moschou and
M. A. Exarchos and
Dimitrios N. Kouvatsos and
George J. Papaioannou and
Aggeliki Arapoyanni and
Apostolos T. Voutsas},
title = {Reliability and defectivity comparison of n- and p-channel {SLS} {ELA}
polysilicon TFTs fabricated with a novel crystallization technique},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1544--1548},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.006},
doi = {10.1016/J.MICROREL.2008.06.006},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MoschouEKPAV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuraCFV08,
author = {Giovanna Mura and
G. Cassanelli and
Fausto Fantini and
Massimo Vanzi},
title = {Sulfur-contamination of high power white {LED}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1208--1211},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.005},
doi = {10.1016/J.MICROREL.2008.07.005},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuraCFV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NakadairaJSSMCKO08,
author = {Yoshikuni Nakadaira and
Seyoung Jeong and
Jongbo Shim and
Jaiseok Seo and
Sunhee Min and
Taeje Cho and
Sayoon Kang and
Seyong Oh},
title = {Growth of tin whiskers for lead-free plated leadframe packages in
high humid environments and during thermal cycling},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {83--104},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.01.091},
doi = {10.1016/J.MICROREL.2007.01.091},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NakadairaJSSMCKO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NalladegaSB08,
author = {Vijayaraghava Nalladega and
Shamachary Sathish and
Amarjit S. Brar},
title = {Characterization of defects in flexible circuits with ultrasonic atomic
force microscopy},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1683--1688},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.05.004},
doi = {10.1016/J.MICROREL.2008.05.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NalladegaSB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NeelsDSPM08,
author = {Antonia Neels and
A. Dommann and
A. Schifferle and
O. Papes and
Edoardo Mazza},
title = {Reliability and failure in single crystal silicon {MEMS} devices},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1245--1247},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.018},
doi = {10.1016/J.MICROREL.2008.07.018},
timestamp = {Wed, 04 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NeelsDSPM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Nicollian08,
author = {Paul E. Nicollian},
title = {Insights on trap generation and breakdown in ultra thin SiO\({}_{\mbox{2}}\)
and SiON dielectrics from low voltage stress-induced leakage current
measurements},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1171--1177},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.011},
doi = {10.1016/J.MICROREL.2008.07.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Nicollian08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NohLJ08,
author = {Bo{-}In Noh and
Jong{-}Bum Lee and
Seung{-}Boo Jung},
title = {Effect of surface finish material on printed circuit board for electrochemical
migration},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {652--656},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.09.006},
doi = {10.1016/J.MICROREL.2007.09.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NohLJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NotzoldGM08,
author = {Kerstin N{\"{o}}tzold and
J{\"{u}}rgen Graf and
Roland M{\"{u}}ller{-}Fiedler},
title = {A four-point-bending-test for the stability assessment of glass frit
bonded molded microsensors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1562--1566},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.001},
doi = {10.1016/J.MICROREL.2008.07.001},
timestamp = {Wed, 02 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NotzoldGM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NousiainenLKRV08,
author = {Olli Nousiainen and
L. Lehtiniemi and
T. Kangasvieri and
Risto Rautioaho and
J. V{\"{a}}h{\"{a}}kangas},
title = {Thermal fatigue endurance of collapsible 95.5Sn4Ag0.5Cu spheres in
{LTCC/PWB} assemblies},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {622--630},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.11.001},
doi = {10.1016/J.MICROREL.2007.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NousiainenLKRV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OlthofR08,
author = {Edgar H. T. Olthof and
G. J. de Raad},
title = {Non-linear width scaling of {ESD} protection devices and link with
p-well implant in BCD-processes},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1417--1421},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.003},
doi = {10.1016/J.MICROREL.2008.07.003},
timestamp = {Tue, 19 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OlthofR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaganoLPKKYCBS08,
author = {R. Pagano and
Salvatore Lombardo and
Felix Palumbo and
Paul Kirsch and
S. A. Krishnan and
Chadwin D. Young and
Rino Choi and
Gennadi Bersuker and
James H. Stathis},
title = {A novel approach to characterization of progressive breakdown in high-k/metal
gate stacks},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1759--1764},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.071},
doi = {10.1016/J.MICROREL.2008.07.071},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PaganoLPKKYCBS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkJ08,
author = {S. B. Park and
Rahul Joshi},
title = {Comparison of thermo-mechanical behavior of lead-free copper and tin-lead
column grid array packages},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {763--772},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.008},
doi = {10.1016/J.MICROREL.2007.12.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PascoliI08,
author = {Stefano Di Pascoli and
Giuseppe Iannaccone},
title = {Noise and reliability in simulated thin metal films},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1015--1020},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.018},
doi = {10.1016/J.MICROREL.2008.03.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PascoliI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PerpinaSJFHURM08,
author = {X. Perpi{\~{n}}{\`{a}} and
Jean{-}Fran{\c{c}}ois Serviere and
Xavier Jord{\`{a}} and
A. Fauquet and
Salvador Hidalgo and
Jes{\'{u}}s Urresti{-}Iba{\~{n}}ez and
Jos{\'{e}} Rebollo and
Michel Mermet{-}Guyennet},
title = {{IGBT} module failure analysis in railway applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1427--1431},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.032},
doi = {10.1016/J.MICROREL.2008.06.032},
timestamp = {Wed, 31 Mar 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PerpinaSJFHURM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PicGO08,
author = {D. Pic and
Didier Goguenheim and
Jean{-}Luc Ogier},
title = {Assessment of temperature and voltage accelerating factors for 2.3-3.2
nm SiO\({}_{\mbox{2}}\) thin oxides stressed to hard breakdown},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {335--341},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.006},
doi = {10.1016/J.MICROREL.2007.08.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PicGO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PicRPOG08,
author = {D. Pic and
Arnaud R{\'{e}}gnier and
V. Pean and
Jean{-}Luc Ogier and
Didier Goguenheim},
title = {Dynamic stress method for accurate {NVM} oxide robustness evaluation
for automotive applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1318--1321},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.050},
doi = {10.1016/J.MICROREL.2008.07.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PicRPOG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Pinsky08,
author = {David A. Pinsky},
