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@article{DBLP:journals/et/Agrawal12, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {1}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5285-4}, doi = {10.1007/S10836-012-5285-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal12a, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {151--152}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5296-1}, doi = {10.1007/S10836-012-5296-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal12a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal12b, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {263--264}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5307-2}, doi = {10.1007/S10836-012-5307-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal12b.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal12c, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {389--390}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5319-y}, doi = {10.1007/S10836-012-5319-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal12c.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal12d, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {551--552}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5331-2}, doi = {10.1007/S10836-012-5331-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal12d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Agrawal12e, author = {Vishwani D. Agrawal}, title = {Editorial}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {773--774}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5341-0}, doi = {10.1007/S10836-012-5341-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Agrawal12e.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/AhmedWUA12, author = {Badar{-}ud{-}din Ahmed and Youren Wang and Rizwan Ullah and Najam{-}ud{-}din Ahmed}, title = {A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {535--540}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5311-6}, doi = {10.1007/S10836-012-5311-6}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/AhmedWUA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/AyadiMM12, author = {R. M. Ayadi and S. Mahresi and M. Masmoudi}, title = {Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {167--176}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5283-6}, doi = {10.1007/S10836-012-5283-6}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/AyadiMM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/BackesMSWG12, author = {Benjamin Backes and Colin McDonough and Larry Smith and Wei Wang and Robert E. Geer}, title = {Effects of Copper Plasticity on the Induction of Stress in Silicon from Copper Through-Silicon Vias (TSVs) for 3D Integrated Circuits}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {53--62}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5242-7}, doi = {10.1007/S10836-011-5242-7}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/BackesMSWG12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/BenficaPVLLGH12, author = {Juliano Benfica and Let{\'{\i}}cia Maria Bolzani Poehls and Fabian Vargas and Jos{\'{e}} Lipovetzky and Ariel Lutenberg and Edmundo Gatti and Fernando Hernandez}, title = {A Test Platform for Dependability Analysis of SoCs Exposed to {EMI} and Radiation}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {803--816}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5334-z}, doi = {10.1007/S10836-012-5334-Z}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/BenficaPVLLGH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/BombieriFG12, author = {Nicola Bombieri and Franco Fummi and Valerio Guarnieri}, title = {{FAST:} An {RTL} Fault Simulation Framework based on RTL-to-TLM Abstraction}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {495--510}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5318-z}, doi = {10.1007/S10836-012-5318-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/BombieriFG12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/BoyerDLLV12, author = {Alexandre Boyer and Sonia Ben Dhia and Binhong Li and Christophe Lemoine and Bertrand Vrignon}, title = {Prediction of Long-term Immunity of a Phase-Locked Loop}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {791--802}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5335-y}, doi = {10.1007/S10836-012-5335-Y}, timestamp = {Mon, 20 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/BoyerDLLV12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ButtrickK12, author = {Michael Buttrick and Sandip Kundu}, title = {On Testing Prebond Dies with Incomplete Clock Networks in a 3D {IC} Using DLLs}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {93--101}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5262-3}, doi = {10.1007/S10836-011-5262-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ButtrickK12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Castellani-CoulieAMP12, author = {Karine Castellani{-}Couli{\'{e}} and Hassen Aziza and Gilles Micolau and Jean{-}Michel Portal}, title = {Optimization of {SEU} Simulations for {SRAM} Cells Reliability under Radiation}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {331--338}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5281-8}, doi = {10.1007/S10836-012-5281-8}, timestamp = {Fri, 24 Dec 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/Castellani-CoulieAMP12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ChakrabortyA12, author = {Kanad Chakraborty and Vishwani D. Agrawal}, title = {Data-Driven {DPPM} Estimation and Adaptive Fault Coverage Calibration Using