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@article{DBLP:journals/mr/Abadeer07,
author = {W. W. (Bill) Abadeer},
title = {Effect of stress voltages on voltage acceleration and lifetime projections
for ultra-thin gate oxides},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {395--400},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.003},
doi = {10.1016/J.MICROREL.2006.05.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Abadeer07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbbateBFICM07,
author = {Carmine Abbate and
Giovanni Busatto and
Luigi Fratelli and
Francesco Iannuzzo and
B. Cascone and
Roberta Manzo},
title = {The robustness of series-connected high power {IGBT} modules},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1746--1750},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.036},
doi = {10.1016/J.MICROREL.2007.07.036},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AbbateBFICM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbermannESLOB07,
author = {Stephan Abermann and
J. K. Efavi and
G. Sj{\"{o}}blom and
Max C. Lemme and
J{\"{o}}rgen Olsson and
Emmerich Bertagnolli},
title = {Impact of Al-, Ni-, TiN-, and Mo-metal gates on MOCVD-grown HfO\({}_{\mbox{2}}\)
and ZrO\({}_{\mbox{2}}\) high-kappa dielectrics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {536--539},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.002},
doi = {10.1016/J.MICROREL.2007.01.002},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AbermannESLOB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AdrianREHGPG07,
author = {J{\'{e}}r{\^{o}}me Adrian and
Nicolas Rodriguez and
Fabien Essely and
G{\'{e}}rald Haller and
Catherine Grosjean and
Alain Portavoce and
Christophe Girardeaux},
title = {Investigation of a new method for dopant characterization},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1599--1603},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.091},
doi = {10.1016/J.MICROREL.2007.07.091},
timestamp = {Thu, 03 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AdrianREHGPG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AkarvardarMSSCGC07,
author = {Kerem Akarvardar and
Abdelkarim Mercha and
Eddy Simoen and
Vaidyanathan Subramanian and
Cor Claeys and
Pierre Gentil and
Sorin Cristoloveanu},
title = {High-temperature performance of state-of-the-art triple-gate transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2065--2069},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.002},
doi = {10.1016/J.MICROREL.2006.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AkarvardarMSSCGC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlamKVM07,
author = {Muhammad Ashraful Alam and
Haldun Kufluoglu and
Dhanoop Varghese and
S. Mahapatra},
title = {A comprehensive model for {PMOS} {NBTI} degradation: Recent progress},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {853--862},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.012},
doi = {10.1016/J.MICROREL.2006.10.012},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlamKVM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AltYHKLIASSBKD07,
author = {K. W. Alt and
R. E. Yeats and
C. P. Hutchinson and
D. K. Kuhn and
T. S. Low and
M. Iwamoto and
M. E. Adamski and
R. L. Shimon and
Timothy E. Shirley and
M. Bonse and
F. G. Kellert and
D. C. D'Avanzo},
title = {Determination of transistor infant failure probability in InGaP/GaAs
heterojunction bipolar technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1175--1179},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.007},
doi = {10.1016/J.MICROREL.2007.02.007},
timestamp = {Tue, 08 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AltYHKLIASSBKD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlwanBKZ07,
author = {M. Alwan and
B. Beydoun and
K. Ketata and
M. Zoaeter},
title = {Gate charge behaviors in N-channel power VDMOSFETs during {HEF} and
{PBT} stresses},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1406--1410},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.096},
doi = {10.1016/J.MICROREL.2007.07.096},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlwanBKZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AmatRNAS07,
author = {Esteve Amat and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
James H. Stathis},
title = {Influence of the SiO\({}_{\mbox{2}}\) layer thickness on the degradation
of HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\) stacks subjected to static
and dynamic stress conditions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {544--547},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.003},
doi = {10.1016/J.MICROREL.2007.01.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AmatRNAS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AnderssonATL07,
author = {C. Andersson and
D. R. Andersson and
Per{-}Erik Tegehall and
Johan Liu},
title = {Effect of different temperature cycling profiles on the crack initiation
and propagation of Sn-3.5Ag wave soldered solder joints},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {266--272},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.014},
doi = {10.1016/J.MICROREL.2006.09.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AnderssonATL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AresuKPG07,
author = {Stefano Aresu and
Werner Kanert and
Reinhard Pufall and
Michael Goroll},
title = {Exceptional operative gate voltage induces negative bias temperature
instability {(NBTI)} on n-type trench {DMOS} transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1416--1418},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.021},
doi = {10.1016/J.MICROREL.2007.07.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AresuKPG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArshadJA07,
author = {Mohd Khairuddin Md Arshad and
Azman Jalar and
Ibrahim Ahmad},
title = {Characterization of parasitic residual deposition on passivation layer
in electroless nickel immersion gold process},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1120--1126},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.003},
doi = {10.1016/J.MICROREL.2006.07.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ArshadJA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsgaryMZ07,
author = {Reza Asgary and
Karim Mohammadi and
Mark Zwolinski},
title = {Using neural networks as a fault detection mechanism in {MEMS} devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {142--149},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.04.012},
doi = {10.1016/J.MICROREL.2006.04.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AsgaryMZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaP07,
author = {Elena Atanassova and
Albena Paskaleva},
title = {Challenges of Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\) as high-k dielectric
for nanoscale DRAMs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {913--923},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.006},
doi = {10.1016/J.MICROREL.2006.06.006},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaSP07,
author = {Elena Atanassova and
D. Spassov and
Albena Paskaleva},
title = {Metal gates and gate-deposition-induced defects in Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)
stack capacitors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2088--2093},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.001},
doi = {10.1016/J.MICROREL.2006.10.001},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaSP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AuleyRKK07,
author = {C. N. Mc Auley and
Andreas Rummel and
F. W. Keating and
Stephan Kleindiek},
title = {3D failure analysis in depth profiles of sequentially made {FIB} cuts},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1595--1598},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.032},
doi = {10.1016/J.MICROREL.2007.07.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AuleyRKK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BabouxBPB07,
author = {Nicolas Baboux and
C. Busseret and
Carole Plossu and
Philippe Boivin},
title = {Peculiarities of electron tunnel injection to the drain of EEPROMs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {631--634},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.055},
doi = {10.1016/J.MICROREL.2007.01.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BabouxBPB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BahiLFL07,
author = {Manoubi Auguste Bahi and
Pascal Lecuyer and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Jean{-}Pierre Landesman},
title = {Sequential environmental stresses tests qualification for automotive
components},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1680--1684},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.004},
doi = {10.1016/J.MICROREL.2007.07.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BahiLFL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarlettaC07,
author = {Giacomo Barletta and
Giuseppe Curr{\`{o}}},
title = {Evaluation of the generation mechanisms at surface and in the bulk
of the silicon by current transient technique},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {810--814},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.004},
doi = {10.1016/J.MICROREL.2007.01.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarlettaC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarliniCMF07,
author = {Davide Barlini and
Mauro Ciappa and
Michel Mermet{-}Guyennet and
Wolfgang Fichtner},
title = {Measurement of the transient junction temperature in {MOSFET} devices
under operating conditions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1707--1712},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.008},
doi = {10.1016/J.MICROREL.2007.07.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarliniCMF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeaudoinSP07,
author = {Felix Beaudoin and
Kevin Sanchez and
Philippe Perdu},
title = {Dynamic laser stimulation techniques for advanced failure analysis
and design debug applications},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1517--1522},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.054},
doi = {10.1016/J.MICROREL.2007.07.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeaudoinSP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelaidKGMMM07,
author = {Mohamed Ali Bela{\"{\i}}d and
K. Ketata and
M. Gares and
Karine Mourgues and
Mohamed Masmoudi and
J{\'{e}}r{\^{o}}me Marcon},
title = {Comparative analysis of {RF} {LDMOS} capacitance reliability under
accelerated ageing tests},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {59--64},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.04.009},
doi = {10.1016/J.MICROREL.2006.04.009},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BelaidKGMMM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenbahoucheMZ07,
author = {Lynda Benbahouche and
A. Merabet and
A. Zegadi},
title = {Numerical analysis and comparative study of short circuit stress in
IGBTs devices (IR, {IXYS)}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1773--1778},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.062},
doi = {10.1016/J.MICROREL.2007.07.062},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BenbahoucheMZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenmansourAMW07,
author = {Adel Benmansour and
Stephane Azzopardi and
Jean{-}Christophe Martin and
Eric Woirgard},
title = {Trench {IGBT} failure mechanisms evolution with temperature and gate
resistance under various short-circuit conditions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1730--1734},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.049},
doi = {10.1016/J.MICROREL.2007.07.049},
timestamp = {Wed, 03 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BenmansourAMW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenmansourAMW07a,
author = {Adel Benmansour and
Stephane Azzopardi and
Jean{-}Christophe Martin and
Eric Woirgard},
title = {A step by step methodology to analyze the {IGBT} failure mechanisms
under short circuit and turn-off inductive conditions using 2D physically
based device simulation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1800--1805},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.051},
doi = {10.1016/J.MICROREL.2007.07.051},
timestamp = {Wed, 03 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BenmansourAMW07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BerechmanRS07,
author = {Ronen A. Berechman and
Boris Revzin and
Yoram Shapira},
title = {Correlating gate sinking and electrical performance of pseudomorphic
high electron mobility transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1202--1207},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.08.020},
doi = {10.1016/J.MICROREL.2006.08.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BerechmanRS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BestoryML07,
author = {Corinne Bestory and
Fran{\c{c}}ois Marc and
Herv{\'{e}} Levi},
title = {Statistical analysis during the reliability simulation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1353--1357},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.079},
doi = {10.1016/J.MICROREL.2007.07.079},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BestoryML07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeylierBBG07,
author = {Gaelle Beylier and
Sylvie Bruy{\`{e}}re and
Darcy Benoit and
G{\'{e}}rard Ghibaudo},
title = {Refined electrical analysis of two charge states transition characteristic
of "borderless" silicon nitride},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {743--747},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.005},
doi = {10.1016/J.MICROREL.2007.01.005},
timestamp = {Thu, 29 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeylierBBG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BhateD07,
author = {Dhruv Bhate and
Martin L. Dunn},
title = {Adhesion of arbitrary-shaped thin-film microstructures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2014--2024},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.011},
doi = {10.1016/J.MICROREL.2007.04.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BhateD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BianicAKSR07,
author = {Stephane Bianic and
St{\'{e}}phanie Allemand and
Gr{\'{e}}gory Kerrosa and
Pascal Scafidi and
Didier Renard},
title = {Advanced backside failure analysis in 65 nm {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1550--1554},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.076},
doi = {10.1016/J.MICROREL.2007.07.076},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BianicAKSR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bisschop07,
author = {Jaap Bisschop},
title = {Reliability methods and standards},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1330--1335},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.084},
doi = {10.1016/J.MICROREL.2007.07.084},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bisschop07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BottiniCGGGMSS07,
author = {Roberta Bottini and
Sonia Costantini and
Nadia Galbiati and
Andrea Ghetti and
Gabriella Ghidini and
Aurelio Giancarlo Mauri and
Claudia Scozzari and
Alessandro Sebastiani},
title = {High voltage transistor degradation in {NVM} pump application},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1384--1388},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.050},
doi = {10.1016/J.MICROREL.2007.07.050},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BottiniCGGGMSS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BouarroudjKOBDL07,
author = {M. Bouarroudj and
Zoubir Khatir and
Jean{-}Pierre Ousten and
F. Badel and
Laurent Dupont and
St{\'{e}}phane Lefebvre},
title = {Degradation behavior of 600 {V-200} {A} {IGBT} modules under power
cycling and high temperature environment conditions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1719--1724},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.027},
doi = {10.1016/J.MICROREL.2007.07.027},
timestamp = {Thu, 25 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BouarroudjKOBDL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoukhenoufaPC07,
author = {A. Boukhenoufa and
Lionel Pichon and
C. Cordier},
title = {Two-dimensional numerical simulations of 1/f noise by {GR} mechanisms
in thin film transistors: Effects of induced defect technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1419--1423},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.059},
doi = {10.1016/J.MICROREL.2007.07.059},
timestamp = {Wed, 28 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoukhenoufaPC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoulencD07,
author = {P. Boulenc and
I. Devos},
title = {Templates for LaAlO\({}_{\mbox{3}}\) epitaxy on silicon},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {709--713},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.010},
doi = {10.1016/J.MICROREL.2007.02.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoulencD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BouyaCMLPCBP07,
author = {Mohsine Bouya and
D. Carisetti and
Nathalie Malbert and
Nathalie Labat and
Philippe Perdu and
J. C. Clement and
M. Bonnet and
G. Pataut},
title = {Study of passivation defects by electroluminescence in AlGaN/GaN {HEMTS}
on SiC},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1630--1633},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.085},
doi = {10.1016/J.MICROREL.2007.07.085},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BouyaCMLPCBP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BreglioINSHNU07,
author = {Giovanni Breglio and
Andrea Irace and
Ettore Napoli and
Paolo Spirito and
K. Hamada and
T. Nishijima and
T. Ueta},
title = {Study of a failure mechanism during {UIS} switching of planar {PT-IGBT}
with current sense cell},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1756--1760},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.009},
doi = {10.1016/J.MICROREL.2007.07.009},
timestamp = {Fri, 01 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BreglioINSHNU07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrennanCSDMG07,
author = {Ciaran J. Brennan and
Kiran V. Chatty and
Jeff Sloan and
Paul Dunn and
Mujahid Muhammad and
Robert Gauthier},
title = {Design automation to suppress cable discharge event {(CDE)} induced
latchup in 90 nm {CMOS} ASICs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1069--1073},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.008},
doi = {10.1016/J.MICROREL.2006.11.008},
timestamp = {Thu, 02 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrennanCSDMG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrennanCWCG07,
author = {Ciaran J. Brennan and
Shunhua Chang and
Min Woo and
Kiran V. Chatty and
Robert Gauthier},
title = {Implementation of diode and bipolar triggered SCRs for {CDM} robust
{ESD} protection in 90 nm {CMOS} ASICs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1030--1035},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.009},
doi = {10.1016/J.MICROREL.2006.11.009},
timestamp = {Thu, 02 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrennanCWCG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BressersDJEZ07,
author = {H. J. L. Bressers and
W. D. van Driel and
Kaspar M. B. Jansen and
Leo J. Ernst and
G. Q. Zhang},
title = {Correlation between chemistry of polymer building blocks and microelectronics
reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {290--294},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.035},
doi = {10.1016/J.MICROREL.2006.09.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BressersDJEZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrodbeckG07,
author = {Tilo Brodbeck and
Reinhold Gaertner},
title = {Experience in {HBM} {ESD} testing of high pin count devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1025--1029},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.010},
doi = {10.1016/J.MICROREL.2006.11.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrodbeckG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrownKBR07,
author = {Douglas W. Brown and
Patrick W. Kalgren and
Carl S. Byington and
Michael J. Roemer},
title = {Electronic prognostics - {A} case study using global positioning system
{(GPS)}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1874--1881},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.020},
doi = {10.1016/J.MICROREL.2007.02.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrownKBR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuiuHERLHC07,
author = {Octavian Buiu and
Steve Hall and
Olof Engstr{\"{o}}m and
B. Raeissi and
Max C. Lemme and
Paul K. Hurley and
Karim Cherkaoui},
title = {Extracting the relative dielectric constant for "high-kappa layers"
from {CV} measurements - Errors and error propagation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {678--681},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.006},
doi = {10.1016/J.MICROREL.2007.01.006},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BuiuHERLHC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BurgaudCMSM07,
author = {P. Burgaud and
L. Constancias and
G. Martel and
C. Savina and
D. Mesnager},
title = {Preliminary reliability assessment and failure physical analysis on
AlGaN/GaN HEMTs {COTS}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1653--1657},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.017},
doi = {10.1016/J.MICROREL.2007.07.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BurgaudCMSM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BychikhinSSPPP07,
author = {Sergey Bychikhin and
T. Swietlik and
Tadeusz Suski and
Sylwester Porowski and
Piotr Perlin and
Dionyz Pogany},
title = {Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient
interferometric mapping},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1649--1652},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.046},
doi = {10.1016/J.MICROREL.2007.07.046},
timestamp = {Sun, 05 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BychikhinSSPPP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CachoOCJ07,
author = {Florian Cacho and
S. Orain and
G. Cailletaud and
H. Jaouen},
title = {A constitutive single crystal model for the silicon mechanical behavior:
Applications to the stress induced by silicided lines and {STI} in