title = {The role of dissolved hydrogen and other trace impurities on propensity
of tin deposits to grow whiskers},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {675--681},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.008},
doi = {10.1016/J.MICROREL.2008.01.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Pinsky08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PolspoelVAPNA08,
author = {W. Polspoel and
Wilfried Vandervorst and
Lidia Aguilera and
Marc Porti and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Nanometer-scale leakage measurements in high vacuum on de-processed
high-k capacitors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1521--1524},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.026},
doi = {10.1016/J.MICROREL.2008.07.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PolspoelVAPNA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PostB08,
author = {Julian W. Post and
A. Bhattacharyya},
title = {Saline soak tests to determine the short-term reliability of an in
situ thin film resistance temperature detector},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1673--1682},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.05.002},
doi = {10.1016/J.MICROREL.2008.05.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PostB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PufallKAG08,
author = {Reinhard Pufall and
Werner Kanert and
Stefano Aresu and
Michael Goroll},
title = {Reduction of test effort. Looking for more acceleration for reliable
components for automotive applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1490--1493},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.034},
doi = {10.1016/J.MICROREL.2008.07.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PufallKAG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QiGP08,
author = {Haiyu Qi and
Sanka Ganesan and
Michael G. Pecht},
title = {No-fault-found and intermittent failures in electronic products},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {663--674},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.02.003},
doi = {10.1016/J.MICROREL.2008.02.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QiGP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReverdyBPMPB08,
author = {Antoine Reverdy and
M. de la Bardonnie and
Patrick Poirier and
H. Murray and
Philippe Perdu and
A. Boukkali},
title = {Dynamic study of the thermal laser stimulation response on advanced
technology structures},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1689--1695},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.05.003},
doi = {10.1016/J.MICROREL.2008.05.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReverdyBPMPB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReverdyPMBP08,
author = {Antoine Reverdy and
Philippe Perdu and
H. Murray and
M. de la Bardonnie and
Patrick Poirier},
title = {Fast and rigorous use of thermal time constant to characterize back
end of the line test structure in advanced technology},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1279--1284},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.045},
doi = {10.1016/J.MICROREL.2008.07.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReverdyPMBP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Roesch08,
author = {William J. Roesch},
title = {Forensic characterization of thin film resistor degradation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {958--964},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.02.002},
doi = {10.1016/J.MICROREL.2008.02.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Roesch08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoigDBLM08,
author = {Jaume Roig and
B. Desoete and
Filip Bauwens and
F. Lovadina and
Peter Moens},
title = {Thermal resistance assessment in multi-trenched power devices},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1479--1484},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.031},
doi = {10.1016/J.MICROREL.2008.06.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoigDBLM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RothWWH08,
author = {N. Roth and
Wolfgang Wondrak and
A. Willikens and
James Hofmeister},
title = {Ball grid array {(BGA)} solder joint intermittency real-time detection},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1155--1160},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.064},
doi = {10.1016/J.MICROREL.2008.07.064},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RothWWH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RuanPLKCPPP08,
author = {Jinyu Jason Ruan and
E. Papandreou and
Mohamed Lamhamdi and
Matroni Koutsoureli and
Fabio Coccetti and
Patrick Pons and
George J. Papaioannou and
Robert Plana},
title = {Alpha particle radiation effects in {RF} {MEMS} capacitive switches},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1241--1244},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.047},
doi = {10.1016/J.MICROREL.2008.06.047},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RuanPLKCPPP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RuanPNMBCP08,
author = {Jinyu Jason Ruan and
George J. Papaioannou and
Nicolas Nolhier and
Nicolas Mauran and
Marise Bafleur and
Fabio Coccetti and
Robert Plana},
title = {{ESD} failure signature in capacitive {RF} {MEMS} switches},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1237--1240},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.035},
doi = {10.1016/J.MICROREL.2008.06.035},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RuanPNMBCP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Russ08,
author = {Christian Russ},
title = {{ESD} issues in advanced {CMOS} bulk and FinFET technologies: Processing,
protection devices and circuit strategies},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1403--1411},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.042},
doi = {10.1016/J.MICROREL.2008.07.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Russ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SalmCMS08,
author = {Cora Salm and
Victor M. Blanco Carballo and
Joost Melai and
Jurriaan Schmitz},
title = {Reliability aspects of a radiation detector fabricated by post-processing
a standard {CMOS} chip},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1139--1143},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.038},
doi = {10.1016/J.MICROREL.2008.06.038},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SalmCMS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SalmelaAPST08,
author = {Olli Salmela and
Klas Andersson and
Altti Perttula and
Jussi S{\"{a}}rkk{\"{a}} and
Markku Tammenmaa},
title = {Modified Engelmaier's model taking account of different stress levels},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {773--780},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.002},
doi = {10.1016/J.MICROREL.2007.12.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SalmelaAPST08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Sanada08,
author = {Masaru Sanada},
title = {Voltage-based fault path tracing by transistor operating point analysis},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1533--1538},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.055},
doi = {10.1016/J.MICROREL.2008.07.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Sanada08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SasseAKS08,
author = {Guido T. Sasse and
Mustafa Acar and
Fred G. Kuper and
Jurriaan Schmitz},
title = {{RF} {CMOS} reliability simulations},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1581--1585},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.017},
doi = {10.1016/J.MICROREL.2008.06.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SasseAKS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SauveplaneTSD08,
author = {Jean{-}Baptiste Sauveplane and