MATLAB{\textregistered}}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {869--875}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5332-1}, doi = {10.1007/S10836-012-5332-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ChakrabortyA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ChangK12, author = {Hsiu{-}Ming (Sherman) Chang and David C. Keezer}, title = {Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and {MEMS} Testing}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {555--556}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5330-3}, doi = {10.1007/S10836-012-5330-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ChangK12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ChenMW12, author = {Xiaomei Chen and Xiaofeng Meng and Guohua Wang}, title = {A Modified Simulation-Based Multi-Signal Modeling for Electronic System}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {155--165}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5273-0}, doi = {10.1007/S10836-011-5273-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ChenMW12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/DalirsaniHEW12, author = {Atefe Dalirsani and Stefan Holst and Melanie Elm and Hans{-}Joachim Wunderlich}, title = {Structural Test and Diagnosis for Graceful Degradation of NoC Switches}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {831--841}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5329-9}, doi = {10.1007/S10836-012-5329-9}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/DalirsaniHEW12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/DasnurkarA12, author = {Sachin Dileep Dasnurkar and Jacob A. Abraham}, title = {Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {697--704}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5327-y}, doi = {10.1007/S10836-012-5327-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/DasnurkarA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/DhiaBVD12, author = {Sonia Ben Dhia and Alexandre Boyer and Bertrand Vrignon and Mika{\"{e}}l Deobarro}, title = {{IC} Immunity Modeling Process Validation Using On-Chip Measurements}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {339--348}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5294-3}, doi = {10.1007/S10836-012-5294-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/DhiaBVD12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/DuanVZCG12, author = {Jingbo Duan and Bharath K. Vasan and Chen Zhao and Degang Chen and Randall L. Geiger}, title = {On Chip Signal Generators for Low Overhead {ADC} {BIST}}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {615--623}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5320-5}, doi = {10.1007/S10836-012-5320-5}, timestamp = {Tue, 26 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/DuanVZCG12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/FerriPBC12, author = {Cesare Ferri and Dimitra Papagiannopoulou and R. Iris Bahar and Andrea Calimera}, title = {NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded Systems}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {349--363}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5295-2}, doi = {10.1007/S10836-012-5295-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/FerriPBC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/FonsecaDBGPVB12, author = {Renan Alves Fonseca and Luigi Dilillo and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Nabil Badereddine}, title = {Impact of Resistive-Bridging Defects in {SRAM} at Different Technology Nodes}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {317--329}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5291-6}, doi = {10.1007/S10836-012-5291-6}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/FonsecaDBGPVB12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/FreijedoSRVTT12, author = {Judit Freijedo and Jorge Semi{\~{a}}o and Juan J. Rodr{\'{\i}}guez{-}Andina and Fabian Vargas and Isabel C. Teixeira and Jo{\~{a}}o Paulo Teixeira}, title = {Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {421--434}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5297-0}, doi = {10.1007/S10836-012-5297-0}, timestamp = {Fri, 30 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/FreijedoSRVTT12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/GomezAM12, author = {Didac G{\'{o}}mez and Josep Altet and Diego Mateo}, title = {On the Use of Static Temperature Measurements as Process Variation Observable}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {685--695}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5298-z}, doi = {10.1007/S10836-012-5298-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/GomezAM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/GrossoHSRTM12, author = {Michelangelo Grosso and Wilson{-}Javier P{\'{e}}rez{-}Holgu{\'{\i}}n and Ernesto S{\'{a}}nchez and Matteo Sonza Reorda and Alberto Paolo Tonda and Jaime Velasco{-}Medina}, title = {Software-Based Testing for System Peripherals}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {189--200}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5287-2}, doi = {10.1007/S10836-012-5287-2}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/GrossoHSRTM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/GuarnieriGBPFHRJU12, author = {Valerio Guarnieri and Giuseppe Di Guglielmo and Nicola Bombieri and Graziano Pravadelli and Franco Fummi and Hanno Hantson and Jaan Raik and Maksim Jenihhin and Raimund Ubar}, title = {On the Reuse of {TLM} Mutation Analysis at {RTL}}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {435--448}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5303-6}, doi = {10.1007/S10836-012-5303-6}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/GuarnieriGBPFHRJU12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HannuHVJM12, author = {Jari Hannu and Juha H{\"{a}}kkinen and Juha{-}Veikko Voutilainen and Heli Jantunen and Markku Moilanen}, title = {Current State of the Mixed-Signal Test Bus 1149.4}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {857--863}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5339-7}, doi = {10.1007/S10836-012-5339-7}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HannuHVJM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HazraGDC12, author = {Aritra Hazra and Priyankar Ghosh and Pallab Dasgupta and Partha Pratim Chakrabarti}, title = {Cohesive Coverage Management: Simulation Meets Formal Methods}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {449--468}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5308-1}, doi = {10.1007/S10836-012-5308-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HazraGDC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HuangHCCKHCK12, author = {Xuan{-}Lun Huang and Jiun{-}Lang Huang and Hung{-}I Chen and Chang{-}Yu Chen and Tseng Kuo{-}Tsai and Ming{-}Feng Huang and Yung{-}Fa Chou and Ding{-}Ming Kwai}, title = {An MCT-Based Bit-Weight Extraction Technique for Embedded {SAR} {ADC} Testing and Calibration}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {705--722}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5325-0}, doi = {10.1007/S10836-012-5325-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HuangHCCKHCK12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HungH12, author = {Shao{-}Feng Hung and Hao{-}Chiao Hong}, title = {Experimental Results of Testing a {BIST} {\(\Sigma\)}-{\(\Delta\)} {ADC} on the {HOY} Wireless Test Platform}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {571--584}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5302-7}, doi = {10.1007/S10836-012-5302-7}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HungH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/IzosimovGLPFPF12, author = {Viacheslav Izosimov and Giuseppe Di Guglielmo and Michele Lora and Graziano Pravadelli and Franco Fummi and Zebo Peng and Masahiro Fujita}, title = {Time-Constraint-Aware Optimization of Assertions in Embedded Software}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {469--486}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5316-1}, doi = {10.1007/S10836-012-5316-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/IzosimovGLPFPF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/KannanKA12, author = {Sukeshwar Kannan and Bruce C. Kim and Byoungchul Ahn}, title = {Fault Modeling and Multi-Tone Dither Scheme for Testing 3D {TSV} Defects}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {39--51}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5263-2}, doi = {10.1007/S10836-011-5263-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/KannanKA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/KavithamaniMD12, author = {Ashok Kavithamani and Venugopal Manikandan and Nanjundappan Devarajan}, title = {Fault Detection of Analog Circuits Using Network Parameters}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {257--261}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5284-5}, doi = {10.1007/S10836-012-5284-5}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/KavithamaniMD12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/KimA12, author = {Hyunjin Kim and Jacob A. Abraham}, title = {A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {585--597}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5324-1}, doi = {10.1007/S10836-012-5324-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/KimA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/KulovicM12, author = {Kemal Kulovic and Martin Margala}, title = {Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {653--671}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5299-y}, doi = {10.1007/S10836-012-5299-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/KulovicM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LongTW12, author = {Bing Long and Shulin Tian and Houjun Wang}, title = {Diagnostics of Filtered Analog Circuits with Tolerance Based on {LS-SVM} Using Frequency Features}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {291--300}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5275-y}, doi = {10.1007/S10836-011-5275-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LongTW12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LongTW12a, author = {Bing Long and Shulin Tian and Houjun Wang}, title = {Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on {LS-SVM}}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {745--755}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5301-8}, doi = {10.1007/S10836-012-5301-8}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LongTW12a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LouYZF12, author = {Yi Lou and Zhuo Yan and Fan Zhang and Paul D. Franzon}, title = {Comparing Through-Silicon-Via {(TSV)} Void/Pinhole Defect Self-Test Methods}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {27--38}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5261-4}, doi = {10.1007/S10836-011-5261-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LouYZF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/LuoWLJ12, author = {Hui Luo and Youren Wang and Hua Lin and Yuanyuan Jiang}, title = {A New Optimal Test Node Selection Method for Analog Circuit}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {279--290}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5274-z}, doi = {10.1007/S10836-011-5274-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/LuoWLJ12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/MaTG12, author = {Junxia Ma and Mohammad Tehranipoor and Patrick Girard}, title = {A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {201--214}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5268-x}, doi = {10.1007/S10836-011-5268-X}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/MaTG12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/MaltabasKM12, author = {Samed Maltabas and Kemal Kulovic and Martin Margala}, title = {Novel Practical Built-in Current Sensors}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {673--683}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5313-4}, doi = {10.1007/S10836-012-5313-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/MaltabasKM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/MarinissenCKV12, author = {Erik Jan Marinissen and Chun{-}Chuan Chi and Mario Konijnenburg and Jouke Verbree}, title = {A DfT Architecture for 3D-SICs Based on a Standardizable Die Wrapper}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {73--92}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5269-9}, doi = {10.1007/S10836-011-5269-9}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/MarinissenCKV12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/MarinissenZ12, author = {Erik Jan Marinissen and Yervant Zorian}, title = {Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {13--14}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5279-2}, doi = {10.1007/S10836-012-5279-2}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/MarinissenZ12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/MaurouxVBDGPGFV12, author = {Pierre{-}Didier Mauroux and Arnaud Virazel and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Beno{\^{\i}}t Godard and Gilles Festes and Laurent Vachez}, title = {Analysis and Fault Modeling of Actual Resistive Defects in {ATMEL} TSTAC\({}^{\mbox{TM}}\) eFlash Memories}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {215--228}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5277-4}, doi = {10.1007/S10836-012-5277-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/MaurouxVBDGPGFV12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/MrozekY12, author = {Ireneusz Mrozek and Vyacheslav N. Yarmolik}, title = {Iterative Antirandom Testing}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {301--315}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5272-1}, doi = {10.1007/S10836-011-5272-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/MrozekY12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/NaingWBHPBGL12, author = {Mozar Naing and Dallas Webster and Nolan Blue and Rick Hudgens and Zahir Parkar and Sumeer Bhatara and Pankaj Gupta and Donald Y. C. Lie}, title = {Maximizing Parallel Testing in an {FM} Receiver}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {723--731}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5323-2}, doi = {10.1007/S10836-012-5323-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/NaingWBHPBGL12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/NeophytouCM12, author = {Stelios Neophytou and Kyriakos Christou and Maria K. Michael}, title = {A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {843--856}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5333-0}, doi = {10.1007/S10836-012-5333-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/NeophytouCM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/NoiaCM12, author = {Brandon Noia and Krishnendu Chakrabarty and Erik Jan Marinissen}, title = {Optimization Methods for Post-Bond Testing of 3D Stacked ICs}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {103--120}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5233-8}, doi = {10.1007/S10836-011-5233-8}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/NoiaCM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/PascaAB12, author = {Vladimir Pasca and Lorena Anghel and Mounir Benabdenbi}, title = {Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {817--829}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5322-3}, doi = {10.1007/S10836-012-5322-3}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/PascaAB12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/PascaANB12, author = {Vladimir Pasca and Lorena Anghel and Michael Nicolaidis and Mounir Benabdenbi}, title = {{CSL:} Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {137--150}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5260-5}, doi = {10.1007/S10836-011-5260-5}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/PascaANB12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Portela-GarciaLEGLMPPV12, author = {Marta Portela{-}Garc{\'{\i}}a and Almudena Lindoso and Luis Entrena and Mario Garc{\'{\i}}a{-}Valderas and Celia L{\'{o}}pez{-}Ongil and N. Marroni and Bernardo Pianta and Let{\'{\i}}cia Maria Bolzani Poehls and Fabian Vargas}, title = {Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {777--789}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5321-4}, doi = {10.1007/S10836-012-5321-4}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Portela-GarciaLEGLMPPV12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RenFCWWVWB12, author = {Yi Ren and L. Fan and Li Chen and Shi{-}Jie Wen and Richard Wong and N. W. van Vonno and Arthur F. Witulski and Bharat L. Bhuva}, title = {Single-Event Effects Analysis of a Pulse Width Modulator {IC} in a {DC/DC} Converter}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {877--883}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5338-8}, doi = {10.1007/S10836-012-5338-8}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/RenFCWWVWB12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RuizFGM12, author = {Jose Mar{\'{\i}}a Ru{\'{\i}}z and Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and Ignacio Gil and Marta Morata}, title = {Current Consumption and Power Integrity of {CMOS} Digital Circuits Under {NBTI} Wearout}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {865--868}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5337-9}, doi = {10.1007/S10836-012-5337-9}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/RuizFGM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/SarrafKSC12, author = {Elie H. Sarraf and Ankit Kansal and Mrigank Sharma and Edmond Cretu}, title = {FPGA-based Novel Adaptive Scheme Using {PN} Sequences for Self-Calibration and Self-Testing of MEMS-based Inertial Sensors}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {599--614}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5336-x}, doi = {10.1007/S10836-012-5336-X}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/SarrafKSC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/SenBNDCC12, author = {Shreyas Sen and Aritra Banerjee and Vishwanath Natarajan and Shyam Kumar Devarakond and Hyun Woo Choi and Abhijit Chatterjee}, title = {BIST/Digital-Compatible Testing of {RF} Devices Using Distortion Model Fitting}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {405--419}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5304-5}, doi = {10.1007/S10836-012-5304-5}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/SenBNDCC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/SenGuptaIL12, author = {Breeta SenGupta and Urban Ingelsson and Erik Larsson}, title = {Scheduling Tests for 3D Stacked Chips under Power Constraints}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {121--135}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5244-5}, doi = {10.1007/S10836-011-5244-5}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/SenGuptaIL12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ShengKZG12, author = {Xiaoqin Sheng and Hans G. Kerkhoff and Amir Zjajo and Guido Gronthoud}, title = {{ADC} Multi-Site Test Based on a Pre-test with Digital Input Stimulus}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {393--404}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5309-0}, doi = {10.1007/S10836-012-5309-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ShengKZG12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ShukoorA12, author = {Mohammed Ashfaq Shukoor and Vishwani D. Agrawal}, title = {Diagnostic Test Set Minimization and Full-Response Fault Dictionary}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {177--187}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5286-3}, doi = {10.1007/S10836-012-5286-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ShukoorA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/SindiaAS12, author = {Suraj Sindia and Vishwani D. Agrawal and Virendra Singh}, title = {Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {541--549}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5305-4}, doi = {10.1007/S10836-012-5305-4}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/SindiaAS12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/SindiaAS12a, author = {Suraj Sindia and Vishwani D. Agrawal and Virendra Singh}, title = {Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {757--771}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5326-z}, doi = {10.1007/S10836-012-5326-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/SindiaAS12a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/SukharevKCHMZH12, author = {Valeriy Sukharev and Armen Kteyan and Jun{-}Ho Choy and Henrik Hovsepyan and Ara Markosian and Ehrenfried Zschech and Rene Huebner}, title = {Multi-scale Simulation Methodology for Stress Assessment in 3D {IC:} Effect of Die Stacking on Device Performance}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {63--72}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5259-y}, doi = {10.1007/S10836-011-5259-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/SukharevKCHMZH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/TadeusiewiczH12, author = {Michal Tadeusiewicz and Stanislaw Halgas}, title = {Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {487--493}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5306-3}, doi = {10.1007/S10836-012-5306-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/TadeusiewiczH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/TaouilH12, author = {Mottaqiallah Taouil and Said Hamdioui}, title = {Yield Improvement for 3D Wafer-to-Wafer Stacked Memories}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {523--534}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5314-3}, doi = {10.1007/S10836-012-5314-3}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/TaouilH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/TaouilHBM12, author = {Mottaqiallah Taouil and Said Hamdioui and Kees Beenakker and Erik Jan Marinissen}, title = {Test Impact on the Overall Die-to-Wafer 3D Stacked {IC} Cost}, journal = {J. Electron. Test.}, volume = {28}, number = {1}, pages = {15--25}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5270-3}, doi = {10.1007/S10836-011-5270-3}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/TaouilHBM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ThibeaultHH12, author = {Claude Thibeault and Yassine Hariri and Christelle Hobeika}, title = {Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {229--242}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5271-2}, doi = {10.1007/S10836-011-5271-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ThibeaultHH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Ting12, author = {Hsin{-}Wen Ting}, title = {Digital-Compatible Testing Scheme for Operational Amplifier}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {267--277}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5290-7}, doi = {10.1007/S10836-012-5290-7}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Ting12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/TsaiAR12, author = {Tsung{-}Yen Tsai and Sadok Aouini and Gordon W. Roberts}, title = {High Speed On-Chip Signal Generation for Debug and Diagnosis}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {625--640}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5289-0}, doi = {10.1007/S10836-012-5289-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/TsaiAR12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ViilukasKRJUF12, author = {Taavi Viilukas and Anton Karputkin and Jaan Raik and Maksim Jenihhin and Raimund Ubar and Hideo Fujiwara}, title = {Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {511--521}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5312-5}, doi = {10.1007/S10836-012-5312-5}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/ViilukasKRJUF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/VockETO12, author = {Stefan R. Vock and Omar Escalona and Colin Turner and Frank J. Owens}, title = {Challenges for Semiconductor Test Engineering: {A} Review Paper}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {365--374}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5276-x}, doi = {10.1007/S10836-011-5276-X}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/VockETO12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/WakabayashiKYKKAN12, author = {Kazuyuki Wakabayashi and Keisuke Kato and Takafumi Yamada and Osamu Kobayashi and Haruo Kobayashi and Fumitaka Abe and Kiichi Niitsu}, title = {Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {641--651}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5293-4}, doi = {10.1007/S10836-012-5293-4}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/WakabayashiKYKKAN12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/WuCD12, author = {Minshun Wu and Degang Chen and Jingbo Duan}, title = {An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {733--743}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5310-7}, doi = {10.1007/S10836-012-5310-7}, timestamp = {Tue, 26 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/WuCD12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X12, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {153--154}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5288-1}, doi = {10.1007/S10836-012-5288-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X12a, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {265--266}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5300-9}, doi = {10.1007/S10836-012-5300-9}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X12a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X12b, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {391--392}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5317-0}, doi = {10.1007/S10836-012-5317-0}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X12b.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X12c, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {553--554}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5328-x}, doi = {10.1007/S10836-012-5328-X}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X12c.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/X12d, title = {Test Technology Newsletter}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {775--776}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5340-1}, doi = {10.1007/S10836-012-5340-1}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/X12d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/YiH12, author = {Joonhwan Yi and John P. Hayes}, title = {Robust Coupling Delay Test Sets}, journal = {J. Electron. Test.}, volume = {28}, number = {3}, pages = {375--388}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5292-5}, doi = {10.1007/S10836-012-5292-5}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/YiH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ZhangGA12, author = {Chaoming Zhang and Ranjit Gharpurey and Jacob A. Abraham}, title = {Built-in Self Test of {RF} Subsystems with Integrated Detectors}, journal = {J. Electron. Test.}, volume = {28}, number = {5}, pages = {557--569}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5315-2}, doi = {10.1007/S10836-012-5315-2}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/ZhangGA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ZhaoCB12, author = {Yang Zhao and Krishnendu Chakrabarty and Bhargab B. Bhattacharya}, title = {Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts}, journal = {J. Electron. Test.}, volume = {28}, number = {2}, pages = {243--255}, year = {2012}, url = {https://doi.org/10.1007/s10836-011-5266-z}, doi = {10.1007/S10836-011-5266-Z}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/ZhaoCB12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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