{MOS} technologies},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {161--167},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.009},
doi = {10.1016/J.MICROREL.2006.09.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CachoOCJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaristiaNBCRCBGS07,
author = {Liliana Caristia and
Giuseppe Nicotra and
Corrado Bongiorno and
Nicola Costa and
Sebastiano Ravesi and
Salvo Coffa and
Riccardo De Bastiani and
Maria Grazia Grimaldi and
Corrado Spinella},
title = {The influence of hydrogen and nitrogen on the formation of Si nanoclusters
embedded in sub-stoichiometric silicon oxide layers},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {777--780},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.056},
doi = {10.1016/J.MICROREL.2007.01.056},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CaristiaNBCRCBGS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CascioCC07,
author = {Alessandra Cascio and
Giuseppe Curr{\`{o}} and
A. Cavagnoli},
title = {Total ionizing dose reliability of thin SiO\({}_{\mbox{2}}\) in PowerMOSFET
devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {815--818},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.007},
doi = {10.1016/J.MICROREL.2007.01.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CascioCC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CastellazziCFPM07,
author = {Alberto Castellazzi and
Mauro Ciappa and
Wolfgang Fichtner and
M. Piton and
Michel Mermet{-}Guyennet},
title = {A study of the threshold-voltage suitability as an application-related
reliability indicator for planar-gate non-punch-through IGBTs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1713--1718},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.035},
doi = {10.1016/J.MICROREL.2007.07.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CastellazziCFPM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CesterGWPAG07,
author = {Andrea Cester and
A. Gasperin and
Nicola Wrachien and
Alessandro Paccagnella and
Valentina Ancarani and
Cosimo Gerardi},
title = {Ionising radiation and electrical stress on nanocrystal memory cell
array},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {602--605},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.008},
doi = {10.1016/J.MICROREL.2007.01.008},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CesterGWPAG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChakravarthiKRK07,
author = {S. Chakravarthi and
A. T. Krishnan and
V. Reddy and
S. Krishnan},
title = {Probing negative bias temperature instability using a continuum numerical
framework: Physics to real world operation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {863--872},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.008},
doi = {10.1016/J.MICROREL.2006.10.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChakravarthiKRK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenK07,
author = {Shih{-}Hung Chen and
Ming{-}Dou Ker},
title = {Active {ESD} protection circuit design against charged-device-model
{ESD} event in {CMOS} integrated circuits},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1502--1505},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.095},
doi = {10.1016/J.MICROREL.2007.07.095},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenXLLX07,
author = {W. B. Chen and
Jing{-}Ping Xu and
Pui{-}To Lai and
Y. P. Li and
S. G. Xu},
title = {Gate leakage properties of {MOS} devices with tri-layer high-k gate
dielectric},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {937--943},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.002},
doi = {10.1016/J.MICROREL.2006.06.002},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenXLLX07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Cheng07,
author = {Shiou{-}Ying Cheng},
title = {Very wide current-regime operation of an InP/InGaAs tunneling emitter
bipolar transistor {(TEBT)}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1208--1212},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.08.018},
doi = {10.1016/J.MICROREL.2006.08.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Cheng07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Chiang07,
author = {T. K. Chiang},
title = {A new two-dimensional threshold voltage model for cylindrical, fully-depleted,
surrounding-gate {(SG)} MOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {379--383},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.016},
doi = {10.1016/J.MICROREL.2006.05.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Chiang07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuCLHC07,
author = {C. C. Chiu and
H. H. Chang and
C. C. Lee and
C. C. Hsia and
Kuo{-}Ning Chiang},
title = {Reliability of interfacial adhesion in a multi-level copper/low-k
interconnect structure},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1506--1511},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.019},
doi = {10.1016/J.MICROREL.2007.07.019},
timestamp = {Wed, 23 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuCLHC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuSLH07,
author = {Fu{-}Chien Chiu and
Wen{-}Chieh Shih and
Joseph Ya{-}min Lee and
Huey{-}Liang Hwang},
title = {An investigation of surface state capture cross-sections for metal-oxide-semiconductor
field-effect transistors using HfO\({}_{\mbox{2}}\) gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {548--551},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.009},
doi = {10.1016/J.MICROREL.2007.01.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuSLH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CicoKGSLGPF07,
author = {Karol Cico and
J{\'{a}}n Kuzm{\'{\i}}k and
Dagmar Gregusov{\'{a}} and
Roman Stoklas and
Tibor Lalinsky and
Alexandros G. Georgakilas and
Dionyz Pogany and
Karol Fr{\"{o}}hlich},
title = {Optimization and performance of Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/GaN
metal-oxide-semiconductor structures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {790--793},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.010},
doi = {10.1016/J.MICROREL.2007.01.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CicoKGSLGPF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CoppensJCPDMM07,
author = {Peter Coppens and
G. Jenicot and
Herman Casier and
F. De Pestel and
F. Depuydt and
N. Martens and
Peter Moens},
title = {{TLP} Characterization of large gate width devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1462--1467},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.041},
doi = {10.1016/J.MICROREL.2007.07.041},
timestamp = {Mon, 13 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CoppensJCPDMM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CorsoASNLSNC07,
author = {Domenico Corso and
S. Aurite and
E. Sciacca and
D. Naso and
Salvatore Lombardo and
A. Santangelo and
M. C. Nicotra and
S. Cascino},
title = {Measurement of the hot carrier damage profile in {LDMOS} devices stressed
at high drain voltage},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {806--809},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.011},
doi = {10.1016/J.MICROREL.2007.01.011},
timestamp = {Tue, 30 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CorsoASNLSNC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CrossonEBTCPP07,
author = {A. Crosson and
Laurent Escotte and
Marise Bafleur and
D. Talbourdet and
L. Cr{\'{e}}tinon and
Philippe Perdu and
Guy Perez},
title = {Long-term reliability of silicon bipolar transistors subjected to
low constraints},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1590--1594},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.057},
doi = {10.1016/J.MICROREL.2007.07.057},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CrossonEBTCPP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CrupiDGBRH07,
author = {Isodiana Crupi and
Robin Degraeve and
Bogdan Govoreanu and
David P. Brunco and
Philippe Roussel and
Jan Van Houdt},
title = {Distribution and generation of traps in SiO\({}_{\mbox{2}}\)/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
gate stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {525--527},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.013},
doi = {10.1016/J.MICROREL.2007.01.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CrupiDGBRH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CuetoACTBFB07,
author = {Olga Cueto and
Myriam Assous and
Fran{\c{c}}ois de Crecy and
A. Toffoli and
David Bouchu and
M. Fayolle and
Fr{\'{e}}d{\'{e}}ric Boulanger},
title = {Development of a permittivity extraction method for ultra low k dielectrics
integrated in advanced interconnects},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {769--772},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.057},
doi = {10.1016/J.MICROREL.2007.01.057},
timestamp = {Fri, 04 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CuetoACTBFB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CuongKKKY07,
author = {Duy Cuong Nguyen and
Dong{-}Jin Kim and
Byoung{-}Don Kang and
Chang Soo Kim and
Soon{-}Gil Yoon},
title = {Characterizations of high resistivity TiN\({}_{\mbox{x}}\)O\({}_{\mbox{y}}\)
thin films for applications in thin film resistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {752--754},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.014},
doi = {10.1016/J.MICROREL.2007.01.014},
timestamp = {Mon, 02 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CuongKKKY07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CurroCCMN07,
author = {Giuseppe Curr{\`{o}} and
Marco Camalleri and
Denise Cal{\`{\i}} and
Francesca Monforte and
Fortunato Neri},
title = {Carrier trapping in thin N\({}_{\mbox{2}}\)O-grown oxynitride/oxide
di-layer for PowerMOSFET devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {798--801},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.015},
doi = {10.1016/J.MICROREL.2007.01.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CurroCCMN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CurroCCMN07a,
author = {Giuseppe Curr{\`{o}} and
Marco Camalleri and
Denise Cal{\`{\i}} and
Francesca Monforte and
Fortunato Neri},
title = {Interface states and traps in thin N\({}_{\mbox{2}}\)O-grown oxynitride/oxide
di-layer for PowerMOSFET devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {819--821},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.016},
doi = {10.1016/J.MICROREL.2007.01.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CurroCCMN07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DankovicMDDGS07,
author = {Danijel Dankovic and
Ivica Manic and
Vojkan Davidovic and
Snezana Djoric{-}Veljkovic and
Snezana Golubovic and
Ninoslav Stojadinovic},
title = {Negative bias temperature instabilities in sequentially stressed and
annealed p-channel power VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1400--1405},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.022},
doi = {10.1016/J.MICROREL.2007.07.022},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DankovicMDDGS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DavidovicKSV07,
author = {Vojkan Davidovic and
Dimitrios N. Kouvatsos and
Ninoslav Stojadinovic and
Apostolos T. Voutsas},
title = {Influence of polysilicon film thickness on radiation response of advanced
excimer laser annealed polycrystalline silicon thin film transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1841--1845},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.025},
doi = {10.1016/J.MICROREL.2007.07.025},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DavidovicKSV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DebledsRMFPM07,
author = {S. Debleds and
J. P. Rebrasse and
Lionel Dantas de Morais and
I. Frapreau and
R. Perdreau and
B. Morillon},
title = {Localization of sensitive areas of power {AC} switch under thermal
laser stimulation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1569--1573},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.018},
doi = {10.1016/J.MICROREL.2007.07.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DebledsRMFPM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DelmonteWCCM07,
author = {Nicola Delmonte and
B. E. Watts and
Giovanni Chiorboli and
Paolo Cova and
Roberto Menozzi},
title = {Test structures for dielectric spectroscopy of thin films at microwave
frequencies},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {682--685},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.062},
doi = {10.1016/J.MICROREL.2007.01.062},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DelmonteWCCM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DemkovSLL07,
author = {Alexander A. Demkov and
Onise Sharia and
Xuhui Luo and
Jaekwang Lee},
title = {Density functional theory of high-k dielectric gate stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {686--693},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.009},
doi = {10.1016/J.MICROREL.2007.02.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DemkovSLL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DevireddyMCTTZ07,
author = {Siva Prasad Devireddy and
Bigang Min and
Zeynep {\c{C}}elik{-}Butler and
Hsing{-}Huang Tseng and
Philip J. Tobin and
Ania Zlotnicka},
title = {Improved low frequency noise characteristics of sub-micron MOSFETs
with TaSiN/TiN gate on {ALD} HfO\({}_{\mbox{2}}\) dielectric},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1228--1232},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.05.006},
doi = {10.1016/J.MICROREL.2007.05.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DevireddyMCTTZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Driel07,
author = {W. D. van Driel},
title = {Facing the challenge of designing for Cu/low-k reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1969--1974},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.009},
doi = {10.1016/J.MICROREL.2007.04.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Driel07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DrielMGZ07,
author = {W. D. van Driel and
A. Mavinkurve and
Marcel A. J. van Gils and
G. Q. Zhang},
title = {Advanced structural similarity rules for the {BGA} package family},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {205--214},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.005},
doi = {10.1016/J.MICROREL.2006.09.005},
timestamp = {Wed, 18 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DrielMGZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DrielYYKZ07,
author = {Willem D. van Driel and
Dao{-}Guo Yang and
Cadmus A. Yuan and
M. van Kleef and
G. Q. (Kouchi) Zhang},
title = {Mechanical reliability challenges for {MEMS} packages: Capping},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1823--1826},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.033},
doi = {10.1016/J.MICROREL.2007.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DrielYYKZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DubecBPGBS07,
author = {Viktor Dubec and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik and
Tilo Brodbeck and
Wolfgang Stadler},
title = {Backside interferometric methods for localization of ESD-induced leakage
current and metal shorts},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1539--1544},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.029},
doi = {10.1016/J.MICROREL.2007.07.029},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DubecBPGBS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuchampCM07,
author = {Genevi{\`{e}}ve Duchamp and
D. Castagnet and
Alain Meresse},
title = {Near-field {EMC} study to improve electronic component reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1668--1672},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.044},
doi = {10.1016/J.MICROREL.2007.07.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuchampCM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuenasCGBKHRL07,
author = {Salvador Due{\~{n}}as and
Helena Cast{\'{a}}n and
H{\'{e}}ctor Garc{\'{\i}}a and
L. Bail{\'{o}}n and
Kaupo Kukli and
Timo Hatanp{\"{a}}{\"{a}} and
Mikko Ritala and
Markku Leskel{\"{a}}},
title = {Experimental observations of temperature-dependent flat band voltage
transients on high-k dielectrics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {653--656},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.080},
doi = {10.1016/J.MICROREL.2007.01.080},
timestamp = {Mon, 30 Mar 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DuenasCGBKHRL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DupontLBKF07,
author = {Laurent Dupont and
St{\'{e}}phane Lefebvre and
M. Bouaroudj and
Zoubir Khatir and
Jean{-}Claude Faugi{\`{e}}res},
title = {Failure modes on low voltage power MOSFETs under high temperature
application},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1767--1772},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.066},
doi = {10.1016/J.MICROREL.2007.07.066},
timestamp = {Thu, 25 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DupontLBKF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuschlKAJSK07,
author = {Rainer Duschl and
Martin Kerber and
A. Avellan and
S. Jakschik and
Uwe Schroeder and
S. Kudelka},
title = {Reliability aspects of Hf-based capacitors: Breakdown and trapping
effects},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {497--500},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.017},
doi = {10.1016/J.MICROREL.2007.01.017},
timestamp = {Sun, 31 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DuschlKAJSK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic07,
author = {Andrzej Dziedzic},
title = {Carbon/polyesterimide thick-film resistive composites - Experimental
characterization and theoretical analysis of physicochemical, electrical
and stability properties},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {354--362},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.016},
doi = {10.1016/J.MICROREL.2006.02.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dziedzic07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziedzicF07,
author = {Andrzej Dziedzic and
Jan Felba},
title = {Polytronic 2005},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {327},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.001},
doi = {10.1016/J.MICROREL.2006.03.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DziedzicF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EggerGBD07,
author = {Peter Egger and
Markus Gr{\"{u}}tzner and
Christian Burmer and
Fabien Dudkiewicz},
title = {Application of time resolved emission techniques within the failure
analysis flow},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1545--1549},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.067},
doi = {10.1016/J.MICROREL.2007.07.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EggerGBD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EndresSS07,
author = {Ralf Endres and
Yordan Stefanov and
Udo Schwalke},
title = {Electrical characterization of crystalline Gd\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
gate dielectric MOSFETs fabricated by damascene metal gate technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {528--531},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.018},
doi = {10.1016/J.MICROREL.2007.01.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EndresSS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EnichlmairCPM07,
author = {Hubert Enichlmair and
Sara Carniello and
Jong Mun Park and
Rainer Minixhofer},
title = {Analysis of hot carrier effects in a 0.35 {\(\mathrm{\mu}\)}m high
voltage n-channel {LDMOS} transistor},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1439--1443},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.034},
doi = {10.1016/J.MICROREL.2007.07.034},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EnichlmairCPM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EntnerGTEM07,
author = {Robert Entner and
Tibor Grasser and
Oliver Triebl and
Hubert Enichlmair and
Rainer Minixhofer},
title = {Negative bias temperature instability modeling for high-voltage oxides
at different stress temperatures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {697--699},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.078},
doi = {10.1016/J.MICROREL.2007.01.078},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EntnerGTEM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM07,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1155},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.015},
doi = {10.1016/J.MICROREL.2007.04.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ErslandM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EthertonWWQMF07,
author = {M. Etherton and
J. Willemen and
Wolfgang Wilkening and
Ning Qu and
S. Mettler and
Wolfgang Fichtner},
title = {Verification of {CDM} circuit simulation using an {ESD} evaluation
circuit},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1036--1043},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.006},
doi = {10.1016/J.MICROREL.2006.11.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EthertonWWQMF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Evseev07,
author = {S. B. Evseev},
title = {Eyring acceleration model in thick nitride/oxide dielectrics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {748--751},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.019},
doi = {10.1016/J.MICROREL.2007.01.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Evseev07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FalatWK07,
author = {Tomasz Falat and
Artur Wymyslowski and
Jana Kolbe},
title = {Numerical approach to characterization of thermally conductive adhesives},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {342--346},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.019},
doi = {10.1016/J.MICROREL.2006.02.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FalatWK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FalatWKJE07,
author = {Tomasz Falat and
Artur Wymyslowski and
Jana Kolbe and
Kaspar M. B. Jansen and
Leo J. Ernst},
title = {Influence of matrix viscoelastic properties on thermal conductivity
of {TCA} - Numerical approach},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1989--1996},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.010},
doi = {10.1016/J.MICROREL.2007.04.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FalatWKJE07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FantiniF07,
author = {Paolo Fantini and
Giorgio Ferrari},