Patrick Tounsi and
Emmanuel Scheid and
A. Deram},
title = {3D electro-thermal investigations for reliability of ultra low {ON}
state resistance power {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1464--1467},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.022},
doi = {10.1016/J.MICROREL.2008.06.022},
timestamp = {Fri, 06 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SauveplaneTSD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchwindenhammerMDP08,
author = {P. Schwindenhammer and
H. Murray and
Philippe Descamps and
Patrick Poirier},
title = {Determination of temperature change inside {IC} packages during laser
ablation of molding compound},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1263--1267},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.044},
doi = {10.1016/J.MICROREL.2008.07.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchwindenhammerMDP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SedlakovaSTM08,
author = {Vlasta Sedlakova and
Josef Sikula and
Pavel Tofel and
Jiri Majzner},
title = {Electro-ultrasonic spectroscopy of polymer-based thick film layers},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {886--889},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.011},
doi = {10.1016/J.MICROREL.2008.03.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SedlakovaSTM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SenYWKCH08,
author = {Banani Sen and
Bing{-}Liang Yang and
Hei Wong and
Chi{-}Wah Kok and
P. K. Chu and
A. Huang},
title = {Effects of aluminum incorporation on hafnium oxide film using plasma
immersion ion implantation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1765--1768},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.069},
doi = {10.1016/J.MICROREL.2008.07.069},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SenYWKCH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeokKSHK08,
author = {Jung{-}Eun Seok and
Hyun{-}Joo Kim and
Jae{-}Yong Seo and
Sam{-}jin Hwang and
Byung{-}Heon Kwak},
title = {Optimization of gate poly {TAB} size and reliability on short channel
pMOSFET},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1185--1188},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.007},
doi = {10.1016/J.MICROREL.2008.07.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SeokKSHK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShaislamovYYSPCHY08,
author = {Ulugbek Shaislamov and
Jun{-}Mo Yang and
Jung Ho Yoo and
Hyun{-}Sang Seo and
Kyung{-}Jin Park and
Chel{-}Jong Choi and
Tae{-}Eun Hong and
Beelyong Yang},
title = {Two-dimensional dopant profiling in semiconductor devices by electron
holography and chemical etching delineation techniques with the same
specimen},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1734--1736},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.002},
doi = {10.1016/J.MICROREL.2008.06.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShaislamovYYSPCHY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShibutaniWYP08,
author = {Tadahiro Shibutani and
Ji Wu and
Qiang Yu and
Michael G. Pecht},
title = {Key reliability concerns with lead-free connectors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1613--1627},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.004},
doi = {10.1016/J.MICROREL.2008.06.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShibutaniWYP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShibutaniYSP08,
author = {Tadahiro Shibutani and
Qiang Yu and
Masaki Shiratori and
Michael G. Pecht},
title = {Pressure-induced tin whisker formation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1033--1039},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.009},
doi = {10.1016/J.MICROREL.2008.04.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShibutaniYSP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShirleyGS08,
author = {Dwayne R. Shirley and
Hamid R. Ghorbani and
Jan K. Spelt},
title = {Effect of primary creep and plasticity in the modeling of thermal
fatigue of SnPb and SnAgCu solder joints},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {455--470},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.002},
doi = {10.1016/J.MICROREL.2007.08.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShirleyGS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SienkiewiczPFSCL08,
author = {Magdalena Sienkiewicz and
Philippe Perdu and
Abdellatif Firiti and
Kevin Sanchez and
Olivier Cr{\'{e}}pel and
Dean Lewis},
title = {Failure Analysis enhancement by evaluating the Photoelectric Laser
Stimulation impact on mixed-mode ICs},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1529--1532},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.060},
doi = {10.1016/J.MICROREL.2008.07.060},
timestamp = {Tue, 11 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SienkiewiczPFSCL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StanimirovicJS08,
author = {Zdravko I. Stanimirovic and
Milan Jevtic and
Ivanka P. Stanimirovic},
title = {Simultaneous mechanical and electrical straining of conventional thick-film
resistors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {59--67},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.09.039},
doi = {10.1016/J.MICROREL.2006.09.039},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StanimirovicJS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojanovicDZ08,
author = {Goran Stojanovic and
Mirjana Damnjanovic and
Ljiljana Zivanov},
title = {Temperature dependence of electrical parameters of {SMD} ferrite components
for {EMI} suppression},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1027--1032},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.020},
doi = {10.1016/J.MICROREL.2008.03.020},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StojanovicDZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08,
author = {Mile K. Stojcev},
title = {Navabi Zainalabedin, Verilog Digital System Design: Register Transfer
Level Synthesis, Testbench, {\&} Verification (second ed.), McGraw
Hill, New York {(2006)} {ISBN} 0-07-144564-1 Hardcover, pp 384, plus
{XVI}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {167--168},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.04.005},
doi = {10.1016/J.MICROREL.2006.04.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08a,
author = {Mile K. Stojcev},
title = {Douglas L. Perry, Harry D. Foster, Applied Formal Verification. Hardcover,
pp 237, Plus {XIV.} New York: McGraw Hill; 2005, {ISBN} 0-07-144372-X},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {169--170},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.04.004},
doi = {10.1016/J.MICROREL.2006.04.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08b,
author = {Mile K. Stojcev},
title = {Joseph D. Dumas II, Computer Architecture: Fundamentals and Principles
of Computer Design , {CRC} Press an imprint of Taylor {\&} Francis
Group, Boca Raton {(2006)} {ISBN} 0-849-32749-0 Hardcover, pp 372,
plus {XVI}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {171--172},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.04.003},
doi = {10.1016/J.MICROREL.2006.04.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08c,
author = {Mile K. Stojcev},
title = {Shuvra S. Bhattacharyya, {E.F.} Deprettere, Jurgen Teich, (Eds.),
Domain-Specific Processors: Systems, Architectures, Modeling, and
Simulation, Hardcover, pp 261, plus XV, Marcel Dekker, Inc., New York,
2004, {ISBN} 0-8427-4711-9},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {329--330},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.04.002},
doi = {10.1016/J.MICROREL.2006.04.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08d,
author = {Mile K. Stojcev},
title = {Sajjan G. Shiva, Advanced Computer Architectures , {CRC} Press, Francis
{\&} Taylor Group, Boca Raton {(2006)} {ISBN} 0-8493-3758-5 Hardcover.
pp 335, plus {XIV}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {331--332},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.04.001},
doi = {10.1016/J.MICROREL.2006.04.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08e,
author = {Mile K. Stojcev},
title = {Bert Haskell, Portable Electronics Product Design and Development
, McGraw Hill, New York {(2004)} {ISBN} 0-07-141639-0 Hardcover, pp
372, plus {XII}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {333--334},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.04.007},
doi = {10.1016/J.MICROREL.2006.04.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08f,
author = {Mile K. Stojcev},
title = {Cory L. Clark, LabVIEW Digital Signal Processing and Digital Communications
, McGraw Hill, New York {(2005)} {ISBN} 0-07-144492-0 205 pp, Hardcover,
plus {XIII}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {490--491},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.08.009},
doi = {10.1016/J.MICROREL.2006.08.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08f.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08g,
author = {Mile K. Stojcev},
title = {Robert B. Northrop, Introduction to Instrumentation and Measurement,
2/e , {CRC} Press, Taylor {\&} Francis Group, Boca Raton {(2005)}
{ISBN} 0-8493-3773-9 743 pp., Hardcover, plus {XXI}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {492--493},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.08.010},
doi = {10.1016/J.MICROREL.2006.08.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08g.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08h,
author = {Mile K. Stojcev},
title = {William C. Dunn, Introduction to Instrumentation, Sensor, and Process
Control , Artech House, Boston {(2005)} {ISBN} 1-58053-011-7 332 pp.,
Hardcover, plus {XIII}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {494--495},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.08.011},
doi = {10.1016/J.MICROREL.2006.08.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08h.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08i,
author = {Mile K. Stojcev},
title = {Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian, Embedded
Processor-Based Self Test , Kluwer Academic Publishers, Dordrecht
{(2004)} {ISBN} 1-4020-2785-0 217 pp., Hardcover, plus {XV}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {657--658},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.08.014},
doi = {10.1016/J.MICROREL.2006.08.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08i.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08j,
author = {Mile K. Stojcev},
title = {Wim Claes, Willy Sansen and Robert Puers, Design of Wireless Autonomous
Data-Logger ICs , Springer, Dordrecht {(2006)} {ISBN} 1-4020-3208-0
pp 199, Hardcover, plus {XVI}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {659--660},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.08.013},
doi = {10.1016/J.MICROREL.2006.08.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08j.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08k,
author = {Mile K. Stojcev},
title = {Amr M. Fahim, Clock Generators for SoC Processors: Circuit and Architectures
, Kluwer Academic Publishers, Boston {(2005)} {ISBN} 1-4020-8079-4
244 pp., Hardcover, plus {XVIII}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {661--662},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.08.012},
doi = {10.1016/J.MICROREL.2006.08.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08k.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08l,
author = {Mile K. Stojcev},
title = {Advances in Electronic Testing: Challenges and Methodologies, Dimitris
Gizopoulos (Ed.). Springer, Dordrecht (2006), 412 pp., plus XXVI,
Hardcover, {ISBN:} 0-387-29408-2},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {798--799},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.09.015},
doi = {10.1016/J.MICROREL.2006.09.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08l.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08m,
author = {Mile K. Stojcev},
title = {Erik Larson, Introduction to Advanced System-on-Chip Test Design and
Optimization , Springer, Dordrecht {(2005)} {ISBN} 1-4020-3207-2 388
pp., Hardcover, plus {XVIII}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {800--801},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.09.016},
doi = {10.1016/J.MICROREL.2006.09.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08m.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08n,
author = {Mile K. Stojcev},
title = {High-performance Energy-efficient Microprocessor Design, Vojin Oklobdzija,
Ram K. Krishnamurthy (Eds.), Dordrecht, The Netherlands, Springer
(2006), 338 pp., Hardcover, {ISBN:} 0-387-28594-6},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {953--954},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.02.001},
doi = {10.1016/J.MICROREL.2007.02.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08n.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08o,
author = {Mile K. Stojcev},
title = {Alan Clements. Principles of Computer Hardware, fourth edition, Oxford
University Press; (2006), Paperbound, pp 656, plus XV, {ISBN:} 0-19-927313-8},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {955--956},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.02.013},
doi = {10.1016/J.MICROREL.2007.02.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08o.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08p,
author = {Mile K. Stojcev},
title = {{T.S.} Rathore, Digital Measurement Techniques (2nd ed.), Alpha Science
International Ltd., Pangbourne, England {(2003)} {ISBN} 0-8493-1709-6
309 pp., Hardcover, plus {XIX}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1106--1107},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.02.023},
doi = {10.1016/J.MICROREL.2007.02.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08p.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08q,
author = {Mile K. Stojcev},
title = {Joseph Cavanagh, Sequential Logic: Analysis and Synthesis , {CRC}
Taylor and Francis Group, Boca Raton {(2007)} {ISBN} 0-8493-7564-9
Hardcover, pp 896, plus {XIII}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1108--1109},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.04.007},
doi = {10.1016/J.MICROREL.2007.04.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08q.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08r,
author = {Mile K. Stojcev},
title = {Tim Kogel, Rainer Leupers and Heinrich Meyr, Integrated System-Level
Modeling of Network-on-Chip enabled Multi-Processors Platforms , Springer,
Dordercht {(2006)} {ISBN} 1-4020-4825-4 Hardcover, 199 pp., plus {XIV}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1742--1743},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.001},
doi = {10.1016/J.MICROREL.2007.05.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08r.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev08s,
author = {Mile K. Stojcev},
title = {Richard Zurawski, Editor, Integration Technologies for Industrial
Automated Systems, {CRC} Taylor and Francis Group, Boca Raton {(2007)}
{ISBN} 0-8493-9262-4 Plus {XX} 552 pp., Hardcover},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1744--1745},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.09.001},
doi = {10.1016/J.MICROREL.2007.09.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev08s.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojcevJ08,
author = {Mile K. Stojcev and
Goran S. Jovanovic},
title = {Clock aligner based on delay locked loop with double edge synchronization},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {158--166},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.02.025},
doi = {10.1016/J.MICROREL.2007.02.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojcevJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunHDZ08,
author = {Fenglian Sun and
Hendrik Pieter Hochstenbach and
Willem D. van Driel and
G. Q. (Kouchi) Zhang},
title = {Fracture morphology and mechanism of {IMC} in Low-Ag {SAC} Solder/UBM
(Ni(P)-Au) for {WLCSP}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1167--1170},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.011},
doi = {10.1016/J.MICROREL.2008.06.011},
timestamp = {Mon, 09 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SunHDZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunP08,
author = {Yaofeng Sun and
John H. L. Pang},
title = {Digital image correlation for solder joint fatigue reliability in
microelectronics packages},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {310--318},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.03.007},
doi = {10.1016/J.MICROREL.2007.03.007},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SunP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TangLL08,
author = {Wing{-}Man Tang and
Cheung H. Leung and
Pui{-}To Lai},
title = {Improved sensing characteristics of MISiC Schottky-diode hydrogen
sensor by using HfO\({}_{\mbox{2}}\) as gate insulator},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1780--1785},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.006},
doi = {10.1016/J.MICROREL.2008.09.006},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TangLL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TazibtMCB08,
author = {W. Tazibt and
P. Mialhe and
J. P. Charles and
M. A. Belkhir},
title = {A junction characterization for microelectronic devices quality and
reliability},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {348--353},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.002},
doi = {10.1016/J.MICROREL.2007.06.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TazibtMCB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TazzoliMZDZBLT08,
author = {Augusto Tazzoli and
Gaudenzio Meneghesso and
Franco Zanon and
Francesca Danesin and
Enrico Zanoni and
Philippe Bove and
R. Langer and
J. Thorpe},
title = {Electrical characterization and reliability study of HEMTs on composite
substrates under high electric fields},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1370--1374},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.031},
doi = {10.1016/J.MICROREL.2008.07.031},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TazzoliMZDZBLT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Tencer08,
author = {Michal Tencer},
title = {Deposition of aerosol ("hygroscopic dust") on electronics - Mechanism
and risk},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {584--593},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.10.003},
doi = {10.1016/J.MICROREL.2007.10.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Tencer08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TeramotoKSO08,
author = {Akinobu Teramoto and
Rihito Kuroda and
Shigetoshi Sugawa and
Tadahiro Ohmi},
title = {Accurate negative bias temperature instability lifetime prediction
based on hole injection},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1649--1654},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.062},
doi = {10.1016/J.MICROREL.2008.07.062},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TeramotoKSO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ThijsseSDDG08,
author = {J. Thijsse and
Olaf van der Sluis and
J. A. W. van Dommelen and
Willem D. van Driel and
Marc G. D. Geers},
title = {Characterization of semiconductor interfaces using a modified mixed
mode bending apparatus},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {401--407},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.003},
doi = {10.1016/J.MICROREL.2007.06.003},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ThijsseSDDG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TinocoEIC08,
author = {Julio C. Tinoco and
Magali Estrada and
Benjam{\'{\i}}n I{\~{n}}{\'{\i}}guez and
Antonio Cerdeira},
title = {Conduction mechanisms of silicon oxide/titanium oxide {MOS} stack
structures},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {370--381},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.005},
doi = {10.1016/J.MICROREL.2007.06.005},
timestamp = {Mon, 10 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TinocoEIC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Toczek08,
author = {Wojciech Toczek},
title = {Self-testing of fully differential multistage circuits using common-mode
excitation},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1890--1899},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.007},
doi = {10.1016/J.MICROREL.2008.09.007},
timestamp = {Wed, 19 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Toczek08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TongY08,
author = {Seung{-}Hoon Tong and
Bong{-}Jin Yum},
title = {A dual burn-in policy for defect-tolerant memory products using the
number of repairs as a quality indicator},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {471--480},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.03.009},
doi = {10.1016/J.MICROREL.2007.03.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TongY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Tsai08,
author = {Han{-}Chang Tsai},
title = {Numerical and experimental analysis of {EMI} effects on circuits with
{MESFET} devices},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {537--546},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.09.003},
doi = {10.1016/J.MICROREL.2007.09.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Tsai08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiC08,
author = {Ming{-}Yi Tsai and
C. H. Chen},
title = {Evaluation of test methods for silicon die strength},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {933--941},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.003},
doi = {10.1016/J.MICROREL.2008.03.003},
timestamp = {Thu, 08 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TsaiC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiLYC08,
author = {Tsung{-}Yueh Tsai and
Yi{-}Shao Lai and
Chang{-}Lin Yeh and
Rong{-}Sheng Chen},
title = {Structural design optimization for board-level drop reliability of
wafer-level chip-scale packages},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {757--762},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.003},
doi = {10.1016/J.MICROREL.2008.01.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsaiLYC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ValdevitKSSQS08,
author = {Lorenzo Valdevit and
V. Khanna and
Arun Sharma and
Sri M. Sri{-}Jayantha and
David L. Questad and
K. Sikka},
title = {Organic substrates for flip-chip design: {A} thermo-mechanical model
that accounts for heterogeneity and anisotropy},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {245--260},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.03.006},
doi = {10.1016/J.MICROREL.2007.03.006},
timestamp = {Thu, 07 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ValdevitKSSQS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ValentinBO08,
author = {Ricky Valentin and
Donald Barker and
Michael D. Osterman},
title = {Model for life prediction of fatigue-creep interaction},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1831--1836},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.05.005},
doi = {10.1016/J.MICROREL.2008.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ValentinBO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VasconcelosFNN08,
author = {Ma{\'{\i}} Correia R. de Vasconcelos and
Denis Teixeira Franco and
Lirida A. B. Naviner and
Jean{-}Fran{\c{c}}ois Naviner},
title = {Relevant metrics for evaluation of concurrent error detection schemes},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1601--1603},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.016},
doi = {10.1016/J.MICROREL.2008.07.016},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VasconcelosFNN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VerchianiBFCAR08,
author = {M. Verchiani and
Emilien Bouyssou and
Guillaume Fiannaca and
F. Cantin and
Christine Anceau and
Pierre Ranson},
title = {Reliability study of TaON capacitors: From leakage current characterization
to {ESD} robustness prediction},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1412--1416},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.032},
doi = {10.1016/J.MICROREL.2008.07.032},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VerchianiBFCAR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VermeerschM08,
author = {Bjorn Vermeersch and
Gilbert De Mey},
title = {Dependency of thermal spreading resistance on convective heat transfer
coefficient},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {734--738},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.009},
doi = {10.1016/J.MICROREL.2008.01.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VermeerschM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Videnovic-MisicJ08,
author = {Mirjana S. Videnovic{-}Misic and
M. M. Jevtic},
title = {Impact of bias condition on 1/f noise of dual-gate depletion type
{MOSFET} in linear region and consequences for noise diagnostic application
and modelling},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1008--1014},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.002},
doi = {10.1016/J.MICROREL.2008.04.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Videnovic-MisicJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WanZB08,
author = {J. W. Wan and
Wen{-}Jun Zhang and
D. J. Bergstrom},
title = {Experimental verification of models for underfill flow driven by capillary
forces in flip-chip packaging},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {425--430},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.006},
doi = {10.1016/J.MICROREL.2007.06.006},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WanZB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangCDL08,
author = {Ying Wang and
Fei Cao and
Minghui Ding and
Yun{-}Tao Liu},
title = {Diffusion barrier performance of Zr-N/Zr bilayered film in Cu/Si contact
system},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1800--1803},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.08.003},
doi = {10.1016/J.MICROREL.2008.08.003},
timestamp = {Thu, 21 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangCDL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLL08,
author = {Tong Hong Wang and
Yi{-}Shao Lai and
Yu{-}Cheng Lin},
title = {Reliability evaluations for board-level chip-scale packages under
coupled power and thermal cycling test conditions},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {132--139},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.02.011},
doi = {10.1016/J.MICROREL.2007.02.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangSY08,
author = {Qingxue Wang and
Lanxia Sun and
Andrew Yap},
title = {Investigation of hot carrier degradation in asymmetric nDeMOS transistors},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {508--513},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.003},
doi = {10.1016/J.MICROREL.2007.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangSY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Weide-ZaageKA08,
author = {Kirsten Weide{-}Zaage and
Farzan Kashanchi and
Oliver Aubel},
title = {Simulation of migration effects in nanoscaled copper metallizations},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1398--1402},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.025},
doi = {10.1016/J.MICROREL.2008.06.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Weide-ZaageKA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Weide-ZaageZCA08,
author = {Kirsten Weide{-}Zaage and
Jiani Zhao and
Joharsyah Ciptokusumo and
Oliver Aubel},
title = {Determination of migration effects in Cu-via structures with respect
to process-induced stress},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1393--1397},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.028},
doi = {10.1016/J.MICROREL.2008.06.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Weide-ZaageZCA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WeinbergM08,
author = {Kerstin Weinberg and
Wolfgang H. M{\"{u}}ller},
title = {A strategy for damage assessment of thermally stressed copper vias
in microelectronic printed circuit boards},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {68--82},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.03.003},
doi = {10.1016/J.MICROREL.2007.03.003},
timestamp = {Sat, 23 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WeinbergM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Whitman08,
author = {Charles S. Whitman},
title = {Estimating effective dielectric thickness for capacitors with extrinsic
defects by a statistical method},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {965--973},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.02.001},
doi = {10.1016/J.MICROREL.2008.02.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Whitman08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WieseRMW08,
author = {Steffen Wiese and
Mike Roellig and
Maik Mueller and
Klaus{-}J{\"{u}}rgen Wolter},
title = {The effect of downscaling the dimensions of solder interconnects on
their creep properties},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {843--850},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.026},
doi = {10.1016/J.MICROREL.2008.03.026},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WieseRMW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wirth08,
author = {Gilson I. Wirth},
title = {Bulk built in current sensors for single event transient detection
in deep-submicron technologies},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {710--715},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.002},
doi = {10.1016/J.MICROREL.2008.01.002},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Wirth08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WirthVNK08,
author = {Gilson I. Wirth and
Michele G. Vieira and
Egas Henes Neto and
Fernanda Lima Kastensmidt},
title = {Modeling the sensitivity of {CMOS} circuits to radiation induced single
event transients},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {29--36},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.01.085},
doi = {10.1016/J.MICROREL.2007.01.085},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WirthVNK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wisz08,
author = {Boguslaw Wisz},
title = {Coupling capacitances in the planar conductive path system of the
hybrid circuit with dielectric layer},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {724--733},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.01.005},
doi = {10.1016/J.MICROREL.2008.01.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wisz08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongPTLLNS08,
author = {C. K. Wong and
John H. L. Pang and
J. W. Tew and
B. K. Lok and
H. J. Lu and
F. L. Ng and
Y. F. Sun},
title = {The influence of solder volume and pad area on Sn-3.8Ag-0.7Cu and
Ni {UBM} reaction in reflow soldering and isothermal aging},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {611--621},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.002},
doi = {10.1016/J.MICROREL.2007.05.002},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WongPTLLNS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongRSSDCZOTLELY08,
author = {Ee{-}Hua Wong and
Ranjan Rajoo and
S. K. W. Seah and
C. S. Selvanayagam and
W. D. van Driel and
J. F. J. M. Caers and
X. J. Zhao and
N. Owens and
L. C. Tan and
M. Leoni and
P. L. Eu and
Y.{-}S. Lai and
C.{-}L. Yeh},
title = {Correlation studies for component level ball impact shear test and
board level drop test},
journal = {Microelectron. Reliab.},
volume = {48},
number = {7},
pages = {1069--1078},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.008},
doi = {10.1016/J.MICROREL.2008.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongRSSDCZOTLELY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongSS08,
author = {Ee{-}Hua Wong and
S. K. W. Seah and
V. P. W. Shim},
title = {A review of board level solder joints for mobile applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1747--1758},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.08.006},
doi = {10.1016/J.MICROREL.2008.08.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongSS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongWCCC08,
author = {C. K. Wong and
Hei Wong and
Mansun Chan and
Y. T. Chow and
H. P. Chan},
title = {Silicon oxynitride integrated waveguide for on-chip optical interconnects
applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {212--218},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.04.014},
doi = {10.1016/J.MICROREL.2007.04.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongWCCC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuSYLS08,
author = {Hong Wu and
Weifeng Sun and
Yangbo Yi and
Haisong Li and
Longxing Shi},
title = {The degradation mechanisms in high voltage pLEDMOS transistor with
thick gate oxide},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1804--1808},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.002},
doi = {10.1016/J.MICROREL.2008.09.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuSYLS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuYCLWLL08,
author = {Zhenyu Wu and
Yintang Yang and
Changchun Chai and
Yuejin Li and
JiaYou Wang and
Jing Liu and
Bin Liu},
title = {Temperature-dependent stress-induced voiding in dual-damascene Cu
interconnects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {578--583},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.001},
doi = {10.1016/J.MICROREL.2007.12.001},
timestamp = {Thu, 08 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuYCLWLL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wymyslowski08,
author = {Artur Wymyslowski},
title = {Guest Editorial: 2007 EuroSimE conference on thermal, mechanical and
multi-physics simulation and experiments in micro-electronics and
micro-systems},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {803--804},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.04.011},
doi = {10.1016/J.MICROREL.2008.04.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wymyslowski08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuJLG08,
author = {Jing{-}Ping Xu and
F. Ji and
Pui{-}To Lai and
J. G. Guan},
title = {Influence of sidewall spacer on threshold voltage of {MOSFET} with
high-k gate dielectric},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {181--186},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.03.001},
doi = {10.1016/J.MICROREL.2007.03.001},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/XuJLG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuLLCXG08,
author = {Jing{-}Ping Xu and
Y. P. Li and
Pui{-}To Lai and
W. B. Chen and
S. G. Xu and
J. G. Guan},
title = {A 2D threshold-voltage model for small {MOSFET} with quantum-mechanical
effects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {1},
pages = {23--28},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2006.12.007},
doi = {10.1016/J.MICROREL.2006.12.007},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/XuLLCXG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangBASVW08,
author = {Yu Yang and
Hugo Bender and
Kai Arstila and
Bart Swinnen and
Bert Verlinden and
Ingrid De Wolf},
title = {Detection of failure sites by focused ion beam and nano-probing in
the interconnect of three-dimensional stacked circuit structures},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1517--1520},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.036},
doi = {10.1016/J.MICROREL.2008.06.036},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangBASVW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangWJLWC08,
author = {Ping{-}Feng Yang and
Hua{-}Chiang Wen and
Sheng{-}Rui Jian and
Yi{-}Shao Lai and
Sean Wu and
Rong{-}Sheng Chen},
title = {Characteristics of ZnO thin films prepared by radio frequency magnetron
sputtering},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {389--394},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.010},
doi = {10.1016/J.MICROREL.2007.08.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YangWJLWC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangYH08,
author = {Lin{-}An Yang and
Chun{-}Li Yu and
Yue Hao},
title = {A new model of subthreshold swing for sub-100 nm MOSFETs},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {342--347},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.06.007},
doi = {10.1016/J.MICROREL.2007.06.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangYH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YehL08,
author = {Chang{-}Lin Yeh and
Yi{-}Shao Lai},
title = {Investigations of solder joint damage potentials for board-level chip-scale
packages subjected to consecutive drops},
journal = {Microelectron. Reliab.},
volume = {48},
number = {2},
pages = {282--292},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.04.017},
doi = {10.1016/J.MICROREL.2007.04.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YehL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YeoEL08,
author = {Alfred Yeo and
Bernd Ebersberger and
Charles Lee},
title = {Consideration of temperature and current stress testing on flip chip
solder interconnects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1847--1856},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.070},
doi = {10.1016/J.MICROREL.2008.07.070},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YeoEL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YiJAHJ08,
author = {Seol{-}Min Yi and
Kwang{-}Ho Jang and
Jung{-}Uk An and
Sang{-}Soo Hwang and
Young{-}Chang Joo},
title = {The self-formatting barrier characteristics of Cu-Mg/SiO\({}_{\mbox{2}}\)
and Cu-Ru/SiO\({}_{\mbox{2}}\) films for Cu interconnects},
journal = {Microelectron. Reliab.},
volume = {48},
number = {5},
pages = {744--748},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.12.005},
doi = {10.1016/J.MICROREL.2007.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YiJAHJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoonCNKKLJ08,
author = {Jeong{-}Won Yoon and
Hyun{-}Suk Chun and
Bo{-}In Noh and
Ja{-}Myeong Koo and
Jong{-}Woong Kim and
Hoo{-}Jeong Lee and
Seung{-}Boo Jung},
title = {Mechanical reliability of Sn-rich Au-Sn/Ni flip chip solder joints
fabricated by sequential electroplating method},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1857--1863},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.09.008},
doi = {10.1016/J.MICROREL.2008.09.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YoonCNKKLJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoonNLLJ08,
author = {Jeong{-}Won Yoon and
Bo{-}In Noh and
Young{-}Ho Lee and
Hyo{-}Soo Lee and
Seung{-}Boo Jung},
title = {Effects of isothermal aging and temperature-humidity treatment of
substrate on joint reliability of Sn-3.0Ag-0.5Cu/OSP-finished Cu {CSP}
solder joint},
journal = {Microelectron. Reliab.},
volume = {48},
number = {11-12},
pages = {1864--1874},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.065},
doi = {10.1016/J.MICROREL.2008.07.065},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YoonNLLJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YouC08,
author = {A. H. You and
P. L. Cheang},
title = {Effect of doping concentration on avalanche multiplication and excess
noise factor in submicron {APD}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {547--554},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.10.006},
doi = {10.1016/J.MICROREL.2007.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YouC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuSKKYS08,
author = {Qiang Yu and
Tadahiro Shibutani and
Do{-}Seop Kim and
Yusuke Kobayashi and
Jidong Yang and
Masaki Shiratori},
title = {Effect of process-induced voids on isothermal fatigue resistance of
{CSP} lead-free solder joints},
journal = {Microelectron. Reliab.},
volume = {48},
number = {3},
pages = {431--437},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.08.008},
doi = {10.1016/J.MICROREL.2007.08.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuSKKYS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanSDZ08,
author = {Cadmus A. Yuan and
Olaf van der Sluis and
Willem D. van Driel and
G. Q. (Kouchi) Zhang},
title = {The need for multi-scale approaches in Cu/low-k reliability issues},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {833--842},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.024},
doi = {10.1016/J.MICROREL.2008.03.024},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YuanSDZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZaalDBLBZ08,
author = {Jeroen J. M. Zaal and
W. D. van Driel and
S. Bendida and
Q. Li and
J. T. M. van Beek and
G. Q. Zhang},
title = {Packaging influences on the reliability of {MEMS} resonators},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1567--1571},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.041},
doi = {10.1016/J.MICROREL.2008.06.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZaalDBLBZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZachariasseH08,
author = {Frank Zachariasse and
Jan van Hassel},
title = {Conditional time resolved photoemission for debugging ICs with intermittent
faults},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1289--1294},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.034},
doi = {10.1016/J.MICROREL.2008.06.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZachariasseH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZarebskiG08,
author = {Janusz Zarebski and
Krzysztof G{\'{o}}recki},
title = {Electrothermal compact macromodel of monolithic switching voltage
regulator {MC34063A}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {10},
pages = {1703--1710},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.06.001},
doi = {10.1016/J.MICROREL.2008.06.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZarebskiG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangKCTP08,
author = {Xiaowu Zhang and
Kripesh Vaidyanathan and
Tai Chong Chai and
Teck Chun Tan and
D. Pinjala},
title = {Board level solder joint reliability analysis of a fine pitch Cu post
type wafer level package {(WLP)}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {602--610},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.05.009},
doi = {10.1016/J.MICROREL.2007.05.009},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangKCTP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zhou08,
author = {Jiang Zhou},
title = {Transient analysis on hygroscopic swelling characterization using
sequentially coupled moisture diffusion and hygroscopic stress modeling
method},
journal = {Microelectron. Reliab.},
volume = {48},
number = {6},
pages = {805--810},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.03.027},
doi = {10.1016/J.MICROREL.2008.03.027},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Zhou08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuCT08,
author = {Jianxin Zhu and
Zhihua Chen and
Shuyuan Tang},
title = {Leaky modes of optical waveguides with varied refractive index for
microchip optical interconnect applications - Asymptotic solutions},
journal = {Microelectron. Reliab.},
volume = {48},
number = {4},
pages = {555--562},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2007.09.004},
doi = {10.1016/J.MICROREL.2007.09.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuCT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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