title = {Low frequency noise and technology induced mechanical stress in MOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1218--1221},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.024},
doi = {10.1016/J.MICROREL.2006.09.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FantiniF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FaqirVFDRMZCCLTD07,
author = {Mustapha Faqir and
Giovanni Verzellesi and
Fausto Fantini and
Francesca Danesin and
Fabiana Rampazzo and
Gaudenzio Meneghesso and
Enrico Zanoni and
Anna Cavallini and
Antonio Castaldini and
Nathalie Labat and
Andr{\'{e}} Touboul and
Christian Dua},
title = {Characterization and analysis of trap-related effects in AlGaN-GaN
HEMTs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1639--1642},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.005},
doi = {10.1016/J.MICROREL.2007.07.005},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FaqirVFDRMZCCLTD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarmakisKKV07,
author = {F. V. Farmakis and
Giannis P. Kontogiannopoulos and
Dimitrios N. Kouvatsos and
Apostolos T. Voutsas},
title = {Degradation of double-gate polycrystalline silicon TFTs due to hot
carrier stress},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1434--1438},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.030},
doi = {10.1016/J.MICROREL.2007.07.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FarmakisKKV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarrellCPAHHM07,
author = {Richard A. Farrell and
Karim Cherkaoui and
Nikolay Petkov and
Heinz Amenitsch and
Justin D. Holmes and
Paul K. Hurley and
Michael A. Morris},
title = {Physical and electrical properties of low dielectric constant self-assembled
mesoporous silica thin films},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {759--763},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.020},
doi = {10.1016/J.MICROREL.2007.01.020},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FarrellCPAHHM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FernandezRNA07,
author = {Raul Fern{\'{a}}ndez and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Effect of oxide breakdown on {RS} latches},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {581--584},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.021},
doi = {10.1016/J.MICROREL.2007.01.021},
timestamp = {Wed, 14 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FernandezRNA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FilhoBFD07,
author = {W. C. Maia Filho and
M. Brizoux and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Yves Danto},
title = {Torsion test applied for reballing and solder paste volume evaluation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1663--1667},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.028},
doi = {10.1016/J.MICROREL.2007.07.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FilhoBFD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FiorenzaNRLTMF07,
author = {Patrick Fiorenza and
Raffaella Lo Nigro and
Vito Raineri and
Salvatore Lombardo and
Roberta G. Toro and
Graziella Malandrino and
Ignazio L. Fragal{\`{a}}},
title = {Defects induced anomalous breakdown kinetics in Pr\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
by micro- and nano-characterization},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {640--644},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.022},
doi = {10.1016/J.MICROREL.2007.01.022},
timestamp = {Tue, 17 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FiorenzaNRLTMF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleetwoodRTZBWSP07,
author = {Daniel M. Fleetwood and
M. P. Rodgers and
L. Tsetseris and
X. J. Zhou and
I. Batyrev and
S. Wang and
Ronald D. Schrimpf and
Sokrates T. Pantelides},
title = {Effects of device aging on microelectronics radiation response and
reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1075--1085},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.009},
doi = {10.1016/J.MICROREL.2006.06.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FleetwoodRTZBWSP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FuWL07,
author = {Y. Fu and
Hei Wong and
Juin J. Liou},
title = {Characterization and modeling of flicker noise in junction field-effect
transistor with source and drain trench isolation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {46--50},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.01.009},
doi = {10.1016/J.MICROREL.2006.01.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FuWL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fukuda07,
author = {Mitsuo Fukuda},
title = {Reliability of semiconductor lasers used in current communication
systems and sensing equipment},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1619--1624},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.007},
doi = {10.1016/J.MICROREL.2007.07.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fukuda07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FukudaOP07,
author = {Yuki Fukuda and
Michael D. Osterman and
Michael G. Pecht},
title = {The impact of electrical current, mechanical bending, and thermal
annealing on tin whisker growth},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {88--92},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.04.011},
doi = {10.1016/J.MICROREL.2006.04.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FukudaOP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalataEPSD07,
author = {S. F. Galata and
E. K. Evangelou and
Yerassimos Panayiotatos and
A. Sotiropoulos and
Athanasios Dimoulas},
title = {Post deposition annealing studies of lanthanum aluminate and ceria
high-k dielectrics on germanium},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {532--535},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.023},
doi = {10.1016/J.MICROREL.2007.01.023},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GalataEPSD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoGSBBEGL07,
author = {Yuan Gao and
Nicolas Guitard and
Christophe Salamero and
Marise Bafleur and
Laurent Bary and
Laurent Escotte and
Patrick Gueulle and
Lionel Lescouz{\`{e}}res},
title = {Identification of the physical signatures of {CDM} induced latent
defects into a {DC-DC} converter using low frequency noise measurements},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1456--1461},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.089},
doi = {10.1016/J.MICROREL.2007.07.089},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GaoGSBBEGL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaresBMMMME07,
author = {M. Gares and
Mohamed Ali Bela{\"{\i}}d and
Hichame Maanane and
Mohamed Masmoudi and
J{\'{e}}r{\^{o}}me Marcon and
Karine Mourgues and
Philippe Eudeline},
title = {Study of hot-carrier effects on power {RF} {LDMOS} device reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1394--1399},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.064},
doi = {10.1016/J.MICROREL.2007.07.064},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GaresBMMMME07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GawAGM07,
author = {Craig A. Gaw and
Thomas Arnold and
Elizabeth Glass and
Robert Martin},
title = {Reliability and performance of a true enhancement mode {HIGFET} for
wireless applications},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1180--1187},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.006},
doi = {10.1016/J.MICROREL.2007.02.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GawAGM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GerardiLACAMGP07,
author = {Cosimo Gerardi and
Salvatore Lombardo and
Giuseppe Ammendola and
Giovanni Costa and
Valentina Ancarani and
Domenico Mello and
Stella Giuffrida and
Maria Cristina Plantamura},
title = {Study of nanocrystal memory integration in a Flash-like {NOR} device},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {593--597},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.024},
doi = {10.1016/J.MICROREL.2007.01.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GerardiLACAMGP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GilsDZBSFJ07,
author = {Marcel A. J. van Gils and
W. D. van Driel and
G. Q. Zhang and
H. J. L. Bressers and
Richard B. R. van Silfhout and
X. J. Fan and
J. H. J. Janssen},
title = {Virtual qualification of moisture induced failures of advanced packages},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {273--279},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.011},
doi = {10.1016/J.MICROREL.2006.09.011},
timestamp = {Wed, 18 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GilsDZBSFJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GilsSZJV07,
author = {Marcel A. J. van Gils and
Olaf van der Sluis and
G. Q. Zhang and
J. H. J. Janssen and
R. M. J. Voncken},
title = {Analysis of Cu/low-k bond pad delamination by using a novel failure
index},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {179--186},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.003},
doi = {10.1016/J.MICROREL.2006.09.003},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GilsSZJV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GlaserESRDCF07,
author = {Ulrich Glaser and
Kai Esmark and
Martin Streibl and
Christian Russ and
Krzysztof Domanski and
Mauro Ciappa and
Wolfgang Fichtner},
title = {{SCR} operation mode of diode strings for {ESD} protection},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1044--1053},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.013},
doi = {10.1016/J.MICROREL.2006.11.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GlaserESRDCF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GlavanovicsKKS07,
author = {Michael Glavanovics and
Helmut K{\"{o}}ck and
Vladim{\'{\i}}r Kosel and
Tobias Smorodin},
title = {Flexible active cycle stress testing of smart power switches},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1790--1794},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.065},
doi = {10.1016/J.MICROREL.2007.07.065},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GlavanovicsKKS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoguenheimPO07,
author = {Didier Goguenheim and
D. Pic and
Jean{-}Luc Ogier},
title = {Oxide reliability below 3 nm for advanced {CMOS:} Issues, characterization,
and solutions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1322--1329},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.048},
doi = {10.1016/J.MICROREL.2007.07.048},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoguenheimPO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GomeniukNVLLBHPC07,
author = {Y. V. Gomeniuk and
A. N. Nazarov and
Ya. N. Vovk and
V. S. Lysenko and
Yi Lu and
Octavian Buiu and
Steve Hall and
R. J. Potter and
Paul R. Chalker},
title = {Charge trapping and interface states in hydrogen annealed HfO\({}_{\mbox{2}}\)-Si
structures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {714--717},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.025},
doi = {10.1016/J.MICROREL.2007.01.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GomeniukNVLLBHPC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GondaJETZ07,
author = {Viktor Gonda and
Kaspar M. B. Jansen and
Leo J. Ernst and
Jaap M. J. den Toonder and
G. Q. Zhang},
title = {Micro-mechanical testing of SiLK by nanoindentation and substrate
curvature techniques},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {248--251},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.033},
doi = {10.1016/J.MICROREL.2006.09.033},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GondaJETZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoodmanHJ07,
author = {Douglas Goodman and
James Hofmeister and
Justin Judkins},
title = {Electronic prognostics for switched mode power supplies},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1902--1906},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.021},
doi = {10.1016/J.MICROREL.2007.02.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoodmanHJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GordonBS07,
author = {P{\'{e}}ter Gordon and
B{\'{a}}lint Balogh and
B{\'{a}}lint Sinkovics},
title = {Thermal simulation of {UV} laser ablation of polyimide},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {347--353},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.01.013},
doi = {10.1016/J.MICROREL.2006.01.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GordonBS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GorollKPA07,
author = {Michael Goroll and
Werner Kanert and
Reinhard Pufall and
Stefano Aresu},
title = {Analysis of {ESD} protection structure behaviour after ageing as new
approach for system level reliability of automotive power devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1512--1516},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.042},
doi = {10.1016/J.MICROREL.2007.07.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GorollKPA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrasserS07,
author = {Tibor Grasser and
Siegfried Selberherr},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {839--840},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.005},
doi = {10.1016/J.MICROREL.2006.10.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GrasserS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrassoMP07,
author = {Francesco Grasso and
Stefano Manetti and
Maria Cristina Piccirilli},
title = {A symbolic approach to design centering of analog circuits},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1288--1295},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.022},
doi = {10.1016/J.MICROREL.2006.09.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GrassoMP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrekhovKTV07,
author = {I. V. Grekhov and
G. G. Kareva and
S. E. Tyaginov and
M. I. Vexler},
title = {Application of an {MOS} tunnel transistor for measurements of the
tunneling parameters and of the parameters of electron energy relaxation
in silicon},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {669--672},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.077},
doi = {10.1016/J.MICROREL.2007.01.077},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GrekhovKTV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuBP07,
author = {Jie Gu and
Donald Barker and
Michael G. Pecht},
title = {Prognostics implementation of electronics under vibration loading},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1849--1856},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.015},
doi = {10.1016/J.MICROREL.2007.02.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuBP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuedjIMLRA07,
author = {Cyril Guedj and
G. Imbert and
E. Martinez and
Christophe Licitra and
N{\'{e}}vine Rochat and
V. Arnal},
title = {Modification of porous ultra-low {K} dielectric by electron-beam curing},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {764--768},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.026},
doi = {10.1016/J.MICROREL.2007.01.026},
timestamp = {Tue, 28 Mar 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GuedjIMLRA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HabchiSMK07,
author = {R. Habchi and
C. Salame and
P. Mialhe and
A. Khoury},
title = {Switching times variation of power {MOSFET} devices after electrical
stress},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1296--1299},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.044},
doi = {10.1016/J.MICROREL.2006.09.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HabchiSMK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HalPGS07,
author = {B. A. E. van Hal and
Ron H. J. Peerlings and
Marc G. D. Geers and
Olaf van der Sluis},
title = {Cohesive zone modeling for structural integrity analysis of {IC} interconnects},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1251--1261},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.08.017},
doi = {10.1016/J.MICROREL.2006.08.017},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HalPGS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HattoriNSHKM07,
author = {Takeo Hattori and
Hiroshi Nohira and
S. Shinagawa and
M. Hori and
M. Kase and
T. Maruizumi},
title = {Angle-resolved photoelectron spectroscopy on gate insulators},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {20--26},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.003},
doi = {10.1016/J.MICROREL.2006.03.003},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HattoriNSHKM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerBMPHGKSR07,
author = {Michael Heer and
Sergey Bychikhin and
W. Mamanee and
Dionyz Pogany and
A. Heid and
P. Grombach and
M. Klaussner and
Winfried Soppa and
Bernd Ramler},
title = {Experimental and numerical analysis of current flow homogeneity in
low voltage {SOI} multi-finger gg-NMOS and {NPN} {ESD} protection
devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1450--1455},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.092},
doi = {10.1016/J.MICROREL.2007.07.092},
timestamp = {Fri, 10 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerBMPHGKSR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeineB07,
author = {Richard Heine and
Donald Barker},
title = {Simplified terrain identification and component fatigue damage estimation
model for use in a health and usage monitoring system},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1882--1888},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.017},
doi = {10.1016/J.MICROREL.2007.02.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeineB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoCHWL07,
author = {Chia{-}Huai Ho and
Kuei{-}Shu Chang{-}Liao and
Ya{-}Nan Huang and
Tien{-}Ko Wang and
T. C. Lu},
title = {Performance and reliability improvement of flash device by a novel
programming method},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {967--971},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.003},
doi = {10.1016/J.MICROREL.2006.06.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoCHWL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HofJWEYZB07,
author = {C. van't Hof and
Kaspar M. B. Jansen and
G. Wisse and
Leo J. Ernst and
Dao{-}Guo Yang and
G. Q. Zhang and
H. J. L. Bressers},
title = {Novel shear tools for viscoelastic characterization of packaging polymers},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {240--247},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.032},
doi = {10.1016/J.MICROREL.2006.09.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HofJWEYZB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HolzHSR07,
author = {M. Holz and
G. Hultsch and
T. Scherg and
R. Rupp},
title = {Reliability considerations for recent Infineon SiC diode releases},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1741--1745},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.031},
doi = {10.1016/J.MICROREL.2007.07.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HolzHSR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HolzerSKGS07,
author = {Stefan Holzer and
Alireza Sheikholeslami and
Markus Karner and
Tibor Grasser and
Siegfried Selberherr},
title = {Comparison of deposition models for a {TEOS} {LPCVD} process},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {623--625},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.058},
doi = {10.1016/J.MICROREL.2007.01.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HolzerSKGS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HongM07,
author = {Changsoo Hong and
Linda Milor},
title = {Modeling of the breakdown mechanisms for porous copper/low-k process
flows},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1478--1482},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.020},
doi = {10.1016/J.MICROREL.2007.07.020},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HongM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoussaAGGH07,
author = {M. Houssa and
Marc Aoulaiche and
Stefan De Gendt and
Guido Groeseneken and
Marc M. Heyns},
title = {Negative bias temperature instabilities in HfSiO(N)-based MOSFETs:
Electrical characterization and modeling},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {880--889},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.010},
doi = {10.1016/J.MICROREL.2006.10.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoussaAGGH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsuL07,
author = {Hsin{-}hao Hsu and
Joseph Ya{-}min Lee},
title = {Electrical characterization of metal-oxide-high-k dielectric-oxide-semiconductor
{(MOHOS)} structures for memory applications},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {606--609},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.027},
doi = {10.1016/J.MICROREL.2007.01.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HsuL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangCT07,
author = {Zhiheng Huang and
Paul P. Conway and
Rachel C. Thomson},
title = {Microstructural considerations for ultrafine lead free solder joints},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1997--2006},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.013},
doi = {10.1016/J.MICROREL.2007.04.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangCT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HurleyCMHG07,
author = {Paul K. Hurley and
Karim Cherkaoui and
S. McDonnell and
G. Hughes and
A. W. Groenland},
title = {Characterisation and passivation of interface defects in {(1} 0 0)-Si/SiO\({}_{\mbox{2}}\)/HfO\({}_{\mbox{2}}\)/TiN
gate stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1195--1201},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.030},
doi = {10.1016/J.MICROREL.2006.09.030},
timestamp = {Fri, 13 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HurleyCMHG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ImmonenKK07,
author = {Marika P. Immonen and
Mikko Karppinen and
Jorma K. Kivilahti},
title = {Investigation of environmental reliability of optical polymer waveguides
embedded on printed circuit boards},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {363--371},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.020},
doi = {10.1016/J.MICROREL.2006.02.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ImmonenKK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/InaniKG07,
author = {Anand Inani and
Victor Koldyaev and
Spencer Graves},
title = {Accelerated testing for time dependent dielectric breakdown {(TDDB)}
evaluation of embedded {DRAM} capacitors using tantalum pentoxide},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1429--1433},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.053},
doi = {10.1016/J.MICROREL.2007.07.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/InaniKG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IraceBS07,
author = {Andrea Irace and
Giovanni Breglio and
Paolo Spirito},
title = {New developments of THERMOS\({}^{\mbox{3}}\), a tool for 3D electro-thermal
simulation of smart power MOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1696--1700},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.012},
doi = {10.1016/J.MICROREL.2007.07.012},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IraceBS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IwayamaHH07,
author = {T. S. Iwayama and
T. Hama and
D. E. Hole},
title = {{RTA} effects on the formation process of embedded luminescent Si
nanocrystals in SiO\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {781--785},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.028},
doi = {10.1016/J.MICROREL.2007.01.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IwayamaHH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobNH07,
author = {Peter Jacob and
Giovanni Nicoletti and
Florian Hauf},
title = {Device decapsulated (and/or depassivated) - Retest ok - What happened?},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1574--1579},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.077},
doi = {10.1016/J.MICROREL.2007.07.077},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JacobNH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangKYKCP07,
author = {Sung Jun Jang and
Dae Hyun Ka and
Chong{-}Gun Yu and
Kwan{-}Su Kim and
Won{-}Ju Cho and
Jong Tae Park},
title = {Comparative study of {NBTI} as a function of Si film orientation and
thickness in {SOI} pMOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1411--1415},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.015},
doi = {10.1016/J.MICROREL.2007.07.015},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JangKYKCP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongHP07,
author = {Jae{-}Seong Jeong and
Soon{-}Ha Hong and
Sang{-}Deuk Park},
title = {Field failure mechanism and improvement of {EOS} failure of integrated
{IGBT} inverter modules},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1795--1799},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.087},
doi = {10.1016/J.MICROREL.2007.07.087},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongHP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JevticH07,
author = {Milan Jevtic and
Jovan M. Hadzi{-}Vukovic},
title = {Study of the electrical cycling stressed large area Schottky diodes
using {I-V} and noise measurements},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {51--58},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.013},
doi = {10.1016/J.MICROREL.2006.03.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JevticH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JinkaGDLSS07,
author = {K. K. Jinka and
S. Ganesan and
A. Dasgupta and
S. Ling and
Andrew A. Shapiro and
D. Schatzel},
title = {Chip-on-Board (CoB) technology for low temperature environments. Part
{I:} Wire profile modeling in unencapsulated chips},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1246--1250},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.08.019},
doi = {10.1016/J.MICROREL.2006.08.019},
timestamp = {Tue, 03 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JinkaGDLSS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerDRG07,
author = {Ben Kaczer and
Robin Degraeve and
Philippe Roussel and
Guido Groeseneken},
title = {Gate oxide breakdown in {FET} devices and circuits: From nanoscale
physics to system-level reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {559--566},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.063},
doi = {10.1016/J.MICROREL.2007.01.063},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaczerDRG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KahnVDDBBPGB07,
author = {Maurice Kahn and
Christophe Vall{\'{e}}e and
Emmanuel Defay and
Catherine Dubourdieu and
Marceline Bonvalot and
Serge Blonkowski and
Jean{-}Raoul Plaussu and
Pierre Garrec and
Thierry Baron},
title = {Improved electrical properties using SrTiO\({}_{\mbox{3}}\)/Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
bilayer dielectrics for {MIM} capacitor applications},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {773--776},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.029},
doi = {10.1016/J.MICROREL.2007.01.029},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KahnVDDBBPGB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KarnerGWEHGVGKS07,
author = {Markus Karner and
Andreas Gehring and
M. Wagner and
Robert Entner and
Stefan Holzer and
Wolfgang Goes and
M. Vasicek and
Tibor Grasser and
Hans Kosina and
Siegfried Selberherr},
title = {{VSP} - {A} gate stack analyzer},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {704--708},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.059},
doi = {10.1016/J.MICROREL.2007.01.059},
timestamp = {Thu, 13 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KarnerGWEHGVGKS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KeimasiAP07,
author = {Mohammadreza Keimasi and
Michael H. Azarian and
Michael G. Pecht},
title = {Isothermal aging effects on flex cracking of multilayer ceramic capacitors
with standard and flexible terminations},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2215--2225},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.12.005},
doi = {10.1016/J.MICROREL.2006.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KeimasiAP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KerC07,
author = {Ming{-}Dou Ker and
Wei{-}Jen Chang},
title = {Overview on {ESD} protection design for mixed-voltage {I/O} interfaces
with high-voltage-tolerant power-rail {ESD} clamp circuits in low-voltage
thin-oxide {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {27--35},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.012},
doi = {10.1016/J.MICROREL.2006.03.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KerC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KerberPVGK07,
author = {A. Kerber and
Luigi Pantisano and
Anabela Veloso and
Guido Groeseneken and
Martin Kerber},
title = {Reliability screening of high-k dielectrics based on voltage ramp
stress},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {513--517},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.030},
doi = {10.1016/J.MICROREL.2007.01.030},
timestamp = {Fri, 09 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KerberPVGK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhatirLS07,
author = {Zoubir Khatir and
St{\'{e}}phane Lefebvre and
F. Saint{-}Eve},
title = {Experimental and numerical investigations on delayed short-circuit
failure mode of single chip {IGBT} devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {422--428},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.004},
doi = {10.1016/J.MICROREL.2006.05.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KhatirLS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Khazhinsky07,
author = {Michael G. Khazhinsky},
title = {{ESD} protection strategies in advanced {CMOS} {SOI} ICs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1313--1321},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.086},
doi = {10.1016/J.MICROREL.2007.07.086},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Khazhinsky07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhongLTDCLVS07,
author = {B. Khong and
Marc Legros and
Patrick Tounsi and
Philippe Dupuy and
X. Chauffleur and
Colette Levade and
G. Vanderschaeve and
Emmanuel Scheid},
title = {Characterization and modelling of ageing failures on power {MOSFET}
devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1735--1740},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.055},
doi = {10.1016/J.MICROREL.2007.07.055},
timestamp = {Fri, 06 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhongLTDCLVS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimISUK07,
author = {Keun{-}Soo Kim and
Takayuki Imanishi and
Katsuaki Suganuma and
Minoru Ueshima and
Rikiya Kato},
title = {Properties of low temperature Sn-Ag-Bi-In solder systems},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1113--1119},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.012},
doi = {10.1016/J.MICROREL.2006.06.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimISUK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimS07,
author = {Hak Sung Kim and
Ho Geon Song},
title = {Investigation of moisture-induced failures of stacked-die package},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1673--1679},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.014},
doi = {10.1016/J.MICROREL.2007.07.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimYB07,
author = {Hyong Tae Kim and
Hae Jeong Yang and
Seung Yub Baek},
title = {Iterative algorithm for automatic alignment by object transformation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {972--985},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.008},
doi = {10.1016/J.MICROREL.2006.06.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimYB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KisielFBM07,
author = {Ryszard Kisiel and
Jan Felba and
Janusz Borecki and
Andrzej Moscicki},
title = {Problems of {PCB} microvias filling by conductive paste},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {335--341},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.018},
doi = {10.1016/J.MICROREL.2006.02.018},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KisielFBM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KolbeACMMSS07,
author = {Jana Kolbe and
Andreas Arp and
Francesco Calderone and
Edouard Marc Meyer and
Wilhelm Meyer and
Helmut Schaefer and
Manuela Stuve},
title = {Inkjettable conductive adhesive for use in microelectronics and microsystems
technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {331--334},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.017},
doi = {10.1016/J.MICROREL.2006.02.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KolbeACMMSS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KomodaMTWY07,
author = {Hirotaka Komoda and
Chie Moritani and
Kazutaka Takahashi and
Heiji Watanabe and
Kiyoshi Yasutake},
title = {Sample tilting technique for preventing electrostatic discharge during
high-current {FIB} gas-assisted etching with XeF\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {74--81},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.04.013},
doi = {10.1016/J.MICROREL.2006.04.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KomodaMTWY07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KooJ07,
author = {Ja{-}Myeong Koo and
Seung{-}Boo Jung},
title = {Effect of displacement rate on ball shear properties for Sn-37Pb and
Sn-3.5Ag {BGA} solder joints during isothermal aging},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2169--2178},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.043},
doi = {10.1016/J.MICROREL.2006.09.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KooJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KunchwarSG07,
author = {Mayuri Kunchwar and
Reza Sedaghat and
Vadim Geurkov},
title = {Dynamic behavior of resistive faults in nanometer technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2141--2146},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.081},
doi = {10.1016/J.MICROREL.2007.01.081},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KunchwarSG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kung07,
author = {Huang{-}Kuang Kung},
title = {Evaluation of sweep resistance of {Q} Auto-Loop and Square-Loop bonds
for semiconductor packaging technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1103--1112},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.001},
doi = {10.1016/J.MICROREL.2006.07.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kung07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KurodaTWMYSO07,
author = {Rihito Kuroda and
Akinobu Teramoto and
Kazufumi Watanabe and
Michihiko Mifuji and
Takahisa Yamaha and
Shigetoshi Sugawa and
Tadahiro Ohmi},
title = {Circuit level prediction of device performance degradation due to
negative bias temperature stress},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {930--936},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.013},
doi = {10.1016/J.MICROREL.2006.06.013},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KurodaTWMYSO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LabatT07,
author = {Nathalie Labat and
Andr{\'{e}} Touboul},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1311--1312},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.08.007},
doi = {10.1016/J.MICROREL.2007.08.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LabatT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LachenalBMR07,
author = {D. Lachenal and
Alain Bravaix and
Frederic Monsieur and
Yannick Rey{-}Tauriac},
title = {Degradation mechanism understanding of {NLDEMOS} {SOI} in {RF} applications},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1634--1638},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.024},
doi = {10.1016/J.MICROREL.2007.07.024},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LachenalBMR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiCKLC07,
author = {Yi{-}Shao Lai and
Kuo{-}Ming Chen and
Chin{-}Li Kao and
Chiu{-}Wen Lee and
Ying{-}Ta Chiu},
title = {Electromigration of Sn-37Pb and Sn-3Ag-1.5Cu/Sn-3Ag-0.5Cu composite
flip-chip solder bumps with Ti/Ni(V)/Cu under bump metallurgy},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1273--1279},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.023},
doi = {10.1016/J.MICROREL.2006.09.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiCKLC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiCY07,
author = {Yi{-}Shao Lai and
Hsiao{-}Chuan Chang and
Chang{-}Lin Yeh},
title = {Evaluation of solder joint strengths under ball impact test},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2179--2187},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.015},
doi = {10.1016/J.MICROREL.2006.11.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiCY07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiFLHY07,
author = {Chieh{-}Ming Lai and
Yean{-}Kuen Fang and
Chien{-}Ting Lin and
Chia{-}Wei Hsu and
Wen{-}Kuan Yeh},
title = {The impacts of high tensile stress {CESL} and geometry design on device
performance and reliability for 90 nm {SOI} nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {944--952},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.010},
doi = {10.1016/J.MICROREL.2006.06.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiFLHY07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiW07,
author = {Yi{-}Shao Lai and
Tong Hong Wang},
title = {Optimal design towards enhancement of board-level thermomechanical
reliability of wafer-level chip-scale packages},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {104--110},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.04.008},
doi = {10.1016/J.MICROREL.2006.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiWTJ07,
author = {Yi{-}Shao Lai and
Tong Hong Wang and
Han{-}Hui Tsai and
Ming{-}Hwa R. Jen},
title = {Cyclic bending reliability of wafer-level chip-scale packages},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {111--117},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.04.010},
doi = {10.1016/J.MICROREL.2006.04.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiWTJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LajnefVBBW07,
author = {Walid Lajnef and
Jean{-}Michel Vinassa and
Olivier Briat and
H. El Brouji and
Eric Woirgard},
title = {Monitoring fading rate of ultracapacitors using online characterization
during power cycling},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1751--1755},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.08.005},
doi = {10.1016/J.MICROREL.2007.08.005},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LajnefVBBW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LallHBISL07,
author = {Pradeep Lall and
Madhura Hande and
Chandan Bhat and
Nokibul Islam and
Jeff Suhling and
Jay Lee},
title = {Feature extraction and damage-precursors for prognostication of lead-free
electronics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1907--1920},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.022},
doi = {10.1016/J.MICROREL.2007.02.022},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LallHBISL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LangS07,
author = {F. Lang and
Uwe Scheuermann},
title = {Reliability of spring pressure contacts under environmental stress},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1761--1766},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.038},
doi = {10.1016/J.MICROREL.2007.07.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LangS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LanzaPNBFRLJ07,
author = {Mario Lanza and
Marc Porti and
Montserrat Nafr{\'{\i}}a and
Guenther Benstetter and
Werner Frammelsberger and
Heiko Ranzinger and
E. Lodermeier and
G. Jaschke},
title = {Influence of the manufacturing process on the electrical properties
of thin (k stacks observed with {CAFM}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1424--1428},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.045},
doi = {10.1016/J.MICROREL.2007.07.045},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LanzaPNBFRLJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauQHSCATS07,
author = {W. S. Lau and
P. W. Qian and
Taejoon Han and
Nathan P. Sandler and
S. T. Che and
S. E. Ang and
C. H. Tung and
T. T. Sheng},
title = {Evidence that N\({}_{\mbox{2}}\)O is a stronger oxidizing agent than
O\({}_{\mbox{2}}\) for both Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)
and bare Si below 1000degreeC and temperature for minimum low-K interfacial
oxide for high-K dielectric on Si},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {429--433},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.018},
doi = {10.1016/J.MICROREL.2006.05.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LauQHSCATS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaurilaMVKLSK07,
author = {Tomi Laurila and
Toni T. Mattila and
Vesa Vuorinen and
Juha Karppinen and
Jue Li and
Mika Sippola and
Jorma K. Kivilahti},
title = {Evolution of microstructure and failure mechanism of lead-free solder
interconnections in power cycling and thermal shock tests},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1135--1144},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.095},
doi = {10.1016/J.MICROREL.2006.07.095},
timestamp = {Thu, 03 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaurilaMVKLSK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LebedinskiiZ07,
author = {Yu. Lebedinskii and
A. V. Zenkevich},
title = {Effective work function of NiSi/HfO\({}_{\mbox{2}}\) gate stacks measured
with X-ray photoelectron spectroscopy},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {649--652},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.064},
doi = {10.1016/J.MICROREL.2007.01.064},
timestamp = {Thu, 28 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LebedinskiiZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLKCC07,
author = {Chang{-}Chun Lee and
Chien{-}Chen Lee and
Hsiao{-}Tung Ku and
Shu{-}Ming Chang and
Kuo{-}Ning Chiang},
title = {Solder joints layout design and reliability enhancements of wafer
level packaging using response surface methodology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {196--204},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.004},
doi = {10.1016/J.MICROREL.2006.09.004},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeLKCC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeS07,
author = {J. G. Lee and
K. N. Subramanian},
title = {Effects of {TMF} heating rates on damage accumulation and resultant
mechanical behavior of Sn-Ag based solder joints},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {118--131},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.001},
doi = {10.1016/J.MICROREL.2006.02.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LembergerBB07,
author = {Martin Lemberger and
A. Baunemann and
Anton J. Bauer},
title = {Chemical vapor deposition of tantalum nitride films for metal gate
application using {TBTDET} and novel single-source {MOCVD} precursors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {635--639},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.032},
doi = {10.1016/J.MICROREL.2007.01.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LembergerBB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Lenahan07,
author = {Patrick M. Lenahan},
title = {Deep level defects involved in {MOS} device instabilities},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {890--898},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.016},
doi = {10.1016/J.MICROREL.2006.10.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Lenahan07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Leray07,
author = {J. L. Leray},
title = {Effects of atmospheric neutrons on devices, at sea level and in avionics
embedded systems},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1827--1835},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.101},
doi = {10.1016/J.MICROREL.2007.07.101},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Leray07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LerouxGR07,
author = {Charles Leroux and
G{\'{e}}rard Ghibaudo and
Gilles Reimbold},
title = {Accurate determination of flat band voltage in advanced {MOS} structure},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {660--664},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.033},
doi = {10.1016/J.MICROREL.2007.01.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LerouxGR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeyrisMHVV07,
author = {C{\'{e}}dric Leyris and
Fr{\'{e}}d{\'{e}}ric Martinez and
Alain Hoffmann and
M. Valenza and
J. C. Vildeuil},
title = {{N-MOSFET} oxide trap characterization induced by nitridation process
using {RTS} noise analysis},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {41--45},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.010},
doi = {10.1016/J.MICROREL.2006.02.010},
timestamp = {Tue, 03 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeyrisMHVV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeyrisMVHV07,
author = {C{\'{e}}dric Leyris and
Fr{\'{e}}d{\'{e}}ric Martinez and
M. Valenza and
Alain Hoffmann and
J. C. Vildeuil},
title = {Random telegraph signal: {A} sensitive and nondestructive tool for
gate oxide single trap characterization},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {573--576},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.034},
doi = {10.1016/J.MICROREL.2007.01.034},
timestamp = {Tue, 03 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeyrisMVHV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LhommeauPMMMK07,
author = {T. Lhommeau and
Xavier Perpi{\~{n}}{\`{a}} and
C. Martin and
R{\'{e}}gis Meuret and
Michel Mermet{-}Guyennet and
Moussa Karama},
title = {Thermal fatigue effects on the temperature distribution inside {IGBT}
modules for zone engine aeronautical applications},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1779--1783},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.093},
doi = {10.1016/J.MICROREL.2007.07.093},
timestamp = {Thu, 30 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LhommeauPMMMK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiSPSCSAAEBDNLGM07,
author = {Z. Li and
Tom Schram and
Luigi Pantisano and
A. Stesmans and
Thierry Conard and
S. Shamuilia and
V. V. Afanasiev and
A. Akheyar and
Sven Van Elshocht and
D. P. Brunco and
W. Deweerd and
Y. Naoki and
P. Lehnen and
Stefan De Gendt and
Kristin De Meyer},
title = {Mechanism of O\({}_{\mbox{2}}\)-anneal induced V\({}_{\mbox{fb}}\)
shifts of Ru gated stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {518--520},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.054},
doi = {10.1016/J.MICROREL.2007.01.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiSPSCSAAEBDNLGM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiT07,
author = {Wei Li and
Cher Ming Tan},
title = {Enhanced finite element modelling of Cu electromigration using {ANSYS}
and matlab},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1497--1501},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.058},
doi = {10.1016/J.MICROREL.2007.07.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoMB07,
author = {Joy Y. Liao and
Howard L. Marks and
F. Beaudoin},
title = {{OBIRCH} analysis of electrically stressed advanced graphic ICs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1565--1568},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.047},
doi = {10.1016/J.MICROREL.2007.07.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoMB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinCCWC07,
author = {Hung{-}Sung Lin and
Chun{-}Ming Chen and
Kuo{-}Hsiung Chen and
Afung Wang and
C. H. Chao},
title = {A case study of defects due to process marginalities in deep sub-micron
technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1604--1608},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.075},
doi = {10.1016/J.MICROREL.2007.07.075},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinCCWC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinCSW07,
author = {M. H. Lin and
K. P. Chang and
K. C. Su and
Tahui Wang},
title = {Effects of width scaling and layout variation on dual damascene copper
interconnect electromigration},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2100--2108},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.004},
doi = {10.1016/J.MICROREL.2006.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinCSW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LindgrenBTL07,
author = {Mats Lindgren and
Ilja Belov and
Magnus T{\"{o}}rnvall and
Peter Leisner},
title = {Application of simulation-based decision making in product development
of an {RF} module},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {302--309},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.008},
doi = {10.1016/J.MICROREL.2006.09.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LindgrenBTL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuHZZY07,
author = {Hongfei Liu and
Alin Hou and
Hongbo Zhang and
Daming Zhang and
Maobin Yi},
title = {A voltage calibration technique of electro-optic probing for characterization
internal to IC's chip},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {82--87},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.007},
doi = {10.1016/J.MICROREL.2006.05.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuHZZY07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuSH07,
author = {D. S. Liu and
M. K. Shih and
W. H. Huang},
title = {Measurement and analysis of contact resistance in wafer probe testing},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1086--1094},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.091},
doi = {10.1016/J.MICROREL.2006.07.091},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuSH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuXFGMWFM07,
author = {Zhanwei Liu and
Huimin Xie and
Daining Fang and
Changzhi Gu and
Yonggang Meng and
Weining Wang and
Yan Fang and
Jianmin Miao},
title = {Deformation analysis in microstructures and micro-devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2226--2230},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.019},
doi = {10.1016/J.MICROREL.2006.11.019},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuXFGMWFM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Lloyd07,
author = {J. R. Lloyd},
title = {Black's law revisited - Nucleation and growth in electromigration
failure},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1468--1472},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.094},
doi = {10.1016/J.MICROREL.2007.07.094},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Lloyd07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Lombardo07,
author = {Salvatore Lombardo},
title = {Guest Editorial},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {477--478},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.008},
doi = {10.1016/J.MICROREL.2007.02.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Lombardo07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Lopez07,
author = {Leon Lopez},
title = {Advanced electronic prognostics through system telemetry and pattern
recognition methods},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1865--1873},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.018},
doi = {10.1016/J.MICROREL.2007.02.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Lopez07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuBHMDPC07,
author = {Y. Lu and
Octavian Buiu and
Steve Hall and
Ivona Z. Mitrovic and
W. Davey and
R. J. Potter and
Paul R. Chalker},
title = {Tuneable electrical properties of hafnium aluminate gate dielectrics
deposited by metal organic chemical vapour deposition},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {722--725},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.052},
doi = {10.1016/J.MICROREL.2007.01.052},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuBHMDPC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuLL07,
author = {C. Y. Lu and
Horng{-}Chih Lin and
Y. J. Lee},
title = {Dynamic {NBTI} characteristics of PMOSFETs with PE-SiN capping},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {924--929},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.004},
doi = {10.1016/J.MICROREL.2006.06.004},
timestamp = {Wed, 21 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LuLL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuanTPLZ07,
author = {Jing{-}en Luan and
Tong Yan Tee and
Eric Pek and
Chwee Teck Lim and
Zhaowei Zhong},
title = {Dynamic responses and solder joint reliability under board level drop
test},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {450--460},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.012},
doi = {10.1016/J.MICROREL.2006.05.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuanTPLZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaJEDSZ07,
author = {Xiaosong Ma and
Kaspar M. B. Jansen and
Leo J. Ernst and
W. D. van Driel and
Olaf van der Sluis and
G. Q. Zhang},
title = {Characterization of moisture properties of polymers for {IC} packaging},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1685--1689},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.090},
doi = {10.1016/J.MICROREL.2007.07.090},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MaJEDSZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MagnonePCG07,
author = {Paolo Magnone and
Calogero Pace and
Felice Crupi and
Gino Giusi},
title = {Low frequency noise in nMOSFETs with subnanometer {EOT} hafnium-based
gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2109--2113},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.001},
doi = {10.1016/J.MICROREL.2006.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MagnonePCG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaingotFLPD07,
author = {V. Maingot and
Jean Baptiste Ferron and
R{\'{e}}gis Leveugle and
Vincent Pouget and
Alexandre Douin},
title = {Configuration errors analysis in SRAM-based FPGAs: Software tool and
practical results},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1836--1840},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.074},
doi = {10.1016/J.MICROREL.2007.07.074},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaingotFLPD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mao07,
author = {Lingfeng Mao},
title = {First-principles study of the effects of oxygen vacancy on hole tunneling
current},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1213--1217},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.027},
doi = {10.1016/J.MICROREL.2006.09.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mao07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarichalWCVK07,
author = {Olivier Marichal and
Geert Wybo and
Benjamin Van Camp and
Pieter Vanysacker and
Bart Keppens},
title = {SCR-based {ESD} protection in nanometer {SOI} technologies},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1060--1068},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.011},
doi = {10.1016/J.MICROREL.2006.11.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MarichalWCVK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarrasIMVS07,
author = {Alessandro Marras and
Maurizio Impronta and
Ilaria De Munari and
M. G. Valentini and
Andrea Scorzoni},
title = {Reliability assessment of multi-via Cu-damascene structures by wafer-level
isothermal electromigration tests},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1492--1496},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.002},
doi = {10.1016/J.MICROREL.2007.07.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MarrasIMVS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin-MartinezGRNACPG07,
author = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Simone Gerardin and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
Andrea Cester and
Alessandro Paccagnella and
G. Ghidini},
title = {Lifetime estimation of analog circuits from the electrical characteristics
of stressed MOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1349--1352},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.088},
doi = {10.1016/J.MICROREL.2007.07.088},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Martin-MartinezGRNACPG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin-MartinezRNAS07,
author = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
James H. Stathis},
title = {Worn-out oxide {MOSFET} characteristics: Role of gate current and
device parameters on a current mirror},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {665--668},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.035},
doi = {10.1016/J.MICROREL.2007.01.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Martin-MartinezRNAS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartyniukAMDF07,
author = {Mariusz Martyniuk and
J. Antoszewski and
C. A. Musca and
J. M. Dell and
L. Faraone},
title = {Dielectric thin films for MEMS-based optical sensors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {733--738},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.060},
doi = {10.1016/J.MICROREL.2007.01.060},
timestamp = {Mon, 23 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MartyniukAMDF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Masana07,
author = {F. N. Masana},
title = {A straightforward analytical method for extraction of semiconductor
device transient thermal parameters},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2122--2128},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.042},
doi = {10.1016/J.MICROREL.2006.09.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Masana07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MatinTVG07,
author = {M. A. Matin and
J. G. A. Theeven and
W. P. Vellinga and
Marc G. D. Geers},
title = {Correlation between localized strain and damage in shear-loaded Pb-free
solders},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1262--1272},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.025},
doi = {10.1016/J.MICROREL.2006.09.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MatinTVG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghiniTSMVMZ07,
author = {Matteo Meneghini and
Lorenzo Trevisanello and
C. Sanna and
Giovanna Mura and
Massimo Vanzi and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {High temperature electro-optical degradation of InGaN/GaN HBLEDs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1625--1629},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.081},
doi = {10.1016/J.MICROREL.2007.07.081},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeneghiniTSMVMZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MercklingDEGRRCMSGRH07,
author = {Clement Merckling and
G. Delhaye and
Mario El Kazzi and
S. Gaillard and
Yoann Rozier and
L. Rapenne and
B. Chenevier and
O. Marty and
G. Saint{-}Girons and
M. Gendry and
Y. Robach and
Guy Hollinger},
title = {Epitaxial growth of LaAlO\({}_{\mbox{3}}\) on Si(0 0 1) using interface
engineering},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {540--543},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.036},
doi = {10.1016/J.MICROREL.2007.01.036},
timestamp = {Mon, 29 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MercklingDEGRRCMSGRH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mermet-GuyennetPP07,
author = {Michel Mermet{-}Guyennet and
X. Perpi{\~{n}}{\`{a}} and
M. Piton},
title = {Revisiting power cycling test for better life-time prediction in traction},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1690--1695},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.099},
doi = {10.1016/J.MICROREL.2007.07.099},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mermet-GuyennetPP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MichalasEPKV07,
author = {Loukas Michalas and
M. A. Exarchos and
George J. Papaioannou and
Dimitrios N. Kouvatsos and
Apostolos T. Voutsas},
title = {An experimental study of the thermally activated processes in polycrystalline
silicon thin film transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2058--2064},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.016},
doi = {10.1016/J.MICROREL.2006.11.016},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MichalasEPKV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MilanovicTSD07,
author = {Miro Milanovic and
Mitja Truntic and
Primoz Slibar and
Drago Dolinar},
title = {Reconfigurable digital controller for a buck converter based on {FPGA}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {150--154},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.019},
doi = {10.1016/J.MICROREL.2006.09.019},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MilanovicTSD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MilorH07,
author = {Linda Milor and
Changsoo Hong},
title = {Backend dielectric breakdown dependence on linewidth and pattern density},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1473--1477},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.023},
doi = {10.1016/J.MICROREL.2007.07.023},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MilorH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MitrovicBHBWDL07,
author = {Ivona Z. Mitrovic and
Octavian Buiu and
Steve Hall and
C. Bungey and
T. Wagner and
W. Davey and
Y. Lu},
title = {Electrical and structural properties of hafnium silicate thin films},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {645--648},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.065},
doi = {10.1016/J.MICROREL.2007.01.065},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MitrovicBHBWDL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MonforteCCCFN07,
author = {Francesca Monforte and
Marco Camalleri and
Denise Cal{\`{\i}} and
Giuseppe Curr{\`{o}} and
Enza Fazio and
Fortunato Neri},
title = {Nitrogen bonding configurations near the oxynitride/silicon interface
after oxynitridation in N\({}_{\mbox{2}}\)O ambient of a thin SiO\({}_{\mbox{2}}\)
gate},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {822--824},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.037},
doi = {10.1016/J.MICROREL.2007.01.037},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MonforteCCCFN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoonenVLCMB07,
author = {R. Moonen and
Piet Vanmeerbeek and
G. Lekens and
Ward De Ceuninck and
Peter Moens and
J. Boutsen},
title = {Lifetime modeling of intrinsic gate oxide breakdown at high temperature},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1389--1393},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.039},
doi = {10.1016/J.MICROREL.2007.07.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoonenVLCMB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoraisARR07,
author = {Lionel Dantas de Morais and
F. Allanic and
F. Roqueta and
J. P. Rebrasse},
title = {Thermal approach of defects generation on copper/organic dielectric
interface due to {SEM} inspections},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1614--1618},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.056},
doi = {10.1016/J.MICROREL.2007.07.056},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoraisARR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Morris07,
author = {James E. Morris},
title = {Isotropic conductive adhesives: Future trends, possibilities and risks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {328--330},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.015},
doi = {10.1016/J.MICROREL.2006.02.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Morris07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoschouEKPV07,
author = {Despina C. Moschou and
M. A. Exarchos and
Dimitrios N. Kouvatsos and
George J. Papaioannou and
Apostolos T. Voutsas},
title = {Performance and reliability of {SLS} {ELA} polysilicon TFTs fabricated
with novel crystallization techniques},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1378--1383},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.073},
doi = {10.1016/J.MICROREL.2007.07.073},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MoschouEKPV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoyS07,
author = {W. H. Moy and
Yu{-}Lin Shen},
title = {On the failure path in shear-tested solder joints},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1300--1305},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.08.021},
doi = {10.1016/J.MICROREL.2006.08.021},
timestamp = {Fri, 17 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MoyS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MullerE07,
author = {Stefan M{\"{u}}ller and
Peter Egger},
title = {Investigation of low temperature {SRAM} and {ROM} failures to enable
the replacement of cold test insertion by room temperature test},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1362--1365},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.080},
doi = {10.1016/J.MICROREL.2007.07.080},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MullerE07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NakadairaJSSMCKO07,
author = {Yoshikuni Nakadaira and
Seyoung Jeong and
Jongbo Shim and
Jaiseok Seo and
Sunhee Min and
Taeje Cho and
Sayoon Kang and
Seyong Oh},
title = {Growth of tin whiskers for lead-free plated leadframe packages in
high humid environments and during thermal cycling},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1928--1949},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.03.008},
doi = {10.1016/J.MICROREL.2007.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NakadairaJSSMCKO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NeauMVVVBPR07,
author = {G. N{\'{e}}au and
Fr{\'{e}}d{\'{e}}ric Martinez and
M. Valenza and
J. C. Vildeuil and
E. Vincent and
Fr{\'{e}}d{\'{e}}ric Boeuf and
F. Payet and
K. Rochereau},
title = {Impact of strained-channel n-MOSFETs with a SiGe virtual substrate
on dielectric interface quality evaluated by low frequency noise measurements},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {567--572},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.079},
doi = {10.1016/J.MICROREL.2007.01.079},
timestamp = {Tue, 03 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NeauMVVVBPR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NeugroschelBC07,
author = {Arnost Neugroschel and
Gennadi Bersuker and
Rino Choi},
title = {Applications of {DCIV} method to {NBTI} characterization},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1366--1372},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.037},
doi = {10.1016/J.MICROREL.2007.07.037},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NeugroschelBC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenBMPABP07,
author = {T. Nguyen and
C. Busseret and
Liviu Militaru and
A. Poncet and
D. Aim{\'{e}} and
Nicolas Baboux and
Carole Plossu},
title = {Parameters extraction of hafnium based gate oxide capacitors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {729--732},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.061},
doi = {10.1016/J.MICROREL.2007.01.061},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NguyenBMPABP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Nickel07,
author = {N. H. Nickel},
title = {Hydrogen transport in doped and undoped polycrystalline silicon},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {899--902},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.014},
doi = {10.1016/J.MICROREL.2006.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Nickel07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NoulisSS07,
author = {Thomas Noulis and
Stylianos Siskos and
G{\'{e}}rard Sarrabayrouse},
title = {Comparison between {BSIM4.X} and {HSPICE} flicker noise models in
{NMOS} and {PMOS} transistors in all operating regions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1222--1227},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.021},
doi = {10.1016/J.MICROREL.2006.09.021},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NoulisSS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OrainBFLJ07,
author = {S. Orain and
J.{-}C. Barb{\'{e}} and
X. Federspiel and
P. Legallo and
H. Jaouen},
title = {FEM-based method to determine mechanical stress evolution during process
flow in microelectronics, application to stress-voiding},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {295--301},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.018},
doi = {10.1016/J.MICROREL.2006.09.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OrainBFLJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PajonaAD07,
author = {O. Pajona and
Christelle Aupetit{-}Berthelemot and
Jean{-}Michel Dumas},
title = {A study of metamorphic {HEMT} technological improvements: Impact on
parasitic effect electrical models},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1643--1648},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.063},
doi = {10.1016/J.MICROREL.2007.07.063},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PajonaAD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanC07,
author = {Min{-}Chun Pan and
Po{-}Chun Chen},
title = {Drop simulation/experimental verification and shock resistance improvement
of {TFT-LCD} monitors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2249--2259},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.12.003},
doi = {10.1016/J.MICROREL.2006.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PanC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanW07,
author = {Cheng{-}Tang Pan and
T. T. Wu},
title = {Simulation and fabrication of magnetic rotary microgenerator with
multipolar Nd/Fe/B magnet},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2129--2134},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.037},
doi = {10.1016/J.MICROREL.2006.09.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PanW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PantelidesTRZFS07,
author = {Sokrates T. Pantelides and
L. Tsetseris and
Sergey N. Rashkeev and
X. J. Zhou and
Daniel M. Fleetwood and
Ronald D. Schrimpf},
title = {Hydrogen in MOSFETs - {A} primary agent of reliability issues},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {903--911},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.011},
doi = {10.1016/J.MICROREL.2006.10.011},
timestamp = {Tue, 26 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PantelidesTRZFS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PapandreouLSPPP07,
author = {E. Papandreou and
Mohamed Lamhamdi and
C. M. Skoulikidou and
Patrick Pons and
George J. Papaioannou and
Robert Plana},
title = {Structure dependent charging process in {RF} {MEMS} capacitive switches},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1812--1817},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.100},
doi = {10.1016/J.MICROREL.2007.07.100},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PapandreouLSPPP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkXSYSCMJLLKCO07,
author = {Jong{-}Hyun Park and
Cheng{-}Ji Xian and
Nak{-}Jin Seong and
Soon{-}Gil Yoon and
Seung{-}Hyun Son and
Hyung{-}Mi Chung and
Jin{-}Suck Moon and
Hyun{-}Joo Jin and
Seung{-}Eun Lee and
Jeong{-}Won Lee and
Hyung{-}Dong Kang and
Yeoul{-}Kyo Chung and
Yong{-}Soo Oh},
title = {Development of embedded capacitor with bismuth-based pyrochlore thin
films at low temperatures for printed circuit board applications},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {755--758},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.038},
doi = {10.1016/J.MICROREL.2007.01.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkXSYSCMJLLKCO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaskalevaLB07,
author = {Albena Paskaleva and
Martin Lemberger and
Anton J. Bauer},
title = {Polarity asymmetry of stress and charge trapping behavior of thin
Hf- and Zr-silicate layers},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2094--2099},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.018},
doi = {10.1016/J.MICROREL.2006.11.018},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PaskalevaLB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PearnHPH07,
author = {Wen Lea Pearn and
H. N. Hung and
N. F. Peng and
C. Y. Huang},
title = {Testing process precision for truncated normal distributions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2275--2281},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.12.001},
doi = {10.1016/J.MICROREL.2006.12.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PearnHPH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PengMM07,
author = {Weiqun Peng and
Eduardo Monlevade and
Marco E. Marques},
title = {Effect of thermal aging on the interfacial structure of SnAgCu solder
joints on Cu},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2161--2168},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.12.006},
doi = {10.1016/J.MICROREL.2006.12.006},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PengMM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PerkinsS07,
author = {Andy Perkins and
Suresh K. Sitaraman},
title = {Universal fatigue life prediction equation for ceramic ball grid array
{(CBGA)} packages},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2260--2274},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.12.004},
doi = {10.1016/J.MICROREL.2006.12.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PerkinsS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PerpinaCPMM07,
author = {X. Perpi{\~{n}}{\`{a}} and
Alberto Castellazzi and
M. Piton and
Michel Mermet{-}Guyennet and
Jos{\'{e}} Mill{\'{a}}n},
title = {Failure-relevant abnormal events in power inverters considering measured
{IGBT} module temperature inhomogeneities},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1784--1789},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.071},
doi = {10.1016/J.MICROREL.2007.07.071},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PerpinaCPMM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PerpinaPMJM07,
author = {X. Perpi{\~{n}}{\`{a}} and
M. Piton and
Michel Mermet{-}Guyennet and
Xavier Jord{\`{a}} and
Jos{\'{e}} Mill{\'{a}}n},
title = {Local thermal cycles determination in thermosyphon-cooled traction
{IGBT} modules reproducing mission profiles},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1701--1706},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.072},
doi = {10.1016/J.MICROREL.2007.07.072},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PerpinaPMJM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetitZ07,
author = {Christian Petit and
Damien Zander},
title = {Low voltage stress induced leakage current and time to breakdown in
ultra-thin (1.2-2.3nm) oxides},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {401--408},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.006},
doi = {10.1016/J.MICROREL.2006.05.006},
timestamp = {Fri, 17 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PetitZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetitZ07a,
author = {Christian Petit and
Damien Zander},
title = {Stress induced gate-drain leakage current in ultra-thin gate oxide},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2070--2081},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.013},
doi = {10.1016/J.MICROREL.2006.10.013},
timestamp = {Fri, 17 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PetitZ07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PicGO07,
author = {D. Pic and
Didier Goguenheim and
Jean{-}Luc Ogier},
title = {A comprehensive study of stress induced leakage current using a floating
gate structure for direct applications in {EEPROM} memories},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1373--1377},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.040},
doi = {10.1016/J.MICROREL.2007.07.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PicGO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PinzelliGBVBG07,
author = {L. Pinzelli and
M. Gros{-}Jean and
Y. Br{\'{e}}chet and
F. Volpi and
A. Bajolet and
J.{-}C. Giraudin},
title = {High-K dielectric deposition in 3D architectures: The case of Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)
deposited with metal-organic precursor {TBTDET}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {700--703},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.066},
doi = {10.1016/J.MICROREL.2007.01.066},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PinzelliGBVBG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PriviteraMCFP07,
author = {Stefania Privitera and
R. Modica and
V. Cerantonio and
Giorgio Fallica and
G. Pappalardo},
title = {{LOCOS} induced stress effects on {SOI} bipolar devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {802--805},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.039},
doi = {10.1016/J.MICROREL.2007.01.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PriviteraMCFP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Puchner07,
author = {Helmut Puchner},
title = {{NBTI} product level reliability for a low-power {SRAM} technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {873--879},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.015},
doi = {10.1016/J.MICROREL.2006.10.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Puchner07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PugatschowHB07,
author = {A. Pugatschow and
Ralf Heiderhoff and
L. J. Balk},
title = {Time resolved determination of electrical field distributions within
dynamically biased power devices by spectral {EBIC} investigations},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1529--1533},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.003},
doi = {10.1016/J.MICROREL.2007.07.003},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PugatschowHB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PuzzilliGIRH07,
author = {Giuseppina Puzzilli and
Bogdan Govoreanu and
Fernanda Irrera and
Maarten Rosmeulen and
Jan Van Houdt},
title = {Characterization of charge trapping in SiO\({}_{\mbox{2}}\)/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
dielectric stacks by pulsed {C-V} technique},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {508--512},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.040},
doi = {10.1016/J.MICROREL.2007.01.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PuzzilliGIRH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QuCQLW07,
author = {Xin Qu and
Zhaoyi Chen and
Bo Qi and
Taekoo Lee and
Jiaji Wang},
title = {Board level drop test and simulation of leaded and lead-free {BGA-PCB}
assembly},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2197--2204},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.017},
doi = {10.1016/J.MICROREL.2006.10.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QuCQLW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RamsaySTWWTR07,
author = {Euan Ramsay and
K. A. Serrels and
M. J. Thomson and
Andrew J. Waddie and
Richard J. Warburton and
Mohammed R. Taghizadeh and
Derryck Telford Reid},
title = {Three-dimensional nanometric sub-surface imaging of a silicon flip-chip
using the two-photon optical beam induced current method},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1534--1538},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.069},
doi = {10.1016/J.MICROREL.2007.07.069},
timestamp = {Fri, 15 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RamsaySTWWTR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaskinSBR07,
author = {Yosef Raskin and
Asaad Salameh and
David Betel and
Yakov Roizin},
title = {Reliability of {HTO} based high-voltage gate stacks for flash memories},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {615--618},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.041},
doi = {10.1016/J.MICROREL.2007.01.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaskinSBR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RegoliniBM07,
author = {Jorge Luis Regolini and
Daniel Benoit and
Pierre Morin},
title = {Passivation issues in active pixel {CMOS} image sensors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {739--742},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.067},
doi = {10.1016/J.MICROREL.2007.01.067},
timestamp = {Thu, 29 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RegoliniBM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReimboldMGLGM07,
author = {Gilles Reimbold and
J{\'{e}}r{\^{o}}me Mitard and
Xavier Garros and
Charles Leroux and
G{\'{e}}rard Ghibaudo and
Fran{\c{c}}ois Martin},
title = {Initial and PBTI-induced traps and charges in Hf-based oxides/TiN
stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {489--496},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.068},
doi = {10.1016/J.MICROREL.2007.01.068},
timestamp = {Tue, 09 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ReimboldMGLGM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Reissner07,
author = {M. Reissner},
title = {Fault localization at high voltage devices using thermally induced
voltage alteration {(TIVA)}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1561--1564},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.016},
doi = {10.1016/J.MICROREL.2007.07.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Reissner07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReyndersM07,
author = {K. Reynders and
Peter Moens},
title = {Integration of an {SCR} in an active clamp},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1054--1059},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.005},
doi = {10.1016/J.MICROREL.2006.11.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReyndersM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RocakMSHBD07,
author = {Dubravka Rocak and
S. Macek and
J. Sitek and
Marko Hrovat and
K. Bukat and
Z. Drozd},
title = {A reliability study of the lead-free solder connections of miniature
chip components on hybrid circuits},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {986--995},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.007},
doi = {10.1016/J.MICROREL.2006.06.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RocakMSHBD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoelligDWBWWM07,
author = {Mike Roellig and
Rainer Dudek and
Steffen Wiese and
Bjoern Boehme and
Bernhard Wunderle and
Klaus{-}J{\"{u}}rgen Wolter and
Bernd Michel},
title = {Fatigue analysis of miniaturized lead-free solder contacts based on
a novel test concept},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {187--195},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.013},
doi = {10.1016/J.MICROREL.2006.09.013},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RoelligDWBWWM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoeschB07,
author = {William J. Roesch and
Steve Brockett},
title = {Field returns, a source of natural failure mechanisms},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1156--1165},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.004},
doi = {10.1016/J.MICROREL.2007.02.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoeschB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RommelBR07,
author = {Mathias Rommel and
Anton J. Bauer and
Heiner Ryssel},
title = {Quantitative oxide charge determination by photocurrent analysis},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {673--677},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.069},
doi = {10.1016/J.MICROREL.2007.01.069},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RommelBR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RooneyGXCS07,
author = {Daniel T. Rooney and
Louis Gullo and
Dongji Xie and
N. Todd Castello and
Dongkai Shanguan},
title = {Evaluation of reliability and metallurgical integrity of wire bonds
and lead free solder joints on flexible printed circuit board sample
modules},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2152--2160},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.01.015},
doi = {10.1016/J.MICROREL.2006.01.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RooneyGXCS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RosaR07,
author = {Giuseppe La Rosa and
Stewart E. Rauch III},
title = {Channel hot carrier effects in n-MOSFET devices of advanced submicron
{CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {552--558},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.031},
doi = {10.1016/J.MICROREL.2007.01.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RosaR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RothschildMKSEDCRVVVLBDJNAB07,
author = {A. Rothschild and
R. Mitsuhashi and
Christoph Kerner and
X. Shi and
J. L. Everaert and
L. Date and
Thierry Conard and
Olivier Richard and
C. Vrancken and
R. Verbeeck and
Anabela Veloso and
A. Lauwers and
Muriel de Potter de ten Broeck and
I. Debusschere and
M. Jurczak and
M. Niwa and
Philippe Absil and
S. Biesemans},
title = {Optimization of HfSiON using a design of experiment {(DOE)} approach
on 0.45 {V} V\({}_{\mbox{t}}\) Ni-FUSI {CMOS} transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {521--524},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.042},
doi = {10.1016/J.MICROREL.2007.01.042},
timestamp = {Wed, 13 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RothschildMKSEDCRVVVLBDJNAB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RouetMDF07,
author = {Vincent Rouet and
Fr{\'{e}}d{\'{e}}ric Minault and
Guillaume Diancourt and
Bruno Foucher},
title = {Concept of smart integrated life consumption monitoring system for
electronics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1921--1927},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.019},
doi = {10.1016/J.MICROREL.2007.02.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RouetMDF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RouxLFOLLM07,
author = {Claire Le Roux and
Laurent Lopez and
Abdellatif Firiti and
Jean{-}Luc Ogier and
Fr{\'{e}}d{\'{e}}ric Lalande and
Romain Laffont and
Gilles Micolau},
title = {A new method to quantify retention-failed cells of an {EEPROM} {CAST}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1609--1613},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.083},
doi = {10.1016/J.MICROREL.2007.07.083},
timestamp = {Fri, 21 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RouxLFOLLM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyTOHH07,
author = {Arijit Roy and
Cher Ming Tan and
Sean J. O'Shea and
Kedar Hippalgaonkar and
Wulf Hofbauer},
title = {Room temperature observation of point defect on gold surface using
thermovoltage mapping},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1580--1584},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.010},
doi = {10.1016/J.MICROREL.2007.07.010},
timestamp = {Tue, 27 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RoyTOHH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RuanNBBCLP07,
author = {Jinyu Jason Ruan and
Nicolas Nolhier and
Marise Bafleur and
Laurent Bary and
Fabio Coccetti and
T. Lisec and
Robert Plana},
title = {Electrostatic discharge failure analysis of capacitive {RF} {MEMS}
switches},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1818--1822},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.070},
doi = {10.1016/J.MICROREL.2007.07.070},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RuanNBBCLP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RushworthDKLO07,
author = {Simon A. Rushworth and
Hywel Davies and
Andrew J. Kingsley and
Thomas Leese and
Rajesh Odedra},
title = {Volatility and vapourisation characterisation of new precursors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {718--721},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.070},
doi = {10.1016/J.MICROREL.2007.01.070},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RushworthDKLO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SacconiJPC07,
author = {F. Sacconi and
J. M. Jancu and
M. Povolotskyi and
Aldo Di Carlo},
title = {Full-band tunneling in high-kappa dielectric {MOS} structures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {694--696},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.043},
doi = {10.1016/J.MICROREL.2007.01.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SacconiJPC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SalmHKHWS07,
author = {Cora Salm and
Eric Hoekstra and
Jay S. Kolhatkar and
Andr{\'{e}} J. Hof and
Hans Wallinga and
Jurriaan Schmitz},
title = {Low-frequency noise in hot-carrier degraded nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {577--580},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.044},
doi = {10.1016/J.MICROREL.2007.01.044},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SalmHKHWS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SandbornP07,
author = {Peter Sandborn and
Michael G. Pecht},
title = {Introduction to special section on electronic systems prognostics
and health management},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1847--1848},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.03.004},
doi = {10.1016/J.MICROREL.2007.03.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SandbornP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SandbornW07,
author = {Peter A. Sandborn and
Chris Wilkinson},
title = {A maintenance planning and business case development model for the
application of prognostics and health management {(PHM)} to electronic
systems},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1889--1901},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.016},
doi = {10.1016/J.MICROREL.2007.02.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SandbornW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanzCC07,
author = {Maria Teresa Sanz and
Santiago Celma and
Bel{\'{e}}n Calvo},
title = {Low-distortion 4th order programmable Butterworth filter},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {471--476},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.008},
doi = {10.1016/J.MICROREL.2006.05.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SanzCC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SarkarMS07,
author = {Partha Sarkar and
Abhijit Mallik and
Chandan Kumar Sarkar},
title = {Performance comparison of channel engineered deep sub-micrometer pseudo
{SOI} n-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {953--958},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.011},
doi = {10.1016/J.MICROREL.2006.06.011},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SarkarMS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScanffFGSGF07,
author = {E. Scanff and
K. L. Feldman and
S. Ghelam and
Peter Sandborn and
M. Glade and
B. Foucher},
title = {Life cycle cost impact of using prognostic health management {(PHM)}
for helicopter avionics},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1857--1864},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.014},
doi = {10.1016/J.MICROREL.2007.02.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ScanffFGSGF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenKBMJL07,
author = {Rudolf Schlangen and
Uwe Kerst and
Christian Boit and
Tahir Malik and
Rajesh Jain and
Ted R. Lundquist},
title = {Non destructive 3D chip inspection with nano scale potential by use
of backside {FIB} and backscattered electron microscopy},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1523--1528},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.082},
doi = {10.1016/J.MICROREL.2007.07.082},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchlangenKBMJL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchoenfelderELBB07,
author = {Stephan Schoenfelder and
Matthias Ebert and
Christof Landesberger and
Karlheinz Bock and
J{\"{o}}rg Bagdahn},
title = {Investigations of the influence of dicing techniques on the strength
properties of thin silicon},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {168--178},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.002},
doi = {10.1016/J.MICROREL.2006.09.002},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchoenfelderELBB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Schroder07,
author = {Dieter K. Schroder},
title = {Negative bias temperature instability: What do we understand?},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {841--852},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.006},
doi = {10.1016/J.MICROREL.2006.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Schroder07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchwierzS07,
author = {F. Schwierz and
C. Schippel},
title = {Performance trends of Si-based {RF} transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {384--390},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.015},
doi = {10.1016/J.MICROREL.2006.05.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchwierzS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SebastianiPMG07,
author = {A. Sebastiani and
R. Piagge and
Alberto Modelli and
G. Ghidini},
title = {High-K dielectrics for inter-poly application in non volatile memories},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {598--601},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.045},
doi = {10.1016/J.MICROREL.2007.01.045},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SebastianiPMG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShaimeevGKWLK07,
author = {Sergey Shaimeev and
Vladimir Gritsenko and
Kaupo Kukli and
Hei Wong and
Eun{-}Hong Lee and
Chungwoo Kim},
title = {Single band electronic conduction in hafnium oxide prepared by atomic
layer deposition},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {36--40},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.002},
doi = {10.1016/J.MICROREL.2006.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShaimeevGKWLK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShickovaKVAHMGK07,
author = {A. Shickova and
Ben Kaczer and
Anabela Veloso and
Marc Aoulaiche and
M. Houssa and
Herman E. Maes and
Guido Groeseneken and
J. A. Kittl},
title = {{NBTI} reliability of Ni FUSI/HfSiON gates: Effect of silicide phase},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {505--507},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.046},
doi = {10.1016/J.MICROREL.2007.01.046},
timestamp = {Tue, 31 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShickovaKVAHMGK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShinwariDL07,
author = {M. Waleed Shinwari and
M. Jamal Deen and
Dolf Landheer},
title = {Study of the electrolyte-insulator-semiconductor field-effect transistor
{(EISFET)} with applications in biosensor design},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2025--2057},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.003},
doi = {10.1016/J.MICROREL.2006.10.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShinwariDL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SluisESDG07,
author = {Olaf van der Sluis and
R. A. B. Engelen and
Richard B. R. van Silfhout and
W. D. van Driel and
Marcel A. J. van Gils},
title = {Efficient damage sensitivity analysis of advanced Cu/low-k bond pad
structures by means of the area release energy criterion},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1975--1982},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.004},
doi = {10.1016/J.MICROREL.2007.04.004},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SluisESDG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SmedesBR07,
author = {Theo Smedes and
J. de Boet and
T. R{\"{o}}dle},
title = {Selecting an appropriate {ESD} protection for discrete {RF} power
LDMOSTs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1000--1007},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.012},
doi = {10.1016/J.MICROREL.2006.11.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SmedesBR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SoestbergenEJD07,
author = {M. van Soestbergen and
Leo J. Ernst and
Kaspar M. B. Jansen and
W. D. van Driel},
title = {Measuring the through-plane elastic modulus of thin polymer films
in situ},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1983--1988},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.006},
doi = {10.1016/J.MICROREL.2007.04.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SoestbergenEJD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SoldnerSHTGSCID07,
author = {Wolfgang Soldner and
Martin Streibl and
U. Hodel and
Marc Tiebout and
Harald Gossner and
Doris Schmitt{-}Landsiedel and
Jung{-}Hoon Chun and
Choshu Ito and
Robert W. Dutton},
title = {{RF} {ESD} protection strategies: Codesign vs. low-C protection},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1008--1015},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.007},
doi = {10.1016/J.MICROREL.2006.11.007},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SoldnerSHTGSCID07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SolomalalaSMCCCF07,
author = {Pierre Solomalala and
J. Saiz and
Michel Mermet{-}Guyennet and
Alberto Castellazzi and
Mauro Ciappa and
X. Chauffleur and
Jean{-}Pierre Fradin},
title = {Virtual reliability assessment of integrated power switches based
on multi-domain simulation approach},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1343--1348},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.006},
doi = {10.1016/J.MICROREL.2007.07.006},
timestamp = {Mon, 12 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SolomalalaSMCCCF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SozziM07,
author = {Giovanna Sozzi and
Roberto Menozzi},
title = {A review of the use of electro-thermal simulations for the analysis
of heterostructure FETs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {65--73},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.014},
doi = {10.1016/J.MICROREL.2006.03.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SozziM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SpraulNMWM07,
author = {M. Spraul and
Wolfgang N{\"{u}}chter and
A. M{\"{o}}ller and
Bernhard Wunderle and
Bernd Michel},
title = {Reliability of SnPb and Pb-free flip-chips under different test conditions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {252--258},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.026},
doi = {10.1016/J.MICROREL.2006.09.026},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SpraulNMWM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SrinivasanCSMPMC07,
author = {Paolo Srinivasan and
Felice Crupi and
Eddy Simoen and
Paolo Magnone and
Calogero Pace and
Durga Misra and
Cor Claeys},
title = {Interfacial layer quality effects on low-frequency noise (1/f) in
p-MOSFETs with advanced gate stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {501--504},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.012},
doi = {10.1016/J.MICROREL.2007.01.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SrinivasanCSMPMC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stadler07,
author = {Wolfgang Stadler},
title = {Guest editorial},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {999},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.002},
doi = {10.1016/J.MICROREL.2006.11.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stadler07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StanimirovicJS07,
author = {Ivanka P. Stanimirovic and
Milan Jevtic and
Zdravko I. Stanimirovic},
title = {Multiple high-voltage pulse stressing of conventional thick-film resistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2242--2248},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.017},
doi = {10.1016/J.MICROREL.2006.11.017},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StanimirovicJS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SteenbergeLWVS07,
author = {Nele Van Steenberge and
Paresh Limaye and
Geert Willems and
Bart Vandevelde and
Inge Schildermans},
title = {Analytical and finite element models of the thermal behavior for lead-free
soldering processes in electronic assembly},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {215--222},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.010},
doi = {10.1016/J.MICROREL.2006.09.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SteenbergeLWVS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SteimleMRSSYHSGVPMACW07,
author = {R. F. Steimle and
R. Muralidhar and
R. Rao and
M. Sadd and
C. T. Swift and
Jane Yater and
B. Hradsky and
S. Straub and
H. Gasquet and
L. Vishnubhotla and
E. J. Prinz and
T. Merchant and
B. Acred and
K. Chang and
B. E. White Jr.},
title = {Silicon nanocrystal non-volatile memory for embedded memory scaling},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {585--592},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.047},
doi = {10.1016/J.MICROREL.2007.01.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SteimleMRSSYHSGVPMACW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07,
author = {Mile K. Stojcev},
title = {Mohamed Ilyas, Imad Mahgoud, Handbook of Sensor Networks: Compact
Wireless and Wired Sensing Systems, Hardcover, pp 864, {CRC} Press,
2005, {ISBN} 0-8493-1968-4},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {996--997},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.006},
doi = {10.1016/J.MICROREL.2006.03.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07a,
author = {Mile K. Stojcev},
title = {Richard Zurawski, ed., The Industrial Information Technology Handbook,
Hardcover, {CRC} Press, 2005, pp 1936, {ISBN} 0-8493-1985-4},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1153--1154},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.007},
doi = {10.1016/J.MICROREL.2006.03.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07b,
author = {Mile K. Stojcev},
title = {S. Sitharama Iyengar, Richards R. Brooks, Eds., Distributed Sensor
Networks, Hardcover, pp 1123, Chapman {\&} Hall/CRC Press, 2005,
{ISBN} 1-58488-383-9},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1306--1307},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.008},
doi = {10.1016/J.MICROREL.2006.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07c,
author = {Mile K. Stojcev},
title = {Richard Zurawski, editor. Embedded Systems Handbook, Hardcover, pp
1112, {CRC} Press, Taylor {\&} Francis Group, 2006, {ISBN} 0-8493-2824-1},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1308--1309},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.04.006},
doi = {10.1016/J.MICROREL.2006.04.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07d,
author = {Mile K. Stojcev},
title = {Taxonomies for the Development and Verification of Digital Systems,
Brian Bailey, Grant Martin, Thomas Anderson (Editors). Springer, New
York {(2005).} 179pp., Hardcover, {ISBN:} 0-387-24019-5},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2282--2283},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.017},
doi = {10.1016/J.MICROREL.2006.09.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07e,
author = {Mile K. Stojcev},
title = {William {C.Y.} Lee, Wireless {\&} Cellular Telecommunications
(third ed.), McGraw Hill, New York {(2006)} {ISBN} 0-07-143686-3 Hardcover,
822 pp., plus {XXIII}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2284--2286},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.041},
doi = {10.1016/J.MICROREL.2006.09.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07f,
author = {Mile K. Stojcev},
title = {Louis Scheffer, Luciano Lavagno and Grant Martin, Editors, Electronic
Design Automation for Integrated Circuits Handbook Vols. {I} and II,
CRC, imprint of Taylor and Francis Group, Boca Raton {(2006)} {ISBN}
0-8493-3096-3 Hardcover, 1095 pp., plus {XLVIII}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2287--2288},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.007},
doi = {10.1016/J.MICROREL.2006.10.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07f.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07g,
author = {Mile K. Stojcev},
title = {Fast, Efficient and Predictable Memory Access: Optimization Algorithms
for Memory Architecture Aware Compilation, Lars Wehmeyer, Peter Marwedel.
Springer, Dordercht, The Netherlands {(2006).} 257pp., Hardcover,
plus XI, {ISBN:} 1-4020-4821-1},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2289--2290},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.082},
doi = {10.1016/J.MICROREL.2007.01.082},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07g.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev07h,
author = {Mile K. Stojcev},
title = {Arithmetic and Logic in Computer Systems, Mi Lu. John Wiley {\&}
Sons, Inc., Hoboken, {NJ} (2004), {ISBN:} 0-471-46945-9},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {157--158},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.004},
doi = {10.1016/J.MICROREL.2006.03.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev07h.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StoyanovKBD07,
author = {Stoyan Stoyanov and
Robert W. Kay and
Chris Bailey and
Marc P. Y. Desmulliez},
title = {Computational modelling for reliable flip-chip packaging at sub-100mum
pitch using isotropic conductive adhesives},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {132--141},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.01.004},
doi = {10.1016/J.MICROREL.2006.01.004},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StoyanovKBD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuSL07,
author = {Yu{-}Di Su and
Wen{-}Chieh Shih and
Joseph Ya{-}min Lee},
title = {The characterization of retention properties of metal-ferroelectric
(PbZr\({}_{\mbox{0.53}}\)Ti\({}_{\mbox{0.47}}\)O\({}_{\mbox{3}}\))-insulator
(Dy\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\), Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\))-semiconductor
devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {619--622},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.048},
doi = {10.1016/J.MICROREL.2007.01.048},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuSL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SverdlovKS07,
author = {Viktor Sverdlov and
Hans Kosina and
Siegfried Selberherr},
title = {Modeling current transport in ultra-scaled field-effect transistors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {11--19},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.009},
doi = {10.1016/J.MICROREL.2006.03.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SverdlovKS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaechakumputTBPCJ07,
author = {P. Taechakumput and
S. Taylor and
Octavian Buiu and
R. J. Potter and
Paul R. Chalker and
A. C. Jones},
title = {Optical and electrical characterization of hafnium oxide deposited
by liquid injection atomic layer deposition},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {825--829},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.049},
doi = {10.1016/J.MICROREL.2007.01.049},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TaechakumputTBPCJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TakeshitaIYS07,
author = {Tatsuya Takeshita and
Ryuzo Iga and
Mitsuo Yamamoto and
Mitsuru Sugo},
title = {Analysis of interior degradation of a laser waveguide using an {OBIC}
monitor},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2135--2140},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.001},
doi = {10.1016/J.MICROREL.2007.01.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TakeshitaIYS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamuraO07,
author = {Susumu Tamura and
Yasuhisa Omura},
title = {Ferroelectric characteristic of group {IV} elements added SrBi\({}_{\mbox{2}}\)Ta\({}_{\mbox{2}}\)O\({}_{\mbox{9}}\)
thin films},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {830--833},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.050},
doi = {10.1016/J.MICROREL.2007.01.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TamuraO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanR07,
author = {Cher Ming Tan and
Nagarajan Raghavan},
title = {An approach to statistical analysis of gate oxide breakdown mechanisms},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1336--1342},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.011},
doi = {10.1016/J.MICROREL.2007.07.011},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanYC07,
author = {Cher Ming Tan and
Stanny Yanuar and
Tai Chong Chai},
title = {Finite element modeling of capacitive coupling voltage contrast},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1555--1560},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.060},
doi = {10.1016/J.MICROREL.2007.07.060},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanYC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanakaTTSO07,
author = {Koutarou Tanaka and
Hiroaki Tanaka and
Akinobu Teramoto and
Shigetoshi Sugawa and
Tadahiro Ohmi},
title = {High quality gate insulator film formation on SiC using by microwave-excited
high-density plasma},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {786--789},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.076},
doi = {10.1016/J.MICROREL.2007.01.076},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanakaTTSO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TangYLW07,
author = {Z. Tang and
P. D. Ye and
D. Lee and
Chu{-}Ryang Wie},
title = {Electrical measurements of voltage stressed Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/GaAs
{MOSFET}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2082--2087},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.012},
doi = {10.1016/J.MICROREL.2007.02.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TangYLW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TannerPCWWBW07,
author = {D. M. Tanner and
T. B. Parson and
A. D. Corwin and
Jeremy A. Walraven and
J. W. Wittwer and
B. L. Boyce and
S. R. Winzer},
title = {Science-based {MEMS} reliability methodology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1806--1811},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.061},
doi = {10.1016/J.MICROREL.2007.07.061},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TannerPCWWBW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaoOCN07,
author = {Guoqiao Tao and
Cedric Ouvrard and
Helene Chauveau and
Som Nath},
title = {Experimental study of carrier transport in multi-layered structures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {610--614},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.051},
doi = {10.1016/J.MICROREL.2007.01.051},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TaoOCN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TardyEDGTBCBZ07,
author = {Jacques Tardy and
Mohsen Erouel and
A. L. Deman and
A. Gagnaire and
V. Teodorescu and
M. G. Blanchin and
B. Canut and
A. Barau and
M. Zaharescu},
title = {Organic thin film transistors with HfO\({}_{\mbox{2}}\) high-k gate
dielectric grown by anodic oxidation or deposited by sol-gel},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {372--377},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.01.012},
doi = {10.1016/J.MICROREL.2006.01.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TardyEDGTBCBZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TazzoliMCBCZM07,
author = {Augusto Tazzoli and
Fabio Alessio Marino and
Martina Cordoni and
A. Benvenuti and
Paolo Colombo and
Enrico Zanoni and
Gaudenzio Meneghesso},
title = {Holding voltage investigation of advanced SCR-based protection structures
for {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1444--1449},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.078},
doi = {10.1016/J.MICROREL.2007.07.078},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TazzoliMCBCZM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TengH07,
author = {Shiang{-}Yu Teng and
Sheng{-}Jye Hwang},
title = {Predicting the process induced warpage of electronic packages using
the {P-V-T-C} equation and the Taguchi method},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2231--2241},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.084},
doi = {10.1016/J.MICROREL.2007.01.084},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TengH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Tosic07,
author = {Milorad Tosic},
title = {{S.V.} Nagaraj, Web Caching and its Applications, Kluwer Academic
Publishers, Boston/Dordrecht/London, (The Kluwer International Series
in Engineering and Computer Science, Vol 772), Hardcover (May 1, 2004),
{\textdollar}105.00, pp 236, {ISBN} 1-4020-8049-2},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {155--156},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.03.005},
doi = {10.1016/J.MICROREL.2006.03.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Tosic07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TremouillesTRNVG07,
author = {David Tr{\'{e}}mouilles and
Steven Thijs and
Philippe Roussel and
M. I. Natarajan and
Vesselin K. Vassilev and
Guido Groeseneken},
title = {Transient voltage overshoot in {TLP} testing - Real or artifact?},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1016--1024},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.004},
doi = {10.1016/J.MICROREL.2006.11.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TremouillesTRNVG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Tsai07,
author = {Han{-}Chang Tsai},
title = {An investigation on the influence of electromagnetic interference
induced in conducting wire of universal LEDs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {959--966},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.005},
doi = {10.1016/J.MICROREL.2006.06.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Tsai07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiYLC07,
author = {Tsung{-}Yueh Tsai and
Chang{-}Lin Yeh and
Yi{-}Shao Lai and
Rong{-}Sheng Chen},
title = {Response spectra analysis for undamped structural systems subjected
to half-sine impact acceleration pulses},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1239--1245},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.096},
doi = {10.1016/J.MICROREL.2006.07.096},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsaiYLC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TurchanikovNLOWSK07,
author = {V. I. Turchanikov and
A. N. Nazarov and
V. S. Lysenko and
V. Ostahov and
O. Winkler and
B. Spangenberg and
H. Kurz},
title = {Charge accumulation in the dielectric of the nanocluster {NVM} {MOS}
structures under anti- and unipolar {W/E} window formation},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {626--630},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.075},
doi = {10.1016/J.MICROREL.2007.01.075},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TurchanikovNLOWSK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TyagulskyyOLNHBLPC07,
author = {I. P. Tyagulskyy and
I. N. Osiyuk and
V. S. Lysenko and
A. N. Nazarov and
Steve Hall and
Octavian Buiu and
Y. Lu and
Richard Potter and
Paul R. Chalker},
title = {Charge trapping characterization of {MOCVD} HfO\({}_{\mbox{2}}\)/p-Si
interfaces at cryogenic temperatures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {726--728},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.074},
doi = {10.1016/J.MICROREL.2007.01.074},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TyagulskyyOLNHBLPC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Urresti-IbanezCPRMC07,
author = {Jes{\'{u}}s Urresti{-}Iba{\~{n}}ez and
Alberto Castellazzi and
M. Piton and
Jos{\'{e}} Rebollo and
Michel Mermet{-}Guyennet and
Mauro Ciappa},
title = {Robustness test and failure analysis of {IGBT} modules during turn-off},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1725--1729},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.097},
doi = {10.1016/J.MICROREL.2007.07.097},
timestamp = {Wed, 31 Mar 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Urresti-IbanezCPRMC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VamvakasTGKP07,
author = {V. Em. Vamvakas and
M. Theodoropoulou and
Stavroula N. Georga and
Christoforos A. Krontiras and
M. N. Pisanias},
title = {Correlation between infrared transmission spectra and the interface
trap density of SiO\({}_{\mbox{2}}\) films},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {834--837},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.072},
doi = {10.1016/J.MICROREL.2007.01.072},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VamvakasTGKP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VamvakasVG07,
author = {Vassilis Emm. Vamvakas and
Nikolaos Vourdas and
S. Gardelis},
title = {Optical characterization of Si-rich silicon nitride films prepared
by low pressure chemical vapor deposition},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {794--797},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.073},
doi = {10.1016/J.MICROREL.2007.01.073},
timestamp = {Tue, 01 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VamvakasVG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VandeveldeGLRB07,
author = {Bart Vandevelde and
Mario Gonzalez and
Paresh Limaye and
Petar Ratchev and
Eric Beyne},
title = {Thermal cycling reliability of SnAgCu and SnPb solder joints: {A}
comparison for several IC-packages},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {259--265},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.034},
doi = {10.1016/J.MICROREL.2006.09.034},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VandeveldeGLRB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VargheseD07,
author = {Joe Varghese and
Abhijit Dasgupta},
title = {Test methodology for durability estimation of surface mount interconnects
under drop testing conditions},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {93--103},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.02.002},
doi = {10.1016/J.MICROREL.2006.02.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VargheseD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VargheseD07a,
author = {Joe Varghese and
Abhijit Dasgupta},
title = {An experimental approach to characterize rate-dependent failure envelopes
and failure site transitions in surface mount assemblies},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1095--1102},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.002},
doi = {10.1016/J.MICROREL.2006.07.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VargheseD07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VellvehiJGFM07,
author = {Miquel Vellveh{\'{\i}} and
Xavier Jord{\`{a}} and
Philippe Godignon and
Carles Ferrer and
Jos{\'{e}} Mill{\'{a}}n},
title = {Coupled electro-thermal simulation of a {DC/DC} converter},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2114--2121},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.009},
doi = {10.1016/J.MICROREL.2006.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VellvehiJGFM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VermeerschM07,
author = {Bjorn Vermeersch and
Gilbert De Mey},
title = {Influence of substrate thickness on thermal impedance of microelectronic
structures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {437--443},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.017},
doi = {10.1016/J.MICROREL.2006.05.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VermeerschM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VermeerschM07a,
author = {Bjorn Vermeersch and
Gilbert De Mey},
title = {Influence of thermal contact resistance on thermal impedance of microelectronic
structures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1233--1238},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.020},
doi = {10.1016/J.MICROREL.2006.09.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VermeerschM07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VriesJD07,
author = {J. W. C. de Vries and
M. Y. Jansen and
W. D. van Driel},
title = {On the difference between thermal cycling and thermal shock testing
for board level reliability of soldered interconnections},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {444--449},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.009},
doi = {10.1016/J.MICROREL.2006.05.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VriesJD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wang07,
author = {Jinlin Wang},
title = {The effects of rheological and wetting properties on underfill filler
settling and flow voids in flip chip packages},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1958--1966},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.016},
doi = {10.1016/J.MICROREL.2007.04.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wang07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangZT07,
author = {Zhichun Wang and
P. Zeelen and
H. Tigelaar},
title = {Importance of multi-temp testing in automotive qualification and zero
defects program},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1358--1361},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.026},
doi = {10.1016/J.MICROREL.2007.07.026},
timestamp = {Mon, 29 Mar 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangZT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WatanabeTKSO07,
author = {Kazufumi Watanabe and
Akinobu Teramoto and
Rihito Kuroda and
Shigetoshi Sugawa and
Tadahiro Ohmi},
title = {Examination of degradation mechanism due to negative bias temperature
stress from a perspective of hole energy for accurate lifetime prediction},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {409--418},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.06.001},
doi = {10.1016/J.MICROREL.2006.06.001},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WatanabeTKSO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Weide-ZaageDDF07,
author = {Kirsten Weide{-}Zaage and
David Dalleau and
Yves Danto and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Dynamic void formation in a DD-copper-structure with different metallization
geometry},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {319--325},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.012},
doi = {10.1016/J.MICROREL.2006.09.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Weide-ZaageDDF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WelBBHW07,
author = {P. J. van der Wel and
J. R. de Beer and
R. J. M. van Boxtel and
Y. Y. Hsieh and
Y. C. Wang},
title = {Effect of oval defects in GaAs on the reliability of SiN\({}_{\mbox{x}}\)
metal-insulator-metal capacitors},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1188--1193},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.089},
doi = {10.1016/J.MICROREL.2007.01.089},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WelBBHW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Whitman07,
author = {Charles S. Whitman},
title = {Defining the safe operating area for HBTs with an InGaP emitter across
temperature and current density},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1166--1174},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.02.005},
doi = {10.1016/J.MICROREL.2007.02.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Whitman07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WieseW07,
author = {Steffen Wiese and
Klaus{-}J{\"{u}}rgen Wolter},
title = {Creep of thermally aged SnAgCu-solder joints},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {223--232},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.006},
doi = {10.1016/J.MICROREL.2006.09.006},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WieseW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongFWC07,
author = {Hei Wong and
Valeriu Filip and
C. K. Wong and
P. S. Chung},
title = {Silicon integrated photonics begins to revolutionize},
journal = {Microelectron. Reliab.},
volume = {47},
number = {1},
pages = {1--10},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.01.002},
doi = {10.1016/J.MICROREL.2006.01.002},
timestamp = {Sat, 11 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongFWC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuLCL07,
author = {You{-}Lin Wu and
Shi{-}Tin Lin and
Tsung{-}Min Chang and
Juin J. Liou},
title = {Reliability study of ultrathin oxide films subject to irradiation-then-stress
treatment using conductive atomic force microscopy},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {419--421},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.014},
doi = {10.1016/J.MICROREL.2006.05.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuLCL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wymyslowski07,
author = {Artur Wymyslowski},
title = {Thermal, mechanical and multi-physics simulation and experiments in
micro-electronics and micro-systems},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1967--1968},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.001},
doi = {10.1016/J.MICROREL.2007.04.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wymyslowski07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WymyslowskiDPTZ07,
author = {Artur Wymyslowski and
W. D. van Driel and
J. van de Peer and
N. Tzannetakis and
G. Q. Zhang},
title = {Advanced numerical prototyping methods in modern engineering applications
- Optimisation for micro-electronic package reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {280--289},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.007},
doi = {10.1016/J.MICROREL.2006.09.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WymyslowskiDPTZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WymyslowskiVA07,
author = {Artur Wymyslowski and
Bart Vandevelde and
Dag Andersson},
title = {Thermal, mechanical and multi-physics simulation and experiments in
micro-electronics and micro-systems},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {159--160},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.029},
doi = {10.1016/J.MICROREL.2006.09.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WymyslowskiVA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamadaTYNASOI07,
author = {Yasushi Yamada and
Yoshikazu Takaku and
Yuji Yagi and
Ikuo Nakagawa and
Takashi Atsumi and
Mikio Shirai and
Ikuo Ohnuma and
Kiyohito Ishida},
title = {Reliability of wire-bonding and solder joint for high temperature
operation of power semiconductor device},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2147--2151},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.102},
doi = {10.1016/J.MICROREL.2007.07.102},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YamadaTYNASOI07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamanakaTS07,
author = {Kimihiro Yamanaka and
Yutaka Tsukada and
Katsuaki Suganuma},
title = {Studies on solder bump electromigration in Cu/Sn-3Ag-0.5Cu/Cu system},
journal = {Microelectron. Reliab.},
volume = {47},
number = {8},
pages = {1280--1287},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.028},
doi = {10.1016/J.MICROREL.2006.09.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YamanakaTS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangJEZBJ07,
author = {Dao{-}Guo Yang and
Kaspar M. B. Jansen and
Leo J. Ernst and
G. Q. Zhang and
H. J. L. Bressers and
J. H. J. Janssen},
title = {Effect of filler concentration of rubbery shear and bulk modulus of
molding compounds},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {233--239},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.031},
doi = {10.1016/J.MICROREL.2006.09.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangJEZBJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangJEZDBJ07,
author = {Dao{-}Guo Yang and
Kaspar M. B. Jansen and
Leo J. Ernst and
G. Q. Zhang and
W. D. van Driel and
H. J. L. Bressers and
J. H. J. Janssen},
title = {Numerical modeling of warpage induced in {QFN} array molding process},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {310--318},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.036},
doi = {10.1016/J.MICROREL.2006.09.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangJEZDBJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YehLCC07,
author = {Chang{-}Lin Yeh and
Yi{-}Shao Lai and
Hsiao{-}Chuan Chang and
Tsan{-}Hsien Chen},
title = {Empirical correlation between package-level ball impact test and board-level
drop reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1127--1134},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.093},
doi = {10.1016/J.MICROREL.2006.07.093},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YehLCC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YehTL07,
author = {Chang{-}Lin Yeh and
Tsung{-}Yueh Tsai and
Yi{-}Shao Lai},
title = {Transient analysis of drop responses of board-level electronic packages
using response spectra incorporated with modal superposition},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2188--2196},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.040},
doi = {10.1016/J.MICROREL.2006.09.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YehTL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YewCC07,
author = {Ming{-}Chih Yew and
Chan{-}Yen Chou and
Kuo{-}Ning Chiang},
title = {Reliability assessment for solders with a stress buffer layer using
ball shear strength test and board-level finite element analysis},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1658--1662},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.043},
doi = {10.1016/J.MICROREL.2007.07.043},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YewCC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoungHNCLB07,
author = {Chadwin D. Young and
Dawei Heh and
Arnost Neugroschel and
Rino Choi and
Byoung Hun Lee and
Gennadi Bersuker},
title = {Electrical characterization and analysis techniques for the high-kappa
era},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {479--488},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.053},
doi = {10.1016/J.MICROREL.2007.01.053},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YoungHNCLB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanSZEDS07,
author = {Cadmus A. Yuan and
Olaf van der Sluis and
G. Q. (Kouchi) Zhang and
Leo J. Ernst and
Willem D. van Driel and
Richard B. R. van Silfhout},
title = {Molecular simulation on the material/interfacial strength of the low-dielectric
materials},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1483--1491},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.052},
doi = {10.1016/J.MICROREL.2007.07.052},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YuanSZEDS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZarandiM07,
author = {Hamid R. Zarandi and
Seyed Ghassem Miremadi},
title = {Dependability evaluation of Altera FPGA-based embedded systems subjected
to SEUs},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {461--470},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.005},
doi = {10.1016/J.MICROREL.2006.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZarandiM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZarebskiG07,
author = {Janusz Zarebski and
Krzysztof G{\'{o}}recki},
title = {Spice-aided modelling of the {UC3842} current mode {PWM} controller
with selfheating taken into account},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1145--1152},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.07.092},
doi = {10.1016/J.MICROREL.2006.07.092},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZarebskiG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZarnikBN07,
author = {Marina Santo Zarnik and
Darko Belavic and
Franc Novak},
title = {Finite-element model-based fault diagnosis, a case study of a ceramic
pressure sensor structure},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {1950--1957},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.018},
doi = {10.1016/J.MICROREL.2007.04.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZarnikBN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZbrzeznySP07,
author = {A. R. Zbrzezny and
Polina Snugovsky and
D. D. Perovic},
title = {Impact of board and component metallizations on microstructure and
reliability of lead-free solder joints},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2205--2214},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.09.038},
doi = {10.1016/J.MICROREL.2006.09.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZbrzeznySP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZelsacherWBPSKB07,
author = {R. Zelsacher and
A. C. G. Wood and
E. Bacher and
E. Prax and
K. Sorschag and
J. Krumrey and
J. Baumgartl},
title = {A novel {SIMS} based approach to the characterization of the channel
doping profile of a trench {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1585--1589},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.001},
doi = {10.1016/J.MICROREL.2007.07.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZelsacherWBPSKB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZenkevichLSFBL07,
author = {Andrei Zenkevich and
Yu. Lebedinskii and
G. Scarel and
Marco Fanciulli and
Andrey Baturin and
N. Lubovin},
title = {Degradation kinetics of ultrathin HfO\({}_{\mbox{2}}\) layers on Si(1
0 0) during vacuum annealing monitored with in situ {XPS/LEIS} and
ex situ {AFM}},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {657--659},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.071},
doi = {10.1016/J.MICROREL.2007.01.071},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZenkevichLSFBL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangVSMK07,
author = {Guangping Zhang and
C. A. Volkert and
Ruth Schwaiger and
R. M{\"{o}}nig and
O. Kraft},
title = {Fatigue and thermal fatigue damage analysis of thin metal films},
journal = {Microelectron. Reliab.},
volume = {47},
number = {12},
pages = {2007--2013},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.04.005},
doi = {10.1016/J.MICROREL.2007.04.005},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangVSMK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoL07,
author = {Jianyin Zhao and
Fang Liu},
title = {Reliability assessment of the metallized film capacitors from degradation
data},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {434--436},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.013},
doi = {10.1016/J.MICROREL.2006.05.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZouXLLC07,
author = {X. Zou and
Jing{-}Ping Xu and
C. X. Li and
Pui{-}To Lai and
W. B. Chen},
title = {A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer},
journal = {Microelectron. Reliab.},
volume = {47},
number = {2-3},
pages = {391--394},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.05.019},
doi = {10.1016/J.MICROREL.2006.05.019},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZouXLLC